The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 11 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 12 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 13 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for 14 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $1\ell$ category for at least 15 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 4 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 5 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 6 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for 9 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold regions defined for the EWK analysis in the $2\ell^{\mathrm{sc}}$ category for at least 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold region in the $1\ell$ category for at least 15 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 40 GeV jet $p_{\mathrm{T}}$ threshold region in the $1\ell$ category for at least 12 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 60 GeV jet $p_{\mathrm{T}}$ threshold region in the $1\ell$ category for at least 11 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 80 GeV jet $p_{\mathrm{T}}$ threshold region in the $1\ell$ category for at least 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 100 GeV jet $p_{\mathrm{T}}$ threshold region in the $1\ell$ category for at least 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 20 GeV jet $p_{\mathrm{T}}$ threshold region in the $2\ell^{\mathrm{sc}}$ category for at least 10 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 40 GeV jet $p_{\mathrm{T}}$ threshold region in the $2\ell^{\mathrm{sc}}$ category for at least 8 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 60 GeV jet $p_{\mathrm{T}}$ threshold region in the $2\ell^{\mathrm{sc}}$ category for at least 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 80 GeV jet $p_{\mathrm{T}}$ threshold region in the $2\ell^{\mathrm{sc}}$ category for at least 7 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

The observed data event yields and the corresponding estimates for the backgrounds in the different $b$-jet multiplicity bins for the 100 GeV jet $p_{\mathrm{T}}$ threshold region in the $2\ell^{\mathrm{sc}}$ category for at least 6 jets. The background is estimated by including all bins in the fit. All uncertainties, which may be correlated across the bins, are included in the total background uncertainty.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $1\ell$ category, as well as the observed and expected 95% CL model-independent upper limits on product of cross-section, acceptance and efficiency (in fb). The parameters of the model are determined in a fit to a reduced set of bins, corresponding to the model-independent fit discussed in the text.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $2\ell^{\mathrm{sc}}$ category, as well as the observed and expected 95% CL model-independent upper limits on product of cross-section, acceptance and efficiency (in fb). The parameters of the model are determined in a fit to a reduced set of bins, corresponding to the model-independent fit discussed in the text.

Expected 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model.

Observed 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model.

Expected 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model.

Observed 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model.

Expected 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with bino LSP.

Observed 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with bino LSP.

Expected 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP.

Observed 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP.

Expected 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with wino LSP.

Observed 95% CL exclusion contour for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with wino LSP.

Expected 95% CL exclusion contour for the stop pair production model with bino LSP.

Observed 95% CL exclusion contour for the stop pair production model with bino LSP.

Expected 95% CL exclusion contour for the stop pair production model with higgsino LSP.

Observed 95% CL exclusion contour for the stop pair production model with higgsino LSP.

Expected 95% CL exclusion contour for the stop pair production model with wino LSP.

Observed 95% CL exclusion contour for the stop pair production model with wino LSP.

Expected 95% CL excluded cross section for the RPV model with electroweakino prodiction with higgsino LSP hypothesis.

Observed 95% CL excluded cross section for the RPV model with electroweakino prodiction with higgsino LSP hypothesis.

Expected 95% CL excluded cross section for the RPV model with electroweakino prodiction with wino LSP hypothesis.

Observed 95% CL excluded cross section for the RPV model with electroweakino prodiction with wino LSP hypothesis.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $1\ell$ category with 20 and 40 GeV jet $p_{\mathrm{T}}$ thresholds. The uncertainties across backgrounds can exhibit strong anticorrelations.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $1\ell$ category with 60, 80 and 100 GeV jet $p_{\mathrm{T}}$ thresholds. The uncertainties across backgrounds can exhibit strong anticorrelations.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $2\ell^{\mathrm{sc}}$ category with 20 and 40 GeV jet $p_{\mathrm{T}}$ thresholds. The uncertainties across backgrounds can exhibit strong anticorrelations.

Data event yields compared with the expected contributions from relevant background sources, in the discovery signal regions defined for the $2\ell^{\mathrm{sc}}$ category with 60, 80 and 100 GeV jet $p_{\mathrm{T}}$ thresholds. The uncertainties across backgrounds can exhibit strong anticorrelations.

Expected 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model.

Observed 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model.

Expected 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model.

Observed 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model.

Expected 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with bino LSP.

Observed 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with bino LSP.

Expected 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with wino LSP.

Observed 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with wino LSP.

Expected 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP.

Observed 95% CL excluded cross section for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP.

Expected 95% CL excluded cross section for the stop pair production model with bino LSP.

Observed 95% CL excluded cross section for the stop pair production model with bino LSP.

Expected 95% CL excluded cross section for the stop pair production model with wino LSP.

Observed 95% CL excluded cross section for the stop pair production model with wino LSP.

Expected 95% CL excluded cross section for the stop pair production model with higgsino LSP.

Observed 95% CL excluded cross section for the stop pair production model with higgsino LSP.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model in the $1\ell$ category.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model in the $2\ell^{\mathrm{sc}}$ category.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model in the $1\ell$ category.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model in the $2\ell^{\mathrm{sc}}$ category.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP in the $1\ell$ category.

Acceptance and efficiency for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with higgsino LSP in the $2\ell^{\mathrm{sc}}$ category.

Acceptance and efficiency for the stop model with higgsino LSP in the $1\ell$ category.

Acceptance and efficiency for the stop model with higgsino LSP in the $2\ell^{\mathrm{sc}}$ category.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 4 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 5 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 6 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 7 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $1\ell$ category with 8 jets, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Acceptance and efficiency for the or the electroweakino production model in the EWK analysis discovery SR for the $2\ell^{\mathrm{sc}}$ category, considering $\tilde{\chi}^0_1 \tilde{\chi}^0_2$ production.

Cut flow for the gluino $\tilde{g}\rightarrow q\bar{q}\tilde{\chi}^0_1\rightarrow q\bar{q}q\bar{q} \ell\nu$ model with $m_{\tilde{g}} = 2$ TeV and $m_{\tilde{\chi}^0_1} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow \bar{t}\tilde{t} \rightarrow \bar{t}\bar{b}\bar{s}$ model with with $m_{\tilde{g}} = 1.6$ TeV and $m_{\tilde{t}} = 1$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the gluino $\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1 \rightarrow t\bar{t} tbs$ model with $m_{\tilde{g}} = 2.2$ TeV and $m_{\tilde{\chi}^0_1} = 1.05$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the stop model with $m_{\tilde{t}} = 1.175$ TeV and $m_{\tilde{\chi}^0_1} = 0.7$ TeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^{\pm}_1 \tilde{\chi}^0_1$, with $m(\tilde{\chi}^{\pm}_1,\tilde{\chi}^0_1)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. In the $2\ell^{\mathrm{sc}}$ category no events are expected, as only one lepton is expected to be produced in the decay.Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Cut flow for the electroweakino production model, considering only the production of $\tilde{\chi}^0_1 \tilde{\chi}^0_2$, with $m(\tilde{\chi}^0_1,\tilde{\chi}^0_2)= 250$ GeV. The column labelled $\mathrm{N}_{\mathrm{raw}}$ shows the number of generated events, while $\mathrm{N}_{\mathrm{events}}$ shows the expected number of events with a luminosity of 139fb$^{−1}$. The last column shows the cut flow efficiency with respect to all weighted events. The events are skimmed by requiring at least one electron or muon that satisfies very loose identification criteria, where the lepton satisfies $p_{\mathrm{T}} > 25$ GeV. The efficiency of this cut is considered in the quoted efficiency of the lepton trigger requirement. Selections with negligible inefficiencies on the given sample, such as data quality requirements, are not displayed. Selections that have not been evaluated in the analysis or are not applicable are denoted with a dash (--).

Efficiency in the Single-bin SR as a function of the M(Sbottom) vs. M(N2) with the $\Delta$ M(N2,N1) $= 130$ GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $\min_{\Theta} < 0.5$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $\min_{\Theta} < 0.5$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $0.5 < \min_{\Theta} < 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $0.5 < \min_{\Theta} < 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Acceptance in the Multi-bin SR, $\min_{\Theta} > 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the acceptance is given in units of $10^{-4}$.

Efficiency in the Multi-bin SR, $\min_{\Theta} > 1.0$ bin as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV. Keep in mind that the efficiency is given in units of $10^{-2}$.

Observed upper limits on the signal cross section as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV.

Expected upper limits on the signal cross section as a function of the M(Sbottom) vs. M(N2) with the $\Delta M$(N2,N1) = 130 GeV.

Cutflows for the bechmarl signal point M(Sbottom) = 800 GeV, M(N2) = 180 GeV. Weighted event yields are reported starting with the "Preselection" line, normalized to an integrated luminosity of $139$ fb$^{−1}$.

Comparison of the expected and observed event yields in the signal regions. The top-quark and Z(mumu) background contributions are scaled with the normalization factors obtained from the background-only fit. The other contribution includes all the backgrounds not explicitly listed in the legend (V+jets except Z(mumu)+jets, di-/triboson, multijet). The hatched band indicates the total statistical and systematic uncertainties in the SM background. The contributions from three signal models to the signal regions are also displayed, where the masses M(Sbottom) and M(N2) are given in GeV in the legend. The lower panel shows the significance of the deviation of the observed yield from the expected background yield.

Dominant systematic uncertainties in the background prediction for the signal regions after the fit to the control regions. “Other” includes the uncertainties arising from muons, jet-vertex tagging, modeling of pile-up, the $E_{T}^{miss}$ computation, multijet background, and luminosity. The individual uncertainties can be correlated and do not necessarily add up quadratically to the total uncertainty.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Excitation function at pion c.m. angle THETA=49 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=57 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=63 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=69 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=75 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at THETA=81 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=87 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=93 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=99 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=104 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=110 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=117 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=123 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=130 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=138 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=148 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Excitation function at pion c.m. angle THETA=162 deg as function of incident photon energy E. The uncertainties are statistical and systematic, combined in quadrature.

Total cross section as a function of incident photon energy E.

Excitation function at cos(Theta_pi0)cm = -0.65

Excitation function at cos(Theta_pi0)cm = -0.55

Excitation function at cos(Theta_pi0)cm = -0.45

Excitation function at cos(Theta_pi0)cm = -0.35

Excitation function at cos(Theta_pi0)cm = -0.25

Excitation function at cos(Theta_pi0)cm = -0.15

Excitation function at cos(Theta_pi0)cm = -0.05

Excitation function at cos(Theta_pi0)cm = 0.05

Excitation function at cos(Theta_pi0)cm = 0.15

Excitation function at cos(Theta_pi0)cm = 0.25

Excitation function at cos(Theta_pi0)cm = 0.35

Excitation function at cos(Theta_pi0)cm = 0.45

Excitation function at cos(Theta_pi0)cm = 0.55

Excitation function at cos(Theta_pi0)cm = 0.65

Excitation function at cos(Theta_pi0)cm = 0.75

Excitation function at cos(Theta_pi0)cm = 0.85

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Axis error includes +- 20/20 contribution.

Values of $g_1^{NS}$ for the COMPASS data in ($x$, $Q^2$) bins.

Parameters of two solutions of the QCD fit. The assumed functional form at $Q^2_0 = 1 ($GeV$/c)^2$ is $q(x) = \eta x^\alpha (1-x)^\beta (1 + \gamma x)/N$ where N is the normalisation. The parametrisation is used for the singlet and gluon helicity distribution and the two non-singlet distributions $\Delta q_3$ and $\Delta q_8$.

Normalisations of the different data sets used in the QCD fit.