Best fit values of $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The values involving cross sections are given for $\sqrt{s}$=8 TeV, assuming the SM values for $\sigma_i(7 \mathrm{TeV})/\sigma_i(8 \mathrm{TeV})$. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\sigma(gg\to H\to WW)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{WW}$ relative to their SM prediction from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS, and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The expected uncertainties in the measurements are also shown.

Best fit values of $\kappa_{gZ}= \kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and of the ratios of coupling modifiers, as defined in the most generic parameterisation described in the context of the $\kappa$ framework, from the combined analysis of the $\sqrt{s}$=7 and 8 TeV data. The results are shown for the combination of ATLAS and CMS and also separately for each experiment, together with their total uncertainties and their breakdown into the four components described in the text. The uncertainties in $\lambda_{tg}$ and $\lambda_{WZ}$, for which a negative solution is allowed, are calculated around the overall best fit value. The expected total uncertainties in the measurements are also shown. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Measured global signal strength $\mu$ and its total uncertainty, together with the breakdown of the uncertainty into its four components as defined in the text. The results are shown for the combination of ATLAS and CMS, and separately for each experiment. The expected uncertainty, with its breakdown, is also shown.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson production processes. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson branching fractions are the same as in the SM.

Measured signal strengths $\mu$ and their total uncertainties for different Higgs boson decay channels. The results are shown for the combination of ATLAS and CMS, and separately for each experiment, for the combined $\sqrt{s}$=7 and 8 TeV data. The expected uncertainties in the measurements are also displayed. These results are obtained assuming that the Higgs boson production process cross sections at $\sqrt{s}$ = 7 and 8 TeV are the same as in the SM.

Results of the ten-parameter fit of $\mu_F^f = \mu_{gg\mathrm{F}+ttH}^f$ and $\mu_V^f = \mu_{\mathrm{VBF}+VH}^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Results of the six-parameter fit of the global ratio $\mu_V/\mu_F = \mu_{\mathrm{VBF}+VH}/\mu_{gg\mathrm{F}+ttH}$ together with $\mu_F^f$ for each of the five decay channels. The results are shown for the combination of ATLAS and CMS, together with their measured and expected uncertainties. The measured results are also shown separately for each experiment.

Fit results allowing BSM loop couplings, assuming that $|\kappa_{V}| \le$ 1, where $\kappa_{V}$ denotes $\kappa_{Z}$ or $\kappa_{W}$, and that $\mathrm{B_{BSM}} \ge$ 0. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results allowing BSM loop couplings, assuming that there are no additional BSM contributions to the Higgs boson width, i.e. $\mathrm{B_{BSM}}=0$. The results for the combination of ATLAS and CMS are reported with their measured and expected uncertainties. Also shown are the results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $\mathrm{B_{BSM}}$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Fit results for the parameterisation assuming the absence of BSM particles in the loops ($\mathrm{B_{BSM}}$=0). The results with their measured and expected uncertainties are reported for the combination of ATLAS and CMS, together with the individual results from each experiment. For the parameters with both signs allowed, the other 1$\sigma$ CL interval is shown on a second line. When a parameter is constrained and reaches a boundary, namely $|\kappa_\mu|$ = 0, the uncertainty is not indicated. For those parameters with no sensitivity to the sign, only the absolute values are shown.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for up-type versus down-type fermions. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{uu}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{du}$, for which both signs are allowed, the other 1$\sigma$ CL interval is shown on a second line. Negative values for the parameter $\lambda_{Vu}$ are excluded by more than 4$\sigma$.

Summary of fit results for a parameterisation probing the ratios of coupling modifiers for leptons versus quarks. The results for the combination of ATLAS and CMS are reported together with their measured and expected uncertainties. Also shown are the results from each experiment. The parameter $\kappa_{qq}$ is positive definite since $\kappa_H$ is always assumed to be positive. For the parameter $\lambda_{lq}$, for which there is no sensitivity to the sign, only the absolute values are shown. Negative values for the parameter $\lambda_{Vq}$ are excluded by more than 4$\sigma$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Correlation matrix obtained from the fit combining the ATLAS and CMS data using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with 23 parameters, $\sigma_i\cdot\mathrm{B}^f$ for each specific channel $i\to H\to f$. Only 20 parameters are shown because the other three, corresponding to the $H\to ZZ$ decay channel for the $WH$, $ZH$, and $ttH$ production processes, are not measured with a meaningful precision.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with nine parameters, $\sigma(gg\to H\to ZZ)$, $\sigma_i/\sigma_{gg\mathrm{F}}$, and $\mathrm{B}^f/\mathrm{B}^{ZZ}$.

Expected correlation matrix obtained from the fit combining ATLAS and CMS pre-fit Asimov data sets using the generic parameterisation with seven parameters, $\kappa_{gZ}=\kappa_{g}\cdot\kappa_{Z} / \kappa_{H}$ and the ratios of coupling modifiers.

ATLAS+CMS combined best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{g}$,$\kappa_{\gamma}$) plane.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel.

ATLAS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

CMS best-fit and 68% and 95% CL negative log-likelihood contours in the ($\kappa_{F}$,$\kappa_{V}$) plane.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\gamma\gamma$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow ZZ$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow WW$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow\tau\tau$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% CL negative log-likelihood contour in the ($\kappa_{F}$,$\kappa_{V}$) plane for the $H\rightarrow bb$ channel, assuming $\kappa_{F}>0$.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\gamma\gamma$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow ZZ$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow WW$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow\tau\tau$ channel.

Best-fit and 68% and 95% CL negative log-likelihood contours in the ($\mu^{f}_{gg\mathrm{F}+ttH}$,$\mu^{f}_{\mathrm{VBF}+VH}$) plane for the $H\rightarrow bb$ channel.

Ratios of $dN_{ch}/d\eta$ distributions measured in different centrality intervals to that in the peripheral (60–90%) centrality interval. The first uncertainty is statistical the second systematic.

Charged-particle pseudorapidity distribution $dN_{ch}/d\eta$ as a function of centrality (related to the $\langle N_{\mathrm{part}} \rangle$ by Table 3) for several $\eta$-regions. The first uncertainty is statistical the second is the systematic uncertianty without centrality determination uncertainty, the third is the centrality determination systematic uncertainty. The centrality determination systematic uncertainty shall not be used in ratios to any quantity determined in the same centrality interval, e.g. for $dN_{ch}/d\eta/(0.5 N_{\mathrm{part}})$ or in ratios of other particle yields. This uncertainty shall be used for comparing to results of other experiments.

Central values and total systematical uncertainties for the unfolded $A_{FB}$ values which takes into account mass bin migration only in muon channel for Born and Dressed leptons. Dressed leptons are constructed by adding 4-vectors of the bare lepton and all real photons coming from the boson/lepton decay within a $\Delta R<$0.1.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties at $7\ TeV$ were corrected on the $\sqrt{\chi^{2}/ndf}$ and they more smaller than systematic uncertainties. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ events with the unlike-charge reference sample for various multiplicity intervals $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 0.9\ TeV$ ($n_{ch} \ge 2$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ ($n_{ch} \ge 2$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$ , this represents the statistical uncertainty only. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. The statistical uncertainties at $7\ TeV$ more smaller than systematic uncertainties.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV\ HM$ ($n_{ch} \ge 150$) events with the unlike-charge reference sample for various $k_{T}$ intervals for the exponential parametrization $\Omega^{(E)}$. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$.Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The results of fits of the two-particle double-ratio correlation function $R_{2} (Q)$ for $\sqrt{s} = 7\ TeV$ events with the unlike-charge reference sample for various $k_{T}$ intervals of different multiplicity regions $n_{ch}$ for the exponential parametrization $\Omega^{(E)}$. The statistical uncertainties were corrected on the $\sqrt{\chi^{2}/ndf}$ when $\chi^{2}/ndf > 1$. The statistical uncertainties smaller than systematic uncertainties. The uncertainties for parameters $\lambda$ and $R$ are square root from the quadratic sum of statistical and systematic errors. Where only one error is shown for parameters $C_{0}$ and $\epsilon$, this represents the statistical uncertainty only.

The $Q$ distribution measured at $0.9\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $0.9\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for unlike-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $Q$ distribution measured at $7\ TeV$ for like-sign pairs for $p_{T} > 100\ MeV$ and $|\eta|<2.5$, renormalized to the total number of charged-particle pairs. The error bars represents the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $n_{ch}$ intervals $p_{T} > 100\ MeV$ and $|\eta|<2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $0.9\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different multiplicity intervals $n_{ch}$ with $p_{T} > 100\ MeV$ and $|\eta| < 2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 2$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV\ HM$ using unlike-charge particle reference sample for different $n_{ch}$ intervals $p_{T} > 100\ MeV$ and $|\eta|<2.5$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured with $7\ TeV\ HM$ data using unlike-charge particle reference sample for different $k_{T}$ intervals with multiplicity $n_{ch} \ge 150$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 2-9$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 10-24$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 25-80$. The error bars represents only the statistical uncertainties.

The $R_{2}(Q)$ correlation function measured at $7\ TeV$ using unlike-charge particle reference sample for different $k_{T}$ intervals within multiplicity interval $n_{ch} = 81-125$. The error bars represents only the statistical uncertainties.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $|y(\hat{t}_{\mathrm{h}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the muon channel.The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the muon channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ in the electron channel. The results shown in this table are one of the inputs for the combined results.

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{h}})$ after the electron and muon channel combination. The results shown in this table correspond to the results presented in figure 11(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the hadronic pseudo-top-quark $|y(\hat{t}_{\mathrm{h}})|$ after the electron and muon channel combination. The results shown in this table correspond to the results presentedin figure 12(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of theleptonic pseudo-top-quark $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}})$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 11(b).

Measured $t\bar{t}$ differential cross-section and relative uncertaintyas a function of the leptonic pseudo-top-quark $|y(\hat{t}_{\mathrm{l}})|$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 12(b).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function ofthe pseudo-top-quark-pair $p_{\mathrm{T}}(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 13(a).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $|y(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})|$ after the electron and muon channel combination.The results shown in this table correspond to the results presented in figure 13(b).

Measured $t\bar{t}$ differential cross-section and relative uncertainty as a function of the pseudo-top-quark-pair $m(\hat{t}_{\mathrm{l}}\hat{t}_{\mathrm{h}})$after the electron and muon channel combination. The results shown in this table correspond to the results presented in figure 13(c).

Observed and expected $E_T^{miss}$ distribution in soft dimuon signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution in hard single-lepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $m_{eff}^{incl}$ distribution for hard single-lepton 5-jet signal region. The last bin includes the overflow.

Observed and expected $E_{T}^{miss}$ distribution for hard single-lepton 6-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard same-flavour dilepton 3-jet signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton low-multiplicity signal region. The last bin includes the overflow.

Observed and expected $M_{R}'$ distribution for hard opposite-flavour dilepton 3-jet opposite-flavour signal region. The last bin includes the overflow.

Observed 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Expected 95% exclusion contour for the mSUGRA/CMSSM model with $\tan\beta=30$, $A_{0}=-2m_{0}$ and $\mu > 0$.

Observed 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Expected 95% exclusion contour for the bRPV MSUGRA/CMSSM model.

Observed 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Expected 95% exclusion contour for the natural gauge mediation with a stau NLSP model (nGM).

Observed 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Expected 95% exclusion contour for the non-universal higgs masses with gaugino mediation model (NUHMG).

Observed 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Expected 95% exclusion contour for the minimal UED model from the combination of the hard dilepton and soft dilepton analyses.

Observed 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the hard dilepton analysis.

Observed 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Expected 95% exclusion contour for the minimal UED model from the soft dilepton analysis.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production, where the top squark is assumed to decay exclusively via $\tilde{t} \rightarrow c \tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Expected 95% exclusion contour for the simplified model with gluino-mediated top squark production where the gluinos are assumed to decay exclusively through a virtual top squark, $\tilde{g} \rightarrow tt+\tilde{\chi}^{0}_{1}$.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the hard single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Expected 95% exclusion contour for the the first- and second-generation squark simplified model from the soft single-lepton analysis for the case in which the chargino mass is fixed at x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) = 1/2.

Observed 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the hard single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the gluino simplified model from the soft single-lepton analysis for the case in which x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the combination of soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected 95% exclusion contour for the first- and second-generation squark simplified model from the soft single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the combination of the hard dilepton and hard single-lepton analyses.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard single-lepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Expected 95% exclusion contour for the two-step first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Expected 95% exclusion contour for the two-step gluino simplified model without sleptons from the hard single-lepton analysis.

Number of generated events in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Production cross-section in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Number of generated events in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV. squark decaying to quark neutralino1 with varying x.

Production cross-section in the the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Number of generated evens in the minimal UED model.

Production cross-section in the minimal UED model in pb.

Number of generated events in the two-step first- and second-generation squark simplified model with sleptons.

Production cross-section in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for soft single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for the soft single-lepton 3-jet inclusive signal region in the gluino simplified model for the case in x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Expected CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed CLs from the combination of the soft single-lepton and hard single-lepton analyses in the gluino simplified model for the case in which the chargino mass is varied and the LSP mass is set at 60 GeV. The chargino mass is parameterised using x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)).

Acceptance for soft dimuon signal region in the minimal UED model (mUED).

Efficiency for soft dimuon signal region in minimal UED model (mUED).

Acceptance for hard dilepton 3-jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3jet opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton 3-jet same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity opposite-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Acceptance for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Efficiency for hard dilepton low-multiplicity same-flavour signal region in the two-step first- and second-generation squark simplified model with sleptons.

Best expected signal region in the minimal UED model (mUED).

Expected CLs from hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Observed CLs from the hard dilepton analysis in the two-step first- and second-generation squark simplified model with sleptons.

Expected CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Observed CLs from the combination of the soft dimuon and hard dilepton analyses in the minimal UED model (mUED).

Acceptance for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 3-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 5-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Efficiency for hard single-lepton 6-jet signal region in the gluino simplified model for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Acceptance for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 3-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 5-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Acceptance for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Efficiency for hard single-lepton 6-jet signal region in the first- and second-generation squark simplified model for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the gluino simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which the chargino mass is fixed at x = (m(gluino)-m(chargino))/(m(gluino)-m(LSP)) = 1/2.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model from the combination of the soft single-lepton and hard single-lepton analyses for the case in which x = (m(squark)-m(chargino))/(m(squark)-m(LSP)) is varied and the LSP mass is set at 60 GeV.

Observed 95% upper limit on the visible cross-section in the first- and second-generation squark simplified model with sleptons from the hard dilepton analysis.

Observed 95% upper limit on the visible cross-section in the minimal UED model (mUED) from the combination of the soft dimuon and hard dilepton analyses.