Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Ht$ decay ($\Gamma_{T}$ is the $T$-quark width).

Cutflow table listing the number of events passing each criterion for a $T$-quark hypothesis with a mass of 1.6 TeV and $\kappa_{T} = 0.5$. The initial signal event yield is the predicted number of $T$-quark events inclusive in the Higgs-boson and top-quark decays for 139 fb$^{-1}$.

Observed 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Expected 95% CL upper limits on the single $T$-quark production cross-section as a function of the $T$-quark coupling $\kappa_{T}$ and $m_{T}$.

Observed and expected 95% CL lower limits on the $T$-quark mass as a function of the $T$-quark width-to-mass ratio and the branching fraction of the $T \rightarrow Wb$ decay ($\Gamma_{T}$ is the $T$-quark width).

Number of predicted signal events in the $\mu\mu X$ final states, for several benchmark signal hypotheses for Majorana HNL. The quoted uncertainties include statistical and systematic uncertainties.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

Covariance matrix for the background prediction in the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Covariance matrix for the background prediction in the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Mean lifetime and production cross section for HNLs of Majorana nature, assuming the decay to three charged leptons and coupling to only electrons or muons, as evaluated from simulated event samples.

Theory cross sections vs m($\widetilde{\chi}^0_1$) for SMS model TChiHH-G, $\widetilde{\chi}^0_1, \widetilde{\chi}^0_2$ NLSPs only.

The 95% CL observed and expected upper limits on the production cross sections of the TChiHH signal model as a function of the $\widetilde{\chi}^0_2$ and $\widetilde{\chi}^0_1$ masses. Relative to Fig. 13, the binning of the table is adjusted to align with the model points that were sampled. In addition, a small correction has been applied that affects the cross section upper limits for points with $m(\widetilde{\chi}^0_1) = 1$ GeV. For that row of points in the figure, the small region of model phase space reached by both the resolved and boosted selections was inadvertently double counted in computing the signal contribution to the predicted yield.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Cross section, 95% CL upper limit plus theory vs m($\widetilde{g}$) for SMS model T5HH.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Pre-fit background correlation matrix $\rho_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Significance vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH.

Significance vs $m(\widetilde{g})$ for SMS model T5HH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $275, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $50) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $450, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $200) for SMS model TChiHH.

Efficiency vs $m(\widetilde{\chi}^0_1)$ for SMS model TChiHH-G. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Efficiency vs $m(\widetilde{g})$ for SMS model T5HH. The denominator includes all 22 signal regions, and no constraint on $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})$.

Efficiency vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Signal and control region populations for the resolved signature.

Signal and control region populations for the boosted signature.

Cut flow table for the resolved topology showing expected event yields at 137 fb$^{-1}$ for selected signal models as successive selections are applied.

Cut flow table for the boosted topology showing expected event yields at 137 fb$^{-1}$ for selected signal model points as successive selections are applied. Here the hadronic baseline is defined by $N_{\mathrm{jet}}\geq$2, \ptmiss$>$300 GeV, $\Delta\phi$ cuts, and the isolated lepton and track vetoes.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.01 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.1 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.2 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.3 $ imes$ its mass.

Model independent observed 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a top quark and a Z boson as a function of the T mass and width.

Singlet model 95% CL excluded values of the product of the cross section and branching fraction for a T decaying to a top quark and a Z boson.

Expected and observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) as a function of signal mass for signal lifetime of 100 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) . B(ZD --> mu+mu-) as a function of signal mass for signal lifetime of 1 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) . B(ZD --> mu+mu-) as a function of signal mass for signal lifetime of 1 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) . B(ZD --> mu+mu-) as a function of signal mass for signal lifetime of 100 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) . B(ZD --> mu+mu-) as a function of signal mass for signal lifetime of 100 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) as a function of signal mass for signal lifetime of 1 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) as a function of signal mass for signal lifetime of 1 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) as a function of signal mass for signal lifetime of 100 mm

Expected and observed limits at 95% CL on the branching fraction B(H --> ZD ZD) as a function of signal mass for signal lifetime of 100 mm

Observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) in the parameter space containing signal mass and signal lifetime. The ROOT file containing the values are available as additional resource

Observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) in the parameter space containing signal mass and signal lifetime. The ROOT file containing the values is available as additional resource

Observed limits at 95% CL on the branching fraction B(H --> ZD ZD) in the parameter space containing signal mass and signal lifetime. The ROOT file containing the values are available as additional resource

Observed limits at 95% CL on the branching fraction B(H --> ZD ZD) in the parameter space containing signal mass and signal lifetime. The ROOT file containing the values is available as additional resource

Region excluded at 95% CL using this search for the inflaton model in the parameter space containing signal mass and square of the signal mixing angle

Region excluded at 95% CL using this search for the inflaton model in the parameter space containing signal mass and square of the signal mixing angle

Observed limits at 95% CL on the branching fraction B(H --> ZD ZD) in the parameter space containing signal mass and kinetic mixing parameter. The ROOT file containing the values are available as additional resource

Observed limits at 95% CL on the branching fraction B(H --> ZD ZD) in the parameter space containing signal mass and kinetic mixing parameter. The ROOT file containing the values is available as additional resource

Observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) as a function of signal lifetime for various representative signal mass hypotheses

Observed limits at 95% CL on the branching fraction B(H --> ZD ZD) as a function of signal lifetime for various representative signal mass hypotheses

CMS and LHCb observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) as a function of signal mass for signal lifetime of 1 mm

CMS and LHCb observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) as a function of signal mass for signal lifetime of 10 mm

CMS and LHCb observed limits at 95% CL on the branching fraction B(hb --> PHI X) . B(PHI --> mu+mu-) as a function of signal mass for signal lifetime of 100 mm

Observed limits at 95% CL on number of signal events in aggregate signal region 0.2 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 0.2 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 0.2 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 0.2 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 1.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 1.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 1.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 1.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 2.4 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 2.4 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 2.4 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 2.4 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 3.1 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 3.1 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 3.1 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 3.1 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 7.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 7.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 0 GeV and two isolated muons

Observed limits at 95% CL on number of signal events in aggregate signal region 7.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and no requirement on muon isolation

Observed limits at 95% CL on number of signal events in aggregate signal region 7.0 cm $\leq$ lxy < 11.0 cm, dimuon pt $\geq$ 25 GeV and two isolated muons

The BDT distribution of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the low mass region ($m^{*}_{b\bar{b}\gamma\gamma} < 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.881 in the low mass region are discarded.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the low mass region ($m^{*}_{b\bar{b}\gamma\gamma} < 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.881 in the low mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the low mass region ($m^{*}_{b\bar{b}\gamma\gamma} < 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.881 in the low mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the low mass region ($m^{*}_{b\bar{b}\gamma\gamma} < 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.881 in the low mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the low mass region ($m^{*}_{b\bar{b}\gamma\gamma} < 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.881 in the low mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded.

The BDT distribution of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded.

The BDT distribution of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded.

The BDT distribution of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded. The range of BDT scores is from 0.8 to 1.

The BDT distribution (with x-axis zoomed in) of the di-Higgs ggF signal for two different values of $\kappa_{\lambda}$ and the main backgrounds in the high mass region ($m^{*}_{b\bar{b}\gamma\gamma} > 350$ GeV). Distributions are normalized to unit area. The dotted lines denote the category boundaries. Events with a BDT score below 0.857 in the high mass region are discarded. The range of BDT scores is from 0.8 to 1.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 300 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.85 for $m_{X}$ = 300 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 300 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.85 for $m_{X}$ = 300 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 300 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.85 for $m_{X}$ = 300 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 300 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.85 for $m_{X}$ = 300 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 500 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.75 for $m_{X}$ = 500 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 500 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.75 for $m_{X}$ = 500 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 500 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.75 for $m_{X}$ = 500 GeV are discarded.

The $BDT_{tot}$ score for the benchmark signal $m_{X}$ = 500 GeV and for the main backgrounds. Distributions are normalized to unit area. The dotted line denotes the event selection threshold. Events with a $BDT_{tot}$ score below 0.75 for $m_{X}$ = 500 GeV are discarded.

Distributions of $m_{\gamma\gamma}$ in high mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in high mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT tight category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ in low mass BDT loose category for the nonresonant $HH$ search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 300 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 370 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 300 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 370 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 300 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 370 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 300 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 370 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 500 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 67 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 500 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 67 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 500 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 67 fb.

Distributions of $m_{\gamma\gamma}$ for the selections used for the resonance mass point $m_{X}$ = 500 GeV for the resonant search. The data-derived fractions of nonresonant $\gamma\gamma$, $\gamma$-jet or jet-$\gamma$, and dijet background are applied and the total background is normalized to the data sideband. The scalar resonance signal is scaled to a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ = 67 fb.

The number of data events observed in the 120 GeV < $m_{\gamma\gamma}$ < 130 GeV window, the number of $HH$ signal events expected for $\kappa_{\lambda}$ = 1 and for $\kappa_{\lambda}$ = 10, and events expected for single Higgs boson production (estimated using MC simulation), as well as for continuum background. For the single Higgs boson, Rest includes VBF, $WH$, $tHqb$, and $tHW$. The values are obtained from a fit of the Asimov data set generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$ = 1. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in $HH$ signals and single Higgs boson background include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of data events observed in the 120 GeV < $m_{\gamma\gamma}$ < 130 GeV window, the number of $HH$ signal events expected for $\kappa_{\lambda}$ = 1 and for $\kappa_{\lambda}$ = 10, and events expected for single Higgs boson production (estimated using MC simulation), as well as for continuum background. For the single Higgs boson, Rest includes VBF, $WH$, $tHqb$, and $tHW$. The values are obtained from a fit of the Asimov data set generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$ = 1. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in $HH$ signals and single Higgs boson background include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of data events observed in the 120 GeV < $m_{\gamma\gamma}$ < 130 GeV window, the number of $HH$ signal events expected for $\kappa_{\lambda}$ = 1 and for $\kappa_{\lambda}$ = 10, and events expected for single Higgs boson production (estimated using MC simulation), as well as for continuum background. For the single Higgs boson, Rest includes VBF, $WH$, $tHqb$, and $tHW$. The values are obtained from a fit of the Asimov data set generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$ = 1. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in $HH$ signals and single Higgs boson background include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of data events observed in the 120 GeV < $m_{\gamma\gamma}$ < 130 GeV window, the number of $HH$ signal events expected for $\kappa_{\lambda}$ = 1 and for $\kappa_{\lambda}$ = 10, and events expected for single Higgs boson production (estimated using MC simulation), as well as for continuum background. For the single Higgs boson, Rest includes VBF, $WH$, $tHqb$, and $tHW$. The values are obtained from a fit of the Asimov data set generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$ = 1. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in $HH$ signals and single Higgs boson background include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

Observed and expected limits at 95% CL on the cross section of nonresonant Higgs boson pair production as a function of the Higgs boson self-coupling modifier $\kappa_{\lambda}= \lambda_{HHH}/\lambda^{\textrm{SM}}_{HHH}$. The expected constraints on $\kappa_{\lambda}$ are obtained with a background hypothesis excluding $pp \rightarrow HH$ production. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown. The theory prediction curve represents the scenario where all parameters and couplings are set to their SM values except for $\kappa_{\lambda}$. The uncertainty band of the theory prediction curve shows the cross-section uncertainty.

Observed and expected limits at 95% CL on the cross section of nonresonant Higgs boson pair production as a function of the Higgs boson self-coupling modifier $\kappa_{\lambda}= \lambda_{HHH}/\lambda^{\textrm{SM}}_{HHH}$. The expected constraints on $\kappa_{\lambda}$ are obtained with a background hypothesis excluding $pp \rightarrow HH$ production. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown. The theory prediction curve represents the scenario where all parameters and couplings are set to their SM values except for $\kappa_{\lambda}$. The uncertainty band of the theory prediction curve shows the cross-section uncertainty.

Observed and expected limits at 95% CL on the cross section of nonresonant Higgs boson pair production as a function of the Higgs boson self-coupling modifier $\kappa_{\lambda}= \lambda_{HHH}/\lambda^{\textrm{SM}}_{HHH}$. The expected constraints on $\kappa_{\lambda}$ are obtained with a background hypothesis excluding $pp \rightarrow HH$ production. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown. The theory prediction curve represents the scenario where all parameters and couplings are set to their SM values except for $\kappa_{\lambda}$. The uncertainty band of the theory prediction curve shows the cross-section uncertainty.

Observed and expected limits at 95% CL on the cross section of nonresonant Higgs boson pair production as a function of the Higgs boson self-coupling modifier $\kappa_{\lambda}= \lambda_{HHH}/\lambda^{\textrm{SM}}_{HHH}$. The expected constraints on $\kappa_{\lambda}$ are obtained with a background hypothesis excluding $pp \rightarrow HH$ production. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown. The theory prediction curve represents the scenario where all parameters and couplings are set to their SM values except for $\kappa_{\lambda}$. The uncertainty band of the theory prediction curve shows the cross-section uncertainty.

Values of the negative log-profile-likelihood ratio ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties in the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence-level intervals.

Values of the negative log-profile-likelihood ratio ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties in the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence-level intervals.

Values of the negative log-profile-likelihood ratio ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties in the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence-level intervals.

Values of the negative log-profile-likelihood ratio ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties in the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence-level intervals.

The number of events observed in the 120 < $m_{\gamma\gamma}$ < 130 GeV window in data, the number of events expected for scalar resonance signals of masses $m_{X}$ = 300 GeV and $m_{X}$ = 500 GeV assuming a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ equal to the observed exclusion limits of Figure 15, and events expected for SM $HH$ and single Higgs boson production (estimated using MC simulation), as well as for continuum background. The values are obtained from a fit of the Asimov data set generated under the signal-plus-background hypothesis. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in the resonant signals and the SM $HH$ and single-Higgs-boson backgrounds include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of events observed in the 120 < $m_{\gamma\gamma}$ < 130 GeV window in data, the number of events expected for scalar resonance signals of masses $m_{X}$ = 300 GeV and $m_{X}$ = 500 GeV assuming a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ equal to the observed exclusion limits of Figure 15, and events expected for SM $HH$ and single Higgs boson production (estimated using MC simulation), as well as for continuum background. The values are obtained from a fit of the Asimov data set generated under the signal-plus-background hypothesis. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in the resonant signals and the SM $HH$ and single-Higgs-boson backgrounds include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of events observed in the 120 < $m_{\gamma\gamma}$ < 130 GeV window in data, the number of events expected for scalar resonance signals of masses $m_{X}$ = 300 GeV and $m_{X}$ = 500 GeV assuming a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ equal to the observed exclusion limits of Figure 15, and events expected for SM $HH$ and single Higgs boson production (estimated using MC simulation), as well as for continuum background. The values are obtained from a fit of the Asimov data set generated under the signal-plus-background hypothesis. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in the resonant signals and the SM $HH$ and single-Higgs-boson backgrounds include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

The number of events observed in the 120 < $m_{\gamma\gamma}$ < 130 GeV window in data, the number of events expected for scalar resonance signals of masses $m_{X}$ = 300 GeV and $m_{X}$ = 500 GeV assuming a total production cross section $\sigma(pp \rightarrow X \rightarrow HH)$ equal to the observed exclusion limits of Figure 15, and events expected for SM $HH$ and single Higgs boson production (estimated using MC simulation), as well as for continuum background. The values are obtained from a fit of the Asimov data set generated under the signal-plus-background hypothesis. The continuum background component of the Asimov data set is obtained from the fit of the data sideband. The uncertainties in the resonant signals and the SM $HH$ and single-Higgs-boson backgrounds include the systematic uncertainties discussed in Section 6. The uncertainty in the continuum background is given by the sum in quadrature of the statistical uncertainty from the fit to the data and the spurious-signal uncertainty.

Observed and expected limits at 95% CL on the production cross section of a narrow-width scalar resonance $X$ as a function of the mass $m_{X}$ of the hypothetical scalar particle. The black solid line represents the observed upper limits. The dashed line represents the expected upper limits. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown.

Observed and expected limits at 95% CL on the production cross section of a narrow-width scalar resonance $X$ as a function of the mass $m_{X}$ of the hypothetical scalar particle. The black solid line represents the observed upper limits. The dashed line represents the expected upper limits. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown.

Observed and expected limits at 95% CL on the production cross section of a narrow-width scalar resonance $X$ as a function of the mass $m_{X}$ of the hypothetical scalar particle. The black solid line represents the observed upper limits. The dashed line represents the expected upper limits. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown.

Observed and expected limits at 95% CL on the production cross section of a narrow-width scalar resonance $X$ as a function of the mass $m_{X}$ of the hypothetical scalar particle. The black solid line represents the observed upper limits. The dashed line represents the expected upper limits. The $\pm 1\sigma$ and $\pm 2\sigma$ variations about the expected limit due to statistical and systematic uncertainties are also shown.

Breakdown of the dominant systematic uncertainties. The impact of the uncertainties is defined according to the statistical analysis described in Section 7. It corresponds to the relative variation of the expected upper limit on the cross section when re-evaluating the profile likelihood ratio after fixing the nuisance parameter in question to its best-fit value, while all remaining nuisance parameters remain free to float. The impact is shown in %. Only systematic uncertainties with an impact of at least 0.2% are shown. Uncertainties of the "Norm. + Shape" type affect both the normalization and the parameters of the functional form. The rest of the uncertainties affect only the yields.

Breakdown of the dominant systematic uncertainties. The impact of the uncertainties is defined according to the statistical analysis described in Section 7. It corresponds to the relative variation of the expected upper limit on the cross section when re-evaluating the profile likelihood ratio after fixing the nuisance parameter in question to its best-fit value, while all remaining nuisance parameters remain free to float. The impact is shown in %. Only systematic uncertainties with an impact of at least 0.2% are shown. Uncertainties of the "Norm. + Shape" type affect both the normalization and the parameters of the functional form. The rest of the uncertainties affect only the yields.

Breakdown of the dominant systematic uncertainties. The impact of the uncertainties is defined according to the statistical analysis described in Section 7. It corresponds to the relative variation of the expected upper limit on the cross section when re-evaluating the profile likelihood ratio after fixing the nuisance parameter in question to its best-fit value, while all remaining nuisance parameters remain free to float. The impact is shown in %. Only systematic uncertainties with an impact of at least 0.2% are shown. Uncertainties of the "Norm. + Shape" type affect both the normalization and the parameters of the functional form. The rest of the uncertainties affect only the yields.

Breakdown of the dominant systematic uncertainties. The impact of the uncertainties is defined according to the statistical analysis described in Section 7. It corresponds to the relative variation of the expected upper limit on the cross section when re-evaluating the profile likelihood ratio after fixing the nuisance parameter in question to its best-fit value, while all remaining nuisance parameters remain free to float. The impact is shown in %. Only systematic uncertainties with an impact of at least 0.2% are shown. Uncertainties of the "Norm. + Shape" type affect both the normalization and the parameters of the functional form. The rest of the uncertainties affect only the yields.

Cutflow for nonresonant di-Higgs ggF signal sample, yields are normalized to 139 $fb^{-1}$.

Cutflow for nonresonant di-Higgs ggF signal sample, yields are normalized to 139 $fb^{-1}$.

Cutflow for nonresonant di-Higgs ggF signal sample, yields are normalized to 139 $fb^{-1}$.

Cutflow for nonresonant di-Higgs ggF signal sample, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 300 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 300 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 300 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 300 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 500 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 500 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 500 GeV, yields are normalized to 139 $fb^{-1}$.

Cutflow for resonant signal sample, with $m_{X}$ = 500 GeV, yields are normalized to 139 $fb^{-1}$.

Comparison of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Comparison of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Comparison of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Comparison of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Fit results of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Fit results of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Fit results of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

Fit results of $m_{b\bar{b}}$ distributions when applying the specific b-jet energy calibration and the nominal jet energy calibration. The distributions are fitted using a Bukin function, and the values of the peak position, resolution and the relative improvement are reported in the legend.

The relative amount (purity) of expected events from SM $HH$ and single Higgs boson production processes for each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b).

The relative amount (purity) of expected events from SM $HH$ and single Higgs boson production processes for each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b).

The relative amount (purity) of expected events from SM $HH$ and single Higgs boson production processes for each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b).

The relative amount (purity) of expected events from SM $HH$ and single Higgs boson production processes for each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b).

The expected significance in each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b). The single Higgs boson processes and the di-photon continuum spectrum are considered as background.

The expected significance in each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b). The single Higgs boson processes and the di-photon continuum spectrum are considered as background.

The expected significance in each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b). The single Higgs boson processes and the di-photon continuum spectrum are considered as background.

The expected significance in each of the four categories of the nonresonant search. The Higgs boson pair production with $k_{\lambda} = 1$ is considered as signal in (a), while the case with $k_{\lambda} = 10$ is considered as signal in (b). The single Higgs boson processes and the di-photon continuum spectrum are considered as background.

Spurious signal result for the exponential pdf for the various ggF nonresonant di-Higgs categories. In each category, the spurious signal value ($n_{sp}$) and its ratio to the expected statistical error ($Z_{spur}$) from data are shown.

Spurious signal result for the exponential pdf for the various ggF nonresonant di-Higgs categories. In each category, the spurious signal value ($n_{sp}$) and its ratio to the expected statistical error ($Z_{spur}$) from data are shown.

Spurious signal result for the exponential pdf for the various ggF nonresonant di-Higgs categories. In each category, the spurious signal value ($n_{sp}$) and its ratio to the expected statistical error ($Z_{spur}$) from data are shown.

Spurious signal result for the exponential pdf for the various ggF nonresonant di-Higgs categories. In each category, the spurious signal value ($n_{sp}$) and its ratio to the expected statistical error ($Z_{spur}$) from data are shown.

Spurious signal result for the exponential pdf as function of the resonant di-Higgs signal mass. The spurious signal value and its ratio to the expected statistical error from data are shown.

Spurious signal result for the exponential pdf as function of the resonant di-Higgs signal mass. The spurious signal value and its ratio to the expected statistical error from data are shown.

Spurious signal result for the exponential pdf as function of the resonant di-Higgs signal mass. The spurious signal value and its ratio to the expected statistical error from data are shown.

Spurious signal result for the exponential pdf as function of the resonant di-Higgs signal mass. The spurious signal value and its ratio to the expected statistical error from data are shown.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson ggF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson ggF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson ggF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson ggF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson VBF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson VBF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson VBF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Distributions of the signal efficiency as a function of $\kappa_{\lambda}$, for the di-Higgs boson VBF nonresonant production mode. The range of $\kappa_{\lambda}$ in the table is from -10 to 10.

Values of the negative log-profile-likelihood ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties on the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence level intervals. The best fit value corresponds to $\kappa_{\lambda}$ = $2.8^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval. The expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.5}_{-2.4}(^{+7.3}_{-4.2})$ for the 1$\sigma$(2$\sigma$) confidence interval. The dashed curves represent values of the negative log-profile-likelihood where the Higgs boson branching fractions and the cross section of the production modes are varied as a function of $\kappa_{\lambda}$. In this case,the best fit value corresponds to $\kappa_{\lambda}$ = $2.7^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ and the expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.4}_{-2.5}(^{+7.3}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval.

Values of the negative log-profile-likelihood ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties on the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence level intervals. The best fit value corresponds to $\kappa_{\lambda}$ = $2.8^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval. The expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.5}_{-2.4}(^{+7.3}_{-4.2})$ for the 1$\sigma$(2$\sigma$) confidence interval. The dashed curves represent values of the negative log-profile-likelihood where the Higgs boson branching fractions and the cross section of the production modes are varied as a function of $\kappa_{\lambda}$. In this case,the best fit value corresponds to $\kappa_{\lambda}$ = $2.7^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ and the expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.4}_{-2.5}(^{+7.3}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval.

Values of the negative log-profile-likelihood ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties on the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence level intervals. The best fit value corresponds to $\kappa_{\lambda}$ = $2.8^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval. The expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.5}_{-2.4}(^{+7.3}_{-4.2})$ for the 1$\sigma$(2$\sigma$) confidence interval. The dashed curves represent values of the negative log-profile-likelihood where the Higgs boson branching fractions and the cross section of the production modes are varied as a function of $\kappa_{\lambda}$. In this case,the best fit value corresponds to $\kappa_{\lambda}$ = $2.7^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ and the expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.4}_{-2.5}(^{+7.3}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval.

Values of the negative log-profile-likelihood ($-2ln\Lambda$) as a function of $\kappa_{\lambda}$ evaluated for the combination of all the categories of the nonresonant search. The coupling of the Higgs boson to fermions and gauge bosons is set to SM values in the profile likelihood calculation. The Asimov data set is generated under the SM signal-plus-background hypothesis, $\kappa_{\lambda}$= 1. All systematic uncertainties, including the theoretical uncertainties on the di-Higgs boson production cross section, are included. The intersections of the solid curves and the horizontal dashed lines indicate the 1$\sigma$ and 2$\sigma$ confidence level intervals. The best fit value corresponds to $\kappa_{\lambda}$ = $2.8^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval. The expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.5}_{-2.4}(^{+7.3}_{-4.2})$ for the 1$\sigma$(2$\sigma$) confidence interval. The dashed curves represent values of the negative log-profile-likelihood where the Higgs boson branching fractions and the cross section of the production modes are varied as a function of $\kappa_{\lambda}$. In this case,the best fit value corresponds to $\kappa_{\lambda}$ = $2.7^{+2.0}_{-2.2}(^{+3.8}_{-4.3})$ and the expected value corresponds to $\kappa_{\lambda}$ = $1.0^{+5.4}_{-2.5}(^{+7.3}_{-4.3})$ for the 1$\sigma$(2$\sigma$) confidence interval.

Minimum BDT value of the events passing the selection criteria of the resonant search. The combined BDT score is formed using as coefficients $C_{1}$ = 0.65 and $C_{2}$ = 1 − $C_{1}$. The selection efficiency for the resonant $X \rightarrow HH$ signal is also shown.

Minimum BDT value of the events passing the selection criteria of the resonant search. The combined BDT score is formed using as coefficients $C_{1}$ = 0.65 and $C_{2}$ = 1 − $C_{1}$. The selection efficiency for the resonant $X \rightarrow HH$ signal is also shown.

Minimum BDT value of the events passing the selection criteria of the resonant search. The combined BDT score is formed using as coefficients $C_{1}$ = 0.65 and $C_{2}$ = 1 − $C_{1}$. The selection efficiency for the resonant $X \rightarrow HH$ signal is also shown.

Minimum BDT value of the events passing the selection criteria of the resonant search. The combined BDT score is formed using as coefficients $C_{1}$ = 0.65 and $C_{2}$ = 1 − $C_{1}$. The selection efficiency for the resonant $X \rightarrow HH$ signal is also shown.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Measured diferential cross sections as a function of the transverse momentum of the lepton from the W decay.

Measured diferential cross sections ratio $R=\sigma(W^+ + \overline{c}) / \sigma(W^- + c)$ as a function of the absolute value of the pseudorapidity of the lepton from the W decay.

Measured diferential cross sections ratio $R=\sigma(W^+ + \overline{c}) / \sigma(W^- + c)$ as a function of the transverse momentum of the lepton from the W decay.