Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Distribution of an input to the BDT classifier in the $3\ell$ category: The linear discrimminant $p_{T}^{miss,LD}$. The discriminant is defined by the relation $p_{T}^{miss,LD} = 0.6 p_{T}^{miss} + 0.4 H_{T}^{miss}$, where $H_{T}^{miss}$ corresponds to the magnitude of the vector $p_{T}$ sum of all electrons, muons, taus and small radius jets passing the selection critertia, and $p_{T}^{miss}$ represents the missing transverse momentum vector computed as the negative vector $p_{T}$ sum of all the particles reconstructed by the PF algorithm in the event.

Distributions of the transverse mass $m_{T}$ of the lepton that is not originating from the Z boson decay and the missing transverse momentum in the $3\ell$/WZ control region. The distributions expected for the WZ and ZZ as well as for other background processes are shown for the values of nuisance parameters obtained from the ML fit used in the signal extraction.

Distributions of the four lepton invariant mass $m_{4\ell}$ in the $4\ell$/ZZ control region. The distributions expected for the ZZ as well as for other background processes are shown for the values of nuisance parameters obtained from the ML fit used in the signal extraction.

Distributions of the transverse mass $m_{T}$ of the leading lepton and the missing transverse momentum in the $2\ell$(ss) control region. The distributions expected for the misidentified $\ell$ background as well as for other background processes is shown for the values of nuisance parameters obtained from the background-only ML fit, in which the HH signal is constrained to be zero.

Distributions of the reconstructed HH mass $m_{HH}$ in the $2\ell+2 au_{h}$ control region. The distributions expected for the misidentified $\ell/ au_{h}$ background as well as for other background processes is shown for the values of nuisance parameters obtained from the background-only ML fit, in which the HH signal is constrained to be zero.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $2\ell$(ss) category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate signal quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $3\ell$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate signal quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $4\ell$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate signal quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $3\ell+1 au_{h}$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate background quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $2\ell+2 au_{h}$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate background quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $1\ell+3 au_{h}$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate background quantiles.

Distribution in the output of the BDT trained for nonresonant HH production and evaluated for the benchmark scenario JHEP04 BM7 for the $4 au_{h}$ category. The SM HH signal is shown for a cross section amounting to $30$ times the value predicted in the SM. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate background quantiles.

Observed and expected $95\%$ CL upper limits on the SM HH production cross section, obtained for both individual search categories and from a simultaneous fit of all seven categories combined.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the Higgs boson self-coupling strength modifier $\kappa_\lambda$ for the combination of all seven categories. All Higgs boson couplings other than $\lambda$ are assumed to have the values predicted in the SM.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the Higgs boson self-coupling strength modifier $\kappa_\lambda$ for the seven different categories as well as their combination. All Higgs boson couplings other than $\lambda$ are assumed to have the values predicted in the SM.

Observed and expected $95\%$ CL upper limits on the HH production cross section for the twelve benchmark scenarios from doi:10.1007/JHEP04(2016)126, the additional benchmark scenario 8a from doi:10.1007/JHEP09(2018)057, the seven benchmark scenarios from doi:10.1007/JHEP03(2020)091, and for the SM.

Observed and expected $95\%$ CL upper limits on the HH production cross section for the twelve benchmark scenarios from doi:10.1007/JHEP04(2016)126, the additional benchmark scenario 8a from doi:10.1007/JHEP09(2018)057, the seven benchmark scenarios from doi:10.1007/JHEP03(2020)091, and for the SM. The limits are shown for all seven search categories as well as for their combination.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the effective coupling $c_{2}$ for the combination of all seven categories. All Higgs boson couplings other than $c_{2}$ are assumed to have the values predicted in the SM.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the effective coupling $c_{2}$ and the top Yukawa coupling modifier $\kappa_{t}$ for the combination of all seven categories. All Higgs boson couplings other than $c_{2}$ and $\kappa_{t}$ are assumed to have the values predicted in the SM. The position of the SM in the ($c_{2}-\kappa_{t}$) plane, as well as the best fit value of $(c_{2},\kappa_{t})=(1.05, 1.74)$ together with contours for the theory cross section are shown as well.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the Higgs boson self-coupling modifier $\kappa_{\lambda}$ and the top Yukawa coupling modifier $\kappa_{t}$ for the combination of all seven categories. All Higgs boson couplings other than $\kappa_{\lambda}$ and $\kappa_{t}$ are assumed to have the values predicted in the SM. The position of the SM in the ($\kappa_{\lambda}-\kappa_{t}$) plane, as well as the best fit value of $(\kappa_{\lambda},\kappa_{t})=(-3.54, -1.70)$ together with contours for the theory cross section are shown as well.

Observed and expected $95\%$ CL upper limits on the HH production cross section as a function of the effective coupling $c_{2}$ and the Higgs boson self-coupling modifier $\kappa_{\lambda}$ for the combination of all seven categories. All Higgs boson couplings other than $c_{2}$ and $\kappa_{\lambda}$ are assumed to have the values predicted in the SM. The position of the SM in the ($c_{2}-\kappa_{\lambda}$) plane, as well as the best fit value of $(c_{2},\kappa_{\lambda})=(-0.66, 5.33)$ together with contours for the theory cross section are shown as well.

Observed and expected $95\%$ CL upper limits on the production of new particles X of spin $0$ and mass $m_{X}$ in the range $250$-$1000$ GeV, which decay to Higgs boson pairs.

Observed and expected $95\%$ CL upper limits on the production of new particles X of spin $0$ and mass $m_{X}$ in the range $250$-$1000$ GeV, which decay to Higgs boson pairs. The Limit is shown for the seven different search categories as well as their combination.

Observed and expected $95\%$ CL upper limits on the production of new particles X of spin $2$ and mass $m_{X}$ in the range $250$-$1000$ GeV, which decay to Higgs boson pairs.

Observed and expected $95\%$ CL upper limits on the production of new particles X of spin $2$ and mass $m_{X}$ in the range $250$-$1000$ GeV, which decay to Higgs boson pairs. The Limit is shown for the seven different search categories as well as their combination.

Distribution in the output of the BDT trained for resonances of spin 2 and mass $750\,$GeV production for the $2\ell$(ss) category. The resonant HH signal is shown for a cross section amounting to $1\,$pb. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate signal quantiles.

Distribution in the output of the BDT trained for resonances of spin 2 and mass $750\,$GeV production for the $3\ell$ category. The resonant HH signal is shown for a cross section amounting to $1\,$pb. The distributions expected for the background processes are shown for the values of nuisance parameters obtained from the ML fit of the signal+background hypothesis to the data. The binning is chosen to approximate signal quantiles.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{\mathrm{jjj}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of $m_{\mathrm{j}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of the deep-WH value of the highest-mass jet with 60 < $m_{\mathrm{j}}$ < 100 GeV for preselected events with $\mathrm{N}_{j}$ = 3

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (LL) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (LH) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (HL) bin, as functions of the deep-WH discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (HH) bin, as functions of the deep-WH discriminant value.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LL samples.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LH samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HL samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HH samples.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR1, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR2, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR3, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR45, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR6, after the scale factors have been applied.

The $m_{\mathrm{j}^{\mathrm{max}}}$ distributions for different jet types for SR1–3 events of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV$ without deep-W (WH) constraints.

The deep-W distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The deep-WH distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The $m_{\mathrm{jj}}$ distribution for CR1 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR2 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR3 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR45 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR6 for data and simulation.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR4.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR6.

Observed upper limits at $95\%$ CL on the signal cross section $\times$ branching fraction as functions of the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ resonance masses.

Expected median lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Observed and predicted mTtot distribution in the b-tag category of the 2tau_h channel. Despite listing this as an exclusive final state (as there must be at least one b-jets), there is no explicit selection on the presence of additional light-flavour jets. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The combined prediction for A and H bosons with masses of 300, 500 and 800 GeV and $\tan\beta$ = 10 in the hMSSM scenario are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 1l1tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. In the paper, the first bin is cut off at 60 GeV for aesthetics but contains underflows down to 50 GeV as in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and predicted mTtot distribution for the b-inclusive selection in the 2tau_h channel. Please note that the bin content is divided by the bin width in the paper figure, but not in the HepData table. The last bin includes overflows. The prediction for a SSM Zprime with masses of 1500, 2000 and 2500 GeV are also provided.

Observed and expected 95% CL upper limits on the b-associated Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Observed and expected 95% CL upper limits on the Drell Yan production cross section times ditau branching fraction as a function of the Zprime boson mass.

Observed and expected 95% CL upper limits on the Higgs boson production cross section times ditau branching fraction as a function of the boson mass and the relative strength of the b-associated production.

Ratio of the 95% CL upper limits on the production cross section times branching fraction for alternate Zprime models with respect to the SSM, both observed and expected are shown.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by gluon-gluon fusion as a function of the scalar boson mass.

Acceptance, acceptance times efficiency and b-tag category fraction for a scalar boson produced by b-associated production as a function of the scalar boson mass.

Acceptance and acceptance times efficiency for a heavy gauge boson produced by Drell Yan as a function of the gauge boson mass.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Two dimensional likelihood scan of the gluon-gluon fusion cross section times braching fraction, $\sigma(gg\phi)\times B(\phi\to\tau\tau)$, vs the b-associated production times branching fraction, $\sigma(bb\phi)\times B(\phi\to\tau\tau)$ for the Higgs boson mass ($m_\phi$) indicated in the table. For each mass, 10000 points are scanned. At each point $\Delta(\mathrm{NLL})$ is calculated, defined as the negative-log-likelihood (NLL) of the conditional fit with $\sigma(gg\phi)$ and $\sigma(bb\phi)$ fixed to their values at the point and with the minimum NLL value at any point subtracted. Vaules are provided for the fit to the observed data and to the expected data, which is the sum of Standard Model contributions not including the SM Higgs boson. The best-fit point and the preferred 68% and 95% boundaries are found at $2\Delta(\mathrm{NLL})$ values of 0.0, 2.30 and 5.90, respectively.

Observed and expected 95% CL upper limits on the gluon-gluon fusion Higgs boson production cross section times ditau branching fraction as a function of the boson mass.

Data (bold boxes) and background estimates (colour fill) for m_beta vs. m_betagamma for the gluino R-hadron search (1000 GeV). The blue thin-line boxes illustrate the expected signal (on top of background) for the given R-hadron mass hypothesis. The black dashed vertical/horizontal lines at 500 GeV show the mass selection (signal region in the top-right). Two events pass this selection.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of bottom-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of top-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Final selection requirements as a function of the simulated R-hadron mass.

Summary of all studied systematic uncertainties. Ranges indicate a dependency on the R-hadron mass hypothesis (from low to high masses).

Expected signal yield (Nsig) and efficiency (eff.), estimated background (Nbkg) and observed number of events in data (Nobs) for the full mass range after the final selection using 3.2/fb of data. The stated uncertainties include both the statistical and systematic contribution.

Distribution of the truth-level beta for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Distribution of the truth-level betagamma for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 50 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 30 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 10 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Object-quality selection cut-flow with observed data and exemplary expected events (scaled to 3.2/fb for MC) in the gluino R-hadron search.

Object-quality selection cut-flow with observed data and exemplary expected events (scaled to 3.2/fb for MC) in the squark R-hadron search.

Expected signal yield (Nsig) and efficiency (eff.), estimated background (Nbkg) and observed number of events in data (Nobs) for the full mass range in the meta-stable gluino R-hadron search using 3.2/fb of data. The stated uncertainties include both the statistical and systematic contribution.