Fraction of events where both bosons are longitudinally polarized in the region with $p_T^Z>200$ GeV using two unconstrained parameters.

Numbers of observed and expected events in the 00-enhanced signal regions, before the fit. The total uncertainties are quoted.

Summary of the relative uncertainties in the measured longitudinal-longitudinal fractions $f_{00}$. The uncertainties are reported as percentages.

Numbers of observed and expected events in the 00-enhanced signal regions, after the fit. The total uncertainties are quoted.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of the TT state.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of of the sum of all polarization.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of of the sum of all polarization.

$|\Delta Y(l_{W}Z)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of the TT state.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 20$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 40$ GeV of of the sum of all polarization.

$|\Delta Y(WZ)|$ Migration matrix RAZ Region $p_{T}^{WZ}< 70$ GeV of of the sum of all polarization.

The $\mathcal{D}$ value for the unfolded $|\Delta Y(l_{W}Z)|$ distributions of the TT polarization state as a function of the $p_T^{WZ}$ cut value.

The $\mathcal{D}$ value for the unfolded $|\Delta Y(WZ)|$ distributions of the TT polarization state as a function of the $p_T^{WZ}$ cut value.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the TT state in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(l_{W}Z)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 20$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 40$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Measured normalized differential $|\Delta Y(WZ)|$ cross-section of the sum of polarization states in the RAZ Region $p_{T}^{WZ}< 70$ GeV. The total uncertainties are quoted. The last bin covers all events above the lower end of the bin.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the TT state in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(l_{W}Z)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<20$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<40$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Summary of the relative uncertainties in the measured depth of the sum of polarization states in the RAZ Region $p_{T}^{WZ}<70$ GeV using $|\Delta Y(WZ)|$. The uncertainties are reported as percentages.

Observed 95% CL exclusion limits on the simplified models of chargino-pair production decaying via W bosons.

$+1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino-pair production decaying via W bosons.

$-1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino-pair production decaying via W bosons.

Expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$+1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$-1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

Observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$+1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$-1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

Expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

$+1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

$-1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

Observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

$+1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

$-1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and h bosons.

Expected 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

$+1\sigma$ expected 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

$-1\sigma$ expected 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

Observed 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

$+1\sigma$ observed 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

$-1\sigma$ observed 95% CL exclusion limits on the simplified models of higgsino GGM scenarios.

Observed upper limit on the signal cross section in fb for the production of $\tilde{\chi}_1^{+}\tilde{\chi}_{1}^{-}$.

The analyses used in combination for each scenario to set limits in models of the production of $\tilde{\chi}_1^{+}\tilde{\chi}_{1}^{-}$.

Observed upper limit on the signal cross section in fb for chargino--neutralino production decaying via W and Z bosons.

The analyses used in combination for each scenario to set limits in models of chargino--neutralino production decaying via W and Z bosons.

Expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$+1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$-1\sigma$ expected 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

Observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$+1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

$-1\sigma$ observed 95% CL exclusion limits on the simplified models of chargino--neutralino production decaying via W and Z bosons.

Observed upper limit on the signal cross section in fb for chargino--neutralino production decaying via W and h bosons.

The analyses used in combination for each scenario to set limits in models of chargino--neutralino production decaying via W and h bosons.

Observed upper limit on the signal cross section in fb for higgsino GGM scenarios.

The analyses used in combination for each scenario to set limits in higgsino GGM scenarios.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the higgsino simplified model being considered. These are shown with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the latest ATLAS searches using the soft lepton and disappearing track signatures are illustrated by the blue and green regions, respectively, while the limit imposed by the LEP experiments is shown in gray. The dot-dashed gray line indicates the predicted mass-splitting for the pure higgsino scenario.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed CLs values per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Expected and observed cross-section upper-limit per signal point represented by the grey numbers. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid along with $\pm 1\sigma_{\mathrm{exp}}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm 1\sigma_{\mathrm{theory}}^{\mathrm{SUSY}}$ (red dotted lines) from signal cross-section uncertainties, respectively.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Truth-level signal acceptances for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$) in a SR with the $S(d_0)$ requirement removed. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation, where the signal candidate track is identified as the charged particle with the largest distance between the interaction vertex and the secondary vertex of the higgsino decays.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-Low for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Signal efficiencies in SR-High for each production process ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$), defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level, where the $S(d_0)$ selecton efficiency has the largest impact. The higgsino decay products from $\Delta \mathrm{m}(\tilde{\chi}_1^\pm,\tilde{\chi}_1^0) < 0.4$ GeV signal have $p_{\mathrm{T}}$ too low to be reconstructed as the signal candidate tracks, and therefore the identified signal candidate tracks are typically from pile-up collisions or underlying events similar to the QCD track background, causing a low $S(d_0)$ selection efficiency in these plots.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 1.5, 1.0, and 0.75 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Event selection cutflows for signal samples with $m(\tilde{\chi}_{1}^0)$ = 150 GeV and $\Delta m(\tilde{\chi}_{1}^\pm, \tilde{\chi}_{1}^0)$ = 0.5, 0.35, and 0.25 GeV, including all six production processes ($\tilde{\chi}_1^\pm \tilde{\chi}_1^0$, $\tilde{\chi}_1^\pm \tilde{\chi}_2^0$, $\tilde{\chi}_1^+ \tilde{\chi}_1^-$, and $\tilde{\chi}_2^0 \tilde{\chi}_1^0$). The cross-section used to obtain the initial number of events ($\sigma(\mathrm{n}_{\mathrm{jets}}) \geq 1$) refers to an emission of at least one gluon or quark with $p_{\mathrm{T}} > 50$ GeV at the parton level.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Truth $P_{T}^{Z}$ distribution after reweghting to data.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Measured $p_T$ cross sections in full-lepton phase space for 1.2 < |y| < 1.6.

Measured $p_T$ cross sections in full-lepton phase space for 1.6 < |y| < 2.0.

Measured $p_T$ cross sections in full-lepton phase space for 2.0 < |y| < 2.4.

Measured $p_T$ cross sections in full-lepton phase space for 2.4 < |y| < 2.8.

Measured $p_T$ cross sections in full-lepton phase space for 2.8 < |y| < 3.2.

Measured cross sections in full-lepton phase space as a function of |y|.

Normalised measured $p_T$ cross sections in full-lepton phase space for |y| < 1.6.

Distribution of the NN output in the $\geq$1fj$\,$SR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the NN output in the $t\bar{t}\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Total event yield in the $W\gamma\,$CR in data and the expected contribution of the signal and background processes after the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions considering the correlations of the uncertainties as obtained by the fit.

Distribution of the scalar sum of the jet transverse momenta in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark+photon system in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the 0fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the scalar sum of the jet transverse momenta in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the invariant mass of the $b$-tagged jet and the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of $p_{\mathrm{T}}$ of the highest-$p_{\mathrm{T}}$ forward jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the difference in $\eta$ between the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the energy of the system formed by the highest-$p_{\mathrm{T}}$ forward jet and the photon in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $\eta$ of the $b$-tagged jet in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Distribution of the reconstructed top-quark mass in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions. The first and last bins include the underflow and overflow, respectively.

Distribution of the $p_{\mathrm{T}}$ of the top-quark and photon system in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $p_{\mathrm{T}}$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions and the last bin includes the overflow.

Distribution of the photon $\eta$ in the $\geq$1fj$\,$SR in data and for the sum of all processes expectations before the profile-likelihood fit. The "Total" column corresponds to the sum of the expected contributions from the signal and background processes. The uncertainty represents the sum of statistical and systematic uncertainties in the signal and background predictions.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the parton-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

Ordered list of the 30 systematic uncertainties with the largest impact on the measured signal normalisation in the fit to data in the particle-level measurement considered as nuisance parameters (NPs) in the profile-likelihood fit. The column "NP value, error" corresponds to the nominal best-fit values and the corresponding uncertainties. The impact of each NP, $\Delta\sigma$/$\sigma_{\mathrm{pred}}$, is computed by comparing the nominal best-fit value of the POI ($\sigma$/$\sigma_{\mathrm{pred}}$) with the result of the fits when fixing the considered NP to its best-fit value shifted by its pre-fit and post-fit uncertainties. The corresponding impacts are listed in the "POI impact prefit high/low" and "POI impact high/low" columns, respectively. The "MC stat." NPs represent the MC statistical uncertainty and they enter the likelihood with a Poisson term, while all the other NPs enter the likelihood via a Gaussian term.

This table lists the kinematic requirements on parton-level objects used to define of the fiducial phase space for the parton-level measurement. Frixione isolation ($\href{https://arxiv.org/abs/hep-ph/9801442}{\text{hep-ph/9801442}}$) with a chosen radius of $\Delta R = 0.2$ is applied to photons ($\gamma$). The measured fiducial parton-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b) = 688\pm 23(\text{stat.})^{+75}_{-71}(\text{syst.})\,$fb.

This table lists the kinematic requirements on particle-level objects used to define of the fiducial phase space for the particle-level measurement. The particle level objects are photons ($\gamma$) not from a hadron decay, neutrinos not from a hadron decay ($\nu$), prompt electrons and muons ($\ell$) "dressed" by adding close-by ($\Delta R < 0.1$) photons, and anti-$k_t$ $R = 0.4$ jets built from stable particles ($\tau > 30\,$ps) and tau leptons excluding neutrinos and prompt dressed muons. Jets are $b$-tagged ($b$-jet) using ghost-matched $b$-hadrons with $p_{\text{T}} > 5\,$GeV. Apart from the kinematic requirements, isolation and overlap removal criteria are applied. Jets within $\Delta R = 0.4$ of a photon are removed if the $p_{\text{T}}$ of charged particles within $\Delta R = 0.3$ of the photon is smaller than $10\,\%$ of its $p_{\text{T}}$. Jets within $\Delta R = 0.4$ of a lepton are removed. Events are removed where a photon is close ($\Delta R < 0.4$) to a lepton or a surviving jet. The measured fiducial particle-level cross section is $\sigma_{tq\gamma}\times\mathcal{B}(t\rightarrow l\nu b)+\sigma_{t(\rightarrow l\nu b\gamma)q} = 303\pm 9(\text{stat.})^{+33}_{-32}(\text{syst.})\,$fb.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.2$.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.2$ at NNLO QCD.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the High-pT jet SR for expected signal events in the strong gluino pair pair production model with m(gluino)=1.8 TeV, m(chi0)=0.2 TeV, tau(chi0)=0.1 ns

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for observed data events

Two-dimensional distribution of the invariant mass $m_{DV}$ and the track multiplicity in the Trackless jet SR for expected signal events in the electroweak pair production model

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in electroweakino pair production models

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.4 TeV

Exclusion limits at 95% CL on the production cross section in the electroweak pair production model.

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m(gluino)=2.4 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.0 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the neutralino in strong gluino pair production models and m(gluino)=2.2 TeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=50 GeV

Expected exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (+1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Observed (-1 sigma) exclusion limits at 95% CL on the lifetime and mass of the gluino in strong gluino pair production models and m(chi0)=450 GeV

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.01 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=0.1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=1 ns

Expected exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Expected (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (+1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Observed (-1 sigma) exclusion limits at 95% CL on the mass of the gluino and neutralino in strong gluino pair production models and tau(chi0)=10 ns

Exclusion limits at 95% CL on the production cross section in the strong gluino pair production models and m($ ilde{\chi}^0_1$)=1.25 TeV

Acceptance cutflow for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Acceptance cutflow for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Acceptance cutflow for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks final state. See additional resources for more information.

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for HighPt SR selections, R > 3870 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R < 1150 mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R [1150, 3870] mm

Reinterpretation Material: Event-level Efficiency for Trackless SR selections, R > 3870 mm

Reinterpretation Material: Vertex-level Efficiency for R < 22 mm

Reinterpretation Material: Vertex-level Efficiency for R [22, 25] mm

Reinterpretation Material: Vertex-level Efficiency for R [25, 29] mm

Reinterpretation Material: Vertex-level Efficiency for R [29, 38] mm

Reinterpretation Material: Vertex-level Efficiency for R [38, 46] mm

Reinterpretation Material: Vertex-level Efficiency for R [46, 73] mm

Reinterpretation Material: Vertex-level Efficiency for R [73, 84] mm

Reinterpretation Material: Vertex-level Efficiency for R [84, 111] mm

Reinterpretation Material: Vertex-level Efficiency for R [111, 120] mm

Reinterpretation Material: Vertex-level Efficiency for R [120, 145] mm

Reinterpretation Material: Vertex-level Efficiency for R [145, 180] mm

Reinterpretation Material: Vertex-level Efficiency for R [180, 300] mm

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the strong gluino pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model. See additional resources for more information.

Cutflow (acceptance x efficiency) for the Trackless SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.

Cutflow (acceptance x efficiency) for the High-pT SR for representative points in the electroweak pair production model with heavy-flavor quarks. See additional resources for more information.