Measured min-$d_{xy}$ distribution in the 2-match category, after requiring the $d_{xy}$ muon to pass the isolation requirement $I_{\mathrm{rel}}^{\mathrm{PF}} <0.25$ (i. e., the B and D bins of the ABCD plane). Overlaid with a red histogram is the background predicted from the region of the ABCD plane failing the same requirement (the A and C bins), as well as three signal benchmark hypotheses (as defined in the legends), assuming $\alpha_D = \alpha_{\mathrm{EM}}$ (the fine-structure constant). The red hatched bands correspond to the background prediction uncertainty. The last bin includes the overflow.

Two-dimensional exclusion surfaces for $\Delta = 0.1 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

Two-dimensional exclusion surfaces for $\Delta = 0.4 \, m_1$ as a function of the DM mass $m_1$ and the signal strength $y$, with $m_{A'} = 3 \, m_1$. Filled histograms denote observed limits on $\sigma(\mathrm{pp} \to A' \to \chi_2 \chi_1) \, \mathcal{B}(\chi_2 \to \chi_1 \mu^+ \mu^-)$. Solid (dashed) curves denote the observed (expected) exclusion limits at 95% CL, with 68% CL uncertainty bands around the expectation. Regions above the curves are excluded, depending on the $\alpha_D$ hypothesis: $\alpha_{\mathrm{D}} = \alpha_{\mathrm{EM}}$ (dark blue) or 0.1 (light magenta).

For the tu$\gamma$ signal channel, the total number of observed selected events in the data (N$_{obs}$), the SM expectations (N$_{SM}$), the efficiencies ($\epsilon$), and the upper limits on the cross sections $\sigma_{fid}$ at the 95% CL in the fiducial region, without and with a requirement on the presence of a single accompanying b jet.

For the tc$\gamma$ signal channel, the total number of observed selected events in the data (N$_{obs}$), the SM expectations (N$_{SM}$), the efficiencies ($\epsilon$), and the upper limits on the cross sections $\sigma_{fid}$ at the 95% CL in the fiducial region, without and with a requirement on the presence of a single accompanying b jet.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

Observed yields and pre-fit background predictions for Njets 8-9.

Observed yields and pre-fit background predictions for Njets >=10.

Observed yields and pre-fit background predictions for aggregated bins.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 174 analysis bins.

Pre-fit background correlation matrix $\rho_{xy}$ for the 174 analysis bins.

Observed yields and post-fit background predictions for Njets 2-3.

Observed yields and post-fit background predictions for Njets 4-5.

Observed yields and post-fit background predictions for Njets 6-7.

Observed yields and post-fit background predictions for Njets 8-9.

Observed yields and post-fit background predictions for Njets >=10.

Simulated signal yields for representative gluino signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative gluino signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

The 95% CL observed and expected upper limits on the production cross sections of the T1tttt signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1bbbb signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1qqqq signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T5qqqqVV signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2tt signal model as a function of the top squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2bb signal model as a function of the bottom squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2qq signal model as a function of the LSP and light squark masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

The observed significance of the SMS models for T1tttt as function of the gluino and LSP masses.

The observed significance of the SMS models for T1bbbb as function of the gluino and LSP masses.

The observed significance of the SMS models for T1qqqq as function of the gluino and LSP masses.

The observed significance of the SMS models for T5qqqqVV as function of the gluino and LSP masses.

The observed significance of the SMS models for T2tt as function of the top squark and LSP masses.

The observed significance of the SMS models for T2bb as function of the bottom squark and LSP masses.

The observed significance of the SMS models for T2qq as function of the LSP and light squark masses.

The efficiency times acceptance of the SMS models for T1tttt as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1bbbb as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1qqqq as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T5qqqqVV as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2tt as function of the top squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2bb as function of the bottom squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2qq as function of the LSP and light squark masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) ~ m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) ~ m(LSP). Only statistical uncertainties are shown.

Theory cross sections vs m($\widetilde{\chi}^0_1$) for SMS model TChiHH-G, $\widetilde{\chi}^0_1, \widetilde{\chi}^0_2$ NLSPs only.

The 95% CL observed and expected upper limits on the production cross sections of the TChiHH signal model as a function of the $\widetilde{\chi}^0_2$ and $\widetilde{\chi}^0_1$ masses. Relative to Fig. 13, the binning of the table is adjusted to align with the model points that were sampled. In addition, a small correction has been applied that affects the cross section upper limits for points with $m(\widetilde{\chi}^0_1) = 1$ GeV. For that row of points in the figure, the small region of model phase space reached by both the resolved and boosted selections was inadvertently double counted in computing the signal contribution to the predicted yield.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Cross section, 95% CL upper limit plus theory vs m($\widetilde{g}$) for SMS model T5HH.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Pre-fit background correlation matrix $\rho_{xy}$ for the 22 analysis bins, ordered as in Fig. 10.

Significance vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH.

Significance vs $m(\widetilde{g})$ for SMS model T5HH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $275, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $300, $m(\widetilde{\chi}^0_1) = $50) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $450, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $1) for SMS model TChiHH.

Likelihood profile at $(m(\widetilde{\chi}^0_2) = $750, $m(\widetilde{\chi}^0_1) = $200) for SMS model TChiHH.

Efficiency vs $m(\widetilde{\chi}^0_1)$ for SMS model TChiHH-G. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Efficiency vs $m(\widetilde{g})$ for SMS model T5HH. The denominator includes all 22 signal regions, and no constraint on $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})$.

Efficiency vs $(m(\widetilde{\chi}^0_2), m(\widetilde{\chi}^0_1))$ for SMS model TChiHH. The denominator includes all 22 signal regions, and assumes $\mathcal{B}(\mathrm{H}$-->$\mathrm{b}\overline{\mathrm{b}})=100\%$.

Signal and control region populations for the resolved signature.

Signal and control region populations for the boosted signature.

Cut flow table for the resolved topology showing expected event yields at 137 fb$^{-1}$ for selected signal models as successive selections are applied.

Cut flow table for the boosted topology showing expected event yields at 137 fb$^{-1}$ for selected signal model points as successive selections are applied. Here the hadronic baseline is defined by $N_{\mathrm{jet}}\geq$2, \ptmiss$>$300 GeV, $\Delta\phi$ cuts, and the isolated lepton and track vetoes.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Product of efficiency and acceptance of the event selection for T signal events as a function of the particle mass $m_\mathrm{T}$ and width $\Gamma$ for the different hypotheses considered.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with 0 forward jets. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved validation region with at least 1 forward jet. Data are compared to backgrounds are after the data-driven extraction is performed.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the partially merged region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with 0 forward jets. Data are compared to backgrounds obtained post-fit.

Distribution of the transverse mass $M_T$ reconstructed from the top quark and the missing transverse energy in the resolved region with at least 1 forward jet. Data are compared to backgrounds obtained post-fit.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.01 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.1 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.2 $ imes$ its mass.

Observed and expected 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a hadronic top quark and a Z boson to neutrinos as a function of the T mass, for a T with a width of 0.3 $ imes$ its mass.

Model independent observed 95% CL upper limits on the product of the cross section and branching fraction of a T decaying to a top quark and a Z boson as a function of the T mass and width.

Singlet model 95% CL excluded values of the product of the cross section and branching fraction for a T decaying to a top quark and a Z boson.

Measured ratio of $\mathcal{B}_{4\mu}/\mathcal{B}_{2\mu}$

Measured branching fraction $\mathcal{B}_{4\mu}$

Measured branching fraction $\mathcal{B}_{4\mu}$

Distributions of the b-tagging efficiency as a function of the mistag rate of charm jets for pp collisions in a PYTHIA simulation.

Distributions of the b-tagging efficiency as a function of the mistag rate of light jets for pPb collisions in a PYTHIA+HIJING simulation.

Distributions of the b-tagging efficiency as a function of the mistag rate of charm jets for pPb collisions in a PYTHIA+HIJING simulation.

Distributions of the Secondary Vertex Mass after applying the SSV tagger selection.

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -2.5 < eta_CM < -1.5.

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -1.5 < eta_CM < -0.5 (x 10^2).

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from -0.5 < eta_CM < 0.5 (x10^4).

b-jet cross-sections in pPb, scaled by the Glauber nuclear overlap function, as well as a b-jet cross-section from a PYTHIA simulation from 0.5 < eta_CM < 1.5 (x10^6).

b-jet RpA (PYTHIA) from 0.5 < eta_CM < 1.5.

b-jet RpA (PYTHIA) from -0.5 < eta_CM < 0.5.

b-jet RpA (PYTHIA) from -1.5 < eta_CM < -0.5.

b-jet RpA (PYTHIA) from -2.5 < eta_CM < -1.5.