Impact of different components of systematic uncertainty on the measured fiducial cross section, without taking into account correlations. The impact of one source of systematic uncertainty is computed by first performing the fit with the corresponding nuisance parameter fixed to one standard deviation up or down from the value obtained in the nominal fit, then these up and down variations are symmetrized. The impacts of several sources of systematic uncertainty are added in quadrature for each component. The categorization of sources of systematic uncertainties into experimental and theory modeling correspond to those used for the measured fiducial cross section.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dijet invariant mass, $m_{jj}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Efficiency correction factor $C_{WW}$, defined as the ratio of the number of reconstructed $W^{\pm}W^{\pm}jj$ electroweak events in the signal region over the number of events generated in the fiducial phase space, in bins of the dilepton invariant mass, $m_{ll}$. The numbers are shown with their statistical and systematic uncertainties added in quadrature. The $C_{WW}$ factors have been calculated with Sherpa v2.2.2. The last bin includes the overflow.

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Lower mass requirement for signal regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected and observed events in the 16 discovery regions along with the according control regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector R-hadron search.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

p0-values and model-independent upper limits on cross-section x acceptance x efficiency for the 16 discovery regions.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the MS-agnostic search for metastable gluino R-hadrons.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector direct-stau search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Expected signal yield and acceptance x efficiency, estimated background and observed number of events in data for the full range of simulated masses in the full-detector chargino search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in gluino R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in sbottom R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stop R-hadron search.

Upper cross-section limit in stau search.

Upper cross-section limit in stau search.

Upper cross-section limit in chargino search.

Upper cross-section limit in chargino search.

Lower mass limit as function of gluino lifetime.

Lower mass limit as function of gluino lifetime.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Acceptance x efficiency, acceptance and efficiency for the full range of simulated masses in the MS-agnostic R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Upper cross-section limit in meta-stable gluino R-hadron search.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the generic model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

Flavor composition of 800 GeV anti-stop R-hadrons simulated using the Regge model as a function of radial distance from the interaction point.

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

ETmiss trigger efficiency as function of true ETmiss (EtmissTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Single-muon trigger efficiency as function of $|\eta|$ and $\beta$ (SingleMuTurnOn).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for ID+Calo selection (IDCaloEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Candidate reconstruction efficiency for loose selection (LooseEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Efficiency for a loose candidate to be promoted to a tight candidate (TightPromotionEff).

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed dE/dx mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for ID+calo candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

Resolution and average of reconstructed ToF mass for a given simulated mass for FullDet candidates.

List of relative uncertainties in the measured cross sections of the $t\bar{t}Z$ and $t\bar{t}W$ processes from the fit, grouped in categories. All uncertainties are symmetrized. The sum in quadrature may not be equal to the total due to correlations between uncertainties introduced by the fit.

The expected and observed 68% and 95% confidence intervals, which include the value 0, for $\mathcal{C}_{i}/\Lambda^{2}$ for the EFT coefficients $\mathcal{C}_{\phi Q}^{(3)}$, $\mathcal{C}_{\phi t}$, $\mathcal{C}_{tB}$ and $\mathcal{C}_{tW}$. The intervals for $\mathcal{C}_{\phi Q}^{(3)}$ are derived setting $\mathcal{C}_{\phi Q}^{(1)}$ to zero; the measurement is sensitive to the difference $\mathcal{C}_{\phi Q}^{(3)}-\mathcal{C}_{\phi Q}^{(1)}$. All results are given in units of 1/TeV$^{2}$. Limits from fits for the EFT coefficients with only the linear term are also shown.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon pT in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of minimum $\Delta R) between the photon and the leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $|\Delta\eta|$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The measured normalized differential cross section as a function of $\Delta\phi$ between the two leptons in the dilepton channel. The uncertainty is decomposed into five components which are the signal modelling uncertainty, the experimental uncertainty, the ttbar modelling uncertainty, the other background estimation uncertainty, and the data statistical uncertainty.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta R$ between the photon and the lepton in the single lepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon pT in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the photon $|\eta|$ in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the minimum $\Delta R$ between the photon and the leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $|\Delta\eta|$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The total correlation matrix of the measured normalized differential cross section as a function of the $\Delta\phi$ between the two leptons in the dilepton channel. The individual systematic uncertainties are symmetrized before deriving the correlation matrix.

The statistical correlation matrix of all the measured normalized differential cross sections in the single lepton channel.

The statistical correlation matrix of all the measured normalized differential cross sections in the dilepton channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Dirac $N_R$ neutrino $ee$ channel.

Expected 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL exclusion contour in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed and expected 95% CL exclusion, for the tested signal mass hypotheses in the $m_{W_R}–m_{N_R}$ plane, for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $ee$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $ee$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Majorana $N_R$ neutrino $\mu\mu$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $ee$ channel.

Observed 95% CL upper limit on cross-section times branching ratio to the $\mu\mu$ final state for the Keung-Senjanovic process in the $m_{W_R}–m_{N_R}$ plane for the Dirac $N_R$ neutrino $\mu\mu$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the SS $e^{\pm}e^{\pm}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the SS $\mu^{\pm}\mu^{\pm}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the OS $e^{\pm}e^{\mp}$ channel.

Efficiencies times acceptance for signal region selection as a function of the signal $W_R$ and $N_R$ masses for the OS $\mu^{\pm}\mu^{\mp}$ channel.

The systematic uncertainty on the unfolded distribution as a function of minimax-mbl, broken down by components.

The covariance matrix for the unfolded, normalized data in bins of minimax-mbl shown in Figure 2. Redundant entries are suppressed.

Leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading lepton pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet transverse momentum distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

Sub-leading b-jet pseudorapidity distribution for events passing the signal selection in bins of minimax-mbl. The data here are not unfolded.

The detector-level minimax-m(bl) distribution for events entering the Z+jets control region.

The detector-level minimax-m(bl) distribution for events entering the same-sign lepton control region.

Exclusion limits on higgsino pair production divided by the theory cross-section.The results of the low-mass analysis are used below m(higgsino) = 300 GeV, while those of the high-mass analysis are used above. The figure shows the observed and expected 95% upper limits on the higgsino pair production cross-section as a function of m(higgsino).

Observed and expected 95% limits in the m(higgsino) vs BR(higgsino to higgs+gravitino) plane. The regions above the lines are excluded by the analyses.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the high-mass search, divided by the theory cross section. Only the high-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search. Only the low-mass analysis results are used in this figure.

The observed and expected 95% upper limits on the total pair production cross section for degenerate higgsinos as a function of m(higgsino) for the low-mass search, divided by the theory cross section. Only the low-mass analysis results are used in this figure.

Particle-level acceptance for the low-mass discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the low-mass analysis, for the two discovery signal regions low-SR-MET0-meff440 and low-SR-MET150-meff440, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Particle-level acceptance for the high-mass discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, shown as a function of higgsino mass. The acceptance is defined as the fraction of signal events passing the particle-level event selection that emulates the detector-level selection. The acceptance calculation considers only those signal events where both higgsinos decay to Higgs bosons that subsequently both decay to b-quarks.

The experimental efficiency of the high-mass analysis, for the two discovery signal regions SR-4b-meff1-A-disc and SR-3b-meff3-A, as a function of higgsino mass. The experimental efficiency is defined as the number of events passing the detector-level event selection divided by the number of events passing the event selection for a perfect detector. The denominator is obtained by implementing particle-level event selection that emulate the detector-level selection. Such particle-level selection is not applied on the numerator.

Example cutflow for SR-3b-meff3-A.

Example cutflow for SR-4b-meff1-A-disc.

Cutflow for low-mass analysis for each signal mass point.

Dijet mass spectra after the background only fit with the background prediction in the high-mass region with two b-tags.

Dijet mass spectra after the background only fit with the background prediction in the low-mass region with two b-tags.

The online b-tagging efficiency with respect to the offline b-tagging efficiency as a function of pT. The b-tagging online and offline working points correspond to an efficiency of 60% and 70%, respectively.

Observed and expected 95% credibility-level upper limits on the cross-section for the b* model in the high-mass region with inclusive b-jet selection.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for the SSM and leptophobic Z' models in the low- and high-mass region with two b-tags selection.

Observed and expected 95% credibility-level upper limits on the cross-section for DM Z' models in the low-mass region with two b-tags selection. The Z' is expected to decay to all five quark flavors other than the top quark and the mediator to SM quark coupling (gSM) equal to 0.1 is assumed.

Observed and expected 95% credibility-level upper limits on the cross-section times branching ratio for DM Z'->bb models in the high-mass region with two b-tags selection. The Z' is expected to decay to bb only and the mediator to SM quark coupling (gSM) equal to 0.25 is assumed.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the high-mass inclusive one b-tag selection.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances with intrinsic width smaller than the detector resolution. The width of the Gaussian reconstructed shape is dominated by the dijet mass resolution. The table shows the limits obtained from the combined low- and high-mass two b-tags selection.

The mass distributions for the inclusive one b-tagged selection and two b-tagged selection using an integrated luminosity of 36.1 $fb^{-1}$. The inclusive one b-tagged Pythia8 MC distribution is normalized to the inclusive one b-tagged data. The two b-tagged Pythia8 MC distribution is normalized to the two b-tagged data. The systematic uncertainty band is dominated by the b-tagging scale factor and the b-jet energy scale.

Signal acceptance times efficiency for inclusive 1 b-tag and 2 b-tag categories as a function of the simulated b* and the Z' masses.

Signal acceptance times efficiency for 2 b-tag categories as a function of the simulated Z' masses.

The flavor composition of the simulated dijet background as a function of dijet mass before tagging. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with inclusive one b-tag. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

The flavor composition of the simulated dijet background as a function of dijet mass with two b-tags. The fraction of the six combinations of the b-jet , c-jet and light-flavor jet are shown. All offline selections are applied.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the inclusive b-jet selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 3%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 7%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 10%.

Observed and expected 95% credibility-level upper limits on cross section times acceptance times branching ratio of X --> bb, including kinematic acceptance and b-tagging efficiencies, for resonances exhibiting a generic Gaussian shape at particle level. The table shows the limits obtained from the combined low- and high-mass two b-tags selection. The limits corresponding to Gaussian-shaped resonances with width of Γ(X)/m(X) = 15%.

Acceptance for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Acceptance for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR1 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR2 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR3 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR4 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for SR5 in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Detector efficiency for best expected CLS SR in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR1 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR2 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR3 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR4 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

SR5 observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR1 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR2 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR3 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR4 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for SR5 in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Upper limits on signal cross sections and exclusion limits at 95% CL for the best expected SR in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

Minimum branching ratio excluded at 95% CL, assuming no sensitivity for other decay possibilities, in the $m(\tilde t_1/\tilde c_1)$-$m(\tilde\chi^0_1)$ plane for the stop/scharm pair production scenario.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

The signal region with the best expected CLS value for each signal in the $\tilde{t}_1/\tilde{c}_1-\tilde{\chi}_1^0$ mass plane.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Expected exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Observed exclusion limit at 95% CL in the $m(\tilde t_1/\tilde c_1)$-$\Delta m$ plane for the stop/scharm pair production scenario.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR1. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR2. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR3. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR4. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Comparison between data and expectation after the background-only fit for the $E_{T}^{miss}$ distribution in SR5. The shaded band indicates detector-related systematic uncertainties and the statistical uncertainties of the MC samples, while the error bars on the data points indicate the data's statistical uncertainty. The final bin in each histogram includes the overflow. The lower panel shows the ratio of the data to the SM prediction after the background-only fit. The distribution is also shown for a representative signal point.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (450,425)$ GeV signal point for signal region SR1.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,420)$ GeV signal point for signal region SR2.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (500,350)$ GeV signal point for signal region SR3.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (600,350)$ GeV signal point for signal region SR4.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

Cutflow for the $(m_{\tilde{t}}, m_{\tilde{\chi}}) = (900,1)$ GeV signal point for signal region SR5.

The observed and expected 95% CL upper limits on the production cross section times branching ratio for SM non-resonant Higgs pair production.