Correlations of the ttH signal-strength modifiers in the different Higgs pT bins of the STXS measurement.

Observed and expected upper 95% CL limit on the tH signal strength modifier $\mu_{tH}$ with $\mu_{ttH}=1$ for different channels and years, where the uncertainties are uncorrelated between the channels and years, and in their combination. The one and two standard deviation confidence intervals on the expected limit are also listed (sigma).

Likelihood-ratio test statistic as a function of the ttH and tH signal strength modifiers $\mu_{ttH}$ and $\mu_{tH}$. The observed best fit point is $(\mu_{tH}, \mu_{ttH}) = (-3.83, +0.35)$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\kappa_{V}$. The observed best fit point is $(\kappa_{t}, \kappa_{V}) = (+0.59, +1.40)$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ for $\kappa_{V}=1$. The observed best fit point is $\kappa_{t} = +0.54$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\tilde{\kappa}_{t}$ with $\kappa_{V}=1$. The observed best fit point is $(\kappa_{t}, \tilde{\kappa}_{t}) = (+0.53, 0.00)$.

Observed and expected likelihood ratio test statistic as a function of $f_{CP}$. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1. The observed best fit point is $f_{CP} = 0.00$.

Observed and expected likelihood ratio test statistic as a function of $\cos(\alpha)$. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1. The observed best fit point is $\cos(\alpha) = +1.00$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\tilde{\kappa}_{t}$ with $\kappa_{V}=1$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channels and in their combination.

Observed and expected likelihood ratio test statistic as a function of $f_{CP}$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channel and in their combination. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1.

Observed and expected likelihood ratio test statistic as a function of $\cos(\alpha)$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channels and in their combination. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1.

Correlation matrix for the differential branching fraction extraction between different $q^2$ bins in the simultaneous fit.

The product of acceptance and efficiency ($A\epsilon$) of the $\mathcal{B}(\mathrm{B}^+\to\mathrm{K}^+\mu^+\mu^-)$ channel, as a function of the muon pair $q^2$, as measured in simulated signal events, after all the corrections applied. In the figure, regions corresponding to resonances are displayed with red markers.

Same as Table 5, but for the bins containing the J$\psi$ and $\psi$(2S) resonances.

Integrated branching fraction $\mathcal{B}(\mathrm{B}^\pm \to \mathrm{K}^\pm\mu^+\mu^-)$ in the low-$q^2$ region.

Ratio of branching fractions $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\mu^+\mu^-)$ to $\mathcal{B}(\text{B}^\pm \to \text{K}^\pm\text{e}^+\text{e}^-)$, determined from the measured double ratio $R$(K) of these decays to the respective branching fractions of the decay chains $\text{B}^\pm\to\text{J/}\psi\text{K}^\pm$ with $\text{J/}\psi\to\mu^+\mu^-$ and $\text{e}^+\text{e}^-$.

Negative log likelihood function from the fit profiled as a function of the inverse ratio $R(\mathrm{K})^{-1}$.

The elliptic flow after nonflow subtraction, $v_{2}^{sub}/4$, for $f_0(980)$ as a function of $<KE_{T}>/4$ in pPb collision at 8.16 TeV.

The elliptic flow after nonflow subtraction, $v_{2}^{sub}/2$, for $f_0(980)$ as a function of $<p_{T}>/2$ in pPb collision at 8.16 TeV.

The elliptic flow after nonflow subtraction, $v_{2}^{sub}/4$, for $f_0(980)$ as a function of $<p_{T}>/4$ in pPb collision at 8.16 TeV.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $10-20\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $20-30\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $30-40\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $40-50\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $50-60\%$ centrality.

$\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlation meassurement in $0-80\%$ centrality.

$\Lambda\Lambda\oplus\overline{\Lambda}\overline{\Lambda}$ correlation meassurement in $0-80\%$ centrality.

The extracted $R_{inv}$ from $K^{0}_{S} K^{0}_{S}$ correlations as a function of centrality.

The extracted $\lambda$ parameters from $K^{0}_{S} K^{0}_{S}$ correlations as a function of centrality.

Extracted effective range ($d_{0}$) and real components of the complex scattering length ($\Re f_{0}$) from the $\Lambda\Lambda\oplus\overline{\Lambda}\overline{\Lambda}$ and $\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlations.

Extracted imaginary components of the complex scattering length ($\Im f_{0}$) and real components of the complex scattering length ($\Re f_{0}$) from the $\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlation.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{jets}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{jets}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|\cos\theta^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\cos\theta^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\cos\theta^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\cos\theta^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{\gamma\gamma}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{\gamma\gamma}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{\gamma\gamma}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{\gamma\gamma}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{1}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{1}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{1}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{1}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{2}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{2}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{2}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{2}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$

Correlation between the measured fiducial cross sections in the different bins of $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$

Differential fiducial higgs to diphoton cross section with respect to $m_{\mathrm{jj}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $m_{\mathrm{jj}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $m_{\mathrm{jj}}$

Correlation between the measured fiducial cross sections in the different bins of $m_{\mathrm{jj}}$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\eta_{j_{1},j_{2}}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\eta_{j_{1},j_{2}}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\eta_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\eta_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{leptons}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{leptons}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{leptons}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{leptons}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{b-jets}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{b-jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{b-jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{b-jets}}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\mathrm{miss}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\mathrm{miss}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\mathrm{miss}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\mathrm{miss}}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$ in the VBF enriched PS

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$ in the VBF enriched PS

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$ in the VBF enriched PS

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$ in the VBF enriched PS

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Differential fiducial higgs to diphoton cross section with respect to $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\tau_{\mathrm{C}}^{j}$

Correlation between the measured fiducial cross sections in the different bins of $\tau_{\mathrm{C}}^{j}$

Differential fiducial higgs to diphoton cross section with respect to $\left|\phi_{\eta}^{\ast}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\left|\phi_{\eta}^{\ast}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\left|\phi_{\eta}^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\phi_{\eta}^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $\tau_{\mathrm{C}}^{j}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $\tau_{\mathrm{C}}^{j}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $n_{\mathrm{jets}}$

Cross sections measured in different regions of the fiducial phase space

Cross sections measured in different regions of the fiducial phase space

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$.

Signal region detector-level distribution for the observable $m_{e\mu}$.

Signal region detector-level distribution for the observable $p_{\mathrm{T}}^{e\mu}$.

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

Measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Relative systematic uncertainties for the fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|y_{e\mu}|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $|\Delta \phi(e \mu)|$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $ \cos\theta^{\ast}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{\mathrm{lead}\, \ell}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $m_{e\mu}$

The statistical correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

The total correlation coefficients (in percentage) between bins for the measured fiducial differential cross-section of $WW \rightarrow e^{\pm}\nu\mu^{\mp}\nu$ production for the observable $p_{\mathrm{T}}^{e\mu}$

Theory cross sections vs m($\widetilde{\chi}^0_1$) for SMS model TChiHH-G, $\widetilde{\chi}^0_1, \widetilde{\chi}^0_2$ NLSPs only.

The 95% CL observed and expected upper limits on the production cross sections of the TChiHH signal model as a function of the $\widetilde{\chi}^0_2$ and $\widetilde{\chi}^0_1$ masses. Relative to Fig. 13, the binning of the table is adjusted to align with the model points that were sampled. In addition, a small correction has been applied that affects the cross section upper limits for points with $m(\widetilde{\chi}^0_1) = 1$ GeV. For that row of points in the figure, the small region of model phase space reached by both the resolved and boosted selections was inadvertently double counted in computing the signal contribution to the predicted yield.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Cross section, 95% CL upper limit plus theory vs m($\widetilde{g}$) for SMS model T5HH.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Pre-fit background correlation matrix $\rho_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Significance vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH.

Significance vs $m(\widetilde{g})$ for SMS model T5HH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $275, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $50) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $450, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $200) for SMS model TChiHH.

Efficiency vs $m(\widetilde{\chi}^0_1)$ for SMS model TChiHH-G. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Efficiency vs $m(\widetilde{g})$ for SMS model T5HH. The denominator includes all 22 signal regions, and no constraint on $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})$.

Efficiency vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Signal and control region populations for the resolved signature.

Signal and control region populations for the boosted signature.

Cut flow table for the resolved topology showing expected event yields at 137 fb$^{-1}$ for selected signal models as successive selections are applied.

Cut flow table for the boosted topology showing expected event yields at 137 fb$^{-1}$ for selected signal model points as successive selections are applied. Here the hadronic baseline is defined by $N_{\mathrm{jet}}\geq$2, \ptmiss$>$300 GeV, $\Delta\phi$ cuts, and the isolated lepton and track vetoes.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.