Table of systematic uncertainties for the relative differential cross-section at particle level for the top quark transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the top quark rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the top quark rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the tt̄ system transverse momentum in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the tt̄ system rapidity in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the mass of the tt̄ system in the resolved regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the top quark transverse momentum in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the absolute differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

Table of systematic uncertainties for the relative differential cross-section at particle level for the absolute value of the top quark rapidity in the boosted regime. Note that the values shown here are obtained by propagating the individual uncertainties to the measured cross-sections, while the covariance matrices are evaluated using pseudo-experiments as described in the text.

The differential cross section of $Z$ boson production scaled by 1/$p_\mathrm{T}^{Z}$, (1/$p_\mathrm{T}^{Z}$) $d\sigma /dp_\mathrm{T}^{Z}$, for $-3<y^\mathrm{*}_{Z}<2$.

The differential cross section of $Z$ boson production scaled by 1/$p_\mathrm{T}^{Z}$, (1/$p_\mathrm{T}^{Z}$) $d\sigma /dp_\mathrm{T}^{Z}$, for $-2<y^\mathrm{*}_{Z}<0$ and $0<y^\mathrm{*}_{Z}<2.

Centrality bias corrected $Z$ boson yields per event for $-3<y^\mathrm{*}_{Z}<2$ scaled by by $\langle N_{coll}\rangle$. (To remove the centrality bias correction each value may be multiplied by the approriate correction value found in arXiv:1412.0976.).

The rapidity differential Z boson yields per event scaled by $\langle N_{coll}\rangle$ for three centrality ranges.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Normalised fiducial ttbar differential cross-section for the jet pull angle distribution constructed using all particles. No uncertainty due to a potential non-SM colour flow model is included. These data should be taken as the 'default' all-particles pull angle data and uncertainties.

Normalised fiducial ttbar differential cross-section for the jet pull angle distribution constructed using charged particles. No uncertainty due to a potential non-SM colour flow model is included. These data should be taken as the 'default' charged-particles pull angle data and uncertainties.

Statistical+Systematic bin-bin correlation matrix.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.6 and after requiring that the pseudorapidity gap > 2.

The cross section differential in the fraction of the proton four-momentum carried by the Pomeron, LOG10(C=XI), for events with at least two jets of pt > 20 GeV found by the anti-kt jet algorithm with R=0.4 and after requiring that the pseudorapidity gap > 2.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The measured differential cross-section normalized to the bin width in values of the angle between the leptons in the leading reconstructed lepton pair for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the rapidity difference between the reconstructed lepton pairs for the 4 lepton channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the leading reconstructed dilepton pT for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the angle between the dilepton pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

The measured differential cross-section normalized to the bin width in values of the transverse mass of the reconstructed diboson pair for the 2 lepton, 2 neutrino channel. The first systematic uncertainty is detector systematics, the second is background systematic uncertainties.

Measured fiducial cross sections for successive exclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive exclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured ratios of the fiducial cross sections for successive inclusive jet multiplicities in the combined electron and muons channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\righarrow\ell\ell)$+>=1 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for the leading jet |y| in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $H_{\text{T}}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $\Delta\phi_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the electron channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the muon channel. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial cross sections for $m_{jj}$ in the combined electron and muon channels. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the exclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicities in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the inclusive jet multiplicity ratio in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow ee)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet $p_{\text{T}}$ in exclusive $Z/\gamma^*(\rightarrow\mu\mu)$+1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=1 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=2 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=3 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow ee)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\mu\mu)$+>=4 jet events in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for |y(jet)| in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $H_{\text{T}}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $\Delta\phi_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for Deltaphijj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the electron channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for $m_{jj}$ in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for mjj in the muon channel. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive exclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for successive inclusive jet multiplicities.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for inclusive jet multiplicity ratios.

Non-perturbative corrections for the jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+1 jet events.

Non-perturbative corrections for the jet pT in Z/gamma*(->ll)+1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=1 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=1 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=2 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=2 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=3 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=3 jet events.

Non-perturbative corrections for the leading jet $p_{\text{T}}$ in $Z/\gamma^*(\rightarrow\ell\ell)$+>=4 jet events.

Non-perturbative corrections for the leading jet pT in Z/gamma*(->ll)+>=4 jet events.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for |y(jet)|.

Non-perturbative corrections for $H_{\text{T}}$.

Non-perturbative corrections for HT.

Non-perturbative corrections for $\Delta\phi_{jj}$.

Non-perturbative corrections for Deltaphijj.

Non-perturbative corrections for $m_{jj}$.

Non-perturbative corrections for mjj.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the exclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the inclusive jet multiplicity ratio averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet $p_{\text{T}}$ for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the jet pT for exclusive Z+1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=3 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet $p_{\text{T}}$ for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet pT for Z+>=4 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the leading jet |y| for Z+>=1 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $H_{\text{T}}$ averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of HT averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of $\Delta\phi_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of Deltaphijj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the $m_{jj}$ for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.

Correction from the cross section calculated with leptons at the Born level to the cross section calculated with dressed leptons as a function of the mjj for Z+>=2 jet events averaging the electron and muon channels derived with MG5_aMC+Py8 CKKWL. The uncertainty is obtained with Alpgen+Py6.