Parton inclusive-jet $p_T$ and $A_{LL}$ values with associated uncertainties for jet-$\eta$ region $0.5<|\eta|<1$.

Parton inclusive-jet $p_T$ and $A_{LL}$ values with associated uncertainties for jet-$\eta$ region $|\eta|<0.5$.

Parton dijet invariant mass $M_{inv}$ and $A_{LL}$ values with associated uncertainties for the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology.

Parton dijet invariant mass $M_{inv}$ and $A_{LL}$ values with associated uncertainties for the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology.

Parton inclusive-jet $p_T$, $x_T$, and $A_{LL}$ values with associated uncertainties for jet-$\eta$ region $|\eta|<1$.

The correlation matrix for the point-to-point uncertainties for inclusive jet measurements with jets in the $0.5<|\eta|<1$ region. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties for inclusive jet measurements with jets in the $|\eta|<0.5$ region. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties for inclusive jet measurements with jets in the $|\eta|<1$ region. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $|\eta|<0.5$ region and jets in the $0.5<|\eta|<1$ region. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $0.5<|\eta|<1$ region with dijet measurements with the the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $0.5<|\eta|<1$ region with dijet measurements with the the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $|\eta|<0.5$ region with dijet measurements with the the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $|\eta|<0.5$ region with dijet measurements with the the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $|\eta|<1$ region with dijet measurements with the the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling inclusive jet measurements with jets in the $|\eta|<1$ region with dijet measurements with the the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties for dijet measurements with the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties for dijet measurements with the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

The correlation matrix for the point-to-point uncertainties coupling dijet measurements with the $\textrm{sign}(\eta_1) \neq \textrm{sign}(\eta_2)$ topology and the $\textrm{sign}(\eta_1) = \textrm{sign}(\eta_2)$ topology. The $A_{LL}$ uncertainty contribution of $0.0007$ from uncertainty in the relative luminosity measurement and $6.1\%$ from the beam polarization uncertainty, which are common to all the data points, are separated from the listed values.

1$\tau$ MediumMass SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ multibin SR eff.

2$\tau$ multibin SR eff.

2$\tau$ GMSB SR eff.

2$\tau$ GMSB SR eff.

1$\tau$ Compressed SR eff.

1$\tau$ Compressed SR eff.

1$\tau$ MediumMass SR eff.

1$\tau$ MediumMass SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ Compressed SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ HighMass SR eff.

2$\tau$ multibin SR eff.

2$\tau$ multibin SR eff.

2$\tau$ GMSB SR eff.

2$\tau$ GMSB SR eff.

1$\tau$ Compressed SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ MediumMass SR acceptance.

1$\tau$ MediumMass SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ GMSB SR acceptance.

2$\tau$ GMSB SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ Compressed SR acceptance.

1$\tau$ MediumMass SR acceptance.

1$\tau$ MediumMass SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ Compressed SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ HighMass SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ multibin SR acceptance.

2$\tau$ GMSB SR acceptance.

2$\tau$ GMSB SR acceptance.

Cutflow table of the $1\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ medium-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $1\tau$ medium-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ compressed SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ high-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ high-mass SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ multibin SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ multibin SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ GMSB SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Cutflow table of the $2\tau$ GMSB SR for the four signal benchmark scenarios of low, medium, and high mass-splitting in the simplified model as well as the GMSB model.

Best performing fit setups entering the final combination as a function of the LSP mass and the gluino mass. 'S' marks the simultaneous fit of the four simplified model single-bin SRs, 'M' denotes the simultaneous fit of the two $1\tau$ SRs and the $2\tau$ multibin SR.

Best performing fit setups entering the final combination as a function of the LSP mass and the gluino mass. 'S' marks the simultaneous fit of the four simplified model single-bin SRs, 'M' denotes the simultaneous fit of the two $1\tau$ SRs and the $2\tau$ multibin SR.

Observed exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Observed exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Expected exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Expected exclusion contour at 95% CL as a function of tanBeta and the SUSY-breaking mass scale Lambda.

Observed exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Observed exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Expected exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Expected exclusion contour at 95% CL as a function of the LSP mass and the gluino mass.

Observed upper limits on the production cross section at 95% CL in pb as a function of tanBeta and SUSY breaking mass scale Lambda.

Observed upper limits on the production cross section at 95% CL in pb as a function of tanBeta and SUSY breaking mass scale Lambda.

Observed upper limits on the production cross section at 95% CL in pb as a function of the LSP mass and the gluino mass.

Observed upper limits on the production cross section at 95% CL in pb as a function of the LSP mass and the gluino mass.

Yields of the expected background from the SM in the bins of the multibin SR of the $2\tau$ channel with all bins being simultaneously used to constrain the background prediction. Expectation is given with the scalings computed in the combined fit applied. Uncertainties are statistial plus systematrics. Only the subsamples contributing the respective region are considered.

Yields of the expected background from the SM in the bins of the multibin SR of the $2\tau$ channel with all bins being simultaneously used to constrain the background prediction. Expectation is given with the scalings computed in the combined fit applied. Uncertainties are statistial plus systematrics. Only the subsamples contributing the respective region are considered.

$m_{\mathrm{T}}^{\tau}$ in the compressed $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the compressed $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the compressed $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the compressed $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the medium-mass $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the medium-mass $m_{\mathrm{T}}^{\tau}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the medium-mass $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$E_{\mathrm{T}}^{\mathrm{miss}}$ in the medium-mass $E_{\mathrm{T}}^{\mathrm{miss}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the medium-mass $H_{\mathrm{T}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the medium-mass $H_{\mathrm{T}}$ VR of the $1\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the top VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the top VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the $W$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$H_{\mathrm{T}}$ in the $W$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the $Z$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau_1}$ + $m_{\mathrm{T}}^{\tau_2}$ in the $Z$ VR of the $2\tau$ channel, illustrating the background modeling after the fit. The last bin includes overflow events.

$m_{\mathrm{T}}^{\tau}$ in the compressed SR of the $1\tau$ channel before application of the $m_{\mathrm{T}}^{\tau}$ > 80 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\tau}$ in the compressed SR of the $1\tau$ channel before application of the $m_{\mathrm{T}}^{\tau}$ > 80 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the medium-mass SR of the $1\tau$ channel before application of the $H_{\mathrm{T}}$ > 1000 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the medium-mass SR of the $1\tau$ channel before application of the $H_{\mathrm{T}}$ > 1000 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\mathrm{sum}}$ in the compressed SR of the $2\tau$ channel before application of the $m_{\mathrm{T}}^{\mathrm{sum}}$ > 1600 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$m_{\mathrm{T}}^{\mathrm{sum}}$ in the compressed SR of the $2\tau$ channel before application of the $m_{\mathrm{T}}^{\mathrm{sum}}$ > 1600 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the high-mass SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1100 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the high-mass SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1100 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

mT(tau_1) + mT(tau_2) in the multibin SR of the 2T channel. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

mT(tau_1) + mT(tau_2) in the multibin SR of the 2T channel. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the GMSB SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1900 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

$H_{\mathrm{T}}$ in the GMSB SR of the $2\tau$ channel before application of the $H_{\mathrm{T}}$ > 1900 GeV requirement. The last bin includes overflow events. Signal predictions corresponding to the simplified model scenarios of low (LM), medium (MM), and high mass-splitting (HM) as well as for the GMSB benchmark are given.

Acceptance x efficiency versus resonance mass for both lephad and hadhad channels in the RS bulk model with k/MPl = 1

Acceptance x efficiency versus resonance mass for both lephad and hadhad channels in the RS bulk model with k/MPl = 2

Acceptance x efficiency versus resonance mass for both lephad and hadhad channels in the scalar model

Upper limits on the production cross-section times the HH to bbtautau branching ratio for non-resonant HH at 95% CLS and their interpretation as multiples of the SM prediction

Upper limits on the production cross-section times the HH to bbtautau branching ratio divided by the SM prediction for non-resonant HH at 95% CL

Post-fit expected number of signal and background events and observed number of data events after applying the selection criteria and requiring exactly 2 b-tagged jets and assuming a background-only hypothesis

Post-fit expected number of signal and background events and observed number of data events in the last two bins of the non-resonant BDT score distribution of the SM signal after applying the selection criteria and requiring exactly 2 b-tagged jets and assuming a background-only hypothesis

Distributions of kinematic variables in the signal regions for the $2\ell$ channels after applying all selection requirements. The histograms show the post-fit background predictions. The last bin includes the overflow. The distribution for $R_{\textrm{ISR}}$ in SR$2\ell$_ISR is plotted. The expected distribution for a benchmark signal model, normalized to the NLO+NLL cross-section times integrated luminosity, is also shown for comparison.

Distributions of kinematic variables in the signal regions for the $3\ell$ channels after applying all selection requirements. The histograms show the post-fit background predictions. The last bin includes the overflow. The distribution for $H_{3,1}^{\textrm{PP}}$ in SR$3\ell$_Low is plotted. The expected distribution for a benchmark signal model, normalized to the NLO+NLL cross-section times integrated luminosity, is also shown for comparison.

Distributions of kinematic variables in the signal regions for the $3\ell$ channels after applying all selection requirements. The histograms show the post-fit background predictions. The last bin includes the overflow. The distribution of $p_{\textrm{T}}^{\ell_{1}}$ in SR$3\ell$_Low is plotted. The expected distribution for a benchmark signal model, normalized to the NLO+NLL cross-section times integrated luminosity, is also shown for comparison.

Distributions of kinematic variables in the signal regions for the $3\ell$ channels after applying all selection requirements. The histograms show the post-fit background predictions. The last bin includes the overflow. The distribution of $p_{\mathrm{T\ ISR}}^{~\textrm{CM}}$ in SR$3\ell$_ISR is plotted. The expected distribution for a benchmark signal model, normalized to the NLO+NLL cross-section times integrated luminosity, is also shown for comparison.

Distributions of kinematic variables in the signal regions for the $3\ell$ channels after applying all selection requirements. The histograms show the post-fit background predictions. The last bin includes the overflow. The distribution of $R_{\textrm{ISR}}$ in SR$3\ell$_ISR is plotted. The expected distribution for a benchmark signal model, normalized to the NLO+NLL cross-section times integrated luminosity, is also shown for comparison.

Expected exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the 2$\ell$ search, assuming 100\% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Observed exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the 2$\ell$ search, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Expected exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the the $3\ell$ search, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Observed exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the the $3\ell$ search, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Expected exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the statistical combination of the $2\ell$ and 3$\ell$ search channels, assuming 100\% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Observed exclusion limits at 95% CL on the masses of C1/N2 and N1 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the statistical combination of the $2\ell$ and 3$\ell$ search channels, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and LSP.

Signal region acceptance for chargino-neutralino production in SR2L_High. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR2L_High.

Signal region acceptanceXefficiency for chargino-neutralino production in SR2L_High.

Signal region acceptance for chargino-neutralino production in SR2L_Int. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR2L_Int.

Signal region acceptanceXefficiency for chargino-neutralino production in SR2L_Int.

Signal region acceptance for chargino-neutralino production in SR2L_Low. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR2L_Low.

Signal region acceptanceXefficiency for chargino-neutralino production in SR2L_Low.

Signal region acceptance for chargino-neutralino production in SR2L_ISR. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR2L_ISR.

Signal region acceptanceXefficiency for chargino-neutralino production in SR2L_ISR.

Signal region acceptance for chargino-neutralino production in SR3L_High. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR3L_High.

Signal region acceptanceXefficiency for chargino-neutralino production in SR3L_High.

Signal region acceptance for chargino-neutralino production in SR3L_Int. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR3L_Int.

Signal region acceptanceXefficiency for chargino-neutralino production in SR3L_Int.

Signal region acceptance for chargino-neutralino production in SR3L_Low. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR3L_Low.

Signal region acceptanceXefficiency for chargino-neutralino production in SR3L_Low.

Signal region acceptance for chargino-neutralino production in SR3L_ISR. The acceptance is with respect to all possible $W/Z$ decays.

Signal region efficiency for chargino-neutralino production in SR3L_ISR.

Signal region acceptanceXefficiency for chargino-neutralino production in SR3L_ISR.

Observed 95% CL upper limit on the production cross-section of C1/N2 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the 2$\ell$ search, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and N1.

Observed 95% CL upper limit on the production cross-section of C1/N2 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the 3$\ell$ search, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and N1.

Observed 95% CL upper limit on the production cross-section of C1/N2 from the analysis of 36.1fb$^{-1}$ of 13 TeV $pp$ collision data obtained from the statistical combination of 2 and 3$\ell$ searches, assuming 100% branching ratio of the sparticles to decay to SM $W/Z$ bosons and N1.

Signal cutflow for SR2L_High and m[C1/N2,N1] = [500,0] GeV. 5000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR2L_Int and m[C1/N2,N1] = [400,200] GeV. 10000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR2L_Low and m[C1/N2,N1] = [200,100] GeV. 20000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR2L_ISR and m[C1/N2,N1] = [200,100] GeV. 20000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR3L_High and m[C1/N2,N1] = [500,0] GeV. 5000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR3L_Int and m[C1/N2,N1] = [400,200] GeV. 10000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR3L_Low and m[C1/N2,N1] = [200,100] GeV. 20000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Signal cutflow for SR3L_ISR and m[C1/N2,N1] = [200,100] GeV. 20000 events were generated for this point. The unweighted number of events correspond to the number of selected MC events in the produced sample, while the weighted yield is normalized to the luminosity of the data.

Dijet mass spectra after the background only fit with the background prediction in the high-mass region with two b-tags.

Dijet mass spectra after the background only fit with the background prediction in the low-mass region with two b-tags.

The online b-tagging efficiency with respect to the offline b-tagging efficiency as a function of pT. The b-tagging online and offline working points correspond to an efficiency of 60% and 70%, respectively.

Observed and expected 95% credibility-level upper limits on the cross-section for the b* model in the high-mass region with inclusive b-jet selection.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for the SSM and leptophobic Z' models in the low- and high-mass region with two b-tags selection.

Observed and expected 95% credibility-level upper limits on the cross-section for DM Z' models in the low-mass region with two b-tags selection. The Z' is expected to decay to all five quark flavors other than the top quark and the mediator to SM quark coupling (gSM) equal to 0.1 is assumed.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for DM Z'->bb models in the high-mass region with two b-tags selection. The Z' is expected to decay to bb only and the mediator to SM quark coupling (gSM) equal to 0.25 is assumed.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the high-mass inclusive one b-tag selection.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the combined low- and high-mass two b-tags selection.

The mass distributions for the inclusive one b-tagged selection and two b-tagged selection using an integrated luminosity of 36.1 $fb^{-1}$. The inclusive one b-tagged Pythia8 MC distribution is normalized to the inclusive one b-tagged data. The two b-tagged Pythia8 MC distribution is normalized to the two b-tagged data. The systematic uncertainty band is dominated by the b-tagging scale factor and the b-jet energy scale.

Signal acceptance times efficiency for inclusive 1 b-tag and 2 b-tag categories as a function of the simulated b* and the Z' masses.

Signal acceptance times efficiency for 2 b-tag categories as a function of the simulated Z' masses.

The flavor composition of the simulated dijet background as a function of dijet mass before tagging. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with inclusive one b-tag. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with two b-tags. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

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Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Distributions of ETmiss for data and the expected SM backgrounds in the 2l+jets channel for SR2-int/high, without the final ETmiss requirement applied. Two signal points are added for comparison.

Distributions of ETmiss for data and the expected SM backgrounds in the 2l+jets channel for SR2-low, without the final ETmiss requirement applied. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-slep-a. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-slep-b. Two signal points are added for comparison.

Distributions of the third leading lepton pT in SR3-slep-c,d,e. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-0Ja,b,c. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Ja. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Jb. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Jc. Two signal points are added for comparison.

Expected 95% CL exclusion limit for chargino-pair production.

Observed 95% CL exclusion limit for chargino-pair production.

Expected 95% CL exclusion limit for direct slepton production.

Observed 95% CL exclusion limit for direct slepton production.

Expected 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 111 < mll < 150 GeV (corresponding to SR2-SF-a,b,c,d). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 150 < mll < 200 GeV (corresponding to SR2-SF-e,f,g,h). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 200 < mll < 300 GeV (corresponding to SR2-SF-i,j,k,l). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions mll > 300 GeV (corresponding to SR2-SF-m). Two signal points are added for comparison.

Signal acceptance for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$ .

Signal efficiency for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal regions contributing to the observed exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 3l channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for left-handed slepton production.

Observed 95% CL exclusion limit for left-handed slepton production.

Expected 95% CL exclusion limit for right-handed slepton production.

Observed 95% CL exclusion limit for right-handed slepton production.

95% upper limit on production cross-section for chargino-pair production.

95% upper limit on production cross-section for direct slepton production.

95% upper limit on production cross-section for chargino-neutralino production with slepton-mediated decays.

95% upper limit on production cross-section for chargino-neutralino production with W/Z-mediated decays

<b>Cutflow 1</b> Event counts for a signal point in SR2-SF-loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

<b>Cutflow 2</b> Event counts for a signal point in SR2-SF-loose and SR2-DF-100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

<b>Cutflow 3</b> Event counts for two signal points in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

<b>Cutflow 4</b> Event counts for two signal points in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

<b>Cutflow 5</b> Event counts for two signal points in SR3-WZ-0Ja/b/c and SR3-WZ-1Ja/b/c for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

<b>Cutflow 6</b> Event counts for two signal points in SR3-slepa-e for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Number of expected Standard Model background events including total statistical and systematic uncertainty added in quadrature (calculated before applying the statistical fitting procedure), number of observed events, and the observed and expected 95% CL upper limits on the visible $\tau\nu$ production cross section, $\sigma_{\rm vis} = \sigma(pp \to \tau\nu +X) \cdot \mathcal{A} \cdot \varepsilon$, for $m_{\rm T}$ thresholds ranging from 250 to 1800 GeV. See HepData abstract for details on how to use this data for reinterpretation.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Observed and expected 95% CL upper limits on cross section times $\tau\nu$ branching fraction for $W^{\prime}_{\rm SSM}$.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Regions of the non-universal G(221) parameter space excluded at 95% CL.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Number of expected $W^{\prime}_{\rm SSM}$, $W^{\prime}_{\rm NU}$, Standard Model background and observed events passing the optimal $m_{\rm T}$ threshold for each considered signal mass hypothesis. The expectations include the total statistical and systematic uncertainty added in quadrature. The yields and uncertainties are calculated before applying the statistical fitting procedure.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at generator-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. The "selected tau" criteria include the requirement of a $\tau_{\rm had-vis}$ with $p_{\rm T}$ > 50 GeV and $|\eta|$ < 2.4. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Acceptance times efficiency for $W^{\prime}_{\rm SSM}$ as a function of the $W^{\prime}_{\rm SSM}$ mass, shown after successively applying selection at reconstruction-level. The acceptance times efficiency is calculated with respect to all $W^{\prime}_{\rm SSM} \to \tau\nu$ events with a generated $\tau\nu$ mass above 120 GeV. "Preselection" includes all criteria prior to those shown. The $m_{\rm T}$ threshold for each $W^{\prime}_{\rm SSM}$ mass is defined in Table 5.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Reconstruction efficiency as a function of $m_{\rm T}$ (see HepData abstract for parameterization), defined as the ratio of the number of $\tau\nu$ events remaining after applying the full selection at reconstruction-level to those remaining after applying the fiducial selection at generator-level. The efficiency is largely model independent, with an uncertainty of ~10% due to model choice.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.