Correlations in the PT distribution.

Normalised fiducial cross section in bins of the Mass of the WZ.

Correlations in the Mass distribution.

The measured individual cross sections in the fiducial region and the combined cross sections for 4-muon and 4-electron final states at a centre-of-collision energy of 8 TeV.

The measured individual cross sections in the fiducial region and the combined cross sections for for 2-muon-2-electron final states at a centre-of-collision energy of 8 TeV.

The measured cross section for four-lepton final states at a centre-of-collision energy of 8 TeV.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Truth $P_{T}^{Z}$ distribution after reweghting to data.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with dressed leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63717.4 $\pm$ 252.4, NPowHeg truth =338714.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63855.8 $\pm$ 252.7 , NPowHeg truth =338708.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64809.8 $\pm$ 254.6, NPowHeg truth =634285.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64822.9 $\pm$ 254.6, NPowHeg truth =634276.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64273.2 $\pm$ 253.5, NPowHeg truth =338671.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 65362.4 $\pm$ 255.7 , NPowHeg truth =634214.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 63486.8 $\pm$ 252.0, NPowHeg truth =333348.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>20$ GeV. Nexp.un f. = 64432.6 $\pm$ 253.8, NPowHeg truth =624059.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57095.9 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =76327.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57130 $\pm$ 254 , NPowHeg truth =301666, N Sherpa truth =763273.

Combined Covariance Matrix for Unfolded $M(l^{+}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58310.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded $M(l^{-}\gamma)$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58320.9 $\pm$ 245, NPowHeg truth =564672, N Sherpa truth =814016.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57705.4 $\pm$ 254 , NPowHeg truth =301655, N Sherpa truth =763259.

Combined Covariance Matrix for Unfolded dR distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58869.2 $\pm$ 256, NPowHeg truth =564660, NS herpa truth =813995.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to ee\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 57358.6 $\pm$ 254 , NPowHeg truth =298662, N Sherpa truth =756609.

Combined Covariance Matrix for Unfolded $P_{T}^{\gamma}$ distribution for $Z \to \mu\mu\gamma$ process with bare leptons and bkg subtraction. $M_{ll}>45$ GeV. Nexp.un f. = 58226.4 $\pm$ 254, NPowHeg truth =558949, N Sherpa truth =806988.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded $M(l^{+}\gamma\gamma)$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded dR distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with dressed leptons.

Unfolded dRgg distribution for $Z \to ll\gamma\gamma$ process with bare leptons.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for leading photon.

Unfolded $P_{T}^{\gamma 1}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for leading photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with dressed leptons for second photon.

Unfolded $P_{T}^{\gamma 2}$ distribution for $Z \to ll\gamma\gamma$ process with bare leptons for second photon.

The effective mass distribution in VR2Z.

The ETmiss distribution in SR0noZa.

The effective mass distribution in SR0noZa.

The ETmiss distribution in SR1noZa.

The effective mass distribution in SR1noZa.

The ETmiss distribution in SR2noZa.

The effective mass distribution in SR2noZa.

The ETmiss distribution in SR0noZb.

The effective mass distribution in SR0noZb.

The ETmiss distribution in SR1noZb.

The effective mass distribution in SR1noZb.

The ETmiss distribution in SR2noZb.

The effective mass distribution in SR2noZb.

The ETmiss distribution in SR0Z.

The effective mass distribution in SR0Z.

The ETmiss distribution in SR1Z.

The effective mass distribution in SR1Z.

The ETmiss distribution in SR2Z.

The effective mass distribution in SR2Z.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV chargino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV gluino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Lslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV Rslepton NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_121 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_122 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_133 != 0.

Observed 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Expected 95% CL exclusion contour for the RPV sneutrino NLSP model with lambda_233 != 0.

Observed 95% CL exclusion contour for the R-slepton RPC model.

Expected 95% CL exclusion contour for the R-slepton RPC model.

Observed and expected 95% CL cross-section upper limits for the Stau RPC model, together with the theoretically predicted cross-section.

Observed and expected 95% CL cross-section upper limits for the Z RPC model, together with the theoretically predicted cross-section.

Observed 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Expected 95% CL exclusion contour for the GGM tan beta = 1.5 model.

Observed 95% CL exclusion contour for the GGM tan beta = 30 model.

Expected 95% CL exclusion contour for the GGM tan beta = 30 model.

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV chargino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV gluino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Lslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV Rslepton NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_121 != 0 and lambda_122 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the RPV sneutrino NLSP models with lambda_133 != 0 and lambda_233 != 0, and the selection of Z-veto signal regions used to set limits in these models. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bba' means that the regions SR0noZb, SR1noZb and SR2noZa were used, in addition to the three Z-rich regions (SR0-2Z).

Observed 95% CL cross-section upper limit for the R-slepton RPC model, and the selection of Z-veto signal regions used to set limits in this model. The combination of regions used is ordered by the minimum number of hadronic taus required. For example, ``bbb' means that the regions SR0noZb, SR1noZb and SR2noZb were used, in addition to the three Z-rich regions (SR0-2Z). For the RPC stau and Z models, the ``aaa' combination of regions was used throughout.

Performance of the SR0noZa selection in the R-slepton RPC model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0noZb selection in the RPV chargino NLSP model with lambda_121 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR1noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZa selection in the RPV sneutrino NLSP model with lambda_233 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR2noZb selection in the RPV gluino NLSP model with lambda_133 != 0: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Performance of the SR0Z selection in the GGM tan beta = 30 model: number of generated signal events; total signal cross-section; acceptance; efficiency; total experimental systematic uncertainty, not including Monte Carlo statistics; observed CL using this region alone; expected CL using this region alone.

Cut flows for a representative selection of SUSY signal points in the Z-veto signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows for a representative selection of SUSY signal points in the Z-rich signal regions. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses (or the value of mu in the case of GGM models). The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0noZa signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPC R-slepton model is used, with (m2,m1) = (450,300) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR1noZb signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the larger of the two masses. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The RPV gluino NLSP model is used, with lambda_133 != 0 and (m2,m1) = (800,400) GeV.

Cut flows by lepton channel for a representative selection of SUSY signal points in the SR0Z signal region. In each case, m2 and m1 refer to the axes of the plots in Sec. XI, where m2 is the value of mu. The number of events expected for a luminosity of 20.3 fb-1 is quoted at each step of the selection. The preselection requires four baseline leptons, at least two of which are light leptons; the signal lepton selection is made at the ``Lepton Multiplicity' stage. ``Event Cleaning' refers to the selection criteria applied to remove non-collision backgrounds and detector noise. The GGM tan beta = 30 model is used, with (m2,m1) = (200,1000) GeV.

Measured fiducial cross sections for successive exclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\righarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for Deltaphijj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for the jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events.

Non-perturbative corrections for the jet pT in Z/gamma*(->ll)+1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=2 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=3 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=4 jet events.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for $H_{\text{T}}$.

Non-perturbative corrections for HT.

Non-perturbative corrections for $\Delta\phi_{jj}$.

Non-perturbative corrections for Deltaphijj.

Non-perturbative corrections for $m_{jj}$.

Non-perturbative corrections for mjj.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet pT for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet $p_{\text{T}}$ for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of HT averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $H_{\text{T}}$ averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of Deltaphijj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $\Delta\phi_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the mjj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the $m_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

The distribution of ratio of cross sections for successive exclusive jet multiplicities n/(n-1). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of exclusive jet multiplicity, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ratio of cross sections for successive exclusive jet multiplicities, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Exclusive jet multiplicity, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Ratio of successive exclusive jet multiplicities, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (leading jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (2nd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (3rd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (4th jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(jet) Z+1jet exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(2nd jet)/pT(leading jet)). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z), Z+1jet, exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (leading jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (2nd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (4th jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Dy (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of M(jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DPhi (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DR (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of HT, the scalar pT sum of the jets and leptons. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ST, the scalar pT sum of the jets. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.