Observed profile likelihood as a function of $\sigma\times\mathcal{B}_{H\rightarrow WW^{*}}$ normalised by the SM expectation for the single-channel measurements

Two-dimensional likelihood scan of the measured values of $\sigma_{ZH}\times\mathcal{B}_{H\rightarrow WW^{*}}$ vs. $\sigma_{WH}\times\mathcal{B}_{H\rightarrow WW^{*}}$.

The observed values of the background normalisation factors for the combined 2-POI fit. The uncertainties correspond to the total of all statistical and systematic sources.

Measured cross sections times the $H\rightarrow WW^{*}$ branching ratio for the $p_T^V$ scheme.

Measured cross sections times the $H\rightarrow WW^{*}$ branching ratio for the STXS scheme. Note: the uncertainties of "-0" are due to the confidence interval reaching the minimum allowed value of the POI.

Correlation matrix of the POIs and normalisation factors for the 2-POI inclusive analysis

Correlation matrix of the parameters of interest, normalisation factors and nuissance parameters for the $p_T^V$ scheme

Correlation matrix of the parameters of interest, normalisation factors and nuissance parameters for the STXS scheme

Event data from Z-dominated SR

The measured differential cross-sections and the predictions from the GM-VFNS calculation for the $D_s^\pm$ meson in bins of $p_T$ for $|\eta| < 2.5$. The statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately for data, while the total theory uncertainties are shown for GM-VFNS.

Inclusive $D^\pm$ meson production cross-sections in different fiducial volumes defined by $|\eta|<2.5$ and different $p_T$ regions. For the ATLAS measurements, the statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately; for the theoretical predictions, the total theoretical uncertainties are shown.

Inclusive $D_s^\pm$ meson production cross-sections in different fiducial volumes defined by $|\eta|<2.5$ and different $p_T$ regions. For the ATLAS measurements, the statistical, systematic (excluding branching ratio) and branching ratio uncertainties are shown separately; for the theoretical predictions, the total theoretical uncertainties are shown.

Correlations of the ttH signal-strength modifiers in the different Higgs pT bins of the STXS measurement.

Observed and expected upper 95% CL limit on the tH signal strength modifier $\mu_{tH}$ with $\mu_{ttH}=1$ for different channels and years, where the uncertainties are uncorrelated between the channels and years, and in their combination. The one and two standard deviation confidence intervals on the expected limit are also listed (sigma).

Likelihood-ratio test statistic as a function of the ttH and tH signal strength modifiers $\mu_{ttH}$ and $\mu_{tH}$. The observed best fit point is $(\mu_{tH}, \mu_{ttH}) = (-3.83, +0.35)$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\kappa_{V}$. The observed best fit point is $(\kappa_{t}, \kappa_{V}) = (+0.59, +1.40)$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ for $\kappa_{V}=1$. The observed best fit point is $\kappa_{t} = +0.54$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\tilde{\kappa}_{t}$ with $\kappa_{V}=1$. The observed best fit point is $(\kappa_{t}, \tilde{\kappa}_{t}) = (+0.53, 0.00)$.

Observed and expected likelihood ratio test statistic as a function of $f_{CP}$. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1. The observed best fit point is $f_{CP} = 0.00$.

Observed and expected likelihood ratio test statistic as a function of $\cos(\alpha)$. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1. The observed best fit point is $\cos(\alpha) = +1.00$.

Observed and expected likelihood ratio test statistic as a function of $\kappa_{t}$ and $\tilde{\kappa}_{t}$ with $\kappa_{V}=1$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channels and in their combination.

Observed and expected likelihood ratio test statistic as a function of $f_{CP}$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channel and in their combination. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1.

Observed and expected likelihood ratio test statistic as a function of $\cos(\alpha)$, in the $H \rightarrow bb$, $H\rightarrow\gamma\gamma$, $H\rightarrow ZZ$, $H\rightarrow WW$, and $H\rightarrow\tau\tau$ decay channels and in their combination. The overall modifier of the top-Higgs coupling strength is profiled such that the likelihood attains its minimum at each point in the plane, and $\kappa_{V}$ is set to 1.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 14.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 15.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 16.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 17.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 18.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 19.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 20.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 1.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 2.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 3.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 4.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 5.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 6.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 7.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 8.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 9.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 10.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M7 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient. The limits on M7 were obtained without taking into account the SM-EFT interference for the EW W$^\pm$Zjj final state.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S02 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T2 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Expected and observed exclusion limits at 95% CL for $\sigma_{\mathrm{VBF}}(\mathrm{H}^{\pm\pm}_5) \times \mathcal{B}(\mathrm{H}^{\pm\pm}_5 \rightarrow W^{\pm}W^{\pm})$ as a function of the doubly-charged Higgs mass.

Expected and observed exclusion limits at 95% CL for $\sin\theta_{\mathrm{H}}$ as a function of the doubly-charged Higgs mass in the Georgi-Machacek model.

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

The measured cross section as a function of exclusive jet multiplicity, $N_{\text{jets}}$, when $50<p_T<100$ GeV

The measured cross section as a function of exclusive jet multiplicity, $N_{\text{jets}}$, when $p_T>100$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $p_T<10$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $10<p_T<30$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $30<p_T<50$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $50<p_T<100$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $p_T>100$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $p_T<10$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $10<p_T<30$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $30<p_T<50$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $50<p_T<100$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $p_T>100$ GeV

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

Response matrix for pT ll mass 50-76 (electron channel)

Response matrix for pT ll mass 50-76 (muon channel)

Response matrix for pT ll mass 76-106 (electron channel)

Response matrix for pT ll mass 76-106 (muon channel)

Response matrix for pT ll mass 106-170 (electron channel)

Response matrix for pT ll mass 106-170 (muon channel)

Response matrix for pT ll mass 170-350 (electron channel)

Response matrix for pT ll mass 170-350 (muon channel)

Response matrix for pT ll mass 350-1000 (electron channel)

Response matrix for pT ll mass 50-76 jet (electron channel)

Response matrix for pT ll mass 50-76 jet (muon channel)

Response matrix for pT ll mass 76-106 jet (electron channel)

Response matrix for pT ll mass 76-106 jet (muon channel)

Response matrix for pT ll mass 106-170 jet (electron channel)

Response matrix for pT ll mass 106-170 jet (muon channel)

Response matrix for pT ll mass 170-350 jet (electron channel)

Response matrix for pT ll mass 170-350 jet (muon channel)

Response matrix for phistar mass 50-76 (electron channel)

Response matrix for phistar mass 50-76 (muon channel)

Response matrix for phistar mass 76-106 (electron channel)

Response matrix for phistar mass 76-106 (muon channel)

Response matrix for phistar mass 106-170 (electron channel)

Response matrix for phistar mass 106-170 (muon channel)

Response matrix for phistar mass 170-350 (electron channel)

Response matrix for phistar mass 170-350 (muon channel)

Response matrix for phistar mass 350-1000 (electron channel)

Response matrix for phistar mass 350-1000 (muon channel)

Measured differential cross section with associated uncertainties as a function of $N$($b$-jets). Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate. For the meaning of the bins please refer to the figure.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $m_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Observed statistical correlations, evaluated with a bootstrapping technique, between $p_\mathrm{T}^{\gamma\gamma}$, $N_\mathrm{jets}$, $m_{jj}$, $\Delta\phi_{jj}$, and $p_\mathrm{T}^{j1}$

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N_\mathrm{jets}$.

Post-fit correlation matrix for the differential cross section measured as a function of $N$($b$-jets).

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>30\ \mathrm{GeV}}=0)$.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$.

Post-fit correlation matrix for the differential cross section measured as a function of $\Delta\phi_{jj}$ in the VBF fiducial region.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $|y_{\gamma\gamma}|$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma1}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma2}/m_{\gamma\gamma}$.

Measured differential cross section with associated uncertainties as a function of $|y_{\gamma\gamma}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|y_{\gamma\gamma}|$.

Measured differential cross section with associated uncertainties as a function of $m_{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $m_{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma j}$.

Measured differential cross section with associated uncertainties as a function of $H_{T}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $H_{T}$.

Measured differential cross section with associated uncertainties as a function of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\tau_{C,j1}$.

Measured differential cross section with associated uncertainties as a function of $\sum\tau_{C,j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\sum\tau_{C,j}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>40\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>50\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma} (N_\mathrm{jets}^{p_T>60\ \mathrm{GeV}}=0)$.

Measured differential cross section with associated uncertainties as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $\pi - |\Delta\phi_{\gamma\gamma,jj}|$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $p_{T}^{\gamma\gamma j}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma}$ in bins of $\tau_{C,j1}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $(p_{T}^{\gamma1}-p_{T}^{\gamma2})/m_{\gamma\gamma}$ in bins of $(p_{T}^{\gamma1}+p_{T}^{\gamma2})/m_{\gamma\gamma}$. The bins are the same as in the corresponding plot of the differential cross section.

Measured differential cross section with associated uncertainties as a function of $|\eta^*|$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $|\eta^*|$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{\gamma\gamma jj}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in the VBF fiducial region.

Measured differential cross section with associated uncertainties as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. Each systematic uncertainty source is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Post-fit correlation matrix for the differential cross section measured as a function of $p_{T}^{j1}$ in bins of $\Delta\phi_{jj}$ in the VBF fiducial region. The bins are the same as in the corresponding plot of the differential cross section.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Pre-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except for the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor which is not defined pre-fit. The last bin includes the overflow.

Comparison of predicted and observed event yields in each of the control and signal regions in the dilepton channel after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison of predicted and observed event yields in each of the control and signal regions in the single-lepton channels after the fit to the data. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the dilepton SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $120\le p_T^H<200$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $200\le p_T^H<300$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton resolved SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV (yield only). The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the BDT discriminant in the single-lepton boosted SRs after the inclusive fit to the data for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ lo}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for ${\Delta R^{{avg}}_{bb}}$ after the inclusive fit to the data in the single-lepton $CR^{5j}_{{\geq}4b\ hi}$ control region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit yields of signal ($S$) and total background ($B$) as a function of $\log (S/B)$, compared with data. Final-discriminant bins in all dilepton and single-lepton analysis regions are combined into bins of $\log (S/B)$, with the signal normalised to the SM prediction used for the computation of $\log (S/B)$. The signal is then shown normalised to the best-fit value and the SM prediction. The lower frame reports the ratio of data to background, and this is compared with the expected ${t\bar {t}H}$-signal-plus-background yield divided by the background-only yield for the best-fit signal strength (solid red line) and the SM prediction (dashed orange line).

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta \eta $ between $b$-tagged jets, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the likelihood discriminant, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the average $\Delta R$ for all possible combinations of $b$-tagged jet pairs, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the DNN $P(H)$ output for the Higgs boson candidate after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate mass for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Post-fit distribution of the reconstructed Higgs boson candidate mass for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Fitted values of the ${t\bar {t}H}$ signal strength parameter in the individual channels and in the inclusive signal-strength measurement.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the fit. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Pre-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Pre-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the Standard Model expectation. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations, except the uncertainty in the $k({t\bar {t}+{\geq }1b})$ normalisation factor that is not defined pre-fit.

Post-fit distribution of the number of jets in the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the number of jets in the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the dilepton $SR^{\geq 4j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton resolved $SR^{\geq 6j}_{\geq 4b}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Post-fit distribution of the reconstructed Higgs boson candidate $p_T^H$ for the single-lepton boosted ${{SR}_{{boosted}}}$ signal region. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The last bin includes the overflow.

Signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal strength.

95% CL simplified template cross-section upper limits in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive limit. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown. The hatched uncertainty bands correspond to the theory uncertainty in the fiducial cross-section prediction in each bin.

The ratios $S/B$ (black solid line, referring to the vertical axis on the left) and $S/\sqrt{B}$ (red dashed line, referring to the vertical axis on the right) for each category in the inclusive analysis in the dilepton channel (left) and in the single-lepton channels (right), where $S$ ($B$) is the number of selected signal (background) events predicted by the simulation and normalised to a luminosity of 139 fb$^{-1}$ .

Comparison between data and prediction for the $\Delta R$ between the Higgs candidate and the ${t\bar {t}}$ candidate system, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the number of $b$-tagged jet pairs with an invariant mass within 30 GeV of 125 GeV, after the inclusive fit to the data in the dilepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the reconstruction BDT score for the Higgs boson candidate identified using Higgs boson information, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the $\Delta R$ between the two highest ${p_{{T}}}$ $b$-tagged jets, after the inclusive fit to the data in the single-lepton resolved channel for $0\le p_T^H<120$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations.

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the sum of $b$-tagging discriminants of jets from Higgs, hadronic top and leptonic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the hadronic top candidate invariant mass, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $300\le p_T^H<450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Comparison between data and prediction for the fraction of the sum of $b$-tagging discriminants of all jets not associated to the Higgs or hadronic top candidates, after the inclusive fit to the data in the single-lepton boosted channel for $p_{{T}}^{H}\ge 450$ GeV. The ${t\bar {t}H}$ signal yield (solid red) is normalised to the fitted $\mu $ value from the inclusive fit. The dashed line shows the ${t\bar {t}H}$ signal distribution normalised to the total background prediction. The uncertainty band includes all uncertainties and their correlations. The first (last) bin includes the underflow (overflow).

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $0\le {\hat{p}_{{T}}^{H}}<120$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $120\le {\hat{p}_{{T}}^{H}}<200$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $200\le {\hat{p}_{{T}}^{H}}<300$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for $300\le {\hat{p}_{{T}}^{H}}<450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

Ranking of the 20 nuisance parameters with the largest post-fit impact on $\mu $ in the STXS fit for ${\hat{p}_{{T}}^{H}}\ge 450$ GeV. Nuisance parameters corresponding to statistical uncertainties in the simulated event samples are not included. The empty blue rectangles correspond to the pre-fit impact on $\mu $ and the filled blue ones to the post-fit impact on $\mu $, both referring to the upper scale. The impact of each nuisance parameter, $\Delta \mu $, is computed by comparing the nominal best-fit value of $\mu $ with the result of the fit when fixing the considered nuisance parameter to its best-fit value, $\hat{\theta }$, shifted by its pre-fit (post-fit) uncertainties $\pm \Delta \theta $ ($\pm \Delta \hat{\theta }$). The black points show the pulls of the nuisance parameters relative to their nominal values, $\theta _0$. These pulls and their relative post-fit errors, $\Delta \hat{\theta }/\Delta \theta $, refer to the lower scale. For experimental uncertainties that are decomposed into several independent sources, NP X corresponds to the X$^{th}$ nuisance parameter, ordered by their impact on $\mu $. The `ljets' (`dilep') label refers to the single-lepton (dilepton) channel.

95% confidence level upper limits on signal-strength measurements in the individual STXS ${\hat{p}_{{T}}^{H}}$ bins, as well as the inclusive signal-strength limit, after the fit used to extract multiple signal-strength parameters. The observed limits are shown (solid black lines), together with the expected limits both in the background-only hypothesis (dotted black lines) and in the SM hypothesis (dotted red lines). In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Post-fit correlation matrix (in percentages) between the $\mu $ values obtained in the STXS bins.

Performance of the Higgs boson reconstruction algorithms. For each row of `truth' ${\hat{p}_{{T}}^{H}}$, the matrix shows (in percentages) the fraction of Higgs boson candidates which are truth-matched to ${b\bar {b}}$ decays, with reconstructed $p_T^H$ in the various bins of the dilepton (left), single lepton resolved (middle) and boosted (right) channels.

Pre-fit event yields in the dilepton signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Post-fit event yields in the dilepton signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other sources' refers to s-channel, t-channel, $tW$, $tWZ$, $tZq$, $Z+$ jets and diboson events.

Pre-fit event yields in the single-lepton resolved and boosted signal regions and control regions. All uncertainties are included except the $k({t\bar {t}+{\geq }1b})$ uncertainty that is not defined pre-fit. For the ${t\bar {t}H}$ signal, the pre-fit yield values correspond to the theoretical prediction and corresponding uncertainties. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Post-fit event yields in the single-lepton resolved and boosted signal regions and control regions, after the inclusive fit in all channels. All uncertainties are included, taking into account correlations. For the ${t\bar {t}H}$ signal, the post-fit yield and uncertainties correspond to those in the inclusive signal-strength measurement. `Other top sources' refers to s-channel, t-channel, $tWZ$ and $tZq$ events.

Breakdown of the contributions to the uncertainties in $\mu$. The contributions from the different sources of uncertainty are evaluated after the fit. The $\Delta \mu $ values are obtained by repeating the fit after having fixed a certain set of nuisance parameters corresponding to a group of systematic uncertainties, and then evaluating $(\Delta \mu)^2$ by subtracting the resulting squared uncertainty of $\mu $ from its squared uncertainty found in the full fit. The same procedure is followed when quoting the effect of the ${t\bar {t}+{\geq }1b}$ normalisation. The total uncertainty is different from the sum in quadrature of the different components due to correlations between nuisance parameters existing in the fit.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the dilepton channel.

Fraction (in percentages) of signal events, after SR and CR selections, originating from $b\bar {b}$, $WW$ and other remaining Higgs boson decay modes in the single-lepton channels.

Predicted SM ${t\bar {t}H}$ cross-section in each of the five STXS ${\hat{p}_{{T}}^{H}}$ bins and signal acceptance times efficiency (including all event selection criteria) in each STXS bin as well as for the inclusive ${\hat{p}_{{T}}^{H}}$ range.

Number of expected signal events before the fit, after each selection requirement applied to enter the dilepton channel $SR^{\geq 4j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel resolved $SR^{\geq 6j}_{\geq 4b}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.

Number of expected signal events before the fit, after each selection requirement applied to enter the single-lepton channel boosted $SR_{boosted}$ region. All ${t\bar {t}H}$ signal events are included, regardless of the $H$ or ${t\bar {t}H}$ decay mode. All object corrections are applied, except for the initial number of events which is calculated using the NLO QCD+EW theoretical prediction. All quoted numbers are rounded to unity. More details on the selection criteria can be found in the text.