Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section upper limit vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Cross section vs m(GLUINO) for SMS model T5ZZ.

Number of events in the pTmiss CR, transfer factor, background prediction, and observed yield in each of the six pTmiss bins. The systematic uncertainties in the background prediction include the shape uncertainties in addition to the uncertainty in T. Also listed in the last column is the number of expected signal events and corresponding statistical uncertainties for one example mass point, m(GLUINO) = 1700 GeV. The last pTmiss bin includes overflows.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 6 pTmiss bins.

Pre-fit background correlation matrix $\rho_{xy}$ for the 6 pTmiss bins.

Observed significance (in standard deviations) of the T5ZZ signal model as a function of the gluino mass.

Cut flow for the signal for two example mass points of the T5ZZ signal model. Here the hadronic baseline is defined by $N_{\mathrm{jets}}\ge 2$, $p_T^{\mathrm{miss}}$ > 300 GeV, $H_T$ > 300 GeV, $\Delta\phi$ cuts, and the isolated photon, lepton and track veto.

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured charge asymmetry from the helicity fit for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Measured cross section from the helicity fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{L}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{-}_{R}$

Impact of groups of uncertainties on charge asymmetry versus $|y_{W}|$ for $W_{R}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on absolute differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on unpolarized charge asymmetry versus $|y_{W}|$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on normalized differential cross section versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Impact of groups of uncertainties on $A_{4}$ coefficient versus $|y_{W}|$ for $W^{+}$

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among normalized signal cross sections in the helicity fit, for combination of muon and electron channel. The cross sections are shown in Fig. 9 in paper

Correlation matrix among PDF nuisances parameters in the helicity fit with fixed signal cross sections, for combination of muon and electron channel. The postfit values for these nuisance parameters are shown in Fig. 20 in paper

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_R$

Postfit pulls and constraints for some nuisance parameters: $p_T^{W}$ binned $\mu_R$, $\mu_F$, $\mu_R\mu_F$ for $W_L$

Postfit pulls and constraints for some nuisance parameters: PDFs and $\alpha_S$

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with fixed signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Postfit pulls and constraints for all nuisance parameters in the W boson helicity fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured double differential cross section from the double-differential cross section fit, divided by 2D-bin area, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured fiducial cross sections and ratio from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential charge asymmetry from the double-differential cross section fit, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Measured differential cross section from the double-differential cross section fit, divided by bin width, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Impact of groups of uncertainties on charge asymmetry versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on absolute differential cross section versus lepton $p_{T}$, for combination of muon and electron channel

Impact of groups of uncertainties on normalized differential cross section versus lepton $|\eta|$, for combination of muon and electron channel

Postfit pulls and constraints for all nuisance parameters in the W boson double-differential cross section fit with floating signal cross sections, from combination of electron and muon channel. The convention adopted to name nuisance parameters in the tables is reported in glossary_nuisAndPois.txt

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $10<p_{\textrm{T}}^{\mu}<20$ GeV selection in the $\mu-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $e-\mu$ channel.

The number of data and fitted simulated events in each bin of the $|d_{0}^{\mu}|$ distribution in the $20<p_{\textrm{T}}^{\mu}<250$ GeV selection in the $\mu-\mu$ channel.

The measurement of the ratio of the rate of decay of W bosons to τ-leptons and muons, $R(\tau/\mu)=B(W\rightarrow\tau\nu_\tau)/B(W\rightarrow \mu\nu_\mu)$.

Mean $p_T$ values of the $\Upsilon(1$S$)$, $\Upsilon(2$S$)$, and $\Upsilon(3$S$)$ states with $p_T\,>\,0\,GeV$ and $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $0<p_T<5\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $5<p_T<7\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $7<p_T<9\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $9<p_T<11\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $11<p_T<15\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $15<p_T<20\,$GeV range

Ratio $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $20<p_T<50\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $0<p_T<5\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $5<p_T<7\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $7<p_T<9\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $9<p_T<11\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $11<p_T<15\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $15<p_T<20\,$GeV range

Ratio $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ with $|y|\,<\,1.2$ as a function of track multiplicity $N_{track}$ in $20<p_T<50\,$GeV range

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of "forward" track multiplicity $N_{track}^{\Delta\phi}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$. Forward tracks are those with momentum direction in $\Delta\phi\,<\,\pi/3$ w.r.t. the $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of "transverse" track multiplicity $N_{track}^{\Delta\phi}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$. Transverse tracks are those with momentum direction in $\pi/3\,<\,\Delta\phi\,<\,2\pi/3$ w.r.t. the $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of "backward" track multiplicity $N_{track}^{\Delta\phi}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$. Backward tracks are those with momentum direction in $\Delta\phi\,>\,2\pi/3$ w.r.t. the $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$ and $N^{\Delta R}_{track}\,=\,0$ charged particles produced in $\Delta R\,<\,0.5$ cone around $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$ and $N^{\Delta R}_{track}\,=\,1$ charged particles produced in $\Delta R\,<\,0.5$ cone around $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$ and $N^{\Delta R}_{track}\,=\,2$ charged particles produced in $\Delta R\,<\,0.5$ cone around $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$ and $N^{\Delta R}_{track}\,>\,2$ charged particles produced in $\Delta R\,<\,0.5$ cone around $\Upsilon(n$S$)$ momentum direction.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ in transverse sphericity bin $0.00\,<\,S_T\,<\,0.55$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ in transverse sphericity bin $0.55\,<\,S_T\,<\,0.70$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ in transverse sphericity bin $0.70\,<\,S_T\,<\,0.85$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$.

Ratios $\Upsilon(2$S$)\,/\,\Upsilon(1$S$)$ and $\Upsilon(3$S$)\,/\,\Upsilon(1$S$)$ as functions of track multiplicity $N_{track}$ in transverse sphericity bin $0.85\,<\,S_T\,<\,1.00$ for $\Upsilon(n$S$)$ states with $p_T\,>\,7\,GeV$ and $|y|\,<\,1.2$.

Efficiency-corrected multiplicity bins used in the $\Upsilon(n$S$)$ ratio analysis and the corresponding mean number of charged particle tracks.

The correlation matrix for the njet measurement. The last bin is inclusive.

The fiducial integrated signal strength and cross section The uncertainty breakdown is given in terms of statistical (stat), experimental (exp), theoretical uncertainties on the background (bkg) and on the signal (sig), and the luminosity uncertainty (lumi). The fiducial cross section and its full uncertainty in each bin are also given.

Measured cross sections obtained with the BDT-based analyses. The uncertainties listed are statistical and systematic. For the results listed in the left (right) half of the table, Higgs boson contributions are counted as signal (background). The VVV cross section is calculated from the fit for \mu_{comb}. For ZZZ production, 95% confidence level upper limits are reported.

$v_{2}$ of $\Upsilon(\mathrm{1S})$ as a function of $p_{\mathrm{T}}$ in three centrality ranges, 10-30%, 30-50% and 50-90%.

$v_{2}$ of $\Upsilon(\mathrm{1S})$ as a function of $p_{\mathrm{T}}$ in 5-60% centrality range.

$\pi^0$ spectra from figure 2a from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\pi^0$ spectra from figure 2a from 60-80% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ spectra from figure 2b from minimum bias U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ spectra from figure 2b from 0-20% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ spectra from figure 2b from 20-40% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ spectra from figure 2b from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ spectra from figure 2b from 60-80% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

Ratio of $\pi^0$ yield to the fit from figure 2c from minimum bias U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

Ratio of $\pi^0$ yield to the fit from figure 2c from 0-20% U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

Ratio of $\pi^0$ yield to the fit from figure 2c from 60-80% U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

Ratio of $\eta$ yield to the fit from figure 2d from minimum bias U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

Ratio of $\eta$ yield to the fit from figure 2d from 0-20% U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

Ratio of $\eta$ yield to the fit from figure 2d from 40-60% U+U collisions. Sys. uncertainties include B and C uncertainties from data points.

$\eta/\pi^0$ ratio from figure 3 from minimum bias U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\eta/\pi^0$ ratio from figure 3 from 0-20% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\eta/\pi^0$ ratio from figure 3 from 20-40% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\eta/\pi^0$ ratio from figure 3 from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\eta/\pi^0$ ratio from figure 3 from 60-80% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\eta/\pi^0$ ratio from figure 3 from minimum bias Au+Au collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point.

$\pi^0$ $R_{AA}$ from figure 4a from 0-20% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\eta$ $R_{AA}$ from figure 4a from 0-20% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\pi^0$ $R_{AA}$ from figure 4b from 20-40% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\eta$ $R_{AA}$ from figure 4b from 20-40% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\pi^0$ $R_{AA}$ from figure 4c from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\eta$ $R_{AA}$ from figure 4c from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\pi^0$ $R_{AA}$ from figure 4d from minimum bias U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\eta$ $R_{AA}$ from figure 4d from minimum bias U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\pi^0$ $R_{AA}$ from figure 5a from 0-20% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 2 set.

$\pi^0$ $R_{AA}$ from figure 5a from 0-5% Au+Au collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\pi^0$ $R_{AA}$ from figure 5a from 40-60% U+U collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 2 set.

$\pi^0$ $R_{AA}$ from figure 5a from 40-50% Au+Au collisions. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\pi^0$ integrated $R_{AA}$ for $p_T>5$ GeV/$c$ in U+U collisions as a function of centrality from figure 6a. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\eta$ integrated $R_{AA}$ for $p_T>5$ GeV/$c$ in U+U collisions as a function of centrality from figure 6a. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 1 set.

$\pi^0$ integrated $R_{AA}$ for $p_T>5$ GeV/$c$ in Au+Au collisions as a function of centrality from figure 6a. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data.

$\eta$ integrated $R_{AA}$ for $p_T>5$ GeV/$c$ in U+U collisions as a function of centrality from figure 6b. Type A uncertainties are uncorrelated point-to-point. Type B uncertainties are correlated point-to-point. Type C uncertainties affect the scale of the data. Calculation is carried out for Glauber 2 set.

Number of participant nucleons of in dep U$+$U collisions

Number of participant nucleons of in dep U$+$U collisions

Number of participant nucleons of in dep Au$+$Au collisions