Showing 2 of 2 results
This paper presents a first measurement of the cross-section for the charged-current Drell-Yan process $pp\rightarrow W^{\pm} \rightarrow \ell^{\pm} \nu$ above the resonance region, where $\ell$ is an electron or muon. The measurement is performed for transverse masses, $m_{\text{T}}^{\text{W}}$, between 200 GeV and 5000 GeV, using a sample of 140~fb$^{-1}$ of $pp$ collision data at a centre-of-mass energy of $\sqrt{s}$ = 13 TeV collected by the ATLAS detector at the LHC during 2015-2018. The data are presented single differentially in transverse mass and double differentially in transverse mass and absolute lepton pseudorapidity. A test of lepton flavour universality shows no significant deviations from the Standard Model. The electron and muon channel measurements are combined to achieve a total experimental precision of 3% at low $m_{\text{T}}^{\text{W}}$. The single- and double differential $W$-boson charge asymmetries are evaluated from the measurements. A comparison to next-to-next-to-leading-order perturbative QCD predictions using several recent parton distribution functions and including next-to-leading-order electroweak effects indicates the potential of the data to constrain parton distribution functions. The data are also used to constrain four fermion operators in the Standard Model Effective Field Theory formalism, in particular the lepton-quark operator Wilson coefficient $c_{\ell q}^{(3)}.$
The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits.
The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.
The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits.
The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.
The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.
The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.
The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.
The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.
Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.
Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.
Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.
Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.
Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.
Differential cross section measurements of W$^\pm\gamma$ production in proton-proton collisions at $\sqrt{s}$ = 13 TeV are presented. The data set used in this study was collected with the CMS detector at the CERN LHC in 2016-2018 with an integrated luminosity of 138 fb$^{-1}$. Candidate events containing an electron or muon, a photon, and missing transverse momentum are selected. The measurements are compared with standard model predictions computed at next-to-leading and next-to-next-to-leading orders in perturbative quantum chromodynamics. Constraints on the presence of TeV-scale new physics affecting the WW$\gamma$ vertex are determined within an effective field theory framework, focusing on the $\mathcal{O}_\mathrm{3W}$ operator. A simultaneous measurement of the photon transverse momentum and the azimuthal angle of the charged lepton in a special reference frame is performed. This two-dimensional approach provides up to a factor of ten more sensitivity to the interference between the standard model and the $\mathcal{O}_\mathrm{3W}$ contribution than using the transverse momentum alone.
Measured absolute differential $p_{\mathrm{T}}^{\gamma}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Measured fractional differential $p_{\mathrm{T}}^{\gamma}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Relative uncertainties on the measured absolute differential $p_{\mathrm{T}}^{\gamma}$ cross section.
Relative uncertainties on the measured fractional differential $p_{\mathrm{T}}^{\gamma}$ cross section.
Correlation matrix for the measured absolute differential $p_{\mathrm{T}}^{\gamma}$ cross section.
Correlation matrix for the measured fractional differential $p_{\mathrm{T}}^{\gamma}$ cross section.
Response matrix from the fiducial to the reconstructed bins of the differential $p_{\mathrm{T}}^{\gamma}$ cross section measurement.
Measured absolute differential $\eta^{\gamma}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Measured fractional differential $\eta^{\gamma}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Relative uncertainties on the measured absolute differential $\eta^{\gamma}$ cross section.
Relative uncertainties on the measured fractional differential $\eta^{\gamma}$ cross section.
Correlation matrix for the measured absolute differential $\eta^{\gamma}$ cross section.
Correlation matrix for the measured fractional differential $\eta^{\gamma}$ cross section.
Response matrix from the fiducial to the reconstructed bins of the differential $\eta^{\gamma}$ cross section measurement.
Measured absolute differential $\Delta R(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Measured fractional differential $\Delta R(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Relative uncertainties on the measured absolute differential $\Delta R(\ell,\gamma)$ cross section.
Relative uncertainties on the measured fractional differential $\Delta R(\ell,\gamma)$ cross section.
Correlation matrix for the measured absolute differential $\Delta R(\ell,\gamma)$ cross section.
Correlation matrix for the measured fractional differential $\Delta R(\ell,\gamma)$ cross section.
Response matrix from the fiducial to the reconstructed bins of the differential $\Delta R(\ell,\gamma)$ cross section measurement.
Measured absolute differential $\Delta\eta(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Measured fractional differential $\Delta\eta(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Relative uncertainties on the measured absolute differential $\Delta \eta(\ell,\gamma)$ cross section.
Relative uncertainties on the measured fractional differential $\Delta \eta(\ell,\gamma)$ cross section.
Correlation matrix for the measured absolute differential $\Delta \eta(\ell,\gamma)$ cross section.
Correlation matrix for the measured fractional differential $\Delta \eta(\ell,\gamma)$ cross section.
Response matrix from the fiducial to the reconstructed bins of the differential $\Delta \eta(\ell,\gamma)$ cross section measurement.
Measured absolute differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Measured fractional differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Relative uncertainties on the measured absolute differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section.
Relative uncertainties on the measured fractional differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section.
Correlation matrix for the measured absolute differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section.
Correlation matrix for the measured fractional differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section.
Response matrix from the fiducial to the reconstructed bins of the differential $m_{\mathrm{T}}^{\mathrm{cluster}}$ cross section measurement.
Measured absolute differential $N_{\mathrm{jets}}$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Correlation matrix for the measured absolute differential $N_{\mathrm{jets}}$ cross section. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$.
Response matrix from the fiducial to the reconstructed bins of the differential $N_{\mathrm{jets}}$ cross section measurement.
Relative uncertainties on the measured absolute differential $N_{\mathrm{jets}}$ cross section.
Measured absolute differential $\Delta\eta(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Measured fractional differential $\Delta\eta(\ell,\gamma)$ cross section, compared to the MG5_aMC+PY8, GENEVA, MATRIX and MCFM predictions. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 30\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 30\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Relative uncertainties on the measured absolute differential $\Delta \eta(\ell,\gamma)$ cross section. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Relative uncertainties on the measured fractional differential $\Delta \eta(\ell,\gamma)$ cross section. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Correlation matrix for the measured absolute differential $\Delta \eta(\ell,\gamma)$ cross section. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Correlation matrix for the measured fractional differential $\Delta \eta(\ell,\gamma)$ cross section. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Response matrix from the fiducial to the reconstructed bins of the differential $\Delta \eta(\ell,\gamma)$ cross section measurement. Requirements of $m_{\mathrm{T}}^{\mathrm{cluster}}>150\,\mathrm{GeV}$ and a veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ are applied in addition to the baseline selection.
Fiducial cross section scaling terms as a function of $C_{3W}$ in all $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ bins. Values are given relative to the SM prediction.
Scans of the profile likelihood test statistic $q$ as a function of $C_{3W}$, given with and without the pure BSM term.
Scans of the profile likelihood test statistic $q$ as a function of $C_{3W}$, given with and without the pure BSM term.
Best-fit values of $C_{3W}$ and corresponding 95% CL confidence intervals as a function of the maximum $p_{\mathrm{T}}^{\gamma}$ bin included in the fit, with and without the pure BSM term.
Best-fit values of $C_{3W}$ and corresponding 95% CL confidence intervals as a function of the maximum $p_{\mathrm{T}}^{\gamma}$ bin included in the fit, with and without the binning in $|\phi_{f}|$.
Response matrix from the fiducial to the reconstructed bins of the differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section measurement.
Measured double-differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section, compared to the MG5_aMC+PY8 NLO prediction. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 80\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 150\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. A veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ is also applied for this result.
Measured double-differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section, compared to the MG5_aMC+PY8 NLO prediction. This table gives the entries for the $(0,\pi/6)$ slice. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 80\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 150\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. A veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ is also applied for this result.
Measured double-differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section, compared to the MG5_aMC+PY8 NLO prediction. This table gives the entries for the $(\pi/6,\pi/3)$ slice. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 80\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 150\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. A veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ is also applied for this result.
Measured double-differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section, compared to the MG5_aMC+PY8 NLO prediction. This table gives the entries for the $(\pi/3,\pi/2)$ slice. The differential cross sections $\sigma_{j}(\mathrm{pp}\rightarrow\mathrm{W}^{\pm}\gamma\rightarrow\ell^{\pm}\nu\gamma)$, where $\ell$ denotes all three lepton flavors, are measured in the following fiducial region: $p_{\mathrm{T}}^{\ell} > 80\,\mathrm{GeV}$, $|\eta^{\ell}| < 2.5$, $p_{\mathrm{T}}^{\gamma} > 150\,\mathrm{GeV}$, $|\eta^{\gamma}| < 2.5$, $p_{\mathrm{T}}^{\mathrm{miss}} > 40\,\mathrm{GeV}$, and $\Delta R(\ell, \gamma) > 0.7$. The leptons are dressed by adding the four-momenta of any photons with $\Delta R(\ell, \gamma) < 0.1$ to the four-momentum of the lepton. A smooth-cone photon isolation is also applied, with parameters $\delta_{0}=0.4$, $\epsilon=1.0$, and $n=1$. A veto on the presence of any jet with $p_{\mathrm{T}} > 30\,\mathrm{GeV}$ and $|\eta| < 2.5$ is also applied for this result.
Correlation matrix for the measured absolute differential $p_{\mathrm{T}}^{\gamma} \times |\phi_{f}|$ cross section.
When you search on a word, e.g. 'collisions', we will automatically search across everything we store about a record. But sometimes you may wish to be more specific. Here we show you how.
Guidance on the query string syntax can also be found in the OpenSearch documentation.
We support searching for a range of records using their HEPData record ID or Inspire ID.
About HEPData Submitting to HEPData HEPData File Formats HEPData Coordinators HEPData Terms of Use HEPData Cookie Policy
Status
Email
Forum
Twitter
GitHub
Copyright ~1975-Present, HEPData | Powered by Invenio, funded by STFC, hosted and originally developed at CERN, supported and further developed at IPPP Durham.