Impact of different components of systematic uncertainty on the measured fiducial cross section, without taking into account correlations. The impact of one source of systematic uncertainty is computed by first performing the fit with the corresponding nuisance parameter fixed to one standard deviation up or down from the value obtained in the nominal fit, then these up and down variations are symmetrized. The impacts of several sources of systematic uncertainty are added in quadrature for each component. The categorization of sources of systematic uncertainties into experimental and theory modeling correspond to those used for the measured fiducial cross section.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dijet invariant mass, $m_{jj}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dilepton invariant mass, $m_{ll}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_\text{T}^{\text{lead }\ell}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $m_{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $p_{T}^{e\mu}$.

Measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Statistical correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Total correlation between bins in data for the measured normalized fiducial cross-section of $WW\rightarrow e\mu$ production for the observable $|y_{e\mu}|$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $\Delta\phi_{e\mu}$.

Measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Statistical correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

Total correlation between bins in data for the measured normalized fiducial cross section of $WW\rightarrow e\mu$ production for the observable $|cos(\theta^*)|$.

List of experimentally considered systematic uncertainties for the WW cross section measurement.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_\text{T}^{\text{lead }\ell}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $m_{e\mu}$.

Extrapolated unfolded fiducial cross-section of $WW\rightarrow e\mu$ production as a function of $p_{T}^{e\mu}$.

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+\nu$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for data

The measured fiducial production cross-sections times branching ratio for $W^+\rightarrow\mu^+ u$ and $W^-\rightarrow\mu^-\bar{\nu}$, their sum, and their ratio for the predictions from DYNNLO (CT14 NNLO PDF set)

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the $W^{+}$ the cross-section (differential in $\eta_{\mu}$, as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. gThe uncertainties are given in percent.

Size of the asymmetry as a function of $|\eta_{\mu}|$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The uncertainties are given as an absolute difference from the nominal.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon pT in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of minimum $\Delta R) between the photon and the leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $|\Delta\eta|$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $\Delta\phi$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the minimum $\Delta R$ between the photon and the leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $|\Delta\eta|$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta\phi$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the measured normalized differential cross sections in the single lepton channel.

The statistical correlation matrix of all the measured normalized differential cross sections in the dilepton channel.

Lower mass exclusion limits for scalar and vector LQs.

Observed upper limits on the production cross section for pair production of LQs decaying into a top quark and a muon or bottom quark and a neutrino at 95% CL in the $M_{LQ} - B(LQ \rightarrow t\mu)$ plane.

Lower mass exclusion limits for scalar and vector LQs.

Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.