The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

Expected allowed ranges for 8 dimensional aQGC, no cutoff).

Inclusive Cross Section.

Normalized $t\bar{t}$ differential cross section measurements with respect to the $p^{W}_{T}$ variable at a center-of-mass energy of 7 TeV (combination of electron and muon channels).

Normalized $t\bar{t}$ differential cross section measurements with respect to the $E^{miss}_{T}$ variable at a center-of-mass energy of 8 TeV (combination of electron and muon channels).

Normalized $t\bar{t}$ differential cross section measurements with respect to the HT variable at a center-of-mass energy of 8 TeV (combination of electron and muon channels).

Normalized $t\bar{t}$ differential cross section measurements with respect to the $S_T$ variable at a center-of-mass energy of 8 TeV (combination of electron and muon channels).

Normalized $t\bar{t}$ differential cross section measurements with respect to the $p^{W}_{T}$ variable at a center-of-mass energy of 8 TeV (combination of electron and muon channels).

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $E_{T}^{miss}$ variable at a center-of-mass energy of 7 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $H_{T}$ variable at a center-of-mass energy of 7 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $S_{T}$ variable at a center-of-mass energy of 7 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $p^{W}_{T}$ variable at a center-of-mass energy of 7 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $E_{T}^{miss}$ variable at a center-of-mass energy of 8 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $H_{T}$ variable at a center-of-mass energy of 8 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $S_{T}$ variable at a center-of-mass energy of 8 TeV. Both statistical and systematic effects are considered.

Covariance matrix for the normalized $t\bar{t}$ differential cross section measurements with respect to the $p^{W}_{T}$ variable at a center-of-mass energy of 8 TeV. Both statistical and systematic effects are considered.

Ratio of normalized fiducial differential cross sections of W- boson to W+ boson decaying to muons at pre-FSR level.

Ratio of normalized fiducial differential cross section of Z0 boson to W+ boson and W- boson at pre-FSR level of muon decay channel.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT < 20 GeV.

Ratio of the normalized fiducial differential cross section of Z0 boson production at center-of-energy 8 TeV to Z0 boson production at center-of-energy 7 TeV decaying to dimuon for boson PT > 20 GeV.

Normalized fiducial differential cross sections of W+ boson and W- boson decaying to muon and neutrino at post-FSR level.

Normalized fiducial differential cross sections of Z0 boson decaying to dimuon at post-FSR level.

Best fit values of $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The values involving cross sections are given for $\sqrt{s}$=8 TeV, assuming the SM values for $\sigma_i(7 \mathrm{TeV})/\sigma_i(8 \mathrm{TeV})$. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\kappa_{gZ}= \kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and of the ratios of coupling modifiers, as defined in the most generic parameterisation described in the context of the $\kappa$ framework, from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The uncertainties in $\lambda_{tg}$ and $\lambda_{WZ}$, for which a negative solution is allowed, are calculated around the overall best fit value. The expected total uncertainties in the measurements are also shown. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Measured global signal strength $\mu$ and its total uncertainty, together with the breakdown of the uncertainty into its four components as defined in the text. The results are shown for the combination of ATLAS and CMS, and separately for each experiment. The expected uncertainty, with its breakdown, is also shown.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson production processes. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson branching fractions are the same as in the SM.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson decay channels. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson production process cross sections at $\sqrt{s}$ = 7 and 8 TeV are the same as in the SM.

Results of the ten-parameter fit of $\mu_F^f = \mu_{gg\mathrm{F}+ttH}^f$ and $\mu_V^f = \mu_{\mathrm{VBF}+VH}^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Results of the six-parameter fit of the global ratio $\mu_V/\mu_F = \mu_{\mathrm{VBF}+VH}/\mu_{gg\mathrm{F}+ttH}$ together with $\mu_F^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Fit results allowing BSM loop couplings, assuming that $|\kappa_{V}| \le$ 1, where $\kappa_{V}$ denotes $\kappa_{Z}$ or $\kappa_{W}$, and that $\mathrm{B_{BSM}} \ge$ 0. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results allowing BSM loop couplings, assuming that there are no additional BSM contributions to the Higgs boson width, i.e. $\mathrm{B_{BSM}}=0$. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $\mathrm{B_{BSM}}$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results for the parameterisation assuming the absence of BSM particles in the loops ($\mathrm{B_{BSM}}$=0). The results with their measured and expected uncertainties are reported for the combination of ATLAS and CMS, together with the individual results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ CL interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $|\kappa_\mu|$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for up-type versus down-type fermions. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{uu}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{du}$, for which both signs are allowed, the other 1$\sigma$ CL interval is shown on a second line. Negative values for the parameter $\lambda_{Vu}$ are excluded by more than 4$\sigma$.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for leptons versus quarks. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{qq}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{lq}$, for which there is no sensitivity to the sign, only the absolute values are shown. Negative values for the parameter $\lambda_{Vq}$ are excluded by more than 4$\sigma$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

ATLAS+CMS combined best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow bb$ channel.

The electron channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kDressed) is also provided.

The muon channel Born-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSYRAP. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

The muon channel Born-level double-differential cross section D2SIG/DM/DABSDETA. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-". The ratio of the dressed-level to Born-level predictions (kdressed) is also provided.

Born-level differential fiducial cross section prediction DSIG/DM at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSYRAP at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Born-level differential fiducial cross section prediction D2SIG/DM/DABSDETA at NNLO including NLO electroweak corrections and the PI contribution. The calculation is performed using the MMHT2014 NNLO PDF set and with dynamic scales set equal to the invariant mass. The predictions are listed together with the statistical uncertainty, the PDF eigenvector variation, the uncertainty from the variation of alpha_s, the combined uncertainty from mu_F and mu_R, and the uncertainty from the variation of the photon PDF in the PI contribution. The fraction of the PI contribution, f(PI), is also given.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 116 GeV < M(EE) < 150 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 150 GeV < M(EE) < 200 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 200 GeV < M(EE) < 300 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 300 GeV < M(EE) < 500 GeV.

Statistical correlation between the measurement bins in mass, absolute rapidity and absolute pseudorapidity separation in the electron channel for 500 GeV < M(EE) < 1500 GeV.

The electron channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(EE) < 150 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(EE) < 200 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(EE) < 300 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(EE) < 500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The electron channel Born-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(EE) < 1500 GeV. The measurements are listed together with the statistical uncertainties. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), electron reconstruction efficiency (reco), electron identification efficiency (id), the isolation efficiency (iso), the electron energy resolution (Eres), the electron energy scale (Escale), the multijet and W+jets background (mult.), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level single-differential cross section DSIG/DM. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSYRAP in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 116 GeV < M(MM) < 150 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 150 GeV < M(MM) < 200 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 200 GeV < M(MM) < 300 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 300 GeV < M(MM) < 500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

The muon channel dressed-level double-differential cross section D2SIG/DM/DABSDETA in the bin 500 GeV < M(MM) < 1500 GeV. The measurements are listed together with the statistical (stat) uncertainty. In addition the contributions from the individual correlated (cor) and uncorrelated (unc) systematic error sources are also provided consisting of the trigger efficiency (trig), muon reconstruction efficiency (reco), the MS resolution (MSres), the ID resolution (IDres), the muon transverse momentum scale (pT), the isolation efficiency (iso), the top and diboson background normalisation (top, diboson), the top and diboson background MC statistical uncertainty (bgMC), the multijet background uncertainty (mult), the signal MC statistical uncertainty (MC), and the luminosity uncertainty (lumi). The sign of the uncertainty corresponds to a one standard deviation upward shift of the uncertainty source, where +/- means "+" and -/+ means "-".

A2 for the yZ-integrated measurement (unregularised).

A3 for the yZ-integrated measurement (unregularised).

A4 for the yZ-integrated measurement (unregularised).

A5 for the yZ-integrated measurement (unregularised).

A6 for the yZ-integrated measurement (unregularised).

A7 for the yZ-integrated measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the yZ-integrated measurement (regularised).

A0 for the yZ-integrated measurement (regularised).

A1 for the yZ-integrated measurement (regularised).

A2 for the yZ-integrated measurement (regularised).

A3 for the yZ-integrated measurement (regularised).

A4 for the yZ-integrated measurement (regularised).

A5 for the yZ-integrated measurement (regularised).

A6 for the yZ-integrated measurement (regularised).

A7 for the yZ-integrated measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 0<|yZ|<1 measurement (unregularised).

A0 for the 0<|yZ|<1 measurement (unregularised).

A1 for the 0<|yZ|<1 measurement (unregularised).

A2 for the 0<|yZ|<1 measurement (unregularised).

A3 for the 0<|yZ|<1 measurement (unregularised).

A4 for the 0<|yZ|<1 measurement (unregularised).

A5 for the 0<|yZ|<1 measurement (unregularised).

A6 for the 0<|yZ|<1 measurement (unregularised).

A7 for the 0<|yZ|<1 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 0<|yZ|<1 measurement (regularised).

A0 for the 0<|yZ|<1 measurement (regularised).

A1 for the 0<|yZ|<1 measurement (regularised).

A2 for the 0<|yZ|<1 measurement (regularised).

A3 for the 0<|yZ|<1 measurement (regularised).

A4 for the 0<|yZ|<1 measurement (regularised).

A5 for the 0<|yZ|<1 measurement (regularised).

A6 for the 0<|yZ|<1 measurement (regularised).

A7 for the 0<|yZ|<1 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0-A2 for the 1<|yZ|<2 measurement (unregularised).

A0 for the 1<|yZ|<2 measurement (unregularised).

A1 for the 1<|yZ|<2 measurement (unregularised).

A2 for the 1<|yZ|<2 measurement (unregularised).

A3 for the 1<|yZ|<2 measurement (unregularised).

A4 for the 1<|yZ|<2 measurement (unregularised).

A5 for the 1<|yZ|<2 measurement (unregularised).

A6 for the 1<|yZ|<2 measurement (unregularised).

A7 for the 1<|yZ|<2 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0-A2 for the 1<|yZ|<2 measurement (regularised).

A0 for the 1<|yZ|<2 measurement (regularised).

A1 for the 1<|yZ|<2 measurement (regularised).

A2 for the 1<|yZ|<2 measurement (regularised).

A3 for the 1<|yZ|<2 measurement (regularised).

A4 for the 1<|yZ|<2 measurement (regularised).

A5 for the 1<|yZ|<2 measurement (regularised).

A6 for the 1<|yZ|<2 measurement (regularised).

A7 for the 1<|yZ|<2 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A2 for the 2<|yZ|<3.5 measurement (unregularised).

A3 for the 2<|yZ|<3.5 measurement (unregularised).

A5 for the 2<|yZ|<3.5 measurement (unregularised).

A7 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A2 for the 2<|yZ|<3.5 measurement (regularised).

A3 for the 2<|yZ|<3.5 measurement (regularised).

A5 for the 2<|yZ|<3.5 measurement (regularised).

A7 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

A0 for the 2<|yZ|<3.5 measurement (unregularised).

A4 for the 2<|yZ|<3.5 measurement (unregularised).

Covariance matrix of all measurements and uncertainties (unregularised).

A0 for the 2<|yZ|<3.5 measurement (regularised).

A4 for the 2<|yZ|<3.5 measurement (regularised).

Covariance matrix of all measurements and uncertainties (regularised).

The inclusive prompt photon cross section with systematic and statistical uncertainties for the region 1.81<|eta(gamma)| < 2.37.