Post-fit distributions of $M_{\ell v jj}$ in the $R2B_A$ subregion for electrons. All process yields and nuisance parameters are set to the values obtained from the background plus signal fit. The signal considered for the fit corresponds to the purely right-handed production of a W' with $m_{W'}$ of 3.6 TeV and a relative width of 1$\%$ of the $m_{W'}$, and is represented by the solid red line. The lower panels show the data minus the expected number of events, normalized to the statistical uncertainty of the data. The orange band represents the systematic uncertainties, also normalized to the statistical uncertainty of the data.

Post-fit distributions of $M_{\ell v jj}$ in the $RW'_A$ subregion for muons. All process yields and nuisance parameters are set to the values obtained from the background plus signal fit. The signal considered for the fit corresponds to the purely right-handed production of a W' with $m_{W'}$ of 3.6 TeV and a relative width of 1$\%$ of the $m_{W'}$, and is represented by the solid red line. The lower panels show the data minus the expected number of events, normalized to the statistical uncertainty of the data. The orange band represents the systematic uncertainties, also normalized to the statistical uncertainty of the data.

Post-fit distributions of $M_{\ell v jj}$ in the $RW'_A$ subregion for electrons. All process yields and nuisance parameters are set to the values obtained from the background plus signal fit. The signal considered for the fit corresponds to the purely right-handed production of a W' with $m_{W'}$ of 3.6 TeV and a relative width of 1$\%$ of the $m_{W'}$, and is represented by the solid red line. The lower panels show the data minus the expected number of events, normalized to the statistical uncertainty of the data. The orange band represents the systematic uncertainties, also normalized to the statistical uncertainty of the data.

Post-fit distributions of $M_{\ell v jj}$ in the $RT_A$ subregion for muons. All process yields and nuisance parameters are set to the values obtained from the background plus signal fit. The signal considered for the fit corresponds to the purely right-handed production of a W' with $m_{W'}$ of 3.6 TeV and a relative width of 1$\%$ of the $m_{W'}$, and is represented by the solid red line. The lower panels show the data minus the expected number of events, normalized to the statistical uncertainty of the data. The orange band represents the systematic uncertainties, also normalized to the statistical uncertainty of the data.

Post-fit distributions of $M_{\ell v jj}$ in the $RT_A$ subregion for electrons. All process yields and nuisance parameters are set to the values obtained from the background plus signal fit. The signal considered for the fit corresponds to the purely right-handed production of a W' with $m_{W'}$ of 3.6 TeV and a relative width of 1$\%$ of the $m_{W'}$, and is represented by the solid red line. The lower panels show the data minus the expected number of events, normalized to the statistical uncertainty of the data. The orange band represents the systematic uncertainties, also normalized to the statistical uncertainty of the data.

The VLL-L BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

Observed and expected upper limits at 95%% CL on the production cross section for the type-III seesaw fermions in the flavor-democratic scenario using the table schemes and the BDT regions of the SS-M and the SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDTs. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95%% CL on the production cross section for the type-III seesaw fermions in the flavor-democratic scenario using the table schemes and the BDT regions of the SS-M and the SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDTs. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95%% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: doublet model. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95%% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: doublet model. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\tau}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\tau}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{e}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{e}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\mu}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\mu}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: singlet model. The limit is shown from the advanced $\mathrm{S_{T}}$ table for all masses.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: singlet model. The limit is shown from the advanced $\mathrm{S_{T}}$ table for all masses.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Advanced $\mathrm{S_{T}}$ table.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the doublet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the doublet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the singlet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the singlet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=B_{\mu}=B_{\tau})}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=B_{\mu}=B_{\tau})}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{\mu}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{\mu}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Limits on anomalous magnetic moment of the tau lepton

Covariance matrix for the total uncertainty (i.e. fit including stat., not extrapolation) for the measurement of the absolute differential cross section as a function of the rho observable at parton level.

Covariance matrix for the statistical uncertainty for the measurement of the absolute differential cross section as a function of the rho observable at parton level.

Covariance matrix for the statistical uncertainty for the measurement of the absolute differential cross section as a function of the rho observable at parton level.

Covariance matrix for the extrapolation uncertainty for the measurement of the absolute differential cross section as a function of the rho observable at parton level.

Covariance matrix for the extrapolation uncertainty for the measurement of the absolute differential cross section as a function of the rho observable at parton level.

Normalized differential cross section as a function of the rho observable at parton level.

Normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the total uncertainty for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the total uncertainty (i.e. fit including stat., not extrapolation) for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the statistical uncertainty for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the statistical uncertainty for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the extrapolation uncertainty for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Covariance matrix for the extrapolation uncertainty for the measurement of the normalized differential cross section as a function of the rho observable at parton level.

Correlation matrix for all nuisance parameters and parameters of interest of the Likelihood fit.

Correlation matrix for all nuisance parameters and parameters of interest of the Likelihood fit.

This table is a numerical representation of Fig. 8 for all nuisance parameters.

This table is a numerical representation of Fig. 8 for all nuisance parameters.

The measured branching fraction ratios

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

The measured branching fractions

The measured branching fractions

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the $\text{t}\bar{\text{t}}$ CR. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the low-MET bin for the WZ-enriched region. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the WZ-enriched region. Uncertainties include both the statistical and systematic components.

The post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin for the SS CR. Uncertainties include both the statistical and systematic components.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the med-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Ewk SR: the post-fit distribution of the $M(\ell\ell)$ variable is shown for the ultra-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 3$\ell$-Ewk search regions: the post-fit distribution of the $M^{\text{min}}_{\text{SFOS}}(\ell\ell)$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 3$\ell$-Ewk search regions: the post-fit distribution of the $M^{\text{min}}_{\text{SFOS}}(\ell\ell)$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the TChiWZ and the simplified higgsino models in the scenario where the product of $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ eigenvalues is positive and negative, respectively. The numbers after the model name in the legend indicate the mass of the NLSP and the mass splitting between the NLSP and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the low-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the med-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the high-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The 2$\ell$-Stop SR: the post-fit distribution of the leading lepton $p_{T}$ variable is shown for the ultra-MET bin. Uncertainties include both the statistical and systematic components. The signal distributions overlaid on the plot are from the T2bff$\tilde{\chi}^0_1$ and the T2bW models. The numbers after the model name in the legend indicate the mass of the top squark and the mass splitting between the top squark and LSP, in GeV.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the TChiWZ model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. Results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2} \widetilde{m}_{\tilde{\chi}^0_1} > 0$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the TChiWZ model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. Results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2} \widetilde{m}_{\tilde{\chi}^0_1} < 0$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the simplified higgsino model. The simplified model includes both neutralino pair and neutralino-chargino production modes. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the pMSSM higgsino model. The pMSSM one includes all possible production modes. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The results are reported for the $\widetilde{m}_{\tilde{\chi}^0_2}\widetilde{m}_{\tilde{\chi}^0_1}$ $M(\ell\ell)$ spectrum reweighting scenario. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the T2bff$\tilde{\chi}^0_1$ simplified model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed 95% CL exclusion contours (black curves) assuming the NLO+NLL cross sections, with the variations (thin lines) corresponding to the uncertainty in the cross section for the T2bW simplified model. The red curves present the 95% CL expected limits with the band (thin lines) covering 68% of the limits in the absence of signal. The range of luminosities of the analysis regions included in the fit is indicated on the plot.

The observed and expected (in parentheses) 95% CL lower mass limits on RPV SUSY, Z′ ($\mathcal{B}=0.1$) , and QBH signals for the e$\mu$, e$\tau$, and $\mu\tau$ channels.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\mu$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the $\mu\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Exclusion limits on the product of the production cross section and the branching fraction for a Radion produced by vector boson fusion and decaying to WW, as a function of the resonance mass hypothesis.

Exclusion limits on the product of the production cross section and the branching fraction for a Z' produced by quark annihilation and decaying to WW, as a function of the resonance mass hypothesis.

Exclusion limits on the product of the production cross section and the branching fraction for a Z' produced by vector boson fusion and decaying to WW, as a function of the resonance mass hypothesis.

Exclusion limits on the product of the production cross section and the branching fraction for a W' produced by quark annihilation and decaying to WZ, as a function of the resonance mass hypothesis.

Exclusion limits on the product of the production cross section and the branching fraction for a W' produced by vector boson fusion and decaying to WZ, as a function of the resonance mass hypothesis.

Exclusion limits on the product of the production cross section and the branching fraction for a W' produced by quark annihilation and decaying to WH, as a function of the resonance mass hypothesis.