Measured total $t\bar{t}\gamma$ production and decay fiducial inclusive cross-sections in both decay channels and in the combination.

Summary of the impact of the systematic uncertainties on the $t\bar{t}\gamma$ fiducial inclusive cross-section in the single-lepton and dilepton channels and their combination grouped into different categories. The quoted relative uncertainties are obtained by repeating the fit, fixing a set of nuisance parameters of the sources corresponding to each category to their post-fit values, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit. The total uncertainty is different from the sum in quadrature of the components due to correlations among nuisance parameters.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,l)$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,l)$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l)_{min}$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l)_{min}$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $p_T$. The last bin of the distributions includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $p_T$. The last bin of the distributions includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $|\eta|$.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $|\eta|$.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $|\eta(\gamma)|$.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $|\eta(\gamma)|$.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,l)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(\gamma,l)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $|\Delta \eta(l,l)|$ . The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $|\Delta \eta(l,l)|$ . The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta \phi(l,l)$ . The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta \phi(l,l)$ . The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $p_T(l,l)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $p_T(l,l)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l_1)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l_1)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l_2)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l_2)$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $|\eta(\gamma)|$.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $|\eta(\gamma)|$.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the single-lepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $|\eta(\gamma)|$.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $|\eta(\gamma)|$.

Absolute $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Normalised $t\bar{t}\gamma$ production differential cross-sections measured in fiducial phase space in the dilepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $p_T(\gamma)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $|\eta(\gamma)|$.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $|\eta(\gamma)|$.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the single-lepton channel as a function of the $p_T(j_1)$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,b)_{min}$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l)_{min}$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(\gamma,l)_{min}$. The last bin of the distribution includes the overflow events.

Absolute differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Normalised differential cross-section of the total $t\bar{t}\gamma$ production and decay measured in fiducial phase space in the dilepton channel as a function of the $\Delta R(l,j)_{min}$. The last bin of the distribution includes the overflow events.

Observed and expected 68% and 95% credible intervals on $C/\Lambda^2\ [\text{TeV}^{-2} ]$ for the $C_{tW}$ operators and $C_{tB}$ obtained from the $t\bar{t}\gamma$ measurement, comparing the results obtained from the marginalised quadratic fit (‘marg.’) and the independent quadratic fits (‘indep.’). Also shown are the best-fit values (global mode) for each operator.

Observed and expected 68% and 95% credible intervals on $C/\Lambda^2\ [\text{TeV}^{-2} ]$ for the $C_{tW}$ operators and $C_{tB}$ obtained from a combined $t\bar{t}Z$ and $t\bar{t}\gamma$ measurements comparing the results obtained from the marginalised global quadratic fit (‘marg.’) and the independent quadratic fits (‘indep.’). Also shown are the best-fit values (global mode) for each operator.

Contributions of the systematic uncertainties grouped in categories in each bin of the measurement of the absolute $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $p_T$. The relative uncertainties quoted are obtained by repeating the fit, fixing the set of nuisance parameters of the sources corresponding to each category to their post-fit values, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit.

Contributions of the systematic uncertainties grouped in categories in each bin of the measurement of the absolute $t\bar{t}\gamma$ production differential cross-sections measured in the combined fiducial phase space of the single-lepton and dilepton channels as a function of the photon $\eta$. The relative uncertainties quoted are obtained by repeating the fit, fixing the set of nuisance parameters of the sources corresponding to each category to their post-fit values, and subtracting in quadrature the resulting uncertainty from the total uncertainty of the nominal fit.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.