The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter λ as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 71 ≤ n_ch < 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T >100 MeV at √s=13 TeV in the multiplicity interval 231 ≤ n_ch < 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the correlation strength, λ(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T > 100  MeV and p_T > 500 MeV at √s = 13  TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of λ(m_ch) for p_T >100 MeV and p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively.

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

The dependence of the R(m_ch) on ∛m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for ∛m_ch < 1.2 for p_T >100 MeV and p_T >500 MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond ∛m_ch > 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for ∛m_ch > 1.45 with p_T >100 MeV and for ∛m_ch > 1.6 with p_T >500 MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 TeV (black circles) and 7 TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 < m_ch ≤ 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13  TeV (black circles) and 7  TeV (open blue circles), and the ratio of C₂^7 TeV (Q) to C₂^13 TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 < k_T ≤500  MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the correlation strength, λ(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to λ(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch ≥ 2 and transfer momentum of tracks with p_T >100 MeV and p_T >500 MeV at √s=13 TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the correlation strength, λ, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The two-dimensional dependence on m_ch and k_T for p_T > 100 MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.1 and 0.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 100 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter μ describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter μ on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The fit parameter ν describing the dependence of the correlation strength, λ, on charged-particle scaled multiplicity, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter ν on m_ch for tracks with p_T >100 MeV (p_T >500 MeV).

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter ξ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter ξ for m_ch > 3.0 for tracks with p_T >100 MeV and for m_ch > 2.8 for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The parameter κ describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T>100 MeV and track p_T>500 MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at √s = 13 TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter κ for tracks with p_T >100 MeV and for tracks with p_T >500 MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T > 500 MeV for the correlation strength, λ, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The two-dimensional dependence on m_ch and k_T for p_T > 500 MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch ≤ 3.08 and the HMT sample for m_ch > 3.08.

The parameter λ for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter λ for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T > 500 MeV as a function of m_ch in k_T intervals between 0.5 and 1.5 GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of ∛n_ch in pp interactions at 13 TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region∶ p_T > 100 MeV and |η|<2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to ∛n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, λ, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T > 100 MeV at √s= 13 TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |η| < 2.5 and both p_T > 100 MeV and p_T > 500 MeV at √s = 13 TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters γ and δ resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, λ, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T > 100 MeV and p_T > 500 MeV at √s = 13 TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters λ and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) λ versus n_ch for MB events, (b) λ versus n_ch for HMT events, (c) λ versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 10, (b) 11 < n_ch ≤ 20, (c) 21 < n_ch ≤ 30, (d) 31 < n_ch ≤ 40, (e) 41 < n_ch ≤ 50, (f) 51 < n_ch ≤ 60, (g) 61 < n_ch ≤ 70, (h) 71 < n_ch ≤ 80 and (i) 81 < n_ch ≤ 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 91 < n_ch ≤ 100, (b) 101 < n_ch ≤ 125, (c) 126 < n_ch ≤ 150, (d) 151 < n_ch ≤ 200, (e) 201 < n_ch ≤ 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 101 < n_ch ≤ 110, (b) 111 < n_ch ≤ 120, (c) 121 < n_ch ≤ 130, (d) 131 < n_ch ≤ 140, (e) 141 < n_ch ≤ 155, (f) 156 < n_ch ≤ 175, (g) 176 < n_ch ≤ 200, (h) 201 < n_ch ≤ 230 and (i) 231 < n_ch ≤ 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals∶ (a) 2 < n_ch ≤ 9, (b) 10 < n_ch ≤ 18, (c) 19 < n_ch ≤ 27, (d) 28 < n_ch ≤ 36, (e) 37 < n_ch ≤ 45, (f) 46 < n_ch ≤ 54, (g) 55 < n_ch ≤ 63, (h) 64 < n_ch ≤ 72, (i) 73 < n_ch ≤ 81, (j) 82 < n_ch ≤ 90, (k) 91 < n_ch ≤ 113, and (l) 114 < n_ch ≤ 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals∶ (a) 100 < k_T ≤ 200 MeV, (b) 200 < k_T ≤ 300 MeV, (c) 300 < k_T ≤ 400 MeV, (d) 400 < k_T ≤ 500 MeV, (e) 500 < k_T ≤ 600 MeV, (f) 600 < k_T ≤ 700 MeV, (g) 700 < k_T ≤ 1000 MeV, and (h) 1000 < k_T ≤ 1500 MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 100 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

The correlation strength, λ, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T > 500 MeV at √s = 13 TeV. Statistical uncertainties for √χ²/ndf>1 are corrected by the √χ²/ndf. The total uncertainties are shown.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Overview of the detector efficiency correction factors, $C_{Z}$ , for the electron and muon channels and their systematic uncertainty contributions.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

Measured inclusive cross-section in the fiducial volume in the electron and muon decay channels at Born level and their combination as well as the theory prediction at NNLO in $\alpha_{s}$ using the CT14 PDF set.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured fiducial cross section vs $E_{\mathrm{T}}^\gamma$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $|\eta^\gamma|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with SHERPA 2.2.2 at NLO. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 2\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-muon final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the muon-hadron final state.

Upper limits at 95% CL on the cross section times branching fraction for the process $H \to 4\gamma_d + X$ with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-muon final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the muon-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 125 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 2\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

Extrapolated signal efficiencies as a function of proper decay length of the dark photon for the $H \to 4\gamma_d + X$ process with $m_H$ = 800 GeV in the hadron-hadron final state.

The double-differential Z + jets production cross-section as a function of |y_{jet}| in the 100 GeV < p_{T}^{jet} < 200 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The double-differential Z + jets production cross-section as a function of |y_{jet}| in the 200 GeV < p_{T}^{jet} < 300 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The double-differential Z + jets production cross-section as a function of |y_{jet}| in the 300 GeV < p_{T}^{jet} < 400 Gev range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The double-differential Z + jets production cross-section as a function of |y_{jet}| in the 400 GeV < p_{T}^{jet} < 1050 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 25 GeV < p_{T}^{jet} < 50 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 50 GeV < p_{T}^{jet} < 100 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 100 GeV < p_{T}^{jet} < 200 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 200 GeV < p_{T}^{jet} < 300 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 300 GeV < p_{T}^{jet} < 400 Gev range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The non-perturbative correction for the Z + jets production cross-section as a function of |y_{jet}| in the 400 GeV < p_{T}^{jet} < 1050 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 25 GeV < p_{T}^{jet} < 50 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 50 GeV < p_{T}^{jet} < 100 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 100 GeV < p_{T}^{jet} < 200 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 200 GeV < p_{T}^{jet} < 300 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 300 GeV < p_{T}^{jet} < 400 Gev range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

The correction for QED radiation effects for the Z + jets production cross-section as a function of |y_{jet}| in the 400 GeV < p_{T}^{jet} < 1050 GeV range. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

Correlation matrix for the bins of the Z + jets cross-section. The particle level phase space definition: - 66 GeV < m_{ee} < 116 GeV - |eta_{electron}| < 2.47 - p_{T}^{electron} > 20 GeV - anti-kt R=0.4 jets N>=1 - |y_{jet}| < 3.4 - p_{T}^{jet} > 25 GeV - Delta R(jet, electron) > 0.4

Measured fiducial cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> e+ nu final state.

Measured total cross section times leptonic branching ratio for W+ production in the W+ -> mu+ nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> e- nu final state.

Measured total cross section times leptonic branching ratio for W- production in the W- -> mu- nu final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> e+ e- final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+ mu- final state.

Combined fiducial cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined fiducial cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined fiducial cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Combined total cross-section measurements for W+ boson production in the W+ -> l+ nu (l = e, mu) final state.

Combined total cross-section measurements for W- boson production in the W- -> l- nu (l = e, mu) final state.

Combined total cross-section measurements for W boson production in the W -> l nu (l = e, mu) final state.

Combined total cross-section measurements for Z/gamma* production in the Z/gamma* -> l- l+ (l = e, mu) final state.

Measured fiducial cross-section ratio R_{W+-/Z} = sigma (W+/- -> l+/- nu/nubar) / sigma (Z/gamma^* -> l+ l-) where l = e, mu.

Measured fiducial cross-section ratio R_{W+/W-} = sigma (W+ -> l+ nu) / sigma (W- -> l- nubar) where l = e, mu.

Measured charge asymmetry in W-boson production A_{l} = ( sigma (W+ -> l+ nu) - sigma (W- -> l- nubar) ) / ( sigma (W+ -> l+ nu) + sigma (W- -> l- nubar) ) where l = e, mu.

The ratio of measured W+ cross-sections in the electron and muon decay channels R_{W+} = sigma (W+ -> e+ nu) / sigma (W+ -> mu+ nu)

The ratio of measured W- cross-sections in the electron and muon decay channels R_{W-} = sigma (W- -> e- nu) / sigma (W- -> mu- nu)

The ratio of measured W cross-sections in the electron and muon decay channels R_{W} = sigma (W -> e nu) / sigma (W -> mu nu)

The ratio of measured Z/gamma^* cross-sections in the electron and muon decay channels R_{Z/gamma^*} = sigma (Z/gamma^* -> e+ e-) / sigma (Z/gamma^* -> mu+ mu-)

Correlation coefficients among (W- -> l- nubar), (W+ -> l+ nu), (Z/gamma^* -> l+ l-) where (l = e, mu) excluding the common normalisation uncertainty due to the luminosity calibration.

Impact of different components of systematic uncertainty on the measured fiducial cross section, without taking into account correlations. The impact of one source of systematic uncertainty is computed by first performing the fit with the corresponding nuisance parameter fixed to one standard deviation up or down from the value obtained in the nominal fit, then these up and down variations are symmetrized. The impacts of several sources of systematic uncertainty are added in quadrature for each component. The categorization of sources of systematic uncertainties into experimental and theory modeling correspond to those used for the measured fiducial cross section.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dijet invariant mass, $m_{jj}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dilepton invariant mass, $m_{ll}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+\nu$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for data

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+ u$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for the predictions from DYNNLO (CT14 NNLO PDF set)

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the asymmetry as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The uncertainties are given as an absolute difference from the nominal.

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (1.09,1.90).

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (−1.84,0.91).

The nuclear modification factor R_pPb for prompt, isolated photons with rapidity in (−2.83,−2.02).

The ratio of R_{pPb} from rapidity (1.09,1.90) to that of rapidity (−2.83,−2.02).