Observed event yields and estimated backgrounds in the low- and high-mass control regions. The uncertainty in the background yield is the sum in quadrature of the statistical and systematic uncertainties.

Summary of the relative systematic uncertainties in heavy Majorana neutrino signal yields and the background from prompt same-sign leptons, both estimated from simulation. The relative systematic uncertainties assigned to the data-driven backgrounds for the misidentified lepton background and mismeasured charge background are also shown. The uncertainties are given for the low-mass selections.

Summary of the relative systematic uncertainties in heavy Majorana neutrino signal yields and the background from prompt same-sign leptons, both estimated from simulation. The relative systematic uncertainties assigned to the data-driven backgrounds for the misidentified lepton background and mismeasured charge background are also shown. The uncertainties are given for the high-mass selections.

Summary of contributions to the systematic uncertainty related to the prompt same-sign leptons background, misidentified lepton background, and mismeasured charge background on the total background uncertainty for the case of $m_{\rm N}$ = 100 and 500 GeV.

Observed event yields and estimated backgrounds after the application of all selection, except for the final optimization. The background predictions from prompt same-sign leptons (Prompt bkgd.), misidentified leptons (Misid. bkgd.), mismeasured charge (Charge mismeas. bkgd.) and the total background (Total bkgd.) are shown together withthe number of events observed in data. The uncertainties shown are the statistical and systematic components, respectively.

Dielectron channel results after final optimization. The background predictions from prompt same-sign leptons, misidentified leptons, and mismeasured charge are shown along with the total background estimate and the number of events observed in data. The uncertainties shown are the statistical and systematic components, respectively.

Electron-muon channel results after final optimization. The background predictions from prompt same-sign leptons and misidentified leptons are shown along with the total background estimate and the number of events observed in data. The uncertainties shown are the statistical and systematic components, respectively.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Number of predicted signal events in the $\mu\mu X$ final states, for several benchmark signal hypotheses for Majorana HNL. The quoted uncertainties include statistical and systematic uncertainties.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Majorana HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{Ne}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

The 95% CL limits on $|V_{N\mu}|^2$ as a function of the HNL mass for a Dirac HNL. Values of $-1$ indicate that no limit is available for the mass point.

Covariance matrix for the background prediction in the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Covariance matrix for the background prediction in the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $eeX$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Correlation matrix for the background prediction the signal region bins for the $\mu\mu X$ final states. The bin labels specify the channel, the $m(\ell_2,\ell_3)$ bin, and the $\Delta_{\mathrm{2D}}$ bin.

Mean lifetime and production cross section for HNLs of Majorana nature, assuming the decay to three charged leptons and coupling to only electrons or muons, as evaluated from simulated event samples.

Observed exclusion limits in the plane of DM particle mass and interaction scale, with the region below the solid curve excluded at a 90% CL. The background-only expectations are represented by their median (dashed line) and by the 68% and 95% CL bands. A lower bound of the validity of the EFT is indicated by the upper edge of the hatched area. The four curves, corresponding to different g and R values, represent the lower bound on $M_{*}$ for which 50% and 80% of signal events have a pair of DM particles with an invariant mass less than $g\sqrt{M_{*}^{3}/m_{t}}$, where $g = 4\pi$ and $g = 2\pi$ respectively.

Figure 8. Gluino pair production cross section.

Table 1. Post-fit yields for the background-only fit, observed data, and expected yields for mgluino = 1600 GeV in each search bin.

Experimental uncertainties affecting transfer factors in the analysis that is used to estimate the W background in the signal region (SR). The number of W boson events are denoted as $W_{SR}$ for the SR and in analogy as $W_{\mu\nu}$ ($W_{e\nu}$) for the single-muon (single-electron) control region (CR).

Uncertainties assigned to the simulation based processes in SR and CRs.

Uncertainties assigned to the simulation based processes in SR and CRs.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections (fb) at large Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and their combination. The theoretical predictions from Madgraph at NLO in QCD and corrected to NLO in electroweak using the NNPDF 3.0 are also reported. With the exception of the largest Z $p_{T}$ bin, the statistical uncertainties in the measurements are much smaller than the systematic uncertainties. Both measurements and predictions correspond to $\sigma \mathcal{B}(Z -> \ell\ell)$, where $\sigma$ is the total fiducial cross section, $\mathcal{B}$ is the branching fraction, and $\ell$ is a charged lepton. The $Z -> \nu\nu$ measurement corresponds to $\sigma \mathcal{B}(Z -> \ell\ell)/\mathcal{B}(Z -> \nu\nu)$.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

Cross sections normalized to the total cross section measurements at high Z $p_{T}$ values in the Z -> $\ell\ell$ and Z -> $\nu\nu$ channels, and in their combination. The uncertainty includes both statistical and systematic uncertainties.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the absolute cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

The relative statistical and systematic uncertainties from various sources for the relative cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Cross section measurements in bins of Z $p_{T}$ on neutrinos and charged leptons.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_t$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_W$ after scaling the simulation to match the total yield in data.

Comparison between data and simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data. The hatched region indicates the total shape uncertainty in the simulation.

The ratio between the observed data and the simulation in the high $\Delta$m portion of the $\ell+\text{jets}$ control region as a function of $N_{\text{res}}$ after scaling the simulation to match the total yield in data.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the low $\Delta$m search bins 0--52. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the low $\Delta$m search bins 0--52. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 53--104. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 53--104. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 105--152 with ${N_b = 2}$. The hatched bands correspond to the total uncertainty in the background prediction.

Observed event yields in data (black points) and predicted SM background (filled histograms) for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The signal models are denoted in the legend with the masses in GeV of the SUSY particles in parentheses: $(m_{\tilde{t}}, m_{\tilde{\chi}^0_1})$ or $(m_{\tilde{g}}, m_{\tilde{\chi}^0_1})$ for the T2 or T1 signal models, respectively. The hatched bands correspond to the total uncertainty in the background prediction. The (unstacked) distributions for two example signal models are also shown.

The ratio of the data to the total background prediction for the high $\Delta$m search bins 153--182 with ${N_b \geq 3}$. The hatched bands correspond to the total uncertainty in the background prediction.

The observed 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The expected 95% CL upper limit on the production cross section of the T2tt simplified model as a function of the top squark and LSP masses. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed exclusion contour of the T2tt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The mean expected exclusion contour of the T2tt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. No interpretation is provided for signal models for which ${|{m_{\tilde{t}} - m_{\tilde{\chi}^0_1} - m_t}| < 25 GeV}$ and ${m_{\tilde{t}} < 275 GeV}$ as described in the text.

The observed 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bW simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2bW simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bW simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2tb simplified model as a function of the top squark and LSP masses.

The observed exclusion contour of the T2tb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2tb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2ttC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2ttC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2ttC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2bWC simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2bWC simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2bWC simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The expected 95% CL upper limit on the production cross section of the T2cc simplified model as a function of the top squark mass and the difference between the top squark and LSP masses.

The observed exclusion contour of the T2cc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T2cc simplified model and the region containing 68\% ($\pm 1\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1tttt simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1tttt simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1tttt simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The expected 95% CL upper limit on the production cross section of the T1ttbb simplified model as a function of the gluino and LSP masses.

The observed exclusion contour of the T1ttbb simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$).

The mean expected exclusion contour of the T1ttbb simplified model and the region containing 68 and 95\% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis.

The observed 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The expected 95% CL upper limit on the production cross section of the T5ttcc simplified model as a function of the gluino and LSP masses. The uppser limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The observed exclusion contour of the T5ttcc simplified model with respect to approximate NNLO+NNLL signal cross sections and the change in this contour due to variation of these cross sections within their theoretical uncertainties ($\sigma_{\text{theory}}$). The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

The mean expected exclusion contour of the T5ttcc simplified model and the region containing 68% and 95% ($\pm 1$ and $2\,\sigma_{\text{experiment}}$) of the distribution of expected exclusion limits under the background-only hypothesis. The expected and observed upper limits do not take into account contributions from direct top squark pair production; however, its effect is small for $m_{\tilde{\chi}^0_1} > 600 GeV$, which corresponds to the phase space beyond the exclusions based on direct top squark pair production. The excluded regions based on direct top squark pair production from this search and earlier searches are indicated by the hatched areas.

CHI distribution for mass bin > 1200 GeV.

Centrality Ratio.