The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured normalized cross sections in bins of Z pt, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of Z pt in |y(Z)| bins, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

The $m_{W}^{T}$ distribution from data (points) and simulation (shaded histograms) in the 2j1t (left) and 3j1t (right) categories for the muon (upper) and electron (lower) channels. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Values of the third-row elements of the CKM matrix inferred from low-energy measurements with the respective values of the top quark decay branching fractions. The q in bs{V_{tq}} and \mathcal{B}(t o Wq) in the first column refers to b, s, and d quarks, according to the quark label shown in the header row.

For each of the production and decay vertices, the cross section times branching fraction for the corresponding signal process from simulation. The uncertainties shown includethose from the factorisation and renormalisation scales, the PDFs, and any experimental uncer-tainties, where appropriate.

The sources and relative values in percent of the systematic uncertainty in the measurement of the STb,b cross section. The uncertainties are broken up into profiled and nonprofiled sources.

The signal strengths obtained under SM assumptions.

Results obtained under SM assumptions.

Results obtained under first BSM scenario.

Results obtained under second BSM scenario.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

W+jets BDT distributions in the muon and electron single-lepton channel. The SR is defined as events with W+jets BDT >= 0.5.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Dijet rapidity difference $(|\Delta y|)$ for events passing the fully hadronic event selection for all $m_{t\overline{t}}$ and for events with an $m_{t\overline{t}}$ > 2 TeV.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $p_{T}$ and $m_{SD}$ for the W+jets background in the muon and electron channels using the W+jets mistag CR.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of $S_{T}$ in the background-enriched CR for $\mu\mu$, $ee$, and $e\mu$ subchannels.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of ST for the $\mu\mu$, $ee$, and $e\mu$ SRs in the boosted and nonboosted regions.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel CR1 and CR2 forthe muon and electron categories.

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the single-lepton channel SRs for the muon and electron categories with and without t tagging

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Distributions of $m_{t\overline{t}}$ for the fully hadronic channel SR categories, used to extract the final results.

Observed yields and pre-fit background predictions for Njets 8-9.

Observed yields and pre-fit background predictions for Njets >=10.

Observed yields and pre-fit background predictions for aggregated bins.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 174 analysis bins.

Pre-fit background correlation matrix $\rho_{xy}$ for the 174 analysis bins.

Observed yields and post-fit background predictions for Njets 2-3.

Observed yields and post-fit background predictions for Njets 4-5.

Observed yields and post-fit background predictions for Njets 6-7.

Observed yields and post-fit background predictions for Njets 8-9.

Observed yields and post-fit background predictions for Njets >=10.

Simulated signal yields for representative gluino signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative gluino signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

The 95% CL observed and expected upper limits on the production cross sections of the T1tttt signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1bbbb signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1qqqq signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T5qqqqVV signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2tt signal model as a function of the top squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2bb signal model as a function of the bottom squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2qq signal model as a function of the LSP and light squark masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

The observed significance of the SMS models for T1tttt as function of the gluino and LSP masses.

The observed significance of the SMS models for T1bbbb as function of the gluino and LSP masses.

The observed significance of the SMS models for T1qqqq as function of the gluino and LSP masses.

The observed significance of the SMS models for T5qqqqVV as function of the gluino and LSP masses.

The observed significance of the SMS models for T2tt as function of the top squark and LSP masses.

The observed significance of the SMS models for T2bb as function of the bottom squark and LSP masses.

The observed significance of the SMS models for T2qq as function of the LSP and light squark masses.

The efficiency times acceptance of the SMS models for T1tttt as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1bbbb as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1qqqq as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T5qqqqVV as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2tt as function of the top squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2bb as function of the bottom squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2qq as function of the LSP and light squark masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) ~ m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) ~ m(LSP). Only statistical uncertainties are shown.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Transverse mass $m_T$ spectrum at midrapidity of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c. $m_0$ is the PDG mass of the $\phi$ meson.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the slope parameter $T$ of the transverse momentum spectrum on rapidity $y$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Dependence of the width $\sigma_y$ of the rapidity distributions on $p_T$, of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 158 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 80 GeV/c.

Rapidity spectrum of $\phi$ mesons produced in minimum bias p+p collisions at beam momentum of 40 GeV/c.

Energy dependence of ratios of total yields of $\phi$ mesons to mean total yields of pions produced in in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of double ratios of total yields of $\phi$ mesons to mean total yields of pions in central Pb+Pb collisions over minimum bias p+p collisions at CERN SPS energies.

Energy dependence of total yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Energy dependence of midrapidity yields of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies.

Widths of rapidity distributions of $\phi$ mesons produced in minimum bias p+p collisions at CERN SPS energies, as a function of beam rapidity.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Expected yields for different processes after several selection stages. The preselection requires two leptons and at least one photon with $\mathrm{p_\mathrm{T}}$ larger than 25, 20, and 25 GeV, respectively; in addition the dilepton $\mathrm{p_\mathrm{T}}$ must be larger than 60 GeV, and the $\mathrm{p_\mathrm{T}}^{\mathrm{miss}}$ larger than 70 GeV. The signal prediction corresponds to $0.1 \sigma_{\mathrm{\mathrm{ZH}}}$ at $m_{H}$ = 125 GeV.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

The timing distribution of the background sources predicted to contribute to the signal region, compared to those for a representative signal model. The time is defined by the jet in the event with the largest $t_{\mathrm{jet}}$ passing the relevant selection. The distributions for the major backgrounds are taken from control regions and normalized to the predictions. The observed data is shown by the black points. No events are observed in data for $t_{\mathrm{jet}} > 3\,$ns (indicated with a vertical black line).

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The product of the acceptance and efficiency in the $c\tau_{0}$ vs. $m_{\tilde{g}}$ plane for the GMSB model, after all requirements.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed.

The observed upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The observed and expected upper limits at $95\%$ CL on the gluino pair production cross section for a gluino GMSB model with $m_{\tilde{g}}=2400$ GeV. The one (two) standard deviation variation in the expected limit is shown in the inner green (outer yellow) band. The blue solid line shows the observed limit obtained by the CMS displaced jet search

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of number of ECAL cells hit in the jet for jets in a background enriched data sample (satisfying $|\eta| < 1.48$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets satisfying signal region requirements (except those on $E_{\mathrm{ECAL}}$ and $N^{\mathrm{cell}}_{\mathrm{ECAL}}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $\mathrm{HEF}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $\mathrm{HEF}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} < 1/12$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $E_{\mathrm{HCAL}}$ for a data sample enriched in beam halo and noise jets (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30 \,\mathrm{GeV}$, $p_\mathrm{T}tf < 0.08$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$) and for signal jets passing signal region selections (except on $E_{\mathrm{HCAL}}$).

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $PV_{\rm track}^{\rm fraction} > 1/12$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $t^{\mathrm{RMS}}_\mathrm{jet}$ for data sample enriched in jets from noise (satisfying $|\eta| < 1.48$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $p_\mathrm{T}tf > 0.08$, $\mathrm{HEF} > 0.2$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20 \,\mathrm{GeV}$ and $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$) and for signal jets passing signal region selections (except on $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}}$ and $t^{\mathrm{RMS}}_\mathrm{jet}$)

The distribution (normalized to unity) of $PV_{\rm track}^{\rm fraction}$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $PV_{\rm track}^{\rm fraction}$).

The distribution (normalized to unity) of $p_\mathrm{T}tf$ for a data sample enriched in main bunch backgrounds (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $|t_{\mathrm{jet}}| < 3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} >20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $p_\mathrm{T}tf$).

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$ for a data sample enriched in beam halo (satisfying $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} < 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} < -3\,\mathrm{ns}$ and $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$) and for signal jets passing signal selections (except on $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}}$)

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{DT}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $PV_{\rm track}^{\rm fraction} < 1/12$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

The distribution (normalized to unity) of $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$ for a data sample enriched in cosmic muons (satisfying $E^{\mathrm{CSC}}_\mathrm{ECAL}/E_{\mathrm{ECAL}} < 0.8$, $p_\mathrm{T} > 30\,\mathrm{GeV}$, $|\eta| < 1.48$, $p_\mathrm{T}tf < 0.08$, $\mathrm{HEF} > 0.2$, $t^{\mathrm{RMS}}_\mathrm{jet}/t_{\mathrm{jet}} < 0.4$, $t_{\mathrm{jet}} > 3\,\mathrm{ns}$, $E_{\mathrm{ECAL}} > 20\,\mathrm{GeV}$ and failing the HCAL noise rejection quality filters) and for signal jets passing signal selections (except on $\mathrm{max}(\Delta \phi_{\mathrm{RPC}})$).

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset with no cleaning selection applied (a) and after all jet cleaning selections are applied (b) in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} > 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds. The cleaning selections are shown to reduce the backgrounds by many orders of magnitude.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 1/12$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Distribution of $t_{\mathrm{jet}}$ for jets with the full Run 2 dataset in events satisfying the trigger requirements and satisfying $p_T^\mathrm{miss} < 300$. The jets are required to pass an inverted selection of $PV_{\rm track}^{\rm fraction} > 0.08$ to enrich the sample in those originating from main and satellite bunch backgrounds (all other jet cleaning selections are applied). Clear contributions from jets from satellite bunch collisions can be seen peaked around -5, 5 and 10 ns.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Contribution to the delayed time of jets from the $\beta$ of the gluino is plotted against the delay contribution from the difference (assuming straight line paths) between the path taken by the gluino and the particle forming the jet from the path length for a particle travelling directly to the same position on the ECAL barrel for gluino $c\tau_{0} = 10$ m and mass of 1000 Gev (top) and 3000 GeV (bottom). The dominant contribution is shown to be the gluino $\beta$.

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=1000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=2400$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

Selection efficiencies for the GMSB model with $m_{\tilde{g}}=3000$ and various proper decay lengths

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The observed upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section relative to the theoretical cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected plus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

The expected minus 1 $\sigma_{\mathrm{experiment}}$ upper limits at $95\%$ CL for the gluino pair production cross section in the GMSB model, shown in the plane of $m_{\tilde{g}}$ and $c\tau_{0}$. A branching fraction of $100\%$ for the gluino decay to a gluon and a gravitino is assumed. The area below the thick black curve represents the observed exclusion region, while the dashed red lines indicate the expected limits and their $\pm 1$ standard deviation ranges from experimental uncertainties. The thin black lines show the effect of the theoretical uncertainties on the signal cross section.

Summary of typical systematic uncertainties for the signal.

Numbers of observed events for all signal regions, including predicted background contributions and expected signal yields.

Limits on anomalous quartic couplings at 95% CL.

Expected and observed 95% CL upper limits on the cross section times the branching ratio sigma(P P --> W+- a)B(a --> W+- W-+) as a function of ALP mass

Expected and observed 95% CL upper limits on the photophobic ALP model parameter 1/f_a as a function of ALP mass.

Observed signal strength, and observed signal cross section.

The $S_{\rm T}$ distribution for group B before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group C before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The $S_{\rm T}$ distribution for group D before fitting.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = 100%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → tH) = 50%.

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The observed and expected 95% CL upper limits on the $T\bar T$ cross section as a function of the T quark mass assuming Br(T → tZ) = B(T → bW) = 50%

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using electron channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The number of observed events and the predicted number of SM background events in the $T\bar T$ search using muon channel in the four event groups.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 1b event category for data and the expected background before fitting.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for 2b event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted t event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted H event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The $S_{\rm T}$ distribution for boosted Z event category for data and the expected background.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = 100%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → bH) = 50%.

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The observed and expected 95% CL upper limits on the $B\bar B$ cross section as a function of the B quark mass assuming Br(B → bZ) = Br(B → tW) = 50%

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using electron channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

The number of observed events and the predicted number of SM background events in the $B\bar B$ search using muon channel in the five event categories.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels in the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for bbA prodcution and the branching fraction $\mathrm{A} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1 b tag category, as a function of the A boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The product of acceptance, efficiency, and branching fraction of the qbX signal with $\mathrm{X} \rightarrow \tau\tau$ and $m_{\mathrm{B}}=170~\mathrm{GeV}$ in $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels of the 1b1f and 1b1c event categories, as a function of the X boson mass. The selections are as described in the paper. The uncertainty refers to the statistical uncertainty only.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed $m_{\tau\tau}$ distribution in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, compared to the expected SM background contributions. The distributions of the qbX signal with $m_{\mathrm{B}}=170~\mathrm{GeV}$, and X boson mass 40 and 60 GeV are overlaid to illustrate the sensitivity. They are normalized to the cross section times branching fraction of 20 pb. The uncertainty band represents the sum in quadrature of statistical and systematic uncertainties obtained from the fit. The lower panel shows the ratio between the observed and expected events in each bin.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 300 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 450 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained from the combination of the $\mathrm{e}\tau_\mathrm{h}$ and $\mu\tau_\mathrm{h}$ channels, and the 1b1f and 1b1c categories, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mathrm{e}\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1f category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

Observed (black solid) and expected (black dotted) limits at 95% confidence level on the product of the the cross section for the prodcution of the qbX signal with mB = 170 GeV and the branching fraction $\mathrm{X} \rightarrow \tau\tau$, obtained in the $\mu\tau_\mathrm{h}$ channel of the 1b1c category, as a function of the X boson mass. The green and yellow bands represent the one and two standard deviation uncertainties in the expected limits.

The distributions of likelihood discriminant for data, simulated QCD multijet events, and simulated signal events. Data and simulated events are selected with the displaced-jet trigger. The offline $H_{T}$ is required to be larger than 400 GeV, and the jets are required to have $p_{T}>50\ \mathrm{GeV}$ and $|\eta|<2.0$. Three benchmark signal distributions are shown (dashed lines) for the jet-jet model with $m_{X}=300\ \mathrm{GeV}$ and varying lifetimes. For visualization each signal process is given a cross section, $\sigma$, such that $\sigma\ 35.9 \mathrm{fb}^{-1} = 1 \times 10^{6}$.

Numbers of predicted and observed background events for the nominal background method and the three cross-checks in the control region. Shown are the comparisons for likelihood discriminant thresholds of 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, and 0.9. The error bars represent the statistical uncertainties of the predictions and the observations. The data points at different likelihood discriminant thresholds are correlated, since the events passing higher likelihood discriminant thresholds also pass lower likelihood discriminant thresholds.

Numbers of predicted and observed background events for the nominal background method and the three cross-checks in the control region. Shown are the comparisons for likelihood discriminant thresholds of 0.95, 0.96, 0.97, 0.98, 0.99, and 0.9993. The error bars represent the statistical uncertainties of the predictions and the observations. The data points at different likelihood discriminant thresholds are correlated, since the events passing higher likelihood discriminant thresholds also pass lower likelihood discriminant thresholds.

The expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived particle X, assuming a $100\%$ branching fraction for X to decay to a quark-antiquark pair, shown at different masses and different proper decay lengths for the jet-jet model.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived gluino, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{g}\widetilde{\mathrm{G}}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived gluino model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{g}\widetilde{\mathrm{G}}$ decays, based on the NLO+NLL calculation of the gluino pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived gluino, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{tbs}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived gluino model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{g}}\to\mathrm{tbs}$ decays, based on the NLO+NLL calculation of the gluino pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the pair production cross section of the long-lived top squark, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{b}\ell$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived top squark model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{b}\ell$ decays, based on the NLO+NLL calculation of the top squark pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

the expected and observed $95\%$ $\text{CL}$ upper limits on the the pair production cross section of the long-lived top squark, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{\overline{d}\overline{d}}$ decays.

the expected and observed $95\%$ $\text{CL}$ limits for the long-lived top squark model in the mass-lifetime plane, assuming a $100\%$ branching fraction for $\widetilde{\mathrm{t}}\to\mathrm{\overline{d}\overline{d}}$ decays, based on an NLO+NLL calculation of the top squark pair production cross section at $\sqrt{s}=13\ \mathrm{TeV}$.

The likelihood ratio for vertex track multiplicity

The likelihood ratio for vertex $L_{xy}$ significance

The likelihood ratio for cluster RMS, the point where cluster RMS equals $-1.0$ represents the case where there is no cluster being reconstructed for the dijet candidate

Measured misidentification probability distribution as a function of track multiplicity for the EMJ-1 criteria group defined in Table 2. The red up-pointing triangles are for b jets while the blue down-pointing triangles are for light-flavor jets. The horizontal lines on the data points indicate the variable bin width.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 8 (SM QCD-enhanced), requiring at least two jets tagged by loose emerging jet criteria.

The $H_\mathrm{T}$ distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

The number of associated tracks distribution for the observed data events (black points) and the predicted background estimation (blue) for selection set 9 (SM QCD-enhanced), requiring at least one jet tagged by loose emerging jet criteria and large $p_\mathrm{T}^\mathrm{miss}$.

Upper limits at 95% CL on the signal cross section for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Dark mediator mass exclusion limits at 95% CL derived from theoretical cross sections for models with dark pion mass $(m_{\pi_\mathrm{DK}})$ of 5 GeV in the proper decay length $(c\tau_{\pi_\mathrm{DK}})$ versus dark mediator mass $(m_{\mathrm{X_{DK}}})$ plane.

Lower mass exclusion limits for scalar and vector LQs.

Observed upper limits on the production cross section for pair production of LQs decaying into a top quark and a muon or bottom quark and a neutrino at 95% CL in the $M_{LQ} - B(LQ \rightarrow t\mu)$ plane.

Lower mass exclusion limits for scalar and vector LQs.

Invariant mass distribution of the selected $\mathrm{B}^+\mathrm{K}^-$ candidates in data

Invariant mass distribution of the selected $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$ candidates in data

The observed signal yields ($N$), natural widths ($\Gamma$), and mass differences from the fits to the $m_{\mathrm{BK}}$ distributions in data, for the two channels: $\mathrm{B}^+\mathrm{K}^-$ and $\mathrm{B}^0 \mathrm{K}^{0}_{\mathrm{S}}$. The uncertainties are statistical only.

The measured ratios of branching fractions

The measured ratios of cross sections times branching fractions

The measured mass differences $M(\mathrm{B}^{(*)0}_{\mathrm{s1,2}})-M^{\mathrm{PDG}}_{\mathrm{B}}-M^{\mathrm{PDG}}_{\mathrm{K}}$

The measured masses of $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ and $\mathrm{B}_{\mathrm{s1}}(5830)^0$ mesons

The measured mass differences between neutral and charged B mesons

The measured $\mathrm{B}^{*}_{\mathrm{s2}}(5840)^0$ natural width

Rapidity distributions for PHI mesons produced in P P collisions.

Integrated yields of PHI and PI mesons and their ratio.

Multiplicity dependence of the PHI/PI ratio in P P collisions.

Centrality dependence of the PHI/PI ratio in the forward hemisphere in P PBcollisions normalised to the average P P values. Here N(C=CD) is the number emi tted in the backward direction in P PB collisions and is essentially related to the mean number of collisions of the projectile in the target.

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