Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and $p_{T}^{t,had}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t,had}$ in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration and $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Statistical correlation matrix between |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration and |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, obtained through the Bootstrap Method.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Covariance matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t,had}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the absolute cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Correlation matrix of the relative cross-section as function of |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration, accounting for the statistical and systematic uncertainties.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 4-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 6-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t,had}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t,had}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for $p_{T}^{t\bar{t}}$ in the 5-jet exclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the absolute differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Systematic uncertanties for the relative differential cross-section at particle-level for |$p_{out}^{t\bar{t}}$| in the 4-jet inclusive configuration. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Measured cross sections for isolated-photon plus jet production as a function of $m^{\gamma-\rm jet}$.

Measured cross sections for isolated-photon plus jet production as a function of $|\cos\theta^{\star}|$.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the low-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($\tau_{\tilde{\chi}_{1}^{\pm}}$ = 0.2 ns and $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV) in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in electroweak channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of fake tracklet in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of muon background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of hadron and electron background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of signal ($m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}} = 500 GeV$) in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of total background in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Pixel-tracklet $p_{T}$ spectrum of observed data in strong channel in the high-Emiss region.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 0.2 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Observed exclusion limit at 95% CL obtained in the strong production channel in terms of the gluino and chargino masses. The limit is shown assuming a chargino lifetime 1.0 ns.

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Expected exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Observed exclusion limit at 95% CL obtained in the electroweak production channel in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (fb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Model dependent upper limits on cross-section (pb) for the electroweak production are shown by grey numbers in terms of the chargino lifetime ($\tau_{\tilde{\chi}_{1}^{\pm}}$) and mass ($m_{\tilde{\chi}_{1}^{\pm}}$).

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the electroweak channel. The total signal acceptance $\times$ efficiency is defined as the probability of an event passing the signal region selection when an electroweak gaugino pair is produced in a pp collision.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

Total acceptance $\times$ efficiency of the strong channel. In white regions, no simulation sample is available. The left-upper triangle region is not allowed kinematically in wino-LSP scenarios. The total signal acceptance $\times$ efficiency is calculated relative to events in which the gluinos decay into electroweak gaugino pairs.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the electroweak channel as a function of the chargino $eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the electroweak channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The generator-level acceptance after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance for charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level).

The generator-level acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

The acceptance $\times$ efficiency after reconstruction, for selecting and reconstructing charginos produced in the strong channel as a function of the chargino $\eta$ and chargino decay radius (at generator level). The acceptance $\times$ efficiency after reconstruction is the probability of a signal event, which passes all the event-level requirements, passing all the track/tracklet requirements after reconstruction.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in direct electroweak production with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

Summary of the selection criteria, and the corresponding observed number of events in data as well as the expected number of signal events in simulation for two benchmark models: a chargino produced in the strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. The expected number of signal events is normalised to 36.1 fb${}^{-1}$. The signal selection efficiencies are also shown in parentheses. The first row shows the number of events after the application of detector and data quality conditions. Requirements below the dashed line are applied to tracks and tracklets.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few electroweak signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

The event and tracklet generator-level acceptance and selection efficiency for a few strong signal models studied in this search. The last column shows the probability ($P$) for a reconstructed tracklet to have $p_{T}$ greater than 100 GeV.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Systematic uncertainties in the signal event yields at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. The uncertainty in the cross-section of the strong production is large due to the large effect from the PDF uncertainty.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anticorrelation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Observed events, expected background for null signal, and expected signal yields for two benchmark models: electroweak channel with ($m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (400 GeV, 0.2 ns) and strong channel with ($m_{\tilde{g}}$, $m_{\tilde{\chi}_{1}^{\pm}}$, $\tau_{\tilde{\chi}_{1}^{\pm}}$) = (1600 GeV, 500 GeV, 0.2 ns) in the high-Emiss region. Also shown are the probability of a background-only experiment being more signal-like than observed ($p_0$) and the upper limit on the model-independent visible cross-section at 95\% CL. The uncertainty in the total background yield is different from the sum of uncertainties in quadrature due to anti-correlation between different backgrounds.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracket background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Effects of systematic uncertainties on the signal exclusion significance at $m_{\tilde{\chi}_{1}^{\pm}}$ = 400 GeV for the electroweak channel and at $m_{\tilde{g}}$ = 1600 GeV, $m_{\tilde{\chi}_{1}^{\pm}}$ = 500 GeV for the strong channel. The lifetime of the chargino is not relevant here. Effects of uncertainties on the fake-tracklet background is smaller in the strong channel analysis because the estimated number of the fake-tracklet background events is small.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

Cross-section upper limits for the strong production, presented in unit of fb. Left-upper triangle region is unphysical because the wino mass is larger than the gluino mass.

The measured $E_{T}^{miss}$ distribution in the Z/$\gamma ^{*}$($\rightarrow \mu \mu$)+jets control region, for the $E_{T}^{miss}$ > 250GeV inclusive selection, compared to the background predictions. The latter include the global normalization factors extracted from the fit. The last bin of the distribution contains overflows.

The measured leading jet $p_{T}$ distribution in the Z/$\gamma ^{*}$($\rightarrow \mu \mu$)+jets control region, for the $E_{T}^{miss}$ > 250GeV inclusive selection, compared to the background predictions. The latter include the global normalization factors extracted from the fit. The last bin of the distribution contains overflows.

The measured $E_{T}^{miss}$ distribution in the top control region, for the $E_{T}^{miss}$ > 250GeV inclusive selection, compared to the background predictions. The latter include the global normalization factors extracted from the fit. The last bin of the distribution contains overflows.

The measured leading jet $p_{T}$ distribution in the top control region, for the $E_{T}^{miss}$ > 250GeV inclusive selection, compared to the background predictions. The latter include the global normalization factors extracted from the fit. The last bin of the distribution contains overflows.

Measured distribution of the $E_{T}^{miss}$ for the $E_{T}^{miss}$ > 250GeV selection compared to the SM predictions. The latter are normalized with normalization factors as determined by the global fit that considers exclusive $E_{T}^{miss}$ regions. The last bin of the distribution contains overflows.

Measured distribution of the leading jet $p_{T}$ for the $E_{T}^{miss}$ > 250GeV selection compared to the SM predictions. The latter are normalized with normalization factors as determined by the global fit that considers exclusive $E_{T}^{miss}$ regions. The last bin of the distribution contains overflows.

Measured distribution of the leading jet $|\eta|$ for the $E_{T}^{miss}$ > 250GeV selection compared to the SM predictions. The latter are normalized with normalization factors as determined by the global fit that considers exclusive $E_{T}^{miss}$ regions. The last bin of the distribution contains overflows.

Measured distribution of the jet multiplicity for the $E_{T}^{miss}$ > 250GeV selection compared to the SM predictions. The latter are normalized with normalization factors as determined by the global fit that considers exclusive $E_{T}^{miss}$ regions. The last bin of the distribution contains overflows.

The expected $95\%$ CL exclusion limit for a simplified model of dark matter production involving an axial-vector operator, Dirac DM and couplings $g_{q} = 0.25$ and $g_{\chi} = 1$ as a function of the assumed mediator mass m$_{Z_{A}}$ and the dark matter mass m$_{\chi}$.

The measured $E_{T}^{miss}$ distribution in the W($\rightarrow \mu \nu$)+jets control region, for the $E_{T}^{miss}$ > 250GeV inclusive selection, compared to the background predictions. The latter include the global normalization factors extracted from the fit. The last bin of the distribution contains overflows.

The observed $95\%$ CL exclusion limit for a simplified model of dark matter production involving an axial-vector operator, Dirac DM and couplings $g_{q} = 0.25$ and $g_{\chi} = 1$ as a function of the assumed mediator mass m$_{Z_{A}}$ and the dark matter mass m$_{\chi}$.

The observed $90\%$ CL exclusion limit on the spin-dependent WIMP–proton scattering cross section in the context of the simplified model with axial-vector couplings, assuming minimal mediator width and the coupling values $g_{q} = 0.25$ and $g_{\chi} = 1$.

The expected $95\%$ CL exclusion limit for a simplified model of dark matter production involving a vector operator, Dirac DM and couplings $g_{q} = 0.25$ and $g_{\chi} = 1$ as a function of the assumed mediator mass m$_{Z_{V}}$ and the dark matter mass m$_{\chi}$.

The observed $95\%$ CL exclusion limit for a simplified model of dark matter production involving a vector operator, Dirac DM and couplings $g_{q} = 0.25$ and $g_{\chi} = 1$ as a function of the assumed mediator mass m$_{Z_{V}}$ and the dark matter mass m$_{\chi}$.

The expected and observed $95\%$ CL limits on the signal strength $\mu = \sigma^{95\% CL}/\sigma$ as a function of the mediator mass for a very light WIMP, in a model with spin-0 pseudoscalar mediator and $g_{q}=g_{\chi}=1.0$.

The expected and observed $95\%$ CL limits on the signal strength $\mu = \sigma^{95\% CL}/\sigma$ as a function of the WIMP mass for $m_{Z_{P}}=10$ GeV, in a model with spin-0 pseudoscalar mediator and $g_{q}=g_{\chi}=1.0$.

The expected exclusion contour at $95\%$ CL in the m$_{\eta}$–m$_{\chi}$ parameter plane for the coloured scalar mediator model, with minimal width and coupling set to $g=1$.

The observed exclusion contour at $95\%$ CL in the m$_{\eta}$–m$_{\chi}$ parameter plane for the coloured scalar mediator model, with minimal width and coupling set to $g=1$.

The expected excluded region at the $95\%$ CL in the ($\tilde{t}_{1}$,$\chi^{0}_{1}$) mass plane for the decay channel $\tilde{t}_{1} \rightarrow c + \chi^{0}_{1}$ (B = $100\%$).

The observed excluded region at the $95\%$ CL in the ($\tilde{t}_{1}$,$\chi^{0}_{1}$) mass plane for the decay channel $\tilde{t}_{1} \rightarrow c + \chi^{0}_{1}$ (B = $100\%$).

The expected excluded region at the $95\%$ CL in the ($\tilde{t}_{1}$,$\chi^{0}_{1}$) mass plane for the decay channel $\tilde{t}_{1} \rightarrow b + ff' + \chi^{0}_{1}$ (B = $100\%$).

The observed excluded region at the $95\%$ CL in the ($\tilde{t}_{1}$,$\chi^{0}_{1}$) mass plane for the decay channel $\tilde{t}_{1} \rightarrow b + ff' + \chi^{0}_{1}$ (B = $100\%$).

The expected exclusion plane at $95\%$ CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_{1} \rightarrow b + \chi^{0}_{1}$ (B = $100\%$).

The observed exclusion plane at $95\%$ CL as a function of sbottom and neutralino masses for the decay channel $\tilde{b}_{1} \rightarrow b + \chi^{0}_{1}$ (B = $100\%$).

The expected exclusion region at $95\%$ CL as a function of squark mass and the squark-neutralino mass difference for $\tilde{q}_{1} → q + \chi^{0}_{1}$ (q =u,d,c,s).

The observed exclusion region at $95\%$ CL as a function of squark mass and the squark-neutralino mass difference for $\tilde{q}_{1} → q + \chi^{0}_{1}$ (q =u,d,c,s).

Expected and observed $95\%$ CL lower limits on the fundamental Planck scale in 4+n dimensions, M$_D$, as a function of the number of extra dimensions.

Expected and observed $95\%$ CL upper limit on the signal strength $\mu$ in the hypothesis of an axial-vector mediator, g$_{q}=0.25$, g$_{\chi}=1.0$ and minimal mediator width, as a function of the assumed mediator and DM masses.

Observed $90\%$ CL exclusion limit on the spin-dependent WIMP–neutron scattering cross section in the context of the simplified model with axial-vector couplings, assuming minimal mediator width and the coupling values $g_{q}=0.25$ and $g_{\chi}=1$.

Expected and observed $95\%$ CL upper limit on the signal strength $\mu$ in the hypothesis of a pseudoscalar mediator, $g_{q}=g_{\chi}=1.0$ and minimal mediator width, as a function of the assumed mediator and DM masses.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the inclusive jet multiplicity.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the inclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Cross section for the production of W bosons as a function of exclusive jet multiplicity.

Statistical correlation between bins in data for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the H_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the W p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 0.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 0.

Differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross section for the production of W bosons as a function of the electron η for events with N_jets ≥ 1.

Differential cross sections for the production of W⁺ bosons, W^- bosons and the W⁺/W^- cross section ratio as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W⁺ bosons as a function of the electron η for events with N_jets ≥ 1.

Statistical correlation between bins in data for the differential cross sections for the production of W^- bosons as a function of the electron η for events with N_jets ≥ 1.

List of experimentally considered systematic uncertainties for the W+jets cross section measurement

Non-perturbative corrections for the cross section for the production of W bosons for different inclusive jet multiplicities.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the inclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of second leading jet rapidity for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of Δ R_jet1,jet2 for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of dijet invariant mass for events with N_jets ≥ 2.

Non-perturbative corrections for the cross section for the production of W bosons as a function of exclusive jet multiplicity.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross section for the production of W bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

Non-perturbative corrections for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 2.

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the H_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the W p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet p_T for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

NNLO/NLO k-factors determined with NNLO Njetti for the differential cross sections for the production of W⁺ bosons and W^- bosons as a function of the leading jet rapidity for events with N_jets ≥ 1. These numbers were obtained with code described in Phys. Rev. Lett. 115 (2015) 062002 [arXiv:1504.02131].

rapidity bin 1.5 < |Y| < 2.0 anti-kt R=0.4

rapidity bin 2.0 < |Y| < 2.5 anti-kt R=0.4

rapidity bin 2.5 < |Y| < 3.0 anti-kt R=0.4

rapidity bin 0 < y* < 0.5 anti-kt R=0.4

rapidity bin 0.5 < y* < 1.0 anti-kt R=0.4

rapidity bin 1.0 < y* < 1.5 anti-kt R=0.4

rapidity bin 1.5 < y* < 2.0 anti-kt R=0.4

rapidity bin 2.0 < y* < 2.5 anti-kt R=0.4

rapidity bin 2.5 < y* < 3.0 anti-kt R=0.4

Observed and expected upper limit on the cross-section for $pp \to H^{++}H^{--}$ for a combination of partial branching ratios of $B(ee) = 30\%$, $B(e \mu ) = 40\%$, and $B( \mu \mu ) = 30\%$.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{L}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{L}^{\pm\pm} \to X) = 1 - B(H_{L}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}e^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \mu^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to e^{\pm}\mu^{\pm})$, with "$X$" not entering any of the signal regions.

Minimum observed and expected lower limit (among all partial branching ratio combinations) on the $H_{R}^{\pm\pm}$ boson mass as a function of the branching ratio $B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$ where $B(H_{R}^{\pm\pm} \to X) = 1 - B(H_{R}^{\pm\pm} \to \ell^{\pm}\ell^{\pm})$, with "$X$" not entering any of the signal regions.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 100%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 90%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 80%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 70%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 60%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 50%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 40%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 30%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 20%.

Observed and expected lower limit on the $H_{L}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Observed and expected lower limit on the $H_{R}^{\pm\pm}$ boson mass for all branching ratio combinations ($B(ee)$,$B(e\mu)$,$B(\mu\mu)$) that sum to 10%.

Measured $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$.

Measured $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $1.56<|\eta^\gamma|<2.37$.

Measured ratio of the $\gamma+b$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$ to that for $1.56<|\eta^\gamma|<2.37$.

Measured ratio of the $\gamma+c$ fiducial differential cross section as a function of $E_\text{T}^\gamma$ for $|\eta^\gamma|<1.37$ to that for $1.56<|\eta^\gamma|<2.37$.

Statistical correlation between the $\gamma+b$ and the $\gamma+c$ cross sections in a given $E_\text{T}^\gamma$ bin and $|\eta^\gamma|$ region. The two cross sections are correlated as the heavy flavour fractions are extracted simultaneously from a template fit, performed in each $E_\text{T}^\gamma$ bin and separately for the two $|\eta^\gamma|$ regions.

Signed shifts of the individual systematic uncertainties on the $\gamma+b$ cross section for $|\eta^\gamma|<1.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+b$ cross section for $1.56<|\eta^\gamma|<2.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+c$ cross section for $|\eta^\gamma|<1.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Signed shifts of the individual systematic uncertainties on the $\gamma+c$ cross section for $1.56<|\eta^\gamma|<2.37$. The numbers after the name of the uncertainty source refer to the individual component in that uncertainty. Each bin of the MC statistical uncertainty is independent of any other bin. The first four components of the photon energy scale uncertainty are specific to this $|\eta^\gamma|$ region and are independent of the components in the other region. The region is indicated as part of their name to indicate the independence between the $|\eta^\gamma|$ regions. The uncertainties on the prompt photon modelling, non-perturbative QCD models and particle-level migration effects are only varied once and not up and down by their nature, but are symmetrised for the final results. Only uncertainties which have at least a 1% variation in at least one bin of the $\gamma+b$ and $\gamma+c$ cross section measurements, including the ratios, are listed. The others are summed in quadrature and listed as a single entry.

Cutflow table for a pair produced coloron of 1500 GeV decaying into two quarks.

The observed number of data, background and top squark signal events in each of the signal regions of the inclusive selection

The observed number of data, background and coloron signal events in each of the signal regions of the inclusive selection

The observed number of data, background and top squark signal events in each of the signal regions of the b-tagged selection

Signal acceptance and efficiency (in %) as a function of M(STOP), before mass windows

Signal acceptance (in %) and efficiency as a function of M(STOP), after mass windows

Signal acceptance and efficiency (in %) as a function of M(RHO), before mass windows

Signal acceptance and efficiency (in %) as a function of M(RHO), after mass windows

Signal acceptance (in %) and efficiency as a function of M(STOP), before mass windows

Signal acceptance (in %) and efficiency as a function of M(STOP), after mass windows

Cross section excluded at 95% CL as a function of the top squark mass, for a pair produced top squark with decays into a pair of light-quarks.

Cross section excluded at 95% CL as a function of the cooron mass, for a pair produced coloron with decays into a pair of light-quarks.

Cross section excluded at 95% CL as a function of the top squark mass, for a pair produced top squark with decays into a b- and an s-quark.