Systematic covariance matrix for the differential cross-section distribution.

Breakdown of relative systematic uncertainties in the measured ${t\bar{t}}$ cross-section. The quoted uncertainties are obtained by repeating the fit with a group of nuisance parameters fixed to their fitted values and subtracting in quadrature the resulting total uncertainty from the uncertainty of the complete fit. However, the total uncertainty is not the quadratic sum of the grouped impacts, as this approach neglects the correlation among the different groups.

The figure shows the measurement of the top quark pair production cross-section, $\sigma_{t\bar{t}}$, in lead-lead (Pb+Pb) collisions at a center-of-mass energy of $\sqrt{s_{\mathrm{NN}}} = 5.02$ TeV, based on 1.9 nb$^{-1}$ of data.

Distributions of the $\mathrm{NN^{SvsB}}$ output for data and the expected background after the likelihood fit in the $SR_{cQu --}$ signal region. The post-fit background expectations are shown as filled histograms, the combined pre-fit background expectations are shown as dashed lines. The signal distribution using the Wilson coefficient values $c_{tu}^{(1)}=0.04$, $c_{Qu}^{(1)}=0.1$, $c_{Qu}^{(8)}=0.1$ is shown with a dotted line, normalized to the same number of events as the background.

Summary of the observed and predicted number of events in the five 2$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Summary of the observed and predicted number of events in the four 3$\ell$ control regions. The background prediction is shown after the combined likelihood fit to data under the signal-plus-background hypothesis across all control regions and signal regions. The uncertainties in the total yields are smaller than the sum in quadrature of the uncertainties in the individual contributions due to anti-correlations resulting from the likelihood fit. Int Conv refers to events with photon conversions in the inner detector, while Mat Conv refers to events with photon conversions in the detector material. QMisID refers to events with charge-misidentified lepton.

Comparison of the observed limits on the three WCs to the limit obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair [JHEP10(2015)150]. The cross-section limits from that analysis are converted to the limits on the WCs by using the fitted EFT parametrization. The bounds on the WCs are shown at the 68$\%$ CL (solid) and/or 95$\%$ CL (dashed) levels. For the ATLAS Run~1 analysis only the bounds at 95$\%$ CL are available. The vertical bar represents the SM prediction. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$.

Observed lower limits at 95$\%$ confidence level on the scale of new physics $\Lambda$ for Wilson coefficient values of 0.01, 1 and $4\pi^2$. The limits are compared with the limits obtained by the ATLAS Run~1 analysis of events with $b$-tagged jets and a same-sign lepton pair.

Observed and expected limits at 95$\%$ confidence level on the cross-section of $\sigma(pp \rightarrow tt)$.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(1)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{tu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

2D likelihood scans of the Wilson coefficients $c_{Qu}^{(1)}$ versus $c_{Qu}^{(8)}$. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient pair.

1D-likelihood scan for $c_{tu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(1)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

1D-likelihood scan for $c_{Qu}^{(8)}$. The observed and expected limits at 68\% and 95\% confidence level (CL) can be read off by finding the intersection of the likelihood scan curve with the 1$\sigma$ and 2$\sigma$ lines. The new-physics scale is set to $\Lambda = 1 \, \text{TeV}$. In the table the $2\Delta$NLL values are shown which correspond to the minimized negative log likelihood for a given Wilson coefficient value.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell3j}$ signal region, which uses the invariant mass of the c-tagged jet and the geometrically closest b-tagged jet, $m_{\mathit{cb}}^{\mathrm{min}\Delta R}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{1\ell6ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{loose}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Post-fit agreement between data and MC prediction for the $SR_{\mathrm{tight}}^{2\ell4ji}$ signal region, which uses the jet multiplicity, $N_{\mathrm{jets}}$, as an observable. The hatched uncertainty bands include all uncertainties and their correlations. The last bins contain overflow events. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes.

Jet multiplicity and tagging criteria for the SRs and CRs in the single-lepton and dilepton channels. All single-lepton regions are defined in the 5-jet-exclusive and 6-jet-inclusive jet selections, all dilepton regions in the 3-jet-exclusive and 4-jet-inclusive jet selections. By construction, $\mathrm{SR}^{2\ell}_{\mathrm{tight}}$ only exists for the 4-jet-inclusive selection. Identical requirements on inclusive and exclusive working points, e.g., one c@22% and one c@11% in the $\mathrm{CR}_1^{1\ell}$, indicate a veto of additional tags at the inclusive working point.

Breakdown of the fiducial $t\bar{t}+{\geq}2c$ and $t\bar{t}+1c$ cross-section uncertainties. Systematic uncertainties are grouped into signal and background modeling, instrumental, and MC statistics categories. The table lists the fractional uncertainty in the measured cross-sections in percent and is estimated from the covariance matrix of the profile likelihood fit, following EPJC 84 (2024) 593. Individual groups of uncertainties can be added in quadrature to obtain the total uncertainty. JES and JER denote the jet energy scale and resolution uncertainties, respectively. The fractional uncertainties in the fitted $t\bar{t}+{\geq}1c$ and $t\bar{t}+\text{light}$ normalization factors are included in the data statistics category. For presentation purposes, all uncertainties are symmetrized.

Measured fiducial cross-section values in comparison with various NLO+PS predictions. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set, but no uncertainties in the parton shower or hadronization. The uncertainties in the measured values include all statistical and systematic uncertainties. For presentation purposes, the quoted measurement and prediction uncertainties are symmetrized.

Measured and predicted values for the $t\bar{t}+{\geq}1b$, $t\bar{t}+{\geq}2c$, and $t\bar{t}+1c$ cross-sections and for the cross-section ratios of these processes to total $t\bar{t}+\text{jets}$ production. The quoted uncertainties in the measurements include statistical and systematic uncertainties. The predictions are taken from the nominal setup using inclusive $t\bar{t}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}2c$, $t\bar{t}+1c$, and $t\bar{t}+\text{light}$ processes, and $t\bar{t}+b\bar{b}$ Powheg+Pythia8 predictions for the $t\bar{t}+{\geq}1b$ process. The first use the 5FS, the latter the 4FS, where the $b$-quarks are treated as massive particles and are included in the matrix element calculation. The uncertainties in the predictions include independent and simultaneous variations of the $\mu_R$ and $\mu_F$ scales and uncertainties in the choice of the PDF set.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ cross-section measurement. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+{\geq}2c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Nuisance parameters with a large impact on the fiducial measurement: ranking of the ten most impactful nuisance parameters for the $t\bar{t}+1c$ ratio to total $t\bar{t}+\text{jets}$ production. The colored boxes indicate the impact of the nuisance parameters, $\Delta\mu$ (top axis), on the corresponding parameter of interest, $\mu$. They are calculated from the covariance matrix using the post-fit up (down) uncertainties of the parameter of interest and the nuisance parameter, $\sigma_{\mathrm{POI}}^{\mathrm{up}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{up}}$ ($\sigma_{\mathrm{POI}}^{\mathrm{down}}$ and $\sigma_{\mathrm{NP}}^{\mathrm{down}}$), and their linear correlation coefficient, $\rho$, following EPJC 84 (2024) 593. The data points and error bars indicate the post-fit values and uncertainties of the nuisance parameters relative to their pre-fit values, $\theta_0$, in units of their pre-fit uncertainties, $\Delta \theta$ (bottom axis). A hollow circle indicates that the nuisance parameter has a Poisson constraint.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Efficiencies and rejection rates for the $b$- and $c$-jet tagging working points of the $b/c$-tagger, as well as the selection cuts on the discriminants, $\mathcal{D}_b'$ and $\mathcal{D}_c'$ that define the tagging bins. The primes indicate that a standard logistic function is applied to the discriminants. The b@70% and c@22% working points are inclusive of their respective tighter working points. The values were estimated from single-lepton and dilepton $t\bar{t}$ events simulated with Powheg + Pythia 8.

Pre-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Pre-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, but all normalization factors are fixed to their pre-fit values with no uncertainties. All uncertainties are assumed to be uncorrelated. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the twelve single-lepton and dilepton control regions (CRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Post-fit event yields in the seven signal regions (SRs) of the analysis. The quoted uncertainties include both statistical and systematic components, and post-fit correlations between uncertainties are taken into account. "Other Top" includes single-top-quark production and associated production of $t\bar{t}$ and single top quarks with bosons. "Non-Top" includes W+jets, Z+jets, and diboson processes. The "Fakes" category includes events from misidentified leptons and non-prompt leptons, estimated through the data-driven matrix method in the single-lepton channel and through MC predictions in the dilepton channel.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for the jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for $H_{\text{T}}$.

Non-perturbative corrections for $\Delta\phi_{jj}$.

Non-perturbative corrections for $m_{jj}$.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet $p_{\text{T}}$ for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $H_{\text{T}}$ averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $\Delta\phi_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the $m_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

The cross-section in bins of the di-$J/\psi$ transverse momentum in the forward rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The cross-section in bins of the di-$J/\psi$ invariant mass in the central rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The cross-section in bins of the di-$J/\psi$ invariant mass in the forward rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $\Delta y$ distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $\Delta \phi$ distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $m$($J/\psi$ $J/\psi$) distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $p_{\mathrm{T}}$($J/\psi$ $J/\psi$) distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the sub-leading $J/\psi$ transverse momentum in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the sub-leading $J/\psi$ transverse momentum in the forward rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ transverse momentum in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ transverse momentum in the forward rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ invariant in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ invariant in the forward rapidity region.

Ratios of integrated fiducial CC and NC cross sections obtained from the combination of electron and muon channels with statistical (stat) and systematic (syst) uncertainties. The common fiducial regions are defined in Section 2.3.

Total cross sections times leptonic branching ratios obtained from the combination of electron and muon channels with statistical and systematic uncertainties, for $W^+$, $W^-$, their sum and the $Z/\gamma^*$ process measured at $\sqrt{s}=7$ TeV. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), the luminosity (lumi), and acceptance extrapolation (acc) contributions.

Ratios of total CC and NC cross sections obtained from the combination of electron and muon channels with statistical and systematic uncertainties. The $Z/\gamma^*$ cross section is defined for the dilepton mass window $m_{\ell\ell} = 66 - 116$ GeV. The uncertainties denote the statistical (stat), the experimental systematic (syst), and acceptance extrapolation (acc) contributions.

The correlation coefficients of the $W^+$, $W^-$ and $Z$ fiducial cross-section measurements.

Measurement of the electron-to-muon cross-section ratios for the $W$ and $Z$ production, $R_W$ and $R_Z$. The uncertainties denote the statistical (stat) and the experimental systematic (syst) contributions.

Differential cross section for the $W^+ \to \ell^+\nu$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \ell^-\bar{\nu}$ processes combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV combined from $\ell = e, \mu$ decays extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to e^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to e^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the forward $Z/\gamma^* \to ee$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^- \to \mu^-\bar{\nu}$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the $W^+ \to \mu^+\nu$ process extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Differential cross section for the central $Z/\gamma^* \to \mu\mu$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV extrapolated to the common fiducial region. The statistical, uncorrelated systematic, correlated systematic and luminosity uncertainties are given in percent.

Values of $E(W[Z])$ and $A(W[Z])$ correction factors for integrated $W\to\ell\nu$ and $Z\to\ell\ell$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W[Z])$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. The $A(W[Z])$ factors, defined in Eq. (9), are used to extract a total cross section. Finally, the ratios of $A(W[Z])$ correction factors are given for four combinations of $W^+$, $W^-$ and $Z$ treating all components of the $A(W[Z])$ uncertainties as correlated between processes, which is relevant for the acceptance uncertainties on the total cross-section ratios.

Values of $E(W)$ correction factors for the differential $W\to\ell\nu$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(W)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region. This only affects the bin of highest $\eta_\ell$, all other $E(W)$ factors are exactly 1 without uncertainties.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential $Z/\gamma^*\to \mu^+\mu^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Values of $E(Z)$ correction factors for the differential forward $Z/\gamma^*\to e^+e^-$ measurements together with the total estimated uncertainties in percent. The separate electron and muon measurements are divided by the $E(Z)$ factors, as defined in Eq.(8), to correct them to the corresponding common fiducial region.

Correlation coefficients between integrated cross sections extrapolated to the total phase space, $\sigma^\mathrm{tot}_{W \to \ell\nu}$ and $\sigma^\mathrm{tot}_{Z/\gamma^* \to \ell\ell}$ for four combinations of $W^+, W^-, W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

Correlation coefficients between integrated fiducial cross sections in electron and muon channels for $W^{\pm}$ and $Z$. Values are given including and excluding the luminosity uncertainties.

The differential W charge asymmetry $A_{\ell}$ as defined in Eq. (19) from the combined electron and muon channel measurements. All uncertainties are quoted in % with respect to the $A_{\ell}$ values. The statistical (stat), uncorrelated (uncor) and correlated (cor) systematic uncertainties are reported.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the integrated common fiducial cross sections using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^+ \to \ell^+\nu$ process using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the $W^- \to \ell^-\bar{\nu}$ process$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial W charge asymmetry $A_{\ell}$ using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$). All predictions are corrected for leading two-loop EW contributions.

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the central $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Combined NNLO QCD and NLO EW predictions as defined in Eq. (15), c.f. Section 6.1.2 and Ref. [110] Chapter III.2.3, for the differential common fiducial cross sections for the forward $Z/\gamma^* \to \ell\ell$ processes in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV using Table 15 input parameters and various NNLO PDFs. The given uncertainties correspond to the statistical accuracy from the numerical DYNNLO 1.5 integration (stat) and the PDF uncertainties, where the latter are evaluated following the different prescriptions of the PDF groups. The term 'EW' quantifies the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised ($\pm$).

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^+ \to \ell^+\nu$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential $W^- \to \ell^-\bar{\nu}$ process. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses FEWZ 3.1.b2 for the NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors of 2 and 0.5, respectively. The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions are negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $46 < m_{\ell\ell} < 66$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential central $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $66 < m_{\ell\ell} < 116$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Nominal NNLO QCD + NLO EW $K_f$-factors as defined in Eq. (20) for the differential forward $Z/\gamma^* \to \ell\ell$ process in the invariant mass region $116 < m_{\ell\ell} < 150$ GeV. The $K_f$-factor is calculated as ratio of the best NNLO QCD + NLO EW prediction to the NLO QCD calculation using the MCFM/APPLGRID calculation, both using the ATLAS-epWZ12 NNLO PDF set, c.f. Section 7.1. In addition to the nominal $K_f$-factor, a full set of alternative $K$-factors is presented reflecting the following systematic variations, c.f. Tables 19 and 21. The factor $K_{FEWZ}$ uses the FEWZ 3.1.b2 NNLO QCD prediction, combined with NLO EW. The factors $K_\mu$ reflect the variation of the renormalisation and factorisations scales ($\mu_R, \mu_F$ up/down) by factors 2 and 0.5, respectively. The factors $K_{EW}$ quantify the deviation in case of using the NNLO QCD and NLO EW combination procedure as defined in Eq. (13) from the nominal prescription in Eq. (15), where the effect is symmetrised (EW up/down). The statistical uncertainty on each $K_f$-factor (stat) is obtained from the NNLO QCD calculation, while the numerical uncertainties from all other contributions is negligible.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the integrated common fiducial cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties are negligible on these correction factors.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to e^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to e^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^+ \to \mu^+\nu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial $W^- \to \mu^-\bar{\nu}$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial central $Z/\gamma^* \to \mu\mu$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

Correction factors estimated from Powheg+Pythia6+Photos samples, c.f. Section 2.2, to convert the differential common fiducial forward $Z/\gamma^* \to ee$ cross-section measurements from Born QED level, c.f. Section 6.1.2, to a "dressed" and "bare" QED FSR definition. The "dressed" level is obtained from the charged final-state lepton(s) combined with all FSR photons within a cone R, as defined in Footnote 1, of R<0.1. The "bare" level is obtained from the charged final-state lepton(s) after QED FSR losses. The factors $C_{dressed}$ ($C_{bare}$) are defined as the ratio of the dressed (bare) to the Born QED level cross sections. The statistical uncertainties (stat) are given.

The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

95% confidence level interval on alpha4 provided for different values of unitarity scale lambda_FF

95% confidence level interval on alpha5 provided for different values of unitarity scale lambda_FF

A and C factors for each categories (0SFOS, 1SFOS and 2SFOS) of the fully-leptonic channel (W+-W+-W-+ -> l+-nu l+-nu l-+nu )

A and C factors for each categories (ee, emu and mumu) of the semi-leptonic channel (W+-W+-W-+ -> l+-nu l+-nu jj)

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.