Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

Upper limits at 95% CL on the gluon-gluon fusion cross section for a heavy Higgs boson as a function of its mass and its width relative to a SM-like Higgs boson.

Upper limits at 95% CL on the VBF cross section for a heavy Higgs boson as a function of its mass and its width relative to a SM-like Higgs boson.

Differential cross-section for $Z$+jet in the leading jet pseudorapidity, $\eta^{\mathrm{jet}}$.

Differential cross-section for $Z$+jet in the boson $Z$ rapidity, $y^Z$.

Cross-section for $Z$+jet production, differential in the $Z$ boson transverse momentum, $p_{T}^{Z}$.

Cross-section for $Z$+jet production, differential in the difference in $\phi$ between the $Z$ boson and the leading jet, $\Delta \phi$.

Cross-section for $Z$+jet production, differential in the difference in rapidity between the $Z$ boson and the leading jet, $\Delta y$.

The distribution of ratio of cross sections for successive exclusive jet multiplicities n/(n-1). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of exclusive jet multiplicity, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ratio of cross sections for successive exclusive jet multiplicities, pT(jet1) > 150 GeV. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Exclusive jet multiplicity, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Ratio of successive exclusive jet multiplicities, M(jj)>350, Dy(jj) >3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (leading jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (2nd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (3rd jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT (4th jet) [GeV]. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(jet) Z+1jet exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(2nd jet)/pT(leading jet)). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(Z), Z+1jet, exclusive. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (leading jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (2nd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (4th jet). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of Dy (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of M(jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DPhi (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of DR (jj). The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of pT(3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of |y| (3rd jet), m(jj) > 350 GeV, Dy(jj) > 3.0. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of HT, the scalar pT sum of the jets and leptons. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

The distribution of ST, the scalar pT sum of the jets. The first (sys) error is the uncorrelated systematic error and the second the correlated systematic error.

Measured differential cross section dsigma/dET in pb/GeV given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dET in pb/GeV given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

The cross section measurement as a function of the transverse momentum of the second leading jet.

The cross section measurement as a function of the transverse momentum of the third leading jet.

The cross section measurement as a function of the transverse momentum of the fourth leading jet.

The cross section measurement as a function of the absolute value of the pseudorapidity of the leading jet.

The cross section measurement as a function of the absolute value of the pseudorapidity of the second leading jet.

The cross section measurement as a function of the absolute value of the pseudorapidity of the third leading jet.

The cross section measurement as a function of the absolute value of the pseudorapidity of the fourth leading jet.

The cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of one or more.

The cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of two or more.

The cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of three or more.

The cross section measurement as a function of the scalar sum of the transverse momenta of jets (HT) for jet multiplicities of four or more.