The JEC, JER, and total systematic uncertainties in unfolded cross sections as functions of transverse momentum, for 1.5<|y|<2. The total systematic uncertainty includes also the luminosity, jet identification and trigger efficiency uncertainties.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for |y|<0.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 0.5<|y|<1, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1<|y|<1.5, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

The unfolded measured particle-level inclusive jet cross section as functions of jet pT (markers), for 1.5<|y|<2, compared to the NLO perturbative QCD prediction (histogram), using the CT14NLO PDF set, with muR = muF = HT, and corrected for the NP effects. The experimental and theoretical systematic uncertainties are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = pT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NLO theoretical predictions, using the CT14NLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the CT14NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for |y|<0.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 0.5<|y|<1. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1<|y|<1.5. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

Ratios (points) of the unfolded measured cross sections to the NNLO theoretical predictions, using the NNPDF31NNLO PDF set, with mu = HT, for 1.5<|y|<2. The vertical error bars show the statistical experimental uncertainty. The systematic experimental uncertainty, the total theoretical uncertainty, and the individual sources of theoretical uncertainty are shown.

The effect of aS(MZ) variation, for |y|<0.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 0.5<|y|<1. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1<|y|<1.5. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

The effect of aS(MZ) variation, for 1.5<|y|<2. The NNLO theoretical cross section predictions using the NNPDF31NNLO PDF with m = HT, calculated for different choices of aS (0.108, 0.110, 0.112, 0.114, 0.116, 0.117, 0.118, 0.119, 0.120, 0.122, and 0.124), are divided by the benchmark NNLO prediction for aS = 0.118 and the same choice of PDF set, muR, and muF. Also shown is the experimental unfolded measurement divided by the same benchmark prediction. The width of the unity line corresponds to the statistical uncertainty from the MC integration for the determination of the NNLO prediction. The error bars on the unfolded data correspond to the total experimental statistical and systematic uncertainty added in quadrature.

Unfolded correlation matrix for |y|<0.5.

Unfolded correlation matrix for 0.5<|y|<1.

Unfolded correlation matrix for 1<|y|<1.5.

Unfolded correlation matrix for 1.5<|y|<2.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 14.

Fiducial differential cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 15.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 16.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 17.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 18.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 19.

Fiducial differential cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. The correlation of uncertainties of the measured cross section across bins is presented in Table 20.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 1.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 2.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 3.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 4.

Observed correlations between the bins of the LH-unfolded cross section of the electroweak $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 5.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\ell\ell}$. See Table 6.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{T}}$. See Table 7.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $m_{\mathrm{jj}}$. See Table 8.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $N_{\mathrm{gap}\,\mathrm{jets}}$. See Table 9.

Observed correlations between the bins of the LH-unfolded cross section of the inclusive $W^\pm W^\pm jj$ production as a function of $\xi_{\mathrm{j}3}$. See Table 10.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label M7 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient. The limits on M7 were obtained without taking into account the SM-EFT interference for the EW W$^\pm$Zjj final state.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S02 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label S1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T0 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T1 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Evolution of the one-dimensional expected and observed limits at 95% CL on the parameters corresponding to the quartic operators with label T2 as a function of the cut-off scale. The unitarity bounds as a function of the cut-off scale are defined for one non-zero Wilson coefficient.

Expected and observed exclusion limits at 95% CL for $\sigma_{\mathrm{VBF}}(\mathrm{H}^{\pm\pm}_5) \times \mathcal{B}(\mathrm{H}^{\pm\pm}_5 \rightarrow W^{\pm}W^{\pm})$ as a function of the doubly-charged Higgs mass.

Expected and observed exclusion limits at 95% CL for $\sin\theta_{\mathrm{H}}$ as a function of the doubly-charged Higgs mass in the Georgi-Machacek model.

Summary of results for cross-section of non-prompt $\psi(2S)$ decaying to a muon pair for 13 TeV data in fb/GeV. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $J/\psi$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt fraction of $\psi(2S)$ decaying to a muon pair as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Summary of results for non-prompt $\psi(2S)$ over $J/\psi$ ratio as a percentage for 13 TeV data. Uncertainties are statistical and systematic, respectively.

Correction factors for an assumed angular dependence $\propto 1+\lambda_{\theta} \cos^2\theta $ in the helicity frame, for several values of the parameter $\lambda_{\theta}$. The correction factors were found to be the same (within 1% - 2%) for $J\psi$ and $\psi(2S)$ mesons, for prompt and non-prompt production mechanisms, and for the three rapidity intervals considered in this paper.

Expected exclusion limits at 95% CL from Fig 7(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Expected exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Expected exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Positive one $\sigma$ observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Negative one $\sigma$ observed exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Expected exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

One $\sigma$ band of expected exclusion limits at 95% CL from Fig 7(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRGGWZ-H.

N-1 distribution for $E_{\mathrm{T}}^{\mathrm{miss}}$of observed data and expected background in SRGGSlep-M.

N-1 distribution for $\sum{p_{\mathrm{T}}^\mathrm{jet}}$of observed data and expected background in SRUDD-ge2b.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRLQD.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRSSWZ-H.

N-1 distribution for $m_{\mathrm{eff}}$of observed data and expected background in SRSSSlep-H(loose).

Signal acceptance for SRGGWZ-H signal region from Fig 10(c) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-H signal region from Fig 15(c) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGWZ-M signal region from Fig 10(b) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-M signal region from Fig 15(b) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGWZ-L signal region from Fig 10(a) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGWZ-L signal region from Fig 15(a) in a SUSY scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-L signal region from Fig 12(a) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-L signal region from Fig 17(a) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-M signal region from Fig 12(b) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-M signal region from Fig 17(b) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRGGSlep-H signal region from Fig 12(c) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRGGSlep-H signal region from Fig 17(c) in a SUSY scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRUDD-1b signal region from Fig 14(b) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-1b signal region from Fig 19(b) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-2b signal region from Fig 14(c) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-2b signal region from Fig 19(c) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-ge2b signal region from Fig 14(d) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-ge2b signal region from Fig 19(d) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRUDD-ge3b signal region from Fig 14(e) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal efficiency for SRUDD-ge3b signal region from Fig 19(e) in a SUSY scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Signal acceptance for SRLQD signal region from Fig 14(a) in a SUSY scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Signal efficiency for SRLQD signal region from Fig 19(a) in a SUSY scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Signal acceptance for SRSSWZ-L signal region from Fig 11(a) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-L signal region from Fig 16(a) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-ML signal region from Fig 11(b) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-ML signal region from Fig 16(b) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-MH signal region from Fig 11(c) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-MH signal region from Fig 16(c) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSWZ-H signal region from Fig 11(d) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSWZ-H signal region from Fig 16(d) in a SUSY scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-H signal region from Fig 13(d) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-H signal region from Fig 18(d) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-MH signal region from Fig 13(c) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-MH signal region from Fig 18(c) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-L signal region from Fig 13(a) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-L signal region from Fig 18(a) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-ML signal region from Fig 13(b) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-ML signal region from Fig 18(b) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal acceptance for SRSSSlep-H(loose) signal region from Fig 13(e) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Signal efficiency for SRSSSlep-H(loose) signal region from Fig 18(e) in a SUSY scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-H in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-M in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGWZ-L in a susy scenario where $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1400 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1000 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-L in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-M in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRGGSlep-H in a susy scenario where $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 500 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-1b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-2b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-ge2b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRUDD-ge3b in a susy scenario where $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 1600 GeV, $m(\tilde{t})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRLQD in a susy scenario where direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$. The masses of the superpartners involved in the process are set to $m(\tilde{g})$ = 2200 GeV, $m(\tilde{\chi_{1}^{0}})$ = 1870 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-L in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-ML in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-MH in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSWZ-H in a susy scenario where $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 800 GeV, $m(\tilde{\chi_{1}^{0}})$ = 600 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-H in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-MH in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-L in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-ML in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region SRSSSlep-H(loose) in a susy scenario where $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$. The masses of the superpartners involved in the process are set to $m(\tilde{q})$ = 1000 GeV, $m(\tilde{\chi_{1}^{0}})$ = 800 GeV. Only statistical uncertainties are shown.

Cross-section upper limits at 95% CL from Fig1(a) for $\tilde{g}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(c) for $\tilde{g}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(f) for $\tilde{g}$ decays into anti-top and $\tilde{t}$ and $\tilde{t}$ decays via a non-zero RPV coupling $\lambda''$

Cross-section upper limits at 95% CL from Fig1(e) for direct $\tilde{\chi_{1}^{0}}$ decay into SM leptons and quarks via a non-zero RPV coupling $\lambda'$

Cross-section upper limits at 95% CL from Fig1(b) for $\tilde{q}$ decays into SM gauge bosons and $\tilde{\chi}^{0}_{1}$

Cross-section upper limits at 95% CL from Fig1(d) for $\tilde{q}$ decays into sleptons and subsequently to SM leptons and $\tilde{\chi}^{0}_{1}$

Observed excluded cross-section at 95% CL for the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 8(aux).

Expected exclusion limits at 95% CL for the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

Observed excluded cross-section at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 7(aux) and Fig 10(aux).

positive one $\sigma$ observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

negative one $\sigma$ observed exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from from Fig 13(a) and from Fig 7 and Fig 10(aux).

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Expected exclusion limits at 95% CL for the Wh-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{bRPV}_{2l-SS}$. in a susy scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV, tan$\beta$=5. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{bRPV}_{3l}$. in a susy scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV, tan$\beta$=5. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{WZ}_{high-m_{T2}}$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 150 GeV, $m(\tilde{\chi}^{0} _{1})$ = 50 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the signal region $SR^{WZ}_{low-m_{T2}}$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 150 GeV, $m(\tilde{\chi}^{0} _{1})$ = 50 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l1b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l1b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the high mass $SR^{RPV}_{2l2b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the low mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the medium mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the high mass $SR^{RPV}_{2l3b}$, where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{0} _{1}/\tilde{\chi}^{0} _{2})$ = 200 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the $SR^{Wh}_{low-m_{T2} }$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Higgs bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 300 GeV, $m(\tilde{\chi}^{0} _{1})$ = 100 GeV. Only statistical uncertainties are shown.

Number of signal events expected for 139 fb$^{-1}$ at different stages of the event selection for the $SR^{Wh}_{high-m_{T2} }$. The wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Higgs bosons. The masses of the superpartners involved in the process are set to $m(\tilde{\chi}^{\pm} _{1}/\tilde{\chi}^{0} _{2})$ = 300 GeV, $m(\tilde{\chi}^{0} _{1})$ = 100 GeV. Only statistical uncertainties are shown.

Signal Hepdataeptance for $SR^{bRPV}_{2l-SS}$ signal region from Fig 13(a)(aux) in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal Hepdataeptance for $SR^{bRPV}_{3l}$ signal region from Fig 13(b)(aux) in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal acceptance for $SR^{WZ}_{high-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal acceptance for $SR^{WZ}_{low-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal acceptance for $SR^{RPV}_{2l1b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l1b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l2b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{RPV}_{2l3b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{bRPV}_{2l-SS}$ signal region in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal efficiency for $SR^{bRPV}_{3l}$ signal region in a SUSY scenario where $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are produced in pairs and decay to all possible allowed bRPV decays.

Signal efficiency for $SR^{WZ}_{high-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal efficiency for $SR^{WZ}_{low-m_{T2}}$ in a SUSY scenario where the wino-like doublet pair ($\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$) were produced and then decays into $bino-like \tilde{\chi}^{0} _{1}$ which is the lightest SUSY particle (LSP) accompanied by mass on-shell or mass off-shell W and Z bosons.

Signal efficiency for $SR^{RPV}_{2l1b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l1b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l2b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-L$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-M$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal efficiency for $SR^{RPV}_{2l3b}-H$ signal region in a SUSY scenario where the $\tilde{\chi}^{0} _{1} and \tilde{\chi}^{0} _{2}$ are directly produced and undergoes prompt RPV decays.

Signal acceptance for $SR^{Wh}_{high-m_{T2} }$ signal region from Fig 11(a)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal acceptance for $SR^{Wh}_{low-m_{T2} }$ signal region from Fig 11(b)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal efficiency for $SR^{Wh}_{high-m_{T2} }$ signal region from Fig 15(a)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Signal efficiency for $SR^{Wh}_{low-m_{T2} }$ signal region from Fig 15(b)(aux) in a SUSY scenario where direct production of a lightest $\tilde{\chi}^{\pm} _{1} and \tilde{\chi}^{0} _{2}$ , decay with 100% branching ratio to a final state with a same sign light lepton (e or $\mu$) pair and two lightest neutralino1, via the on-shell emission of SM W and Higgs bosons,

Observed 95% X-section upper limits as a function of higgsino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{1}/\tilde{\chi}^{0}_{2}$ mass in the bilinear RPV model from Fig 14.

Observed 95% X-section upper limits as a function of higgsino $\tilde{\chi}^{0}_{1}/\tilde{\chi}^{0}_{2}$ mass in the UDD RPV model from Fig 18.

Observed 95% X-section upper limits as a function of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ mass in the WZ-mediated simplified model of wino $\tilde{\chi}^{\pm}_{1}/\tilde{\chi}^{0}_{2}$ production from Fig 9(aux).

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{WZ}_{high-m_{T2}}$ from publication's Figure 11(a) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{WZ}_{low-m_{T2}}$ from publication's Figure 11(b) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{bRPV}_{2l-SS}$ from publication's Figure 11(c) . The last bin is inclusive.

N-1 distributions for $m_{T2}$ of observed data and expected background towards $SR^{bRPV}_{3l}$ from publication's Figure 11(d) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l1b}-L$ from publication's Figure 16(a) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l2b}-M$ from publication's Figure 16(b) . The last bin is inclusive.

N-1 distributions for $\sum p^{b-jet}_{T}/\sum p^{jet}_{T}$ of observed data and expected background towards $SR^{RPV}_{2l3b}-H$ from publication's Figure 16(c) . The last bin is inclusive.

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in ee channel

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in e$\mu$ channel

N-1 distribution for $E_{T}^{miss}$ in $SR^{Wh}_{high-m_{T2} }$ in $\mu\mu$ channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in ee channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in e$\mu$ channel

N-1 distribution for $\mathcal{S}(E_{T}^{miss})$ in $SR^{Wh}_{low-m_{T2} }$ in $\mu\mu$ channel

Self-normalised yield of electrons from heavy-flavour hadron decays as a function of normalised charged-particle pseudorapidity density at midrapidity computed in pp collisions at $\sqrt{s}$ = 13 TeV in different $p_{\rm T}$ intervals

Self-normalised yield of electrons from heavy-flavour hadron decays as a function of normalised charged-particle pseudorapidity density at midrapidity computed in p--pPb collisions at $\sqrt{s_{\rm NN}}$ = 8.16 TeV in different $p_{\rm T}$ intervals

Measured unfolded differential cross-section as a function of the dilepton transverse momentum $p^{ll}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the the four-body transverse momentum $p^{ll\gamma\gamma}_{\mathrm{T}}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the diphoton invariant mass $m_{\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Measured unfolded differential cross-section as a function of the four-body invariant mass $m_{ll\gamma\gamma}$. NLO predictions from Sherpa 2.2.10 and MadGraph5_aMC@NLO 2.7.3 are also shown. The uncertainty in the predictions is divided into statistical and theoretical uncertainties (scale and PDF+$\alpha_{s}$).

Expected and observed $95\%$ confidence intervals for the coupling parameters $f_{T,j}/\Lambda^{4}$ of transverse dimension-8 operators. All parameter values outside of the stated range are excluded at the chosen confidence level. No unitarity constraints are applied.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,8}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,0}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,1}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,2}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,5}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,6}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,7}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Expected and observed unitarised $95\%$ confidence intervals for the coupling parameter $f_{T,9}/\Lambda^{4}$ in the clipping energy range between 1.1 and 5 TeV. The non-unitarised limits ($E_c = \infty$) are also shown. All parameter values outside of the stated range are excluded at the chosen confidence level.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the leading $p_{T}$ jet ($p_{T1}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the subleading $p_{T}$ jet ($p_{T2}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the third leading $p_{T}$ jet ($p_{T3}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the fourth leading $p_{T}$ jet ($p_{T4}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity distribution in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet multiplicity in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource.

Jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{t}\varphi}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{tb}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{bW}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\text{tZ}}$ where the other Wilson coefficients are simultaneously fit.

Negative log-likelihood difference in $\text{c}_{\varphi\text{t}}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\varphi\text{Q}}^{3}, \text{c}_{\varphi\text{Q}}^{-}$ where the other Wilson coefficients are fixed to 0.

Negative log-likelihood difference in $\text{c}_{\text{tW}}, \text{c}_{\text{tZ}}$ where the other Wilson coefficients are fixed to 0.

The rho-parameter, i.e. the ratio of the real to imaginary part of the elastic scattering amplitude extrapolated to t=0. The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter B from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter C from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The nuclear slope parameter D from a fit of the form exp(-Bt-Ct^2-Dt^3). The systematic uncertainty includes experimental and theoretical uncerainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section measured inside the fiducial volume. The systematic uncertainty includes experimental uncertainties.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total elastic cross section obtained from the fitted parameters, extrapolated to full phase space using only the nuclear amplitude.

The total inelastic cross section.

The total inelastic cross section.

The ratio of elastic to total cross section.

The ratio of elastic to total cross section.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

The differential elastic cross section as function of t with statistical and systematic uncertainties. The systematic uncertainties are given as signed relative change for 20 sources of experimental uncertainty associated to nuisance parameters used in the fit for the extraction of physics parameters.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

Statistical covariance matrix for the measurement of the differential elastic cross section as function of t.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter &lambda; as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 71 &le; n_ch &lt; 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 231 &le; n_ch &lt; 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13&nbsp;TeV (black circles) and 7&nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 &lt; m_ch &le; 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 &nbsp;TeV (black circles) and 7 &nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 &lt; k_T &le;500 &nbsp;MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, &lambda;, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T &gt; 100&nbsp;MeV at &radic;s= 13&nbsp;TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |&eta;| &lt; 2.5 and both p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters &gamma; and &delta; resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Comparison of observed $95\%$ CL intervals for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$. Results are shown from a CMS ttZ measurement [JHEP 03 (2020) 056], from a CMS ttZ & tZq interpretation [arXiv:2107.13896], from a CMS ttG (lepton+jets) measurement [arXiv:2107.01508], from this measurement, and from a global fit by J. Ellis et al. [JHEP 04 (2021) 279].

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Extracted scale factors for the contribution from misidentified electrons for the three data-taking periods, and the Z$\gamma$, W$\gamma$ simulations.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The covariance matrix of statistic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of statistical uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $p_{T}(\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $|\eta(\gamma)|$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

The correlation matrix of systematic uncertainties for the unfolded differential measurement for $\Delta R(l,\gamma)$.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Differential cross sections as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Differential cross sections as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events.

Area normalized distribution as function of Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Area normalized distribution as function of Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Area normalized distribution as function of transverse momentum imbalance between leading and subleading jet for Z+ ≥ 2 jets events

Response matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events.

Response matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events.

Response matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events.

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for absolute differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and the leading jet for Z+ ≥ 1 jet events (for normalized differential cross section measurements).

Correlation matrix for Delta Phi between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between Z boson and dijet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Correlation matrix for transverse momentum imbalance between the leading jet and subleading jet for Z+ ≥ 2 jets events (for normalized differential cross section measurements).

Post-fit $m_{T}$ distribution in the SR 2J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 4J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-veto N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{T}$ distribution in the SR 6J b-tag N-1 region. N-1 refers to all cuts except for the requirement on $m_T$ being applied. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Pre-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties (added in quadrature). The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the WR6J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 2J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J low-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 4J high-x b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Post-fit $m_{eff}$ distribution in the 4J high-x b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Post-fit $m_{eff}$ distribution in the 6J b-tag signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Post-fit $m_{eff}$ distribution in the 6J b-veto signal region. Uncertainties include statistical and systematic uncertainties. Including exemplary signal points. The value 9999 is used as a placeholder for infinity.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for the gluino one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step x = 1/2 model. space.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Observed 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the gluino one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for the squark one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-step variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Observed 95% CL exclusion contours for one-flavour schemes in one-step x = 1/2 model.

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Expected 95% CL exclusion contours for the squark one-flavour schemes in variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x

Upper limits on the signal cross section for simplified model gluino one-step x = 1/2

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Upper limits on the signal cross section for simplified model gluino one-step variable-x

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Upper limits on the signal cross section for simplified model squark one-step x = 1/2

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step x=1/2 in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Upper limits on the signal cross section for simplified model squark one-step variable-x in one-flavour schemes

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the TR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the WR2J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Post-fit $m_{eff}$ distribution in the TR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the WR4J control region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 2J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-tag validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 4J b-veto validation region. Uncertainties include statistical and systematic uncertainties. The value 9999 is used as a placeholder for infinity.

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Post-fit $m_{eff}$ distribution in the 6J b-tag validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Post-fit $m_{eff}$ distribution in the 6J b-veto validation region. Uncertainties include statistical and systematic uncertainties.

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR2JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR4JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBT. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Event selection cutflow for two representative signal samples for the SR6JBV. The gluino, squark, chargino and neutralino masses are reported. Weighted events including statistical uncertainties are shown.

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for gluino production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step x = 1/2 simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR2J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jhx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx discovery region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Tag bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR4Jlx b-Veto bin3 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin1 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin2 region for squark production one-step variable-x simplified models

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal acceptance in SR6J b-Tag bin3 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Tag bin4 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin1 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin2 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin3 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J b-Veto bin4 region for squark production one-step variable-x simplified models

Signal efficiency in SR2J b-Veto bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J discovery high region for squark production one-step variable-x simplified models

Signal efficiency in SR2J discovery high region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal acceptance in SR6J discovery low region for squark production one-step variable-x simplified models

Signal efficiency in SR2J discovery low region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx discovery region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin2 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR2J b-Veto bin1 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0

Signal efficiency in SR4Jhx b-Tag bin3 region for gluino production one-step x = 1/2 simplified models. The -1 value indicates the truth yields for this point is 0 but the reco yields is not 0