Cutflow for SR-$e\mu$ for 2 representative signal points. For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Cutflow for SR-$\mu\mu$ for 5 representative signal points. For the following $\tilde{\mu}$ mass and lifetime points, the number of Monte Carlo events generated are: 24,000 for (100 GeV, 0.01 ns), 16,000 for (300 GeV, 1 ns), and 12,000 for (500 GeV, 0.1 ns). For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Cutflow for SR-$\mu\mu$ for 5 representative signal points. For the following $\tilde{\mu}$ mass and lifetime points, the number of Monte Carlo events generated are: 24,000 for (100 GeV, 0.01 ns), 16,000 for (300 GeV, 1 ns), and 12,000 for (500 GeV, 0.1 ns). For the $\tilde{\tau}$ mass and lifetime points, the number of Monte Carlo events generated are: 30,000 for (200 GeV, 0.1 ns), and 104,000 for (300 GeV, 0.1 ns).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, where all slepton flavors are mass degenerate (co-NLSP).

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the selectron signal model. Selectron ($\tilde{e}_{L, R}$) refers to the scalar superpartners of left- and right-handed electrons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed electrons, $\tilde{e}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed electrons, $\tilde{e}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the smuon signal model. Smuon ($\tilde{\mu}_{L, R}$) refers to the scalar superpartners of left- and right-handed muons.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the left-handed muons, $\tilde{\mu}_L$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the superpartners of the right-handed muons, $\tilde{\mu}_R$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for the stau signal model. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin\theta_{\tilde\tau}=0.95$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

Upper limits on observed signal cross section, $\sigma_\text{obs}^\text{95}$, for $\tilde{\tau}_L$ production, where $\tilde{\tau}_L$ is pure-state superpartner of the left-handed $\tau$.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

The expected and observed yields in the signal regions. Combined statistical and systematic uncertainties are presented. Estimates are truncated at 0 if the size of measured systematic uncertainties would yield a negative result.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal electrons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.47 for electrons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Electron selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Reconstruction efficiency as a function of $|d_{0}|$ and $p_\text{T}$ for signal muons. Monte Carlo samples with $\tilde{e}$ or $\tilde{\mu}$ with mass 400 GeV and 1 ns lifetime were used. Efficiency is defined as the number of leptons passing all signal requirements and matched to generator-level muons divided by the number of generator level leptons with $p_\text{T} > 65$ GeV, $|d_{0}| >$ 3 mm, and |$\eta$| $<$ 2.5 for muons. No event-level selections are made. Reconstructed leptons must pass all quality criteria, including the cosmic veto. Muon selection scale factors are included on the reconstructed leptons. The overflow is not shown in these plots.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{e}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\mu}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$ee$ from $\tilde{e}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47 for electrons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$\mu\mu$ from $\tilde{\mu}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 for muons, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Acceptance for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Acceptance is defined as the number of accepted events at generator level in signal Monte Carlo simulation divided by the total number of events in the sample. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$ee$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth electrons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.47, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$e\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Efficiency for $\tilde{\tau}$ of various masses and lifetimes in SR-$\mu\mu$. Efficiency is defined as the number of selected reconstruced events divided by the acceptance. To be accepted, events are required to have at least 2 truth muons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5, $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. To be selected, events must satisfy all signal region requirements.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Acceptance as a function of the generator-level $p_\text{T}$ of the leading and subleading lepton in SR-$e\mu$ from $\tilde{\tau}$ decays. The plot is made from signal Monte Carlo events with $\tilde{\ell}$ with mass of 400 GeV and lifetime of 1 ns. To be accepted, events are required to have at least 2 truth leptons with $p_\text{T} > 65$ GeV, |$\eta$| $<$ 2.5 (2.47) for muons (electrons), $|d_{0}| > 3$ mm, and $\Delta R_{\ell\ell} > 0.2$. Events are also required to fall into one of the acceptance regions of the triggers used. At generator level, events must have one of the following: one electron with $p_\text{T} >$ 160 GeV, 2 electrons each with $p_\text{T} >$ 60 GeV, or 1 muon with $p_\text{T} >$ 60 GeV and $|\eta| < 1.07$. The overflow is not shown in these plots.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane where all slepton flavors and chiralities are mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L, R}$) refer to the scalar superpartners of left- and right-handed electrons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{L}$) refer to the scalar superpartners of left-handed electrons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$ee$ targeting selectron production. Selectrons ($\tilde{e}_{R}$) refer to the scalar superpartners of right-handed electrons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L, R}$) refer to the scalar superpartners of left- and right-handed muons, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{L}$) refer to the scalar superpartners of left-handed muons.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\ell})$ plane in SR-$\mu\mu$ targeting smuon production. Smuons ($\tilde{\mu}_{R}$) refer to the scalar superpartners of right-handed muons. Purple denotes the region excluded by LEP.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau})$ plane. Staus, $\tilde{\tau}_{1,2}$ are the mixed states of the superpartners of the left- and right-handed $\tau$ leptons, with mixing angle $\sin(\theta_{\tilde\tau})=0.95$, which are assumed to be mass degenerate.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Observed 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Expected 95% CL exclusion sensitivity. The limit is displayed in the lifetime vs. $m(\tilde{\tau}_L)$ plane, where $\tilde{\tau}_L$ is the pure-state super-partner of the left-handed $\tau$. Purple denotes the region excluded by LEP. This result does not present signficant sensitivity to the pure-state superpartner of the right-handed $\tau$.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> ee. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> emu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the transverse decay radius Rxy of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Dependence of the overall signal efficiency on the pT of the long-lived Z' for Z' -> mumu. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

Overall signal efficiency as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model. The error bars indicate the total uncertainties.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 700 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda121 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

95% CL upper limits on the squark-antisquark production cross-section as a function of the mean proper lifetime (ctau) of the neutralino for the lambda122 scenario of the RPV SUSY model and a 1600 GeV squark. The uncertainties of the expected limit indicate the +-1sigma variations.

Fraction of detector volume covered by the material veto as a function of z and Rxy of the displaced dilepton vertex.

Fraction of detector volume covered by the disabled pixel modules veto veto as a function of z and Rxy of the displaced dilepton vertex.

Observed Rxy distribution of vertices composed of two non-leptonic tracks in a control sample in the data and the predicted distribution obtained from the event mixing. The error bars indicate the statistical uncertainties.

Rxy distributions of Kshort vertices from the large radius tracking in the data and background MC samples. Data has been normalised such that the total number of Kshort from the standard tracking in the data agrees with the total number of Kshort from the standard tracking in the MC. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the statistical uncertainties.

Acceptance per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the statistical uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Detection efficiency per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> eenu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> emunu. The error bars indicate the total uncertainties.

Overall signal efficiency (acceptance times efficiency) per decay as a function of the mean proper lifetime (ctau) of the neutralino for neutralino -> mumunu. The error bars indicate the total uncertainties.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron pair in LLP -> eeX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the electron and muon pair in LLP -> emuX.

Detection efficiency per decay for Rxy < 22 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 22 <= Rxy < 38 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 38 <= Rxy < 73 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 73 <= Rxy < 111 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 111 <= Rxy < 145 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay for 145 <= Rxy < 300 mm as a function of the invariant mass and pT of the muon pair in LLP -> mumuX.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 100 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 250 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 500 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 750 GeV and LLP -> mumu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> ee.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> emu.

Detection efficiency per decay as a function of the transverse decay radius Rxy and the dilepton pT for a LLP mass of 1000 GeV and LLP -> mumu.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 100 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 250 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 500 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 750 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Acceptance, detection efficiency, and overall signal efficiency in the Z' toy model for mZ' = 1000 GeV, three mean proper lifetimes (ctau) and the three decay modes of the Z'.

Distribution of $S$, which is one of the discriminating variables used to define the $2\ell^{sc}$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=3), which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{leading jet}$, which is one of the discriminating variables used to define the $3\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $E_{T}^{miss}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $\Delta R_{\ell^{\pm}\ell^{\pm}}^{min}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $m_{x\ell}$ ($x$=4), which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Distribution of $p_{T}^{\ell_{1}}$, which is one of the discriminating variables used to define the $4\ell$ SRs. The events are selected with the preselection requirements listed in Table 4 in the paper. The data (dots) are compared with the expected contributions from the relevant background sources (histograms). The expected signal distributions for $m_{H^{\pm\pm}} = 300~GeV$ are also shown, scaled to the observed number of events. The last bin includes overflows.

Contributions from different categories of uncertainties relative to the expected background yields in the defined SRs, as obtained after performing the likelihood ratio test discussed in Section 9 in the paper. The uncertainties are shown for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

Data event yields compared with the expected contributions from relevant background sources, for the combination of the individual channels of the $2\ell^{sc}$, $3\ell$ and $4\ell$ SRs. The total uncertainties in the expected event yields are shown as the hatched bands. The SRs are indicated along the horizontal axis. In the HEPData entry, the x-axis is simplified for easier visualisation. The first number indicates the sub channel (2:$2\ell^{sc}$, 3:$3\ell$, 4:$4\ell$), while the second number indicates the mass point (2:200, 3:300, 4:400, 5:500).

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $2\ell^{sc}$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $3\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

The $E_{T}^{miss}$ distribution for the SRs of the $m_{H^{\pm\pm}} = 300~GeV$ signal mass hypothesis, where the selection requirement on $E_{T}^{miss}$ has been removed. In the attached plot, the signals are stacked on top of the backgrounds while individuals contributions of the $4\ell$ channel are shown in HEPData. The last bin, isolated by a vertical red dashed line, is inclusive and corresponds to the SR.

Observed and expected upper limits of the $H^{\pm\pm}$ pair production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(a) in the paper.

Observed and expected upper limits of the $H^{\pm\pm}$ and $H^{\pm}$ production cross section times branching fraction at 95% CL obtained from the combination of 2$\ell^{sc}$, 3$\ell$ and 4$\ell$ channels. The region above the observed limit is excluded by the measurement. The bands represent the expected exclusion curves within one and two standard deviations.

The theoretical prediction of Figure 9(b) in the paper.

Data event yields compared with the estimated background in the $m_{H^{\pm\pm}} = 200~GeV$ or $m_{H^{\pm\pm}} = 220~GeV$ SRs. SFOC 0 and SFOC 1,2 refer to the number of same-flavour opposite charge lepton pairs. The total uncertainties in the estimated background yields are shown as the hashed bands. In the HEPData entry, the x-axis is simplified for easier visualisation (1:$e^{\pm}e^{\pm}$, 2:$e^{\pm}\mu^{\pm}$, 3:$\mu^{\pm}\mu^{\pm}$, 4:SFOC 0, 5:SFOC 1,2, 6:$4\ell$).

Observed and expected upper limit on the cross-section for $pp \to H^{++}H^{--}$ for a combination of partial branching ratios of $B(ee) = 30\%$, $B(e \mu ) = 40\%$, and $B( \mu \mu ) = 30\%$.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit for the CRs. For backgrounds whose normalisation is extracted from the fit, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields in the VRs. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-low for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $m_{T2}$ in VR-top-high for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ in VR-WW-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-VZ for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Distributions of $E_T^{miss}$ significance in VR-top-WW for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Breakdown of the dominant systematic uncertainties on background estimates in the inclusive SRs requiring $m_{T2}$>100 GeV after performing the profile likelihood fit. Note that the individual uncertainties can be correlated, and do not necessarily add up quadratically to the total background uncertainty. The percentages show the size of the uncertainty relative to the total expected background. "Top theoretical uncertainties" refers to $t\bar t$ theoretical uncertainties and the uncertainty associated to $Wt-t\bar t$ interference added quadratically.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the DF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted post-fit background yields for the SF inclusive SRs. The model independent upper limits at 95% confidence level (CL) on the observed and expected number of beyond the SM events $S^{0.95}_{obs/exp}$ and the effective beyond the SM cross-section $\sigma^{0.95}_{obs}$ are also reported. The last row reports the $p_0$-value of the SM-only hypothesis. For SRs where the data yield is smaller than expected, the $p$-value is truncated at 0.50. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$+V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRSF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-0J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Distributions of $m_{T2}$ in SRDF-1J for data and the estimated SM backgrounds. The normalisation factors extracted from the corresponding CRs are used to rescale the $t\bar t$, single top, WW, WZ and ZZ backgrounds. The fake and non-prompt leptons background (FNP) is calculated using the data-driven matrix method. The uncertainty band includes all sources of systematic and statistical errors and the last bin includes the overflow. Distributions for three benchmark signal points are overlaid for comparison.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with $W$ boson mediated decays. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for chargino-pair production with slepton/sneutrino mediated mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for selectron-pair production, with left and right handed selectron production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed selectron-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for smuon-pair production, with left and right handed smuon production combined. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed smuon-pair production. All limits are computed at 95% CL.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned DF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=0$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed events and predicted background yields from the fit in the binned SF SRs with $n_{non-b-tagged jets}=1$. For backgrounds whose normalisation is extracted from the fit in the CRs, the yield expected from the simulation before the fit is also reported. The background denoted as "Other" in the Table includes the non-dominant background sources for this analysis, i.e. Z+jets, $t\bar t$ +V, Higgs and Drell-Yan events. A "–" symbol indicates that the background contribution is negligible.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for left-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Observed exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Expected exclusion limits on SUSY simplified models for right-handed slepton-pair production. All limits are computed at 95% CL.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with W -boson-mediated decays.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for chargino-pair production with slepton/sneutrino-mediated decays. The mass relation $m(\tilde{l}_L)=\frac{1}{2}[m(\tilde{\chi}^{\pm}_1 + m(\tilde{\chi}^{0}_1)]$ is assumed.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Upper limits on signal cross-section (fb) for slepton-pair production.

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[100,105).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[105,110).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[110,120).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[120,140).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[140,160).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[160,180).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[180,220).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[220,260).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-SF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-0J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Acceptance for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Signal Efficiency for direct chargino-pair production with W-boson mediated decays in SR-DF-1J-[260,inf).

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via $W^{\pm}W^{\mp}$. The masses of the two charginos are 300 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 50 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde{\chi}_1^{\pm}\tilde{\chi}_1^{\mp}$ decay via slepton-neutrino/sneutrino-lepton pair. The masses of the two charginos are 600 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 1 GeV. The slepton/sneutrino masses are 300 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Cutflow for supersymmetric model where $\tilde\ell\tilde\ell$ are produced. Only $\tilde{e}$ and $\tilde{\mu}$ are considered in this model. The masses of the two sleptons are 400 GeV, while the mass of $\tilde{\chi}_1^{0}$ is 200 GeV. The numbers are normalised to the luminosity of 139~fb$^{-1}$.

Distributions of ETmiss for data and the expected SM backgrounds in the 2l+jets channel for SR2-int/high, without the final ETmiss requirement applied. Two signal points are added for comparison.

Distributions of ETmiss for data and the expected SM backgrounds in the 2l+jets channel for SR2-low, without the final ETmiss requirement applied. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-slep-a. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-slep-b. Two signal points are added for comparison.

Distributions of the third leading lepton pT in SR3-slep-c,d,e. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-0Ja,b,c. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Ja. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Jb. Two signal points are added for comparison.

Distributions of ETmiss for data and the estimated SM backgrounds in the 3l channel for SR3-WZ-1Jc. Two signal points are added for comparison.

Expected 95% CL exclusion limit for chargino-pair production.

Observed 95% CL exclusion limit for chargino-pair production.

Expected 95% CL exclusion limit for direct slepton production.

Observed 95% CL exclusion limit for direct slepton production.

Expected 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with slepton-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 111 < mll < 150 GeV (corresponding to SR2-SF-a,b,c,d). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 150 < mll < 200 GeV (corresponding to SR2-SF-e,f,g,h). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions 200 < mll < 300 GeV (corresponding to SR2-SF-i,j,k,l). Two signal points are added for comparison.

The mT2 distributions for data and the estimated SM backgrounds in the exclusive SF signal regions of the 2l+0jets channel in the regions mll > 300 GeV (corresponding to SR2-SF-m). Two signal points are added for comparison.

Signal acceptance for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$ .

Signal efficiency for C1C1 production in SR2-SFloose for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-SFtight for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF150 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF200 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal efficiency for C1C1 production in SR2-DF300 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for direct Slepton production in SR2-SF-Tight for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for C1N2 production in SR2-high for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->2j) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepa for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepd for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal efficiency for Slep production in SR3-slepe for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-0Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Ja for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jb for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal acceptance for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal efficiency for WZ production in SR3-WZ-1Jc for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

Signal regions contributing to the observed exclusion limit for chargino-neutralino production with W/Z-mediated decays.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 3l channel.

Observed 95% CL exclusion limit for chargino-neutralino production with W/Z-mediated decays in the 2l+jets channel.

Expected 95% CL exclusion limit for left-handed slepton production.

Observed 95% CL exclusion limit for left-handed slepton production.

Expected 95% CL exclusion limit for right-handed slepton production.

Observed 95% CL exclusion limit for right-handed slepton production.

95% upper limit on production cross-section for chargino-pair production.

95% upper limit on production cross-section for direct slepton production.

95% upper limit on production cross-section for chargino-neutralino production with slepton-mediated decays.

95% upper limit on production cross-section for chargino-neutralino production with W/Z-mediated decays

<b>Cutflow 1</b> Event counts for a signal point in SR2-SF-loose for the process P P -> $\tilde{\ell}^\pm \tilde{\ell}^\mp$ -> $\ell^\pm \ell^\mp \widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

<b>Cutflow 2</b> Event counts for a signal point in SR2-SF-loose and SR2-DF-100 for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

<b>Cutflow 3</b> Event counts for two signal points in SR2-int for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

<b>Cutflow 4</b> Event counts for two signal points in SR2-low for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_1^\mp$ -> 2x $\ell \nu \widetilde{\chi}_1^0$.

<b>Cutflow 5</b> Event counts for two signal points in SR3-WZ-0Ja/b/c and SR3-WZ-1Ja/b/c for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $W$(->l $\nu$) $Z$(->2l) $\widetilde{\chi}_1^0 \widetilde{\chi}_1^0$.

<b>Cutflow 6</b> Event counts for two signal points in SR3-slepa-e for the process P P -> $\widetilde{\chi}_1^\pm \widetilde{\chi}_2^0$ -> $\tilde{\ell}_L \tilde{\ell}_L l (\tilde{\nu}\nu), l \tilde{\nu} \tilde{\ell}_L (\tilde{\nu}\nu)$ -> $l \nu \widetilde{\chi}_1^0 l l (\nu \nu) \widetilde{\chi}_1^0$.

<b>Kinematics 2</b> Kinematic distributions after the background-only fit showing the data as well as the expected background in the inclusive electroweakino SR&#8467;&#8467;-m_{&#8467;&#8467;} [1, 60] (top) and slepton SR&#8467;&#8467;-m_T2¹⁰⁰ [100, &infin;] (bottom) signal regions. The arrow in the E_T^miss/H_T^lep variables indicates the minimum value of the requirement imposed in the final SR selection. The m_{&#8467;&#8467;} and m_T2 distributions (right) have all the SR requirements applied. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The uncertainty bands plotted include all statistical and systematic uncertainties. The last bin includes overflow. The dashed lines represent benchmark signal samples corresponding to the Higgsino H&#771; and slepton &#8467;&#771; simplified models. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 3</b> Kinematic distributions after the background-only fit showing the data as well as the expected background in the inclusive electroweakino SR&#8467;&#8467;-m_{&#8467;&#8467;} [1, 60] (top) and slepton SR&#8467;&#8467;-m_T2¹⁰⁰ [100, &infin;] (bottom) signal regions. The arrow in the E_T^miss/H_T^lep variables indicates the minimum value of the requirement imposed in the final SR selection. The m_{&#8467;&#8467;} and m_T2 distributions (right) have all the SR requirements applied. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The uncertainty bands plotted include all statistical and systematic uncertainties. The last bin includes overflow. The dashed lines represent benchmark signal samples corresponding to the Higgsino H&#771; and slepton &#8467;&#771; simplified models. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 3</b> Kinematic distributions after the background-only fit showing the data as well as the expected background in the inclusive electroweakino SR&#8467;&#8467;-m_{&#8467;&#8467;} [1, 60] (top) and slepton SR&#8467;&#8467;-m_T2¹⁰⁰ [100, &infin;] (bottom) signal regions. The arrow in the E_T^miss/H_T^lep variables indicates the minimum value of the requirement imposed in the final SR selection. The m_{&#8467;&#8467;} and m_T2 distributions (right) have all the SR requirements applied. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The uncertainty bands plotted include all statistical and systematic uncertainties. The last bin includes overflow. The dashed lines represent benchmark signal samples corresponding to the Higgsino H&#771; and slepton &#8467;&#771; simplified models. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 4</b> Kinematic distributions after the background-only fit showing the data as well as the expected background in the inclusive electroweakino SR&#8467;&#8467;-m_{&#8467;&#8467;} [1, 60] (top) and slepton SR&#8467;&#8467;-m_T2¹⁰⁰ [100, &infin;] (bottom) signal regions. The arrow in the E_T^miss/H_T^lep variables indicates the minimum value of the requirement imposed in the final SR selection. The m_{&#8467;&#8467;} and m_T2 distributions (right) have all the SR requirements applied. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The uncertainty bands plotted include all statistical and systematic uncertainties. The last bin includes overflow. The dashed lines represent benchmark signal samples corresponding to the Higgsino H&#771; and slepton &#8467;&#771; simplified models. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 4</b> Kinematic distributions after the background-only fit showing the data as well as the expected background in the inclusive electroweakino SR&#8467;&#8467;-m_{&#8467;&#8467;} [1, 60] (top) and slepton SR&#8467;&#8467;-m_T2¹⁰⁰ [100, &infin;] (bottom) signal regions. The arrow in the E_T^miss/H_T^lep variables indicates the minimum value of the requirement imposed in the final SR selection. The m_{&#8467;&#8467;} and m_T2 distributions (right) have all the SR requirements applied. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The uncertainty bands plotted include all statistical and systematic uncertainties. The last bin includes overflow. The dashed lines represent benchmark signal samples corresponding to the Higgsino H&#771; and slepton &#8467;&#771; simplified models. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Exclusion 1 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 1 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 1 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 1 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 2 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 2 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 2 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 2 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with pm1&sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with pm1&sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct Higgsino (top) and wino (bottom) production. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive the limit, which is projected into the &Delta; m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) vs. m(&chi;&#771;₂⁰) plane. For Higgsino production, the chargino &chi;&#771;₁^pm mass is assumed to be halfway between the two lightest neutralino masses, while m(&chi;&#771;₂⁰) = m(&chi;&#771;₁^pm) is assumed for the wino--bino model. The gray regions denote the lower chargino mass limit from LEP [20]. The blue region in the lower plot indicates the limit from the 2&#8467;+3&#8467; combination of ATLAS Run 1 [41,42].

<b>Exclusion 3 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with &plusmn; 1 &sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with &plusmn; 1 &sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct slepton production. A fit of slepton signals to the m_T2¹⁰⁰ spectrum is used to derive the limit, which is projected into the &Delta; m(&#8467;&#771;, &chi;&#771;₁⁰) vs. m(&#8467;&#771;) plane. Slepton &#8467;&#771; refers to the scalar partners of left- and right-handed electrons and muons, which are assumed to be fourfold mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R). The gray region is the e&#771;_R limit from LEP [20,24], while the blue region is the fourfold mass degenerate slepton limit from ATLAS Run 1 [41].

<b>Exclusion 3 (exp)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with &plusmn; 1 &sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with &plusmn; 1 &sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct slepton production. A fit of slepton signals to the m_T2¹⁰⁰ spectrum is used to derive the limit, which is projected into the &Delta; m(&#8467;&#771;, &chi;&#771;₁⁰) vs. m(&#8467;&#771;) plane. Slepton &#8467;&#771; refers to the scalar partners of left- and right-handed electrons and muons, which are assumed to be fourfold mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R). The gray region is the e&#771;_R limit from LEP [20,24], while the blue region is the fourfold mass degenerate slepton limit from ATLAS Run 1 [41].

<b>Exclusion 3 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with &plusmn; 1 &sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with &plusmn; 1 &sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct slepton production. A fit of slepton signals to the m_T2¹⁰⁰ spectrum is used to derive the limit, which is projected into the &Delta; m(&#8467;&#771;, &chi;&#771;₁⁰) vs. m(&#8467;&#771;) plane. Slepton &#8467;&#771; refers to the scalar partners of left- and right-handed electrons and muons, which are assumed to be fourfold mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R). The gray region is the e&#771;_R limit from LEP [20,24], while the blue region is the fourfold mass degenerate slepton limit from ATLAS Run 1 [41].

<b>Exclusion 3 (obs)</b> Expected 95% CL exclusion sensitivity (blue dashed line) with &plusmn; 1 &sigma;_exp (yellow band) from experimental systematic uncertainties and observed limits (red solid line) with &plusmn; 1 &sigma;_theory (dotted red line) from signal cross-section uncertainties for simplified models of direct slepton production. A fit of slepton signals to the m_T2¹⁰⁰ spectrum is used to derive the limit, which is projected into the &Delta; m(&#8467;&#771;, &chi;&#771;₁⁰) vs. m(&#8467;&#771;) plane. Slepton &#8467;&#771; refers to the scalar partners of left- and right-handed electrons and muons, which are assumed to be fourfold mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R). The gray region is the e&#771;_R limit from LEP [20,24], while the blue region is the fourfold mass degenerate slepton limit from ATLAS Run 1 [41].

<b>Upper Limits 1</b> The first two columns present observed (N_obs) and expected (N_exp) event yields in the inclusive signal regions. The latter are obtained by the background-only fit of the control regions, and the errors include both statistical and systematic uncertainties. The next two columns show the observed 95% CL upper limits on the visible cross-section (&lang;&epsilon;&sigma;&rang;_obs⁹⁵) and on the number of signal events (S_obs⁹⁵). The fifth column (S_exp⁹⁵) shows what the 95% CL upper limit on the number of signal events would be, given an observed number of events equal to the expected number (and +- 1 &sigma; deviations from the expectation) of background events. The last column indicates the discovery p-value (p(s = 0)), which is capped at 0.5.

<b>Upper Limits 1</b> The first two columns present observed (N_obs) and expected (N_exp) event yields in the inclusive signal regions. The latter are obtained by the background-only fit of the control regions, and the errors include both statistical and systematic uncertainties. The next two columns show the observed 95% CL upper limits on the visible cross-section (&lang;&epsilon;&sigma;&rang;_obs⁹⁵) and on the number of signal events (S_obs⁹⁵). The fifth column (S_exp⁹⁵) shows what the 95% CL upper limit on the number of signal events would be, given an observed number of events equal to the expected number (and +- 1 &sigma; deviations from the expectation) of background events. The last column indicates the discovery p-value (p(s = 0)), which is capped at 0.5.

<b>Cutflow 1</b> Observed event yields and exclusion fit results with the signal strength parameter set to zero for the exclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Cutflow 1</b> Observed event yields and exclusion fit results with the signal strength parameter set to zero for the exclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Acceptances 1</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 1</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 2</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 2</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 3</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 3</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 4</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 4</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 5</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 5</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 6</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 6</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 7</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 7</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^&plusmn; production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 8</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 8</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 9</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 9</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 10</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 10</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 11</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 11</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 12</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 12</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 13</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 13</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 14</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 14</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 15</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 15</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 16</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 16</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 17</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 17</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 18</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 18</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 19</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 19</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 20</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 20</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 21</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 21</b> Truth acceptances for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 22</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 22</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 23</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 23</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 24</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 24</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 25</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 25</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 26</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 26</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 27</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 27</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 28</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 28</b> Truth acceptances for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Numbers overlaid on the mass planes are the acceptance &times; 10⁴.

<b>Acceptances 29</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 29</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 30</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 30</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 31</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 31</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 32</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 32</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 33</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 33</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 34</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Acceptances 34</b> Truth acceptances for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Numbers overlaid on the mass planes are the acceptance &times; 10³.

<b>Efficiencies 1</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 1</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 2</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 2</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 3</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 3</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 4</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 4</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 5</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 5</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 6</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 6</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 7</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 7</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁺ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 8</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 8</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 9</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 9</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 10</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 10</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 11</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 11</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 12</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 12</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 13</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 13</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 14</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 14</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 15</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 15</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 16</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 16</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 17</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 17</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 18</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 18</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 19</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 19</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 20</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 20</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 21</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 21</b> Efficiencies for the Higgsino &chi;&#771;₂⁰&chi;&#771;₁⁰ production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 22</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 22</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 23</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 23</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 24</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 24</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 25</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 25</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 26</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 26</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 27</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 27</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 28</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 28</b> Efficiencies for the Higgsino &chi;&#771;₁⁺&chi;&#771;₁^- production process in the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 29</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 29</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 30</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 30</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 31</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 31</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 32</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 32</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 33</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 33</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 34</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Efficiencies 34</b> Efficiencies for the &#8467;&#771;&#8467;&#771; production in the inclusive SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Efficiencies are computed as the ``acceptance times efficiency" divided by the acceptance. The black line indicates the maximum allowed value of &Delta; m or m_T2 for the inclusive signal region under study.

<b>Cross-Sections 1</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 1</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 2</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 2</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 3</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 3</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 4</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 4</b> Cross-sections of the Higgsino signal grid for each production process denoted in the caption.

<b>Cross-Sections 5</b> Cross-sections of the wino--bino signal grid for each production process in the caption.

<b>Cross-Sections 5</b> Cross-sections of the wino--bino signal grid for each production process in the caption.

<b>Cross-Sections 6</b> Cross-sections of the wino--bino signal grid for each production process in the caption.

<b>Cross-Sections 6</b> Cross-sections of the wino--bino signal grid for each production process in the caption.

<b>Cross-Sections 7</b> Total cross-sections of the slepton simplified model signal grid. Slepton refers to a the scalar partners of the left- and right-handed electrons and muons, which are assumed to be mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R).

<b>Cross-Sections 7</b> Total cross-sections of the slepton simplified model signal grid. Slepton refers to a the scalar partners of the left- and right-handed electrons and muons, which are assumed to be mass degenerate m(e&#771;_L) = m(e&#771;_R) = m(&mu;&#771;_L) = m(&mu;&#771;_R).

<b>Kinematics 5</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 5</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 6</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 6</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 7</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 7</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 8</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 8</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 9</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 9</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 10</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 10</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 11</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 11</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 12</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 12</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 13</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 13</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 14</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 14</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 15</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Kinematics 15</b> Distributions after the background-only fit of kinematic variables used to define selections common to all signal regions, i.e. not including requirements specific to the electroweakino or slepton SR definitions. Blue arrows in the upper panel denote the final requirement used to define the common SR, otherwise all selections are applied. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. The first (last) bin includes underflow (overflow). Benchmark Higgsino H&#771; and slepton &#8467;&#771; signals are overlaid as dashed lines. Orange arrows in the Data/SM panel indicate values that are beyond the y-axis range.

<b>Upper Limits 2</b> Numbers show 95% CL model-dependent upper limits on the inclusive Higgsino signal cross-sections.

<b>Upper Limits 2</b> Numbers show 95% CL model-dependent upper limits on the inclusive Higgsino signal cross-sections.

<b>Upper Limits 3</b> Numbers show 95% CL model-dependent upper limits on the inclusive Higgsino signal cross-sections.

<b>Upper Limits 3</b> Numbers show 95% CL model-dependent upper limits on the inclusive Higgsino signal cross-sections.

<b>Upper Limits 4</b> Numbers show 95% CL model-dependent upper limits on the inclusive signal cross-sections of the wino--bino model.

<b>Upper Limits 4</b> Numbers show 95% CL model-dependent upper limits on the inclusive signal cross-sections of the wino--bino model.

<b>Upper Limits 5</b> Numbers show 95% CL model-dependent upper limits on the inclusive signal cross-sections of the wino--bino model.

<b>Upper Limits 5</b> Numbers show 95% CL model-dependent upper limits on the inclusive signal cross-sections of the wino--bino model.

<b>Upper Limits 6</b> Numbers show the 95% CL model-dependent upper limits on the slepton signal cross-sections, assuming a fourfold mass degeneracy m(e&#771;_L,R) = m(&mu;&#771;_L,R).

<b>Upper Limits 6</b> Numbers show the 95% CL model-dependent upper limits on the slepton signal cross-sections, assuming a fourfold mass degeneracy m(e&#771;_L,R) = m(&mu;&#771;_L,R).

<b>Upper Limits 7</b> Numbers show the 95% CL model-dependent upper limits on the slepton signal cross-sections, assuming a fourfold mass degeneracy m(e&#771;_L,R) = m(&mu;&#771;_L,R).

<b>Upper Limits 7</b> Numbers show the 95% CL model-dependent upper limits on the slepton signal cross-sections, assuming a fourfold mass degeneracy m(e&#771;_L,R) = m(&mu;&#771;_L,R).

<b>Upper Limits 8</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Upper Limits 8</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Upper Limits 9</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Upper Limits 9</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Upper Limits 10</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Upper Limits 10</b> Expected and observed 95% CL cross-section upper limits as a function of the universal gaugino mass m_1/2 for the NUHM2 model. The gray numbers indicate the values of the observed limit. The green and yellow bands around the expected limit indicate the &plusmn; 1&sigma; and &plusmn; 2&sigma; uncertainties, respectively. The expected signal production cross-sections as well as the associated uncertainty are indicated with the blue solid and dashed lines. The lower x-axis indicates the difference between the &chi;&#771;₂⁰ and &chi;&#771;₁⁰ masses for different values of m_1/2. A fit of signals to the m_{&#8467;&#8467;} spectrum is used to derive this limit.

<b>Cutflow 2</b> Observed event yields and exclusion fit results with the signal strength parameter set to zero for the exclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Cutflow 2</b> Observed event yields and exclusion fit results with the signal strength parameter set to zero for the exclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Cutflow 3</b> Observed event yields and background-only fit results for the inclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Cutflow 3</b> Observed event yields and background-only fit results for the inclusive electroweakino and slepton signal regions. Background processes containing fewer than two prompt leptons are categorized as `Fake/nonprompt'. The category `Others' contains rare backgrounds from triboson, Higgs boson, and the remaining top-quark production processes listed in Table 1. Uncertainties in the fitted background estimates combine statistical and systematic uncertainties.

<b>Exclusion 4</b> Nominal observed and expected CLs values for Higgsino signals.

<b>Exclusion 4</b> Nominal observed and expected CLs values for Higgsino signals.

<b>Exclusion 5</b> Nominal observed and expected CLs values for wino--bino signals.

<b>Exclusion 5</b> Nominal observed and expected CLs values for wino--bino signals.

<b>Exclusion 6</b> Nominal observed and expected CLs values for slepton signals.

<b>Exclusion 6</b> Nominal observed and expected CLs values for slepton signals.

<b>Upper Limits 11</b> Upper limits on observed (expected) Higgsino simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Upper Limits 11</b> Upper limits on observed (expected) Higgsino simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Upper Limits 12</b> Upper limits on observed (expected) wino--bino simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Upper Limits 12</b> Upper limits on observed (expected) wino--bino simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Upper Limits 13</b> Upper limits on observed (expected) slepton simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Upper Limits 13</b> Upper limits on observed (expected) slepton simplified model signal cross section &sigma;_{obs (exp)}⁹⁵ and signal strength &sigma;_{obs (exp)}⁹⁵ / &sigma;_theory.

<b>Cutflow 4</b> Event counts for Higgsino H and slepton &#8467; signals after sequential selections for the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} and SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Weighted events are normalised to mathcalL = 36.1 fb^-1 and the inclusive cross section &sigma;, while raw MC events are also shown. The generator filter with efficiency &epsilon;_filt applied to the Higgsino signal requires truth E_T^miss &gt; 50 GeV and at least 2 leptons with p_T &gt; 3 GeV, while only the E_T^miss &gt; 50 GeV requirement is applied to the slepton signal. The mathcalB refers to the branching ratio Z^(*) &rarr; &#8467;⁺&#8467;^- in the Higgsino processes. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions.

<b>Cutflow 4</b> Event counts for Higgsino H and slepton &#8467; signals after sequential selections for the inclusive SR&#8467;&#8467;-m_{&#8467;&#8467;} and SR&#8467;&#8467;-m_T2¹⁰⁰ regions. Weighted events are normalised to mathcalL = 36.1 fb^-1 and the inclusive cross section &sigma;, while raw MC events are also shown. The generator filter with efficiency &epsilon;_filt applied to the Higgsino signal requires truth E_T^miss &gt; 50 GeV and at least 2 leptons with p_T &gt; 3 GeV, while only the E_T^miss &gt; 50 GeV requirement is applied to the slepton signal. The mathcalB refers to the branching ratio Z^(*) &rarr; &#8467;⁺&#8467;^- in the Higgsino processes. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions.

<b>Cutflow 5</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁⁺ process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs), followed by those optimised for Higgsinos and sleptons. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 5</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁⁺ process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs), followed by those optimised for Higgsinos and sleptons. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 6</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁^- process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs), followed by those optimised for Higgsinos and sleptons. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 6</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁^- process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs), followed by those optimised for Higgsinos and sleptons. ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 7</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁⁰ process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement followed by those optimised for Higgsinos and sleptons. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 7</b> Event counts for the &chi;&#771;₂⁰&chi;&#771;₁⁰ process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement followed by those optimised for Higgsinos and sleptons. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 8</b> Event counts for the &chi;&#771;₁⁺&chi;&#771;₁^- process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs). ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.

<b>Cutflow 8</b> Event counts for the &chi;&#771;₁⁺&chi;&#771;₁^- process of the Higgsino m(&chi;&#771;₂⁰, &chi;&#771;₁⁰) = (110, 100) GeV signal and sequentially with each addition requirement for selections common to all signal regions (SRs). ``Lepton truth matching" requires that the selected leptons are consistent with being decay products of the SUSY process. ``Lepton author 16 veto" removes a class of electron candidates reconstructed with algorithms designed to identify photon conversions. Weighted events are normalised to 36.1 fb^-1 and the raw Monte Carlo events are also displayed.