$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 20--40\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 40--60\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

$p_{\rm T}$-differential yields of $\Lambda$(1520) (sum of particle and anti-particle states) in p--Pb collisions at $\sqrt{s_{\mathrm{NN}}}$ $\mathrm{=}$ 5.02 TeV in multiplicity interval 60--100\%. The uncertainty 'sys,$p_{\rm T}$-correlated' indicates the systematic uncertainty after removing the contributions of $p_{\rm T}$-uncorrelated uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to charged $\pi$ ($\pi^{+} + \pi^{-}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to K$^{-}$ as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) at midrapidity as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in inelastic pp collisions at $\sqrt{s}$ $\mathrm{=}$ 7 TeV.

Ratio of $p_{\rm T}$-integrated yields of $\Lambda$(1520) (sum of particle and anti-particle states) to its ground state particle $\Lambda$ ($\Lambda + \bar{\Lambda}$) as a function of $\langle {\rm d}N_{\rm ch}/{\rm d} \eta_{\rm lab} \rangle$ in p--Pb collisions at $\sqrt{s}$ $\mathrm{=}$ 5.02 TeV. The uncertainty 'sys,uncorrelated' indicates the multiplicity uncorrelated systematic uncertainty.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties at $7\ TeV$ were corrected on the $\sqrt{\chi^{2}/ndf}$ and they more smaller than systematic uncertainties. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ ($n_{ch} \ge 2$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ ($n_{ch} \ge 2$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$ , this represents the statistical uncertainty only. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. The statistical uncertainties at $7\ TeV$ more smaller than systematic uncertainties.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ ($n_{ch} \ge 150$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$.Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various $k_{T}$ intervals of different multiplicity regions $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. The statistical uncertainties smaller than systematic uncertainties. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The $Q$ distribution measured at $0.9\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $0.9\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $n_{ch}$ intervals $p_{T} > 100\ MeV$ and $|\eta|<2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different multiplicity intervals $n_{ch}$ with $p_{T} > 100\ MeV$ and $|\eta| < 2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV\ HM$ using unlike-charge particle reference sample for different $n_{ch}$ intervals $p_{T} > 100\ MeV$ and $|\eta|<2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured with $7\ TeV\ HM$ data using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 150$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 2-9$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 10-24$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 25-80$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 81-125$. The error bars represents only the statistical uncertainties.

The total inelastic cross section, the first systematic error accounts for all experimental uncertainties and the second error for the extrapolation t-->0.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 24 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Stat2: Alignment uncertainty from the choice of a reference station -- Dist: Alignment uncertainty related to the distance calibration between the upper and lower detectors -- Leff: Alignment uncertainty related to effective lever arm used in the alignment optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 2.3%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) A small difference in the statistical uncertainties give here compared to the published version is related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $\psi(2\mathrm{S})$ $p_{\rm T}$ for $\psi(2\mathrm{S})$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0\leq |y| < 0.75$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $0.75\leq |y| < 1.5$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Prompt and non-prompt production cross-section times branching ratio as a function of $J/\psi$ $p_{\rm T}$ for $J/\psi$ rapidity interval of $1.5\leq |y| < 2$. The first uncertainty is statistical, the second is systematic. Spin-alignment and luminosity ($\pm 1.8\%$) uncertainties are not included.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $p_T$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $b$-jet $|y|$.

The inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma(Zb)\times N_{b\text{-jet}}$ as a function of $y_{\text{boost}}(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta y(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta\phi(Z,b)$.

The inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the inclusive $b$-jet cross-section $\sigma^{*}(Zb)\times N_{b\text{-jet}}$ as a function of $\Delta R(Z,b)$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zb)$ as a function of $Z$ boson $|y|$.

Integrated $Z+\ge 2$ $b$-jets cross-section.

Breakdown of systematic uncertainties (in %) for the integrated $Z+\ge 2$ $b$-jets cross-section.

The cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta R(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $\Delta m(b,b)$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $p_T$.

The cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$ together with the corresponding non-perturbative corrections.

Breakdown of systematic uncertainties (in %) for the cross-section $\sigma(Zbb)$ as a function of $Z$ boson $|y|$.

Detailed list of the contribution of each source of uncertainty to the total uncertainty on the measured values of $\sigma(tq)$, $\sigma(\bar{t}q)$, $R_t$, and $\sigma(tq+\bar{t}q)$. The evaluation of the systematic uncertainties has a statistical uncertainty of $0.3\,\%$. Uncertainties contributing less than $1.0\,\%$ are marked with "$<1$" in the paper. To provide numerical values for this table in HEPdata, these uncertainties are approximated with $\pm 0.5\,\%$. This approximation is applied to all measurements for the following uncertainties$:$ JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by-jets, JES pileup, $b$-JES, jet vertex fraction, mistag efficiency and $W+\;$jets shape variation. For the measurement of $\sigma(tq)$ the approximation is applied in addition to the following uncertainties$:$ JES flavor response, $c$-tagging efficiency, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR. For the measurement of $\sigma(\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $b/\bar{b}$ acceptance, and $t\bar{t}$ ISR/FSR. For the measurement of $R_t$ the approximation is applied in addition to these uncertainties$:$ JES detector, $b$-tagging efficiency, $c$-tagging efficiency, $b/\bar{b}$ acceptance and $tq$ scale variations. For the measurement of $\sigma(tq+\bar{t}q)$ the approximation is applied in addition to these uncertainties$:$ JES flavor response, $c$-tagging efficiency, $b/\bar{b}$ acceptance, $t\bar{t}$ generator + parton shower and $t\bar{t}$ ISR/FSR.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(T)).

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

Differential t-channel top-quark production cross sections and normalized differential t-channel top-quark production cross sections as functions of ABS(YRAP(TBAR)).

Parametrization factors for the $m_{t}$ dependence [see Eq. (4) in the paper] of $\sigma(tq)$, $\sigma(\bar tq)$, and $\sigma(t q+\bar t q)$.

The cross sections for top-quark and top-antiquark production in the t-channel, together with the cross-section ratio.

The value of $|V_{tb}|^{2}$ is extracted by dividing the measured value of $\sigma(t q+\bar t q)$ by the prediction of the approximate NNLO calculation. The experimental and theoretical uncertainties are added in quadrature.

Event yields for the 2-jet-$\ell^{+}$ and 2-jet-$\ell^{-}$ HPR channels. The expectation for the signal and background yields correspond to the result of the binned maximum-likelihood fit described in Sec. $\mathrm{VI~D}$ in the paper. The uncertainty of the expectations is the normalization uncertainty of each process after the fit, as described in Sec. $\mathrm{VII~F}$ in the paper.

Migration matrix relating the parton level $p_{\mathrm{T}}(t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-quark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $p_{\mathrm{T}}(\bar t)$ shown on the $y$ axis and the reconstruction level $p_{\mathrm{T}}(\ell \nu b)$ shown on the $x$ axis for the top-antiquark $p_{\mathrm{T}}$ distribution.

Migration matrix relating the parton level $|y(t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-quark $|y|$ distribution.

Migration matrix relating the parton level $|y(\bar t)|$ shown on the $y$ axis and the reconstruction level $|y(\ell \nu b)|$ shown on the $x$ axis for the top-antiquark $|y|$ distribution.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $p_{\mathrm{T}}(\bar t)$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(t)|$ with the uncertainties for each bin given in percent.

Normalized differential t-channel top-quark production cross section as a function of $|y(\bar t)|$ with the uncertainties for each bin given in percent.

Comparison between the measured differential cross sections and the predictions from the NLO calculation using the MSTW2008 PDF set. For each variable and prediction a $\chi^{2}$ value is calculated with HERAfitter using the covariance matrix of each measured spectrum. The theory uncertainties of the predictions are treated as uncorrelated. The number of degrees of freedom (NDF) is equal to the number of bins in the measured spectrum.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, mistag efficiency, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, jet-vertex fraction, $b/\bar{b}$ acceptance, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. The JES $\eta$ intercalibration uncertainty has a sign switch from the first to the second bin. For the $tq$ generator $+$ parton shower uncertainty a sign switch is denoted with $\mp$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $c-$tagging efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}p_{\mathrm{T}}(\bar t)}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, $b-$JES, jet-vertex fraction, $b/\bar{b}$ acceptance, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, and $t \bar{t}$ generator. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content$:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Detailed list of the contribution of each source of uncertainty to the total relative uncertainty on the measured $\dfrac{1}{\sigma}\dfrac{\mathrm{d}\sigma}{\mathrm{d}|y(\bar t)|}$ distribution given in percent for each bin. The list includes only those uncertainties that contribute with more than $1\%$. Sign switches within one uncertainty are denoted with $\mp$ and $\pm$. The following uncertainties contribute to the total uncertainty with less than $1\%$ to each bin content $:$ JES detector, JES statistical, JES physics modeling, JES mixed detector and modeling, JES close-by jets, JES pileup, JES flavor composition, JES flavor response, b-JES, jet energy resolution, jet-vertex fraction, $b/\bar{b}$ acceptance, $b-$tagging efficiency, $c-$ tagging efficiency, mistag efficiency, $E_{\mathrm{T}}^{\mathrm{miss}}$ modeling, lepton uncertainties, $W+$ jets shape variation, $t \bar{t}$ generator, $t \bar{t}$ ISR/FSR, and unfolding. In cases when the uncertainty is report to be "$<1\%$" in the table of the paper the uncertainty is approximated by a value of $0.5\%$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the differential cross section as a function of $|y(\bar t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $p_{\mathrm{T}}(\bar t)$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(t)|$.

Statistical correlation matrices for the normalized differential cross section as a function of $|y(\bar t)|$.