Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections for pT(gamma) > 15 GeV with statistical, systematic, and luminosity uncertainties, respectively. Combined result of electron and muon channels.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 0.6$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $0.6 < |y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon$(1S) state and $|y| <0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 1.2$.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

The differential cross section measurement as a function of the transverse momentum of the second leading jet.

The differential cross section measurement as a function of the transverse momentum of the third leading jet.

The differential cross section measurement as a function of the transverse momentum of the fourth leading jet.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of one or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of two or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of three or more.

The differential cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of four or more.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the first second jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The differential cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the first leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the second leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the third leading jet and the muon.

The differential cross section measurement as a function of the absolute value of the azimuthal separation between the fourth leading jet and the muon.

Measured differential cross sections as function of the lepton pseudo-rapidity of the production of a W boson with a D meson or a D* meson times the branching ratio W -> l nu in the fiducial regions together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured cross section ratios of the production of a W boson with a D meson or a D* meson and the inclusive production of a W boson in the fiducial regions together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured differential cross section ratios of the production of a W boson with a D meson or a D* meson and the inclusive production of a W boson in the fiducial regions as function of the D/D* meson pT together with the statistical and systematic uncertainties. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Measured integrated cross sections of the production of a W boson in association with a single c-jet and exactly zero or one additional non-c-jets times the branching ratio W -> l nu in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. The cross sections are defined for OS-SS events.

Measured integrated cross sections ratio of the production of a W+ and W- bosons in association with a single c-jet and exactly zero or one additional non-c-jets in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. The cross sections are defined for OS-SS events.

Measured integrated cross sections of the production of a W boson in association with a single c-jet decaying into a soft muon in the fiducial regions together with the statistical and systematic uncertainties. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Soft muons are associated to c-jets within a cone of DeltaR<0.5. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events.

Correlation matrix corresponding to the total uncertainties of measured integrated cross sections of the production of a W boson with a single c-jet, a D meson or a D* meson times the branching ratio W -> l nu in the fiducial regions.

Systematic uncertainties after the averaging procedure of the inclusive cross sections in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels. The luminosity is included in these correlated systematic uncertainties.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ + cbar-jet channel are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W- + c-jet channel are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ D- and W- D+ channels are shown in this table.

Systematic uncertainties after the averaging procedure of the differential cross sections as function of the lepton pseudo-rapidity in different channels. The first row (labeled Uncorr.) represents the uncorrelated systematic uncertainties. The following rows represent the diagonalized list of systematic uncertainties which are correlated across all channels and bins. The luminosity is included in these correlated systematic uncertainties. The systematic uncertainties for the W+ D*- and W- D*+ channels are shown in this table.

Theoretical Predictions for the integrated cross section of the production of W+ and W- bosons associated with a single c-jet, a D meson or a D* meson in the fiducial regions together with the statistical and systematic uncertainties. For the W+c-jet cross sections events with more than one c-jet are discarded. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events. The predictions have been obtained the aMC@NLO MC simulation interfaced to the Herwig++ parton shower programme. The uncertainties on the predictions entail PDF uncertainties, parton shower, fragmentation and scale uncertainties. The predictions are reweighted using LHAPDF from the CT10nlo PDF set to the following PDF sets with the LHAPDF IDs given in brackets: CT10nlo (11000), MSTW2008nlo68cl (21100), NNPDF23_nlo_as_0119 (230000), NNPDF23_nlo_collider_as_0119 (236000), HERAPDF15NLO (EIG+VAR, 60700+60730), ATLAS-epWZ12 (EIG+VAR, 65000+65040).

PDF uncertainty for each of the used PDF sets as well as the combined parton shower, fragmentation and scale uncertainties (given in percent) for the theoretical Predictions for the integrated cross section of the production of W+ and W- bosons associated with a single c-jet, a D meson or a D* meson in the fiducial regions together with the statistical and systematic uncertainties. If added quadratically, these uncertainties represent the total uncertainty on the quoted theory prediction. For the W+c-jet cross sections events with more than one c-jet are discarded. The particle-level c-jet is defined as the one containing a weakly decaying c-hadron with pt>5 GeV, within DeltaR<0.3. Jets containing c-hadrons originating from b-hadron decays are not counted as c-jets. Jets are not required for the W+D/D* cross sections. The cross sections are defined for OS-SS events. The predictions have been obtained the aMC@NLO MC simulation interfaced to the Herwig++ parton shower programme. The uncertainties on the predictions entail PDF uncertainties, FSR uncertainties and scale uncertainties. The predictions are reweighted using LHAPDF from the CT10nlo PDF set to the following PDF sets with the LHAPDF IDs given in brackets: CT10nlo (11000), MSTW2008nlo68cl (21100), NNPDF23_nlo_as_0119 (230000), NNPDF23_nlo_collider_as_0119 (236000), HERAPDF15NLO (EIG+VAR, 60700+60730), ATLAS-epWZ12 (EIG+VAR, 65000+65040). The determination of the parton shower, fragmentation and scale uncertainties is detailed in the paper.