Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$2\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Observed ($N_{\text{obs}}$) and expected ($N_{\text{exp}}$) yields after the background-only fit for the flavor-merged inclusive SRs. The third and fourth columns list the 95\% CL upper limits on the visible cross-section ($\sigma_{\text{vis}}^{95}$) and on the number of signal events ($S_\text{obs}^{95}$). The fifth column ($S_\text{exp}^{95}$) shows the 95\% CL upper limit on the number of signal events, given the expected number of background events and its $\pm 1\sigma$ variations. The last two columns indicate the CL$_{\text{b}}$ value, i.e. the confidence level observed for the background-only hypothesis, and the discovery $p$-value ($p(s = 0)$) with its associated statistical significance $Z$. If the observed yield is below the expected yield, the $p$-value is capped at 0.5.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$eee$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$ee\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

The expected upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

The observed upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-on-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-off-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown. The generator level selections require to have two or more leptons.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.

The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Pre-fit MC statistical uncertainties per bin. These values are used to quantify the MC statistical uncertainty contributions to the total uncertainty in $m_t$ based on elements from the covariance matrix obtained in the profile likelihood fit. Each MC statistical contribution is estimated by dividing the relevant covariance matrix entry (see Table 2) by the corresponding pre-fit MC statistical uncertainty for that bin.

The contribution of each source of systematic uncertainty to the total uncertainty in $m_t$ is provided. Each source's contribution is taken directly from the relevant element of the covariance matrix for the profile likelihood fit to $\overline{m_J}$, $m_{jj}$, and $m_{tj}$ using data. The sign of the effect of each uncertainty is included.

The fitted $m_t$ is provided for each replica generated using bootstrapping. Each replica is a 3D histogram of $m_{J}$, $m_{jj}$, and $m_{tj}$, where $m_{J}$ has 50 bins between 145.0 GeV and 205.0 GeV. This method uses the BootstrapGenerator class in ROOT to initialise a pseudo-random number generator for each event, which is seeded by the value of the eventNumber and runNumber variables for a given event in the input dataset. The pseudo-random numbers are drawn from a Poisson distribution with rate parameter equal to 1. These are used to fluctuate the amount by which each replica histogram is filled. There are 1000 replicas, numbered from 0 to 999.

The observed and expected ($\pm2\sigma$) upper limits at 95% CL on the branching ratio for $H\rightarrow aa\rightarrow \gamma\gamma\tau\tau$ as a function of the resonance mass hypothesis $m_{a}$.

The polynomial parameterisation of the total signal selection efficiency as a function of $m_{a}$, defined as the fraction of the reconstructed and selected events out of the total number of events in the signal simulated samples.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the resolved qqbb signal region.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the resolved lvbb signal region.

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the merged lvbb signal region

Product of acceptance and efficiency for pp->tbH(->Wh) as function of the charged Higgs boson mass for the merged qqbb signal region

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the low-purity signal regions of the resolved qqbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the high-purity signal regions of the resolved qqbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 5jex3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 5jex4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 6jin3bex event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

Distributions of the mWh observable in the signal regions of the resolved lvbb 6jin4bin event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The distributions are presented after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contribution assuming $m_{H^{\pm}}$ = 700 GeV, normalised to the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) of 0.064 pb, is shown as a dashed histogram.

The mWh distributions in the Low-NN-score SRs of the merged qqbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged qqbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged qqbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged qqbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Low-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Medium-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the Medium-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged lvbb 0b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

The mWh distributions in the High-NN-score SRs of the merged lvbb 1b event categories. The term ‘Others’ summarises events from tHjb, tWh, tttt, and SM Vh production. The background prediction is shown after a background-only maximum-likelihood fit to data. The individual background uncertainty does not take into account the possible correlations between the nuisance parameter. The expected signal contributions assuming $m_{H^{\pm}}$ = 900 GeV and $m_{H^{\pm}}$ = 2000 GeV, normalised the expected limit of the cross-section times branching ratio ($\sigma_{sig}$ × B) values of 0.036 pb and 2.7 fb respectively, are shown as dashed histograms.

Cutflow table for a few selected signal samples after applying the selection requirements of the resolved analysis. At the initial cut stage, all events from the tbH ± → W ± h(→ b b) production process (including those from the fully hadronic decay channel) are considered.

Cutflow table for a few selected signal samples after applying the selection requirements of the merged analysis. At the initial cut stage, all events from the tbH ± → W ± h(→ bb) production process (including those from the fully hadronic decay channel) are considered.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM1.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM2.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-HM3.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp1.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp2.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp3.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp-1c.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to charm quarks and neutralinos when only considering SR-Comp-1c.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 1 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of top squarks decaying to top or charm quarks and 200 GeV neutralinos for different branching fraction assumptions.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Expected exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit $(+1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit $(-1\sigma)$ at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed exclusion limit at 95% CL for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Observed upper limit on the cross-section at 95% CL for pair production of top squarks decaying into charm quarks and neutralinos for the fit with the best expected CL$_\mathrm{S}$.

Observed upper limit on the cross-section for pair production of up-type scalar LQs coupled to first generation leptons and second generation quarks.

Observed upper limit on the cross-section for pair production of up-type scalar LQs coupled to second generation leptons and quarks.

Expected upper limit on the cross-section $(-1\sigma)$ for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(+1\sigma)$ for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Observed upper limit on the cross-section for $U(1)$ vector LQ models in the minimal coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,min}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(-1\sigma)$ for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section $(+1\sigma)$ for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Expected upper limit on the cross-section for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Observed upper limit on the cross-section for $U(1)$ vector LQ models in the Yang-Mills coupling scenario with $\beta_{23}=1$, corresponding to a branching fraction $\mathcal{B}(\mathrm{vLQ}^\mathrm{u,YM}_{23}\rightarrow c\nu) = 0.5$.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp-1c showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(450,430)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $E_\mathrm{T}^\mathrm{miss}\mathrm{ Sig.}$ in SR-HM1 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(1000,1)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $m_{\mathrm{T}}^{\mathrm{min}}(c)$ in SR-HM2 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(750,450)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp1 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(600,550)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp2 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(550,470)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Distribution of $R_{\mathrm{ISR}}$ in SR-Comp3 showing the data and the expected backgrounds, after simultaneously fitting all the control regions. The pre-fit yields for a representative $m(\tilde{t}_1,\tilde{\chi}_1^0)=(550,375)$ GeV signal is included. Processes with top quarks and multiple vector bosons are included in "Other". The right-most bin does not include the overflow entry but the $x$-axis range is chosen to include all observed data.

Acceptance across the SUSY signal grid for SR-Comp-1c.

Acceptance across the SUSY signal grid for SR-HM1.

Acceptance across the SUSY signal grid for SR-HM2.

Acceptance across the SUSY signal grid for SR-HM3.

Acceptance across the SUSY signal grid for SR-HM-Disc.

Acceptance across the SUSY signal grid for SR-Comp1.

Acceptance across the SUSY signal grid for SR-Comp2.

Acceptance across the SUSY signal grid for SR-Comp3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM1.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM2.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM-Disc.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM1.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM2.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM3.

Acceptance across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM-Disc.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3.

Acceptance for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc. Due to the limited statistical power of the signal samples, efficiencies can fluctuate and can drop to zero.

Acceptance times efficiency across the SUSY signal grid for SR-Comp-1c.

Acceptance times efficiency across the SUSY signal grid for SR-HM1.

Acceptance times efficiency across the SUSY signal grid for SR-HM2.

Acceptance times efficiency across the SUSY signal grid for SR-HM3.

Acceptance times efficiency across the SUSY signal grid for SR-HM-Disc.

Acceptance times efficiency across the SUSY signal grid for SR-Comp1.

Acceptance times efficiency across the SUSY signal grid for SR-Comp2.

Acceptance times efficiency across the SUSY signal grid for SR-Comp3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM1.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM2.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{21}$ signal grid for SR-HM-Disc.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM1.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM2.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM3.

Acceptance times efficiency across the $\mathrm{LQ}^\mathrm{u}_{22}$ signal grid for SR-HM-Disc.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM1.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM2.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM3.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,min}_{23}$ signal model in SR-HM-Disc.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM1.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM2.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM3.

Acceptance times efficiency for the $\mathrm{vLQ}^\mathrm{u,YM}_{23}$ signal model in SR-HM-Disc.

Cutflow table for SR-Comp-1c using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (450,430)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp1 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (600,550)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp2 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (550,470)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-Comp3 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (550,375)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM1 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (1000,1)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM2 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM3 using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM-Disc using the $m(\tilde{t}_{1},\tilde{\chi}_{1}^{0}) = (750,450)$ GeV signal point as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM1 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM2 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM3 using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Cutflow table for SR-HM-Disc using the $m(\mathrm{LQ}_{21}^\mathrm{u}) = 600$ GeV signal point, with a 50% branching fraction to $c\nu$, as the benchmark. All jet-related variables use jets with $p_\mathrm{T}>40$ GeV, however, the $E_\mathrm{T}^\mathrm{miss}$ is calculated with jets with $p_\mathrm{T}>20$ GeV. The "Preselection" requirement includes: $E_\mathrm{T}^\mathrm{miss}>250$ GeV; events containing electrons or muons are vetoed; at least two jets must be present of which at least one must be identified as a $c$-tagged jet; events with jets that have been identified as $b$-tagged are discarded; the minimum azimuthal angular ($\phi$) distance between the (up to) four leading jets and the $\vec{p}_\mathrm{T}^\mathrm{miss}$ is required to be greater than 0.4.

Post-fit $m_\mathrm{MMC}$ distribution in the high-mass SR for the $m_A = 90\,\mathrm{GeV}$ signal mass hypothesis. $m_\mathrm{MMC}$ is the mass reconstructed by the Missing Mass Calculator. Processes contributing to the background Others are $Z/\gamma^* \rightarrow ee/\mu\mu$ and SM Higgs. The subscript on the $A\to\tau\tau$ process indicates the mass of the $A$ boson. otal includes all backgrounds and the signal process. The high-mass Signal Region is defined as: - 1 electron and 1 muon with opposite charge - $p_\mathrm{T}$ requirements of the leptons are a combination of the following: - $p_\mathrm{T}^e > 18\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 15\,\mathrm{GeV}$ or - $p_\mathrm{T}^e > 10\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 25\,\mathrm{GeV}$ or - $p_\mathrm{T}^e > 27\,\mathrm{GeV}$ and $p_\mathrm{T}^\mu > 10\,\mathrm{GeV}$ - $\vert \eta_e \vert < 2.47$, excluding $1.37 < \vert \eta_e \vert < 1.52$ - $\vert \eta_\mu \vert < 2.7$ - no jets with $b$-quarks - $\Delta R_{\ell\ell} < 1.0$ - $E_\mathrm{T}^\mathrm{miss} > 30\,\mathrm{GeV}$ - $m_\mathrm{T}^\mathrm{tot} = \sqrt{\left(p_\mathrm{T}^e+p_\mathrm{T}^\mu+E_\mathrm{T}^\mathrm{miss}\right)^2-\left(\vec{p}_\mathrm{T}^{\,e}+\vec{p}_\mathrm{T}^{\,\mu}+\vec{E}_\mathrm{T}^{\,\mathrm{miss}}\right)^2} < 65\,\mathrm{GeV}$ - $35\,\mathrm{GeV} < m_\mathrm{MMC} < 130\,\mathrm{GeV}$

Expected and observed $95\%$ CL limits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the absolute value of the up-type quark coupling parameter $|\zeta_\mathrm{u}|$ for masses of the $A$ boson ranging from $20$ to $90\,\mathrm{GeV}$.

Expected and observed $95\%$ CL limits on the absolute value of the up-type quark coupling parameter $|\zeta_\mathrm{u}|$ for masses of the $A$ boson ranging from $20$ to $90\,\mathrm{GeV}$.

Observed $p_0$ values for the fits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses from $20$ to $90\,\mathrm{GeV}$. For the fit on the up-type quark coupling parameter the $p_0$ values agree up to a precision of $O(10^{-5})$.

Observed $p_0$ values for the fits on the production cross-section for $gg\rightarrow A$ times the branching ratio for $A$ decaying into two $\tau$-leptons for $A$ boson masses from $20$ to $90\,\mathrm{GeV}$. For the fit on the up-type quark coupling parameter the $p_0$ values agree up to a precision of $O(10^{-5})$.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the compressed SUSY simplified model with a bino-like LSP and wino-like NLSPs being considered. These are shown with $\pm1\sigma_\text{exp}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm1\sigma^{\text{SUSY}}_{\text{theory}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the ATLAS searches using the soft lepton signature is illustrated by the blue region while the limit imposed by the LEP experiments is shown in grey.

Expected (dashed black line) and observed (solid red line) 95% CL exclusion limits on the compressed SUSY simplified model with a bino-like LSP and wino-like NLSPs being considered. These are shown with $\pm1\sigma_ ext{exp}$ (yellow band) from experimental systematic and statistical uncertainties, and with $\pm1\sigma^{ ext{SUSY}}_{ ext{theory}}$ (red dotted lines) from signal cross-section uncertainties, respectively. The limits set by the ATLAS searches using the soft lepton signature is illustrated by the blue region while the limit imposed by the LEP experiments is shown in grey.

The expected upper limits on the cross-sections at 95% CL for the simplified SUSY model featuring the production of mass-degenerate pairs of wino-like $\widetilde{\chi}_{2}^{0}$ and $\widetilde{\chi}_{1}^{\pm}$ particles in association with at least two jets. The production modes considered are $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$.

The observed upper limits on the cross-sections at 95% CL for the simplified SUSY model featuring the production of mass-degenerate pairs of wino-like $\widetilde{\chi}_{2}^{0}$ and $\widetilde{\chi}_{1}^{\pm}$ particles in association with at least two jets. The production modes considered are $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$.

Truth-level signal acceptances in $\text{SR}_\text{2j}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation. The generator-level selections are the same as the ones at reconstruction level.

Truth-level signal acceptances in $\text{SR}_{\geq\text{3j}}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The acceptance is defined as the fraction of accepted events divided by the total number of events in the generator-level signal Monte Carlo simulation. The generator-level selections are the same as the ones at reconstruction level.

Signal efficiencies in $\text{SR}_\text{2j}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. The generator-level selections are the same as the ones at reconstruction level.

Signal efficiencies in $\text{SR}_{\geq\text{3j}}$ with BDT score $\in [0.88, 1.0]$. All of the considered production modes ($\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{1}^{\pm}$, $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\mp}$, $\widetilde{\chi}_{2}^{0}\widetilde{\chi}_{2}^{0}$, and $\widetilde{\chi}_{1}^{\pm}\widetilde{\chi}_{1}^{\pm}$) are included. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. The generator-level selections are the same as the ones at reconstruction level.

Event selection cutflows for signal samples with $m(\tilde\chi^0_2) =100~\text{GeV}$ and $\Delta m(\tilde\chi^0_2 / \tilde\chi^\pm_1,\tilde\chi^0_1) = 0.2~\text{GeV}, 1.0~\text{GeV},$ and $5.0~\text{GeV}$. The first number in the column for each mass point corresponds to the signal event yield after applying the associated cut while the second number in parentheses represents the efficiency with respect to the previous cut. All of the production modes are included. The total cross-section used to obtain the initial number of events ($\sigma$) includes the cuts applied at parton level as described in the main text.

Distributions of the $\mathrm{NN^{SvsB}}$ output for data and the expected background after the likelihood fit in the $SR_{cQu --}$ signal region. The post-fit background expectations are shown as filled histograms, the combined pre-fit background expectations are shown as dashed lines. The signal distribution using the Wilson coefficient values $c_{tu}^{(1)}=0.04$, $c_{Qu}^{(1)}=0.1$, $c_{Qu}^{(8)}=0.1$ is shown with a dotted line, normalized to the same number of events as the background.

Summary of the observed and predicted number of events in the five 2$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Summary of the observed and predicted number of events in the four 3$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Comparison of the observed limits on the three WCs to the limit obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair [JHEP10(2015)150]. The cross-section limits from that analysis are converted to the limits on the WCs by using the fitted EFT parametrization. The bounds on the WCs are shown at the 68$\%$ CL (solid) and/or 95$\%$ CL (dashed) levels. For the ATLAS Run~1 analysis only the bounds at 95$\%$ CL are available. The vertical bar represents the SM prediction. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$.

Observed lower limits at 95$\%$ confidence level on the scale of new physics $\Lambda$ for Wilson coefficient values of 0.01, 1 and $4\pi^2$. The limits are compared with the limits obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair.

Observed and expected limits at 95$\%$ confidence level on the cross-section of $\sigma(pp \rightarrow tt)$.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(1)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{Qu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

1D-likelihood scan for $c_{tu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(8)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

Distribution of the reconstructed $\tau\tau$ invariant mass ($m_{\tau\tau}$) for all events in the VBF_1 signal region for $p_{\text{T}}^{H}>200$ GeV. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. Entries with values above the $x$-axis range are shown in the last bin of each distribution. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow H\rightarrow\tau\tau$ cross-section.

Distribution of the reconstructed $\tau\tau$ invariant mass ($m_{\tau\tau}$) for all events in the VBF_0 signal region for $m_{jj}<1$ TeV. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. Entries with values above the $x$-axis range are shown in the last bin of each distribution. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow H\rightarrow \tau\tau$ cross-section.

Distribution of the reconstructed $\tau\tau$ invariant mass ($m_{\tau\tau}$) for all events in the VBF_0 signal region for $m_{jj}>1$ TeV. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. Entries with values above the $x$-axis range are shown in the last bin of each distribution. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow H \rightarrow \tau\tau$ cross-section.

Distribution of the reconstructed $\tau\tau$ invariant mass ($m_{\tau\tau}$) for all events in the VBF_1 signal region for $m_{jj}<1$ TeV. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. Entries with values above the $x$-axis range are shown in the last bin of each distribution. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow \rightarrow \tau\tau$ cross-section.

Distribution of the reconstructed $\tau\tau$ invariant mass ($m_{\tau\tau}$) for all events in the VBF_1 signal region for $m_{jj}>1$ TeV. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. Entries with values above the $x$-axis range are shown in the last bin of each distribution. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow H\rightarrow \tau\tau$ cross-section.

Comparison of the observed and expected event yields in the ttH categories. The window category contains events with $m_{\tau\tau} \in [100, 150]$ GeV, while events outside of this mass region are included in the sideband region. The observed Higgs boson signal corresponds to $(\sigma\times B)/(\sigma\times B)_{\text{SM}}\,=\,0.99$. The prediction for each sample is determined from the likelihood fit performed to measure the total $pp\rightarrow H\rightarrow\tau\tau$ cross-section.

The measured values of $\sigma_{H}\times B(H\rightarrow\tau\tau)$ relative to the SM expectations in the total (labelled as 'Combined') and per-production-mode fit. The total $\pm1\sigma$ uncertainty in each measurement is indicated by the error bar. The total systematic uncertainty in each measurement is also indicated.

The measured values for $\sigma_{H}\times B(H\rightarrow\tau\tau)$ relative to the SM expectations in the simplified template cross-section measurement. The total $\pm1\sigma$ uncertainty in each measurement is indicated by the error bar. The total systematic uncertainty in each measurement is also indicated.

Upper limits at 95% CL on simplified template cross-sections in the individual ttH $p_{\text{T}}^{H}$ bins relative to their SM expectation in the $H\rightarrow\tau\tau$ decay channel, derived using the CL$_\text{s}$ method. The observed upper limits, together with the expected limits both in the background-only hypothesis and in the SM hypothesis (dotted red lines) are included. In the case of the expected limits in the background-only hypothesis, one- and two-standard-deviation uncertainty bands are also shown.

Measured fiducial differential cross-sections as a function of $p_\text{T}(j_0)$. The measurements are compared with particle-level SM predictions from the POWHEG+PYTHIA8, POWHEG+HERWIG7 and MadGraph5_aMC@NLO+Pythia8 generators for the combined VBF, ggF, $VH$, and $t\bar{t}H$ Higgs boson production modes. The shaded box around each data point shows the statistical uncertainty, while the total uncertainty is indicated by the error bar. The contribution from the ggF, $VH$, and $t\bar{t}H$ production modes as predicted by POWHEG+PYTHIA8 is also shown.

Measured fiducial differential cross-sections as a function of $p_\text{T}^{H}$. The measurements are compared with particle-level SM predictions from the POWHEG+PYTHIA8, POWHEG+HERWIG7 and MadGraph5_aMC@NLO+Pythia8 generators for the combined VBF, ggF, $VH$, and $t\bar{t} H$ Higgs boson production modes. The shaded box around each data point shows the statistical uncertainty, while the total uncertainty is indicated by the error bar. The contribution from the ggF, $VH$, and $t\bar{t} H$ production modes as predicted by POWHEG+PYTHIA8 is also shown.

Measured fiducial differential cross-sections as a function of $\Delta\phi_{jj}^{\text{signed}}$. The measurements are compared with particle-level SM predictions from the POWHEG+PYTHIA8, POWHEG+HERWIG7 and MadGraph5_aMC@NLO+Pythia8 generators for the combined VBF, ggF, $VH$, and $t\bar{t}H$ Higgs boson production modes. The shaded box around each data point shows the statistical uncertainty, while the total uncertainty is indicated by the error bar. The contribution from the ggF, $VH$, and $t\bar{t} H$ production modes as predicted by POWHEG+PYTHIA8 is also shown.

Measured fiducial differential cross-sections as a function of $\Delta\phi_{jj}^{\text{signed}}$ vs $p_\text{T}^\text{H}$. The measurements are compared with particle-level SM predictions from the POWHEG+PYTHIA8, POWHEG+HERWIG7 and MadGraph5_aMC@NLO+Pythia8 generators for the combined VBF, ggF, $VH$, and $t\bar{t}H$ Higgs boson production modes. The shaded box around each data point shows the statistical uncertainty, while the total uncertainty is indicated by the error bar. The contribution from the ggF, $VH$, and $t\bar{t}H$ production modes as predicted by POWHEG+PYTHIA8 is also shown.

The unfolded data compared with the nominal SM predictions from POWHEG+PYTHIA8, as well as the predictions for several values of Wilson coefficients in the SMEFT, for $\Delta\phi_{jj}^{\text{signed}}$.

The unfolded data compared with the nominal SM predictions from POWHEG+PYTHIA8, as well as the predictions for several values of Wilson coefficients in the SMEFT, for $\Delta\phi_{jj}^{\text{signed}}$.

The unfolded data compared with the nominal SM predictions from POWHEG+PYTHIA8, as well as the predictions for several values of Wilson coefficients in the SMEFT, for $\Delta\phi_{jj}^{\text{signed}}$ vs $p_\text{T}^{H}$.

The unfolded data compared with the nominal SM predictions from POWHEG+PYTHIA8, as well as the predictions for several values of Wilson coefficients in the SMEFT, for $p_\text{T}^{H}$.

The 95% expected and observed confidence intervals for each of the six considered Wilson coefficients. Each coefficient is treated individually and both the linear and linear + quadratic models are considered when evaluating the sensitivity to the terms that enter at $\mathcal{O}(\Lambda^{-4})$. For the CP-even operators the $\Delta\phi_{jj}^{\text{signed}}$ distribution is used to extract the confidence interval. The limits are computed at a new-physics scale $\Lambda=1$ TeV.

The 95% expected and observed confidence intervals for each of the six considered Wilson coefficients. Each coefficient is treated individually and both the linear and linear + quadratic models are considered when evaluating the sensitivity to the terms that enter at $\mathcal{O}(\Lambda^{-4})$. For the CP-odd operators the $\Delta\phi_{jj}^{\text{signed}}$ vs $p_\text{T}^{H}$ distribution is used to extract the confidence interval. The limits are computed at a new-physics scale $\Lambda=1$ TeV.

Two-dimensional observed and expected limits at 68% and 95% confidence level obtained from $c_{HW}$ and $c_{HB}$ using only the SM-dimension-6 interference in the SMEFT basis. The limits are computed at a new-physics scale $\Lambda$ = 1 TeV. In this case, the $\Delta\phi_{jj}^{signed}$ distribution is used. IMPORTANT: HEPData requires the same number of rows for each column. However, each curve of on the plot has a different number of points. For that reason, the curves are padded with data of "0.0, 0.0". The "0.0, 0.0" points should be omitted in analysis.

Two-dimensional observed and expected limits at 68% and 95% confidence level obtained from $c_{H\tilde{W}}$ and $c_{H\tilde{B}}$ using only the SM-dimension-6 interference in the SMEFT basis. The limits are computed at a new-physics scale $\Lambda$ = 1 TeV. In this purely CP-odd case, the $\Delta\phi_{jj}^{signed}$ vs $p_{T}^{H}$ distribution is used. IMPORTANT: HEPData requires the same number of rows for each column. However, each curve of on the plot has a different number of points. For that reason, the curves are padded with data of "0.0, 0.0". The "0.0, 0.0" points should be omitted in analysis.

Two-dimensional observed and expected limits at 68% and 95% confidence level obtained from $c_{HW}$ and $c_{H\tilde{W}}$ using only the SM-dimension-6 interference in the SMEFT basis. The limits are computed at a new-physics scale $\Lambda$ = 1 TeV. In this case, the $\Delta\phi_{jj}^{signed}$ distribution is used. IMPORTANT: HEPData requires the same number of rows for each column. However, each curve of on the plot has a different number of points. For that reason, the curves are padded with data of "0.0, 0.0". The "0.0, 0.0" points should be omitted in analysis.

The expected values of $\sigma_{H}\times B(H\rightarrow\tau\tau)$ relative to the SM expectations in the total (labelled as 'Combined') and per-production-mode fit. The total $\pm1\sigma$ uncertainty in each measurement is indicated by the error bar. The total systematic uncertainty in each measurement is also indicated.

The expected values for $\sigma_{H}\times B(H\rightarrow\tau\tau)$ relative to the SM expectations in the simplified template cross-section measurement. The total $\pm1\sigma$ uncertainty in each measurement is indicated by the error bar. The total systematic uncertainty in each measurement is also indicated.

The measured values for $\sigma_{H}\times B(H\rightarrow\tau\tau)$ in the simplified template cross-section measurement. The total $\pm1\sigma$ uncertainty in the measurement is indicated by the black error bars, with the individual contribution from the statistical uncertainty in blue.

The measured correlations between differential fiducial cross-sections, $\sigma$, and the normalisation factors, $\alpha$, for the $Z(\to\tau\tau) + \text{jets}$ and top backgrounds for $p_\text{T}(j_0)$. The bins denoted as $\sigma_{1,2,3,4}$ correspond to the measurements in the four bins listed elsewhere for each observable.

The measured correlations between differential fiducial cross-sections, $\sigma$, and the normalisation factors, $\alpha$, for the $Z(\to\tau\tau) + \text{jets}$ and top backgrounds for $p_\text{T}^{H}}$. The bins denoted as $\sigma_{1,2,3,4}$ correspond to the measurements in the four bins listed elsewhere for each observable.

The measured correlations between differential fiducial cross-sections, $\sigma$, and the normalisation factors, $\alpha$, for the $Z(\to\tau\tau) + \text{jets}$ and top backgrounds for $\Delta\phi_{jj}^{\text{signed}}$. The bins denoted as $\sigma_{1,2,3,4}$ correspond to the measurements in the four bins listed elsewhere for each observable.

The measured correlations between differential fiducial cross-sections, $\sigma$, and the normalisation factors, $\alpha$, for the $Z(\to\tau\tau) + \text{jets}$ and top backgrounds for $\Delta\phi_{jj}^{\text{signed}}$ vs $p_\text{T}^{H}$. The bins denoted as $\sigma_{1,2,3,4}$ correspond to the measurements in the four bins listed elsewhere for each observable.