The Charged-hadron yields as a function of pT in different y selections in p+Pb collisions.

The K^{0}_{S} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Lambda yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Xi^{-} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The K^{0}_{S} yields as a function of pT in different y selections in p+Pb collisions.

The #Lambda yields as a function of pT in different y selections in p+Pb collisions.

The #Xi^{-} yields as a function of pT in different y selections in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $2\mu+\text{jets}$ region of the incluse jet phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $2e+\text{jets}$ region of the incluse jet phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the inclusive jet phase space for $1\mu+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the inclusive jet phase space for $1e+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the inclusive jet phase space for $2\mu+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the inclusive jet phase space for $2e+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{miss}$ differential cross-sections in the $p_\text{T}^\text{miss}+\text{jets}$ region of the VBF phase spaces, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $1\mu+\text{jets}$ region of the VBF phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $1e+\text{jets}$ region of the VBF phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $2\mu+\text{jets}$ region of the VBF phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $p_\text{T}^\text{recoil}$ differential cross-sections in the $2e+\text{jets}$ region of the VBF phase space, compared with the SM predictions. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the VBF phase space for $1\mu+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the VBF phase space for $1e+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the VBF phase space for $2\mu+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $p_\text{T}^\text{recoil}$ in the VBF phase space for $2e+\text{jets}$. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $m_{jj}$ distribution in the VBF phase space compared with the SM predictions, for the $p_\text{T}^\text{miss}+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $m_{jj}$ distribution in the VBF phase space compared with the SM predictions, for the $1\mu+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $m_{jj}$ distribution in the VBF phase space compared with the SM predictions, for the $1e+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $m_{jj}$ distribution in the VBF phase space compared with the SM predictions, for the $2\mu+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $m_{jj}$ distribution in the VBF phase space compared with the SM predictions, for the $2e+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $m_{jj}$ in the $1\mu+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $m_{jj}$ in the $e+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $m_{jj}$ in the $2\mu+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $m_{jj}$ in the $2e+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $\Delta\phi_{jj}$ distributions in the VBF phase space compared with the SM predictions for the $p_\text{T}^\text{miss}+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $\Delta\phi_{jj}$ distributions in the VBF phase space compared with the SM predictions for the $1\mu+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $\Delta\phi_{jj}$ distributions in the VBF phase space compared with the SM predictions for the $1e+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $\Delta\phi_{jj}$ distributions in the VBF phase space compared with the SM predictions for the $2\mu+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured $\Delta\phi_{jj}$ distributions in the VBF phase space compared with the SM predictions for the $2e+\text{jets}$ region. The middle panels show the ratios of the predictions to the data, along with their uncertainties, while the lower panels show the relative contributions from different SM processes relative to the total MEPS@NLO prediction. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $\Delta\phi_{jj}$ in the $1\mu+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $\Delta\phi_{jj}$ in the $1e+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $\Delta\phi_{jj}$ in the $2\mu+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

Comparison with SM predictions of the $\text{R}_\text{miss}$ ratios of the measured differential cross-sections for $\Delta\phi_{jj}$ in the $2e+\text{jets}$ region of the VBF phase space. The bottom panels show the ratios of the predictions to the data, along with their uncertainties. Note that individually numbered PDF components ('dK_PDF_') in the uncertainty breakdown correspond to NNPDF Hessian eigenvectors. Uncertainty components labeled 'VV_dK' include Vjj processes.

The measured Z → νν cross-section, differential in p_T^Z in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured Z → νν cross-section, differential in p_T^Z in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured Z → νν cross-section, differential in p_T^Z in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured Z → νν cross-section, differential in p_T^Z in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the inclusive jet phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets,(e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured m_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured Δφ_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets (b) γ+jets (c) 2e+jets (d) 2μ+jets (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the inclusive jet phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets,(e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured m_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured Δφ_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets (b) γ+jets (c) 2e+jets (d) 2μ+jets (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the inclusive jet phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets,(e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured m_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured Δφ_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets (b) γ+jets (c) 2e+jets (d) 2μ+jets (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the inclusive jet phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets,(e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured p_T^Z, p_T^W and p_T^γ differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured m_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets, (b) γ+jets, (c) 2e+jets, (d) 2μ+jets, (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured Δφ_jj differential cross-sections in the VBF phase spaces compared with the SM predictions: (a) p_T^miss+jets (b) γ+jets (c) 2e+jets (d) 2μ+jets (e) e+jets and (f) μ+jets. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red shading).

The measured γ+jets cross-section, differential in p_T^γ in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured γ+jets cross-section, differential in p_T^γ in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured γ+jets cross-section, differential in p_T^γ in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

The measured γ+jets cross-section, differential in p_T^γ in the (a) single jet and (b) VBF phase spaces, and differential in (c) m_jj and (d) Δφ_jj in the VBF phase space, compared with the SM predictions. The lower panels show the ratios of the predictions to the data, along with the data statistical uncertainties (black bars) and systematic uncertainties (red hatched band).

SM processes contributing to the fiducial SM predictions shown in Figure 7a

SM processes contributing to the fiducial SM predictions shown in Figure 7b

SM processes contributing to the fiducial SM predictions shown in Figure 8a

SM processes contributing to the fiducial SM predictions shown in Figure 8b

SM processes contributing to the fiducial SM predictions shown in Figure 8c

SM processes contributing to the fiducial SM predictions shown in Figure 8d

SM processes contributing to the fiducial SM predictions shown in Figure 9a

SM processes contributing to the fiducial SM predictions shown in Figure 9b

SM processes contributing to the fiducial SM predictions shown in Figure 9c

SM processes contributing to the fiducial SM predictions shown in Figure 9d

SM processes contributing to the fiducial SM predictions shown in Figure 3b of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 3c of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 3d of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 3e of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 5b of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 5c of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 5d of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 7b of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 7c of Auxiliary Material

SM processes contributing to the fiducial SM predictions shown in Figure 7d of Auxiliary Material

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, $\geq 1$ jet phase space (Figure 7a) and $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, $\geq 1$ jet phase space (Figure 7a).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, $\geq 1$ jet phase space (Figure 7a) and $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 7b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, $\geq 1$ jet phase space (Figure 7a) and $m_{\text jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9a).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, $\geq 1$ jet phase space (Figure 7a) and $\Delta\phi_\text{jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 8c) and $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 8c).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 8c) and $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, VBF phase space (Figure 3d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 8c) and $m_{\text jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 5d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 8c) and $\Delta\phi_\text{jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 7d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, $\geq 1$ jet phase space (Figure 8a) and $p_\text{T}^\text{recoil}$ observable, 1e + jets region, $\geq 1$ jet phase space (Figure 8a).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, $\geq 1$ jet phase space (Figure 8a) and $p_\text{T}^\text{recoil}$ observable, 1e + jets region, VBF phase space (Figure 3b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, $\geq 1$ jet phase space (Figure 8a) and $m_{\text jj}$ observable, 1e + jets region, VBF phase space (Figure 5b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, $\geq 1$ jet phase space (Figure 8a) and $\Delta\phi_\text{jj}$ observable, 1e + jets region, VBF phase space (Figure 7b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 8d) and $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 8d).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 8d) and $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, VBF phase space (Figure 3e (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 8d) and $m_{\text jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9c).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 8d) and $\Delta\phi_\text{jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9d).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, $\geq 1$ jet phase space (Figure 8b) and $p_\text{T}^\text{recoil}$ observable, 2e + jets region, $\geq 1$ jet phase space (Figure 8b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, $\geq 1$ jet phase space (Figure 8b) and $p_\text{T}^\text{recoil}$ observable, 2e + jets region, VBF phase space (Figure 3c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, $\geq 1$ jet phase space (Figure 8b) and $m_{\text jj}$ observable, 2e + jets region, VBF phase space (Figure 5c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, $\geq 1$ jet phase space (Figure 8b) and $\Delta\phi_\text{jj}$ observable, 2e + jets region, VBF phase space (Figure 7c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 2c (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, $\geq 1$ jet phase space (Figure 2c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, $\geq 1$ jet phase space (Figure 10a) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, $\geq 1$ jet phase space (Figure 10a).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 2d (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, $\geq 1$ jet phase space (Figure 2d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, $\geq 1$ jet phase space (Figure 10b) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, $\geq 1$ jet phase space (Figure 10b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 7b) and $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 7b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 7b) and $m_{\text jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9a).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 7b) and $\Delta\phi_\text{jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9b).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, VBF phase space (Figure 3d (aux)) and $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, VBF phase space (Figure 3d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, VBF phase space (Figure 3d (aux)) and $m_{\text jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 5d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $1\mu$ + jets region, VBF phase space (Figure 3d (aux)) and $\Delta\phi_\text{jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 7d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, VBF phase space (Figure 3b (aux)) and $p_\text{T}^\text{recoil}$ observable, 1e + jets region, VBF phase space (Figure 3b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, VBF phase space (Figure 3b (aux)) and $m_{\text jj}$ observable, 1e + jets region, VBF phase space (Figure 5b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 1e + jets region, VBF phase space (Figure 3b (aux)) and $\Delta\phi_\text{jj}$ observable, 1e + jets region, VBF phase space (Figure 7b (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, VBF phase space (Figure 3e (aux)) and $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, VBF phase space (Figure 3e (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, VBF phase space (Figure 3e (aux)) and $m_{\text jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9c).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $2\mu$ + jets region, VBF phase space (Figure 3e (aux)) and $\Delta\phi_\text{jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9d).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, VBF phase space (Figure 3c (aux)) and $p_\text{T}^\text{recoil}$ observable, 2e + jets region, VBF phase space (Figure 3c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, VBF phase space (Figure 3c (aux)) and $m_{\text jj}$ observable, 2e + jets region, VBF phase space (Figure 5c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, 2e + jets region, VBF phase space (Figure 3c (aux)) and $\Delta\phi_\text{jj}$ observable, 2e + jets region, VBF phase space (Figure 7c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 4c (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 4c (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 4a (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 4a (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 4d (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 4d (aux)).

Statistical correlations between $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 4b (aux)) and $p_\text{T}^\text{recoil}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 4b (aux)).

Statistical correlations between $m_{\text jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9a) and $m_{\text jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9a).

Statistical correlations between $m_{\text jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9a) and $\Delta\phi_\text{jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9b).

Statistical correlations between $m_{\text jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 5d (aux)) and $m_{\text jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 5d (aux)).

Statistical correlations between $m_{\text jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 5d (aux)) and $\Delta\phi_\text{jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 7d (aux)).

Statistical correlations between $m_{\text jj}$ observable, 1e + jets region, VBF phase space (Figure 5b (aux)) and $m_{\text jj}$ observable, 1e + jets region, VBF phase space (Figure 5b (aux)).

Statistical correlations between $m_{\text jj}$ observable, 1e + jets region, VBF phase space (Figure 5b (aux)) and $\Delta\phi_\text{jj}$ observable, 1e + jets region, VBF phase space (Figure 7b (aux)).

Statistical correlations between $m_{\text jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9c) and $m_{\text jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9c).

Statistical correlations between $m_{\text jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9c) and $\Delta\phi_\text{jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9d).

Statistical correlations between $m_{\text jj}$ observable, 2e + jets region, VBF phase space (Figure 5c (aux)) and $m_{\text jj}$ observable, 2e + jets region, VBF phase space (Figure 5c (aux)).

Statistical correlations between $m_{\text jj}$ observable, 2e + jets region, VBF phase space (Figure 5c (aux)) and $\Delta\phi_\text{jj}$ observable, 2e + jets region, VBF phase space (Figure 7c (aux)).

Statistical correlations between $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 6c (aux)) and $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 6c (aux)).

Statistical correlations between $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 6a (aux)) and $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 6a (aux)).

Statistical correlations between $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 10c) and $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 10c).

Statistical correlations between $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 6b (aux)) and $m_{\text jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 6b (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9b) and $\Delta\phi_\text{jj}$ observable, $p_\text{T}^\text{miss}$ + jets region, VBF phase space (Figure 9b).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 7d (aux)) and $\Delta\phi_\text{jj}$ observable, $1\mu$ + jets region, VBF phase space (Figure 7d (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, 1e + jets region, VBF phase space (Figure 7b (aux)) and $\Delta\phi_\text{jj}$ observable, 1e + jets region, VBF phase space (Figure 7b (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9d) and $\Delta\phi_\text{jj}$ observable, $2\mu$ + jets region, VBF phase space (Figure 9d).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, 2e + jets region, VBF phase space (Figure 7c (aux)) and $\Delta\phi_\text{jj}$ observable, 2e + jets region, VBF phase space (Figure 7c (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 8c (aux)) and $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $1\mu$ + jets region, VBF phase space (Figure 8c (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 8a (aux)) and $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 1e + jets region, VBF phase space (Figure 8a (aux)).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 10d) and $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ $2\mu$ + jets region, VBF phase space (Figure 10d).

Statistical correlations between $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 8b (aux)) and $\Delta\phi_\text{jj}$ observable, $\text{R}_\text{miss}$ observable, $R_{miss}$ 2e + jets region, VBF phase space (Figure 8b (aux)).

Correlation matrix for the individual sources of systematic uncertainty considered in the analysis, for the combined opposite sign (OS) and same sign (SS) binned-template profile likelihood fit to data. The OS or SS refers to the charge signs of the primary lepton and the soft muon. The gamma parameters are NPs used to describe the effect of the limited statistics of the samples.

The unfolded differential charge asymmetry as a function of the transverse momentum of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded differential charge asymmetry as a function of the longitudinal boost of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded inclusive leptonic asymmetry. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the invariant mass of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the transverse momentum of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the longitudinal boost of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ inclusive measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ < 500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [500,750] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [750,1000] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [1000,1500] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ > 1500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ < 30 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ $\in$ [30,120] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ > 120 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ < 200 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [200,300] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [300,400] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ > 400 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ < 20 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ $\in$ [20, 70] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ > 70 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

Covariance matrix for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. The total (stat. + syst.) uncertainties are considered.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter &lambda; as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 71 &le; n_ch &lt; 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 231 &le; n_ch &lt; 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13&nbsp;TeV (black circles) and 7&nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 &lt; m_ch &le; 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 &nbsp;TeV (black circles) and 7 &nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 &lt; k_T &le;500 &nbsp;MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, &lambda;, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T &gt; 100&nbsp;MeV at &radic;s= 13&nbsp;TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |&eta;| &lt; 2.5 and both p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters &gamma; and &delta; resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 25$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 25$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

A comparison of the measured cell $E_T^{miss}$ distribution with that predicted by the two-component model for two pile-up scenarios. The magenta points extend the measured distribution using L1 $E_T^{miss} > 30\,$GeV and L1 $E_T^{miss} > 50\,$GeV data. The red curve is the prediction from the calorimeter-resolution part of the model. The green curve is the high $E_T^{miss}$ tail's probability distribution for the mean number of $pp$ interactions $\mu$ in each figure. The blue curve is the full model prediction computed by combining the $E_T^{miss}$ from these two individual sources shown in red and green, each calculated for $\mu=\langle\mu\rangle$. The black points show the unbiased $E_T^{miss}$ distribution measured in data. Corresponds to a prediction for $\langle\mu\rangle = 55$.

The $E_T^{miss}$ model predicted trigger rate as a function of $\mu$ for the cell $E_T^{miss}$ algorithm with a threshold of $80\,$GeV and $120\,$GeV, assuming no additional pile-up mitigation.

The L1 $E_T^{miss}$ trigger efficiency, shown as a function of $p_T(\mu\mu)$ in $Z\rightarrow\mu\mu$ events.

The efficiencies in the plot are shown for events satisfying a $Z\rightarrow\mu\mu$ selection and with $p_T(\mu\mu)$ larger than $150\,$GeV vs pile-up for each of the four years of data taking.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger rate as a function of $\langle\mu\rangle$ for runs in three different periods ($\alpha$, $\beta$, $\gamma$) in the year 2017.

The L1 $E_T^{miss}$ trigger efficiency is shown as a function of mean pile-up for events satisfying a $Z\rightarrow\mu\mu$ selection and with $p_T(\mu\mu)$ larger than $150\,$GeV in three periods during the year 2017.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $0\leq\langle\mu\rangle < 20$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $20\leq\langle\mu\rangle < 30$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $30\leq\langle\mu\rangle < 40$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Background acceptance vs signal efficiency for each of four individual HLT $E_T^{miss}$ algorithms for a $Z\rightarrow\mu\mu$ selection with $p_T(\mu\mu) > 175\,$GeV for data recorded in the year 2017. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger. $40\leq\langle\mu\rangle$.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Relative background acceptance fraction vs. relative efficiency for two different $p_T(\mu\mu)>150\,$GeV threshold for data recorded in the year 2018. Two of the curves show the performance of the stand-alone cell algorithm and the stand-alone pufit algorithm. The other two show combined algorithms each formed by requiring that the event satisfy both a fixed threshold (either 65 GeV or 70 GeV as shown in the legend) for the cell algorithm and a pufit threshold which varies along the curve. In each plot the background acceptance fractions and the efficiencies are relative to those of the pufit $E_T^{miss} > 110\,$GeV trigger and thus can be greater than one. The diamond indicates the performance of the pufit $E_T^{miss}>110\,$GeV trigger while the cross indicates the performance of the combined (pufit $E_T^{miss}>110\,$GeV and cell $E_T^{miss}>50\,$GeV) trigger.

Turn-on efficiency curves are shown for $Z\rightarrow\mu\mu$ events for three algorithms: the cell algorithm alone, the pufit algorithm alone and the combined cell+pufit algorithm. The thresholds are set such that the algorithms have equal rates, and the data were recorded in the year 2018. Here the trigger efficiency is shown with respect to $p_T(\mu\mu)$.

Turn-on efficiency curves are shown for $Z\rightarrow\mu\mu$ events for three algorithms: the cell algorithm alone, the pufit algorithm alone and the combined cell+pufit algorithm. The thresholds are set such that the algorithms have equal rates, and the data were recorded in the year 2018. Here the trigger efficiency is shown with respect to the offline $E_T^{miss}$ calculation with muons treated as being invisible.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for a $p_T(\mu\mu)$ threshold of 150 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an offline $E_T^{miss}$ threshold of 150 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an $p_T(\mu\mu)$ threshold of 175 GeV.

Efficiencies for $Z\rightarrow\mu\mu$ events are shown for the L1 $E_T^{miss}>50\,$GeV trigger and for the complete L1+HLT trigger chain that also requires pufit > 110 GeV. Each is shown as a function of $\langle\mu\rangle$ for an offline $E_T^{miss}$ threshold of 175 GeV.

HLT_xe70_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2015.

HLT_xe90_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2016.

HLT_xe110_mht trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2016.

HLT_xe110_pufit trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2017. This trigger included an implicit requirement of cell $E_T^{miss}>50\,$GeV.

HLT_xe110_pufit_xe65 trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2018.

HLT_xe110_pufit_xe70 trigger output rate as a function of $\langle\mu\rangle$ shown for an example run in year 2018.

Full-chain trigger efficiencies for each year as a function of $p_T(\mu\mu)$. The efficiency corresponds to that of the lowest unprescaled trigger that is adjusted throughout each year.

Full-chain trigger efficiencies for 2015, 2016, 2017 and 2018 as a function of $\langle\mu\rangle$ for $p_T(\mu\mu)>150$ GeV. The efficiency corresponds to that of the lowest unprescaled trigger that is adjusted throughout the year.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $W\rightarrow e\nu$ and $Z\rightarrow\mu\mu$ selections with offline $E_T^{miss}>150\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $t\bar t$ with offline $E_T^{miss}>150\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $W\rightarrow e\nu$ and $Z\rightarrow\mu\mu$ selections with offline $E_T^{miss}>175\,$GeV.

Efficiencies for the first-level trigger L1XE50 and the combined L1+HLT trigger chain HLT_xe110_pufit_xe65_L1XE50 in data recorded in the year 2018 are shown as a function of $\langle\mu\rangle$ for $t\bar t$ with offline $E_T^{miss}>175\,$GeV.

The expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The +1 $\sigma$ expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The -1 $\sigma$ expected exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The +1 $\sigma$ observed exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The -1 $\sigma$ observed exclusion limit contours at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

The observed and expected exclusion limit at 95% CL for the $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ production in the $m(\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2})$-$m(\tilde{\chi}^{0}_{1})$ plane.

Expected and observed 95% CL exclusion upper limits on the higgsino production ($\tilde{\chi}\tilde{\chi} \equiv \tilde{\chi}^{0}_{1}\tilde{\chi}^{0}_{2}, \tilde{\chi}^{0}_{1}\tilde{\chi}^{\pm}_{1}, \tilde{\chi}^{0}_{2}\tilde{\chi}^{\pm}_{1}, \tilde{\chi}^{\pm}_{1}\tilde{\chi}^{\mp}_{1}$) cross-section in the signal of $h \tilde{G} h \tilde{G} $ as a function of the higgsino mass.

The distribution of $S_{E_\mathrm{T}^{\mathrm{miss}}}$ after the selection of diphoton candidates with $120~GeV < m_{\gamma\gamma} < 130~GeV$. Expected distributions are shown for the $\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2} \to W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1} $ signal with $m(\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2})=200~GeV$ and $m(\tilde{\chi}^{0}_{1})=0.5~GeV$, and the $h\tilde{G} h\tilde{G}$ signal with $m(\tilde{\chi}^{0}_{1})=150~GeV$ and $m(\tilde{G})=1~MeV$. These overlaid signal points are representative of the model kinematics. The sum in quadrature of the MC statistical and experimental systematic uncertainties in the total background is shown as the hatched bands, while the theoretical uncertainties in the background normalisation are not included. The $t\bar{t}\gamma$ and $t\bar{t}\gamma\gamma$ processes have a negligible contribution and are not represented. Overflow events are included in the rightmost bin. The lower panel shows the ratio of the data to the background.

Acceptance and efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signal in each category.

Acceptance and efficiency for the $h \tilde{G} h \tilde{G}$ signal in each category.

Cut flow for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signal sample at $m(\tilde{\chi}^{\pm}_{1} \tilde{\chi}^{0}_{2})=200~GeV$, $m(\tilde{\chi}^{0}_{1})=0.5~GeV$, with 260000 entries.

Cut flow for the $h \tilde{G} h \tilde{G}$ signal sample at $m(\tilde{\chi}^{0}_{1})=150~GeV$, $m(\tilde{G})=1~MeV$, with 50000 entries.

Event yields in the range 120 <$m\gamma\gamma$< 130 GeV for data, signal models, the SM Higgs boson background and non-resonant background in each analysis category after the fit.

Event yields in the range 120 <$m\gamma\gamma$< 130 GeV for data, signal models, the SM Higgs boson background and non-resonant background in each analysis category before the fit.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the leptonic channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the leptonic channel.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the hadronic channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the hadronic channel.

Acceptance for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the rest channel.

Efficiency for the $W^{\pm} \tilde{\chi}^{0}_{1} h \tilde{\chi}^{0}_{1}$ signals in the rest channel.

Acceptance for the $h \tilde{G} h \tilde{G}$ signals in the each channel.

Efficiency for the $h \tilde{G} h \tilde{G}$ signals in the each channel.

Observed and expected multivariate discriminant distribution in the $\ell\ell\ell\ell jj$ SR.

Observed and expected multivariate discriminant distribution in the $\ell\ell\nu\nu jj$ SR.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.33 < ln(R/#DeltaR) < 0.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 0.67 < ln(R/#DeltaR) < 1.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.00 < ln(R/#DeltaR) < 1.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.33 < ln(R/#DeltaR) < 1.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 1.67 < ln(R/#DeltaR) < 2.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.00 < ln(R/#DeltaR) < 2.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.33 < ln(R/#DeltaR) < 2.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 2.67 < ln(R/#DeltaR) < 3.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.00 < ln(R/#DeltaR) < 3.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.33 < ln(R/#DeltaR) < 3.67.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 3.67 < ln(R/#DeltaR) < 4.00.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single vertical slice of the Lund jet plane between 4.00 < ln(R/#DeltaR) < 4.33.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.69 < ln(1/z) < 0.97.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 0.97 < ln(1/z) < 1.25.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.25 < ln(1/z) < 1.52.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.52 < ln(1/z) < 1.80.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 1.80 < ln(1/z) < 2.08.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.08 < ln(1/z) < 2.36.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.36 < ln(1/z) < 2.63.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.63 < ln(1/z) < 2.91.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 2.91 < ln(1/z) < 3.19.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.19 < ln(1/z) < 3.47.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.47 < ln(1/z) < 3.74.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 3.74 < ln(1/z) < 4.02.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.02 < ln(1/z) < 4.30.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.30 < ln(1/z) < 4.57.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.57 < ln(1/z) < 4.85.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 4.85 < ln(1/z) < 5.13.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.13 < ln(1/z) < 5.41.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.41 < ln(1/z) < 5.68.

Normalized differential cross-section of the Lund jet plane. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties. The data is presented as a 1D distribution, for a single horizontal slice of the Lund jet plane between 5.68 < ln(1/z) < 5.96.

The summed covariance matrix of all systematic and statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.

The summed covariance matrix of all statistical uncertainties associated with the measurement in bins of $\ln{(1/z)} \times \ln{(R/\Delta R)}$.