$\xi$ distributions for different jet $p_T$ bins.

$\xi$ distributions for different jet $p_T$ bins.

The $j_T/p_{T}^{\rm jet}$ distributions for different jet $p_T$ bins.

The $j_T/p_{T}^{\rm jet}$ distributions for different jet $p_T$ bins.

$r$ distributions for different jet $p_T$ bins.

VLL "4321" cross-sections at NLO order of accuracy obtained by MadGraph.

SUSY RPV LQD higgsino cross-sections at NLO + NLL order of accuracy obtained by Resummino.

SUSY RPV LQD wino cross-sections at NLO + NLL order of accuracy obtained by Resummino.

Cutflow of the selection requirements for VLL signals with m_VLL =600, 900, and 1200 GeV. The yields correspond to an integrated luminosity of 126 fb^-1 (140 fb^-1) for the BJET (MST and MSDT) signal regions. The first row refers to unweighted event yields, while the yields presented in other rows are computed after applying event weights according to the selected object reconstruction and identification efficiency scale factors. Dashes (––) refer to requirements that are not applicable.

The expected acceptance times efficiency (including object identification and reconstruction, trigger selection, and event selection) for VLL signal as a function of m_VLL for the combined signal regions as well as for three individual signal region categories: 1τ_had ≥3b MST, 1τ_had ≥3b BJET and ≥2τ_had ≥3b MSDT. The region 1τ_had ≥3b MST refers to the combination of 1τ_had 3b MST and 1τ_had ≥4b MST signal regions, while the region 1τ_had ≥3b BJET refers to the combination of 1τ_had 3b BJET and 1τ_had ≥4b BJET signal regions.

The distributions of the variables used in the simultaneous fit for the SR. The black points with error bars represent the data and their statistical uncertainties, whereas the shaded band represents the predicted uncertainties. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The last bin of each plot has been extended to include the overflow contribution.

Expected and observed 95% upper limits on the product of the cross section and branching fraction$\sigma(\mathrm{pp} \ ightarrow W\mathrm{a})\mathcal{B}(W ightarrow \ell^{+} v_{\ell})\mathcal{B}(\mathrm{a} \rightarrow Z\gamma)\mathcal{B}(Z \rightarrow \ell^{+} \ell^{-})$ s a function of the ALP mass from 110 to 400 GeV

Expected and observed 95% upper limits on the photophobic ALP model parameter $1/f_{\mathrm{a}}$ as a function of ALP mass reinterpreted from $1/f_{\mathrm{a}}=2~\mathrm{TeV}^{-1}$

Systematic covariance matrix for the differential cross-section distribution.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-on-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$2\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. The hatched band includes all statistical and systematic uncertainties.

Observed ($N_{\text{obs}}$) and expected ($N_{\text{exp}}$) yields after the background-only fit for the flavor-merged inclusive SRs. The third and fourth columns list the 95\% CL upper limits on the visible cross-section ($\sigma_{\text{vis}}^{95}$) and on the number of signal events ($S_\text{obs}^{95}$). The fifth column ($S_\text{exp}^{95}$) shows the 95\% CL upper limit on the number of signal events, given the expected number of background events and its $\pm 1\sigma$ variations. The last two columns indicate the CL$_{\text{b}}$ value, i.e. the confidence level observed for the background-only hypothesis, and the discovery $p$-value ($p(s = 0)$) with its associated statistical significance $Z$. If the observed yield is below the expected yield, the $p$-value is capped at 0.5.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{e}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Observed and expected exclusion limits on the SBH model where only $\tilde{\mu}_{\text{L}}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100~GeV.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $m_{\text{T}}^{\text{min}}$ in SROS-off-b-$e\mu\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$eee$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Distribution of $E_{\text{T}}^{\text{miss}}$ in SRSS-$ee\mu$. The SR selections are applied for each distribution, except for the variable shown, for which the selection is indicated by a black arrow. The last bin includes the overflow. The `Others' category contains the production of Higgs boson, 3-top, 4-top, and single-top processes. Distributions for SBH signals are overlaid. The bottom panels show the ratio of the observed data to the predicted total background yields. Ratio values outside the graph range are indicated by brown arrows. The hatched band includes all statistical and systematic uncertainties.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ is considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $m(\tilde{\ell}_{\text{L}}^{\pm})$ vs $m(\tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 150 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

Observed and expected exclusion limits on the SBH model where mass-degenerate $\tilde{e}_{\text{L}}$, $\tilde{\mu}_{\text{L}}$ and $\tilde{\nu}$ are considered. The expected 95% CL exclusion limit is shown as a dashed black line, with the yellow band indicating $\pm1\sigma_{\text{exp}}$ including all uncertainties except for the signal cross-section uncertainty. The observed 95% CL exclusion limit is shown as a red solid line, with the dotted red lines indicating $\pm1\sigma_{\text{theory}}$ due to the signal cross-section uncertainty. The limits are shown projected onto the $\Delta m(\tilde{\chi}^0_3, \tilde{\chi}^0_1)$ vs $\Delta m(\tilde{\ell}_{\text{L}}, \tilde{\chi}^0_3)$ plane, with $m(\tilde{\chi}^0_1)$ assumed to be 100 GeV.

The expected upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

The observed upper limits on the cross-section for each signal point. The gray numbers represent the values. The expected (dashed) and observed (solid) 95% CL exclusion limits are overlaid. An asymptotic approximation is employed in the CL$_{\text{s}}$ calculation instead of the full calculation using pseudo-experiments.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Acceptance for signals with $m(\tilde{\chi}^0_1)=100$ GeV in flavored-merged SRs. The acceptance is given by the ratio of weighted selected events in the SR to the weighted total number of generated events. The selection is based on generator-level particle information.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Efficiencies for signals with $m(\tilde{\chi}^0_1)=100$ GeV in the $m_{3\ell}$ merged SRSFOS and SRSS. The efficiency is defined by the number of events of reconstructed-level signal simulation divided by the number of events obtained at generator level. Efficiencies below 0.002% are rounded to 0. The efficiency values are affected by statistical fluctuations due to the limited number of events.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-on-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown for SROS-off-b for reference. The generator level selections require to have two or more leptons.

Summary of the number of events passing each selection for the $m(\tilde{\ell}_{\text{L}}^{\pm},\tilde{\chi}^0_3,\tilde{\chi}^0_1)=(300, 200, 100)$, $(550, 300, 100)$, $(450, 180, 100)$ GeV signal points, including all production processes. After the initial selections, the table is split into row blocks per inclusive region, and then further for each SR channel. Flavor-binned SRs are shown. The generator level selections require to have two or more leptons.

The Charged-hadron yields as a function of pT in different y selections in p+Pb collisions.

The K^{0}_{S} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Lambda yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The #Xi^{-} yields as a function of pT in different y selections in Pb+Pb photo-nuclear collisions.

The K^{0}_{S} yields as a function of pT in different y selections in p+Pb collisions.

The #Lambda yields as a function of pT in different y selections in p+Pb collisions.

The #Xi^{-} yields as a function of pT in different y selections in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in Pb+Pb photo-nuclear collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The Charged-hadron and identified-hadron yields as a function of y in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The meanpT of charged hadrons and identified hadrons as a function of Nchrec in p+Pb collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in Pb+Pb photo-nuclear collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The baryon to meson ratio as a function of pT in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in Pb+Pb photo-nuclear collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The ratios of identified-strange-hadron yield to charged-hadron yields as a function of Nchrec in p+Pb collisions.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits.

The expected EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The expected EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear-only electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

The observed EFT limits at 95% CL, shown for the linear+quadratic electron, muon, and combined fits. The PDF eigenvectors in the theoretical uncertainty are used at 68% CL.

Born-level single-differential cross section $\frac{d\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross section $\frac{d\sigma (W\to e\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^+\to e^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W^-\to e^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross section $\frac{d^2\sigma (W\to e\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level single-differential cross-section $\frac{d\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} } $ including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^+\to\mu^+\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W^-\to\mu^-\bar{\nu}) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [200-300] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [300-425] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [425-600] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [600-900] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Born-level double-differential cross-section $\frac{d^2\sigma (W\to\mu\nu) }{d m_{\text{T}}^{W} d |\eta| } $ for $m_T^W$ = [900-2000] GeV including the absolute statistical and systematic uncertainties. Symmetric uncertainties are denoted by $\pm$ or $\mp$, where the upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^+$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^-$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level single-differential cross-section including the absolute statistical and systematic uncertainties in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Physical sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The systematic uncertainties are related to the unfolding procedure (``unf.''), the jet energy scale/resolution (``JER/JES''), the \met scale and resolution, the electron and muon scale, resolution and efficiency (``Eff.''), the multijet and $t\bar{t}$ (where $t\bar{t}$ RW refers to a reweighting to NNLO) background estimates and normalization of small background processes (``Norm.''). The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[200,300]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[300,425]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[425,600]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[600,900]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Combined Born-level double-differential cross-section including the absolute statistical and systematic uncertainties for $m_T^W=[900,2000]\,\mathrm{GeV}$ in the $\ell^\pm$-channel. Orthogonal sources of systematic uncertainties are shown. The upper sign corresponds to the one standard deviation upward shift of the uncertainty source. The luminosity uncertainty of $0.83\%$ is not included.

Ratio of the $e^\pm$- and $\mu^\pm$-channel single-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Ratio of the $e^\pm$- and $\mu^\pm$-channel double-differential cross sections including the absolute data statistical, $e$-$\mu$-uncorrelated (including signal and background statistical) and $e$-$\mu$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel single-differential cross-sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Asymmetry of the $\ell^+$- and $\ell^-$-channel double-differential cross sections including the absolute total statistical and $\ell^+$-$\ell^-$-correlated systematic uncertainties and the total uncertainty.

Pre-fit MC statistical uncertainties per bin. These values are used to quantify the MC statistical uncertainty contributions to the total uncertainty in $m_t$ based on elements from the covariance matrix obtained in the profile likelihood fit. Each MC statistical contribution is estimated by dividing the relevant covariance matrix entry (see Table 2) by the corresponding pre-fit MC statistical uncertainty for that bin.

The contribution of each source of systematic uncertainty to the total uncertainty in $m_t$ is provided. Each source's contribution is taken directly from the relevant element of the covariance matrix for the profile likelihood fit to $\overline{m_J}$, $m_{jj}$, and $m_{tj}$ using data. The sign of the effect of each uncertainty is included.

The fitted $m_t$ is provided for each replica generated using bootstrapping. Each replica is a 3D histogram of $m_{J}$, $m_{jj}$, and $m_{tj}$, where $m_{J}$ has 50 bins between 145.0 GeV and 205.0 GeV. This method uses the BootstrapGenerator class in ROOT to initialise a pseudo-random number generator for each event, which is seeded by the value of the eventNumber and runNumber variables for a given event in the input dataset. The pseudo-random numbers are drawn from a Poisson distribution with rate parameter equal to 1. These are used to fluctuate the amount by which each replica histogram is filled. There are 1000 replicas, numbered from 0 to 999.