The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $10<p_{\textrm{T}}^{\mu}<20$ GeV selection in the $\mu-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $e-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $\mu-\mu$ channel.

The measurement of the ratio of the rate of decay of W bosons to τ-leptons and muons, $R(\tau/\mu)=B(W\rightarrow\tau\nu_\tau)/B(W\rightarrow \mu\nu_\mu)$.

Expected and observed 95% CL upper limits on the production of a heavy, narrow-width, scalar resonance decaying to a pair of Higgs bosons ($X\rightarrow HH$). The final state used in the search consists of a boosted $b\bar{b}$ pair and a boosted hadronically decaying $\tau^{+}\tau^{-}$ pair, and the SM braching ratio of the Higgs boson are assumed. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit are indicated by the error bands. Two different requirements are applied on the visible mass of the two boosted Higgs boson candidates for the resonance mass hypotheses of 1.6 TeV and 2.5 TeV, leading to discontinuities in the limits (at 1.6 TeV, the difference between imposing no requirement and $m^{vis}_{HH}>900$ GeV is less than 1% though).

Post-fit background and signal yields in the full signal region. The total systematic uncertainty differs from the sum in quadrature of the different uncertainties due to correlations. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair. HF $e$ (HF $\mu$) refers to events with one non-prompt electron (muon) from heavy-flavour hadron decay, LF refers to events with a lepton originating from light-meson decay, and 'Other $t\bar{t}X$' includes events coming from $t\bar{t}WZ$, $t\bar{t}Z$+jets, $t\bar{t}WH$, $t\bar{t}HH$.

Ranking of the nuisance parameters included in the fit according to their impact on the signal strength $\mu$. Only the 20 most highly ranked nuisance parameters are shown in the thumbnail figure. The empty blue rectangles correspond to the pre-fit impact on $\mu$ and the filled blue ones to the post-fit impact on $\mu$, both referring to the upper $x$-axis scale. The impact of each nuisance parameter, $\Delta\mu$, is computed by comparing the nominal best-fit value of $\mu$ with the result of the fit when fixing the nuisance parameter to its best-fit value, $\hat{\theta}$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta\theta$ ($\pm \Delta\hat{\theta}$). The black points show the pulls of the parameter relative to their nominal values, $\theta_0$. The nominal value for all parameters is $\theta_0 = 0$. The pulls of the most impactful parameters and their relative post-fit errors, $\Delta\hat{\theta}/\Delta\theta$, are referenced to the lower $x$-axis scale. In the table, POI means Parameter of Interest.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the $\Sigma p_{T}^{l}$ variable in the 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF e' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the 'HF mu' control region. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $m_{ee}^{PV}$ variable in the 'Conv.' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the $\Sigma p_{T}^{l}$ variable in the in 'ttW' control region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction before the fit ('Pre-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Comparison between data and prediction after the fit ('Post-Fit') for the BDT score in the signal region. The first and last bins contain underflow and overflow events, respectively. Q mis-id refers to the charge misassignment background. Mat. Conv. and Low $m_{\gamma^*}$ refer respectively to events with one non-prompt electron originating from photon conversion in the detector material and to events with a virtual photon leading to an $e^+e^-$ pair.

Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Number of events in the pTmiss CR, transfer factor, background prediction, and observed yield in each of the six pTmiss bins. The systematic uncertainties in the background prediction include the shape uncertainties in addition to the uncertainty in T. Also listed in the last column is the number of expected signal events and corresponding statistical uncertainties for one example mass point, m(GLUINO) = 1700 GeV. The last pTmiss bin includes overflows.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 6 pTmiss bins.

Pre-fit background correlation matrix $\rho_{xy}$ for the 6 pTmiss bins.

Observed significance (in standard deviations) of the T5ZZ signal model as a function of the gluino mass.

Cut flow for the signal for two example mass points of the T5ZZ signal model. Here the hadronic baseline is defined by $N_{\mathrm{jets}}\ge 2$, $p_T^{\mathrm{miss}}$ > 300 GeV, $H_T$ > 300 GeV, $\Delta\phi$ cuts, and the isolated photon, lepton and track veto.

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on unpolarized charge asymmetry versus $|y_{W}|$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among PDF nuisances parameters in the helicity fit with fixed signal cross sections, for combination of muon and electron channel. The postfit values for these nuisance parameters are shown in Fig. 20 in paper

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_R$

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_L$

Postfit pulls and constraints for some nuisance parameters: PDFs and $\alpha_S$

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with fixed signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured fiducial cross sections and ratio from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Postfit pulls and constraints for all nuisance parameters in the W boson double-differential cross section fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton $|cos(\theta*)|$ are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for average photon transverse momentum are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line) with bands denoting the theoretical uncertainty.

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for average photon transverse momentum are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

Measured differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton rapidity are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line) with bands denoting the theoretical uncertainty.

Measured normalised differential fiducial cross sections of $\gamma\gamma \rightarrow \gamma\gamma$ production in Pb+Pb collisions at $\sqrt{s_{NN}}$ = 5.02 TeV for diphoton rapidity are shown as points with error bars giving the statistical uncertainty and grey bands indicating the size of the total uncertainty. The results are compared with the prediction from the SuperChic v3.0 MC generator (solid line).

The 95% CL upper limit on the ALP cross section $\sigma_{\gamma\gamma\rightarrow a \rightarrow\gamma\gamma}$ for the $\gamma\gamma\rightarrow a \rightarrow \gamma\gamma$ process as a function of ALP mass m$_{a}$. The observed upper limit is shown as a solid black line and the expected upper limit is shown by the dashed black line with its $\pm1$ and $\pm2$ standard deviation bands. The discontinuity at $m_{a}=70 GeV$ is caused by the increase of the mass-bin width which brings an increase in signal acceptance.

The 95% CL upper limit on the ALP coupling $1/\Lambda_{a}$ for the $\gamma\gamma\rightarrow a \rightarrow \gamma\gamma$ process as a function of ALP mass m$_{a}$. The observed upper limit is shown as a solid black line and the expected upper limit is shown by the dashed black line with its $\pm1$ and $\pm2$ standard deviation bands. The discontinuity at $m_{a} = 70 GeV$ is caused by the increase of the mass-bin width which brings an increase in signal acceptance.

Fiducial cross section for light-by-light scattering

Observed and expected 95% confidence-level limits on sigma x BR as a function of mZ`.

Cutflow Table for 1 TeV, 2 TeV, 4 TeV MC signal samples and Data. Cut0: $\mathcal{L} \times \sigma \times B(Z`\to H\gamma)\times B(H \to b\bar{b})$; Cut1: Preselection; Cut2: Photon requirement; Cut3: Large-$R$ jet requirement; Cut4: Large-$R$ jet mass optimization; Cut5: Double $b$-tagged; Cut5.1: $p_T$ optimization(Double $b$-tagged); Cut6: Single $b$-tagged; Cut6.1: $p_T$ optimization(Single $b$-tagged).

Post-fit yields for data and prediction in each of the single-bin signal regions of the analysis.

Observed 95% confidence level limit for the two-step signal grid.

Observed 95% confidence level limit for the two-step signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the two-step signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the two-step signal grid.

Expected 95% confidence level limit for the two-step signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the two-step signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the Gtt signal grid.

Observed 95% confidence level limit for the Gtt signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the Gtt signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the Gtt signal grid.

Expected 95% confidence level limit for the Gtt signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the Gtt signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the RPV signal grid.

Observed 95% confidence level limit for the RPV signal grid with the signal cross section increased by one sigma.

Observed 95% confidence level limit for the RPV signal grid with the signal cross section decreased by one sigma.

Expected 95% confidence level limit for the RPV signal grid.

Expected 95% confidence level limit for the RPV signal grid plus one sigma from experimental systematics.

Expected 95% confidence level limit for the RPV signal grid minus one sigma from experimental systematics.

Observed 95% confidence level limit for the two-step signal grid.

Expected 95% confidence level limit for the two-step signal grid.

Observed 95% confidence level limit for the Gtt signal grid.

Expected 95% confidence level limit for the Gtt signal grid.

Observed 95% confidence level limit for the RPV signal grid.

Expected 95% confidence level limit for the RPV signal grid.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-10ij50-0ib-MJ340. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-12ij50-2ib. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

$\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ distribution in the signal region SR-9ij80-0ib. Two benchmark signal models are shown along with the background yields. These models, each representing a single mass point, are labelled 'RPV' with $(m_{\tilde{g}}, m_{\tilde{t}}) = (1600, 600) \, \mathrm{GeV}$ and 'two-step' with $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-8ij50-0ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-9ij50-0ib-MJ340. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-0ib-MJ340. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-0ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-10ij50-1ib-MJ500. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-11ij50-0ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-12ij50-2ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Number of signal events expected for $139 \, \mathrm{fb}^{-1} $ after different analysis selections in the signal region SR-9ij80-0ib. This 'two-step' model requires that a strongly produced gluino decays into quarks, the W and Z bosons, and the lightest stable neutralino where $(m_{\tilde{g}}, m_{\tilde{\chi^{0}_{1}}}) = (1600, 100) \, \mathrm{GeV}$.

Acceptance for the signal region SR-8ij50-0ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-8ij50-0ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-9ij50-0ib-MJ340 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-9ij50-0ib-MJ340 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-0ib-MJ340 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-0ib-MJ340 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-0ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-0ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-10ij50-1ib-MJ500 showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-10ij50-1ib-MJ500 showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-11ij50-0ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-11ij50-0ib showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-12ij50-2ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-12ij50-2ib showing the efficiency for the complete two-step signal grid.

Acceptance for the signal region SR-9ij80-0ib showing the acceptance for the complete two-step signal grid.

Efficiency for the signal region SR-9ij80-0ib showing the efficiency for the complete two-step signal grid.

The normalisation factors for the dominant backgrounds of the analysis in each of the multi-bin and single-bin regions.

Post-fit yields for data and prediction in each of the single-bin validation regions to test the $N_{\mathrm{jet}}$ extraction.

Post-fit yields for data and prediction in each of the single-bin validation regions to test the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ extrapolation.

Post-fit yields for data and prediction in each of the multi-bin validation regions to test the $N_{\mathrm{jet}}$ extraction.

Post-fit yields for data and prediction in each of the multi-bin validation regions to test the $\mathcal{S}(E_{\mathrm{T}}^{\mathrm{miss}})$ extrapolation.

The observed Cls from the best expected signal regions for the two-step decay.

The observed Cls from the best expected signal regions for the Gtt decay.

The observed Cls from the best expected signal regions for the RPV decay.

Number of events in each signal region broken down by background type and the number of observed data events.

From left to right; the $95\%$ CL upper limits on the visible cross section (${\langle \epsilon\sigma \rangle}^{95}_{obs}$) and on the number of signal events. Next is the $95\%$ CL upper limit on the number of signal events, given the expected number of background events. The last two columns show the confidence level for the background only hypothesis ($CL_{b}$) and the dicovery $p$-value along with the Gaussian significance (Z).

Visualisation of the highest jet multiplicity event selected in signal regions targeting long cascade decays of pair-produced gluinos. This event was recorded by ATLAS on 23 October 2016, and contains 16 jets, illustrated by cones. Yellow blocks represent the calorimeter energy measured in noise-suppressed clusters. Of the reconstructed jets, 13 (11) have transverse momenta above 50 GeV (80 GeV), with 3 (2) being b-tagged. The leading jet has a transverse momentum of 507 GeV, and the sum of jet transverse momenta $H_T=2.9$ TeV. A value of 343 GeV is observed for the $E_{T}^{miss}$, whose direction is shown by the dashed red line, producing a significance $S(E_{T}^{miss})=6.4$. The sum of the masses of large-radius jets is evaluated as $M_{J}^{\Sigma}=1070$ GeV.

Visualisation of the highest jet multiplicity event selected in a control region used to make predictions of the background from multijet production. This event was recorded by ATLAS on 18 July 2018, and contains 19 jets, illustrated by cones. Yellow blocks represent the calorimeter energy measured in in noise-suppressed clusters. Of the reconstructed jets, 16 (10) have transverse momenta above 50 GeV (80 GeV). No jets were b-tagged. The leading et has a transverse momentum of 371 GeV, and the sum of jet transverse momenta $H_T=2.2$ TeV. A value of 8 GeV is observed for the $E_{T}^{miss}$, whose direction is shown by the dashed red line, producing a significance $S(E_{T}^{miss})=0.2$. The sum of the masses of large-radius jets is evaluated as $M_{J}^{\Sigma}=767$ GeV.

Transverse momentum spectra of PI− in rapidity slices produced in the 5% most central Be+Be collisions at 75A GeV/c.

Transverse momentum spectra of PI− in rapidity slices produced in the 5% most central Be+Be collisions at 150A GeV/c.

Transverse mass spectra 1/mT d2n/(dydmT) of negatively charged pions produced in central Be+Be collisions at the SPS energies.

Rapidity spectra of PI− produced in the 5% most central Be+Be collisions at the SPS energies.

Collision energy dependence of the ratio of the width sigma_y of the rapidity distribution to the beam rapidity y_beam for central Be+Be.

Energy dependence of the mean transverse mass of PI- measured at mid-rapidity in central Be+Be collisions.

The "kink" plot showing the ratio of pion multiplicity <PI> to number of wounded nucleons <W> versus the Fermi energy variable F=s^1/4_NN from central Be+Be collisions.