The p--$\Omega^{-}$ $\oplus$ $\overline{\mathrm{p}}$--$\overline{\Omega}^{+}$ correlation function.

Predicted and observed yields as a function of $m_{4\ell}$ in the VBS-Suppressed region. Overflow events are included in the last bin of the distribution.

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{jj}

Relative systematic uncertainties in the unfolded differential cross section for 4ljj production in the VBS-Enhanced region as a function of m_{4\ell}

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $m_{4\ell}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $ p_{T,4l}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $\Delta\phi_{jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $|\Delta y_{jj}|$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{12})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $cos(\theta^{*}_{34})$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,jj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $p_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Enhanced region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Differential cross-sections for inclusive 4ljj production in the VBS-Suppressed region as a function of $S_{T,4ljj}$. Overflow events are included in the last bin of the distribution.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Enhanced region.

Statistical correlation between different bins of the unfolded cross-section for all the measured observables in the VBS-Suppressed region.

The second-order Fourier coefficients, $V_{3\Delta}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles, after correcting for back-to-back jet correlations, estimated from the 10 $\leq$ $N_{offline}^{trk}$ < 20 range.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The triangular flow after correcting for back-to-back jet correlations, $v_{3}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow, $v_{2}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $K^{0}_{S}$.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $p_{T}$ for $\Lambda/\bar{\Lambda}$.

The elliptic flow per constituent quark after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)/n_{q}$, as a function of transverse kinetic energy per constituent quark $KE_{T}/n_{q}$ for $K^{0}_{S}$.

The elliptic flow per constituent quark after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of transverse kinetic energy per constituent quark $KE_{T}/n_{q}$ for $\Lambda/\bar{\Lambda}$.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The four-particle cumulant, $c_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The six-particle cumulant, $c_{2}(6)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow after correcting for back-to-back jet correlations, $v_{2}^{sub}(2, |\Delta\eta| > 2)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(4)$, as a function of $N_{offline}^{trk}$ for charged particles.

The elliptic flow, $v_{2}(6)$, as a function of $N_{offline}^{trk}$ for charged particles.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 14.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 15.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 16.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 17.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 18.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 19.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 20.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 1.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 2.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 3.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 4.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 5.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 6.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 7.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 8.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 9.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 10.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M7 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient. The limits on M7 were obtained without taking into account the SM-EFT interference for the EW W$^\pm$Zjj final state.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S02 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T2 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Expected and observed exclusion limits at 95% CL for $\sigma_{\mathrm{VBF}}(\mathrm{H}^{\pm\pm}_5) \times \mathcal{B}(\mathrm{H}^{\pm\pm}_5 \rightarrow W^{\pm}W^{\pm})$ as a function of the doubly-charged Higgs mass.

Expected and observed exclusion limits at 95% CL for $\sin\theta_{\mathrm{H}}$ as a function of the doubly-charged Higgs mass in the Georgi-Machacek model.

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 105. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 110. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 pPb data at $\sqrt{s} =$ 5.02 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 PbPb data at $\sqrt{s} =$ 2.76 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{jets}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{jets}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|\cos\theta^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\cos\theta^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\cos\theta^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\cos\theta^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{\gamma\gamma}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{\gamma\gamma}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{\gamma\gamma}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{\gamma\gamma}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{1}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{1}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{1}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{1}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta y_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\Delta\phi_{\gamma\gamma,j_{1}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{2}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $\left|y^{j_{2}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{2}}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|y^{j_{2}}\right|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$

Correlation between the measured fiducial cross sections in the different bins of $|\bar{\eta}_{j_{1},j_{2}}-\eta_{\gamma\gamma}|$

Differential fiducial higgs to diphoton cross section with respect to $m_{\mathrm{jj}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $m_{\mathrm{jj}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $m_{\mathrm{jj}}$

Correlation between the measured fiducial cross sections in the different bins of $m_{\mathrm{jj}}$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\eta_{j_{1},j_{2}}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\eta_{j_{1},j_{2}}|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\eta_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\eta_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{leptons}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{leptons}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{leptons}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{leptons}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{b-jets}}$

Differential fiducial higgs to diphoton cross section with respect to $n_{\mathrm{b-jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{b-jets}}$

Correlation between the measured fiducial cross sections in the different bins of $n_{\mathrm{b-jets}}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\mathrm{miss}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\mathrm{miss}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\mathrm{miss}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\mathrm{miss}}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{j_{2}}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{j_{2}}$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$ in the VBF enriched PS

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$ in the VBF enriched PS

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{\gamma\gamma,j_{1}j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$ in the VBF enriched PS

Differential fiducial higgs to diphoton cross section with respect to $|\Delta\phi_{j_{1},j_{2}}|$ in the VBF enriched PS

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Correlation between the measured fiducial cross sections in the different bins of $|\Delta\phi_{j_{1},j_{2}}|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ in the VBF enriched PS. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$

Differential fiducial higgs to diphoton cross section with respect to $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\tau_{\mathrm{C}}^{j}$

Correlation between the measured fiducial cross sections in the different bins of $\tau_{\mathrm{C}}^{j}$

Differential fiducial higgs to diphoton cross section with respect to $\left|\phi_{\eta}^{\ast}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $\left|\phi_{\eta}^{\ast}\right|$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $\left|\phi_{\eta}^{\ast}\right|$

Correlation between the measured fiducial cross sections in the different bins of $\left|\phi_{\eta}^{\ast}\right|$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $\tau_{\mathrm{C}}^{j}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $\tau_{\mathrm{C}}^{j}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $\tau_{\mathrm{C}}^{j}$

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Differential fiducial higgs to diphoton cross section with respect to $p_{\mathrm{T}}^{\gamma\gamma}$ vs. $n_{\mathrm{jets}}$. The last bin in the differential observable extends to infinity and the measured fiducial cross section in this bin is devided by the given bin width

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $n_{\mathrm{jets}}$

Correlation between the measured fiducial cross sections in the different bins of $p_{\mathrm{T}}^{\gamma\gamma}$ and $n_{\mathrm{jets}}$

Cross sections measured in different regions of the fiducial phase space

Cross sections measured in different regions of the fiducial phase space