The Levy scale parameter $R$ versus the transverse mass $m_{\mathrm{T}}$ in different centrality classes for negatively and positively charged hadron pairs.

The $1/R^2$ distribution vs. transverse mass $m_{\mathrm{T}}$ in different centrality classes for negatively and positively charged hadron pairs.

The linear-fit parameter $A$ versus $\langle N_{\text{part}}\rangle$ for positively and negatively charged hadron pairs. The bin range on $\langle N_{\text{part}}\rangle$ represents the 68% confidence interval associated to its uncertainty.

The linear-fit parameter $B$ versus $\langle N_{\text{part}}\rangle$ for positively and negatively charged hadron pairs. The bin range on $\langle N_{\text{part}}\rangle$ represents the 68% confidence interval associated to its uncertainty.

The Levy scale parameter $R$ versus $\langle N_{\text{part}}\rangle^{1/3}$ in different $m_{\mathrm{T}}$ classes for negatively and positively charged hadron pairs. The bin range on $\langle N_{\text{part}}\rangle^{1/3}$ represents the 68% confidence interval associated to its uncertainty.

The Levy stability index $\alpha$ versus the transverse mass $m_{\mathrm{T}}$ in different centrality classes for negatively and positively charged hadron pairs.

The average Levy stability index $\langle \alpha \rangle$ versus $\langle N_{\text{part}}\rangle$ for both positively and negatively charged hadron pairs. The bin range on $\langle N_{\text{part}}\rangle$ represents the 68% confidence interval associated to its uncertainty.

The correlation strength $\lambda$ versus the transverse mass $m_{\mathrm{T}}$ in different centrality classes for negatively and positively charged hadron pairs.

The correlation strength (re-scaled with the square of the pion fraction) $\lambda ^*$ versus the transverse mass $m_{\mathrm{T}}$ in different centrality classes for positively and negatively charged hadron pairs.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $10-20\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $20-30\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $30-40\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $40-50\%$ centrality.

$K^{0}_{S} K^{0}_{S}$ correlation meassurement in $50-60\%$ centrality.

$\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlation meassurement in $0-80\%$ centrality.

$\Lambda\Lambda\oplus\overline{\Lambda}\overline{\Lambda}$ correlation meassurement in $0-80\%$ centrality.

The extracted $R_{inv}$ from $K^{0}_{S} K^{0}_{S}$ correlations as a function of centrality.

The extracted $\lambda$ parameters from $K^{0}_{S} K^{0}_{S}$ correlations as a function of centrality.

Extracted effective range ($d_{0}$) and real components of the complex scattering length ($\Re f_{0}$) from the $\Lambda\Lambda\oplus\overline{\Lambda}\overline{\Lambda}$ and $\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlations.

Extracted imaginary components of the complex scattering length ($\Im f_{0}$) and real components of the complex scattering length ($\Re f_{0}$) from the $\Lambda K^{0}_{S} \oplus \overline{\Lambda} K^{0}_{S}$ correlation.

Correlation for the uncertainties of the differential cross-section of prompt inclusive production of long-lived charged particles.

Correlation for the uncertainties of the differential cross-section of prompt inclusive production of long-lived charged particles.

Correlation for the uncertainties of the differential cross-section of prompt inclusive production of long-lived charged particles.

Measured differential cross section with associated uncertainties as a function of COS(THETA*). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2GAMMA). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>30 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of MULT(JET,PT>50 GEV). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of HT. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET1). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of YRAP(JET2). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of M(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DELTAYRAP(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of ABSDPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of DPHI(2GAMMA,2JET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of TAUJET. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of SUM(TAUJET). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=0,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=1,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET=2,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

Measured differential cross section with associated uncertainties as a function of PT(2GAMMA) [NJET>=3,PT>30 GEV]. Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.

The measured cross sections or cross section limits of the diphoton, VBF-enhanced, Nlepton $\geq$ 1, high $E_{T}^{miss}$, and ttH-enhanced fiducial regions are shown.

Measured differential cross section with associated uncertainties as a function of diphoton transverse momentum in bins of ABS(COS(THETA*)). Each systematic uncertainty sources is fully uncorrelated with the other sources and fully correlated across bins, except for the background modelling systematics for which an uncorrelated treatment across bins is more appropriate.Each systematic uncertainty sources is fully uncorrelated with the other sources.

Non-perturbative correction factors in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are evaluated by deriving these factors using different generators and tunes as described in the text. No factor are given for the Nlepton $\geq$ 1 and High-$E_{T}^{miss}$ fiducial regions as the gluon fusion contamination in both is negligible.

Isolation efficiencies in percent for gluon fusion $H\rightarrow\gamma\gamma$ for each fiducial region/variable bin measured in this analysis. The isolation efficiency is defined as the probability for both photons to fulfil the isolation criteria (as described in Section 9.1) for events that pass the diphoton kinematic criteria. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. Uncertainties are assigned in the same way as for the non-perturbative correction factors: by varying the fragmentation and underlying event modelling. These factors can be multiplied by the kinematic acceptance factors (see Table 29) to extrapolate an inclusive gluon fusion Higgs prediction to the fiducial volume used in this analysis. No factors for the Nlepton $\geq$ 1 and High $E_{T}^{miss}$ fiducial regions are provided as the gluon fusion contamination is negligible.

Combined non-perturbative (Table 27) and particle-level isolation correction factors (Table 28) in percent accounting for the impact of hadronisation and the underlying event activity for all measured variables and fiducial regions. Regions of phase space where no reliable estimate could be obtained are listed as 100 without uncertainties. The uncertainties on the combined values properly take into account the correlations between both multiplicative factors.

Diphoton kinematic acceptances in percent for gluon-gluon fusion for the diphoton fiducial region and all differential variable bins studied in this paper, defined as the probability to fulfill the diphoton kinematic criteria: $p_{T}$/$m_{\gamma\gamma}$ < 0.35 (0.25) for the leading (subleading) photon and $|\eta_{\gamma\gamma}|$ < 2.37. The factors are evaluated using the Powheg NNLOPSevent generator. Uncertainties are taken from PDF variations. QCD scale variations have a negligible impact on these factors. The range of each bin is given in Table 26.

observed statistical correlations between pTyy, Njets, mjj, |DeltaPhijj| and pTj1

ggH default MC + XH predictions

XH ( = VBF + VH + ttH + bbH ) MC predictions

Best-fit values and uncertainties of the production-mode cross sections times branching ratio.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Best-fit values and uncertainties of the simplified template cross sections times branching ratio.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Observed correlations between the measured simplified template cross sections, including both the statistical and systematic uncertainties.

Figure 3 (upper). Distribution of $M_{T2}(ll)$ in a control region enriched in $t\bar{t}$ events defined by requiring at least 2 jets, at least one of them b-tagged, and missing transverse momentum below 80 GeV. For the plot, simulated yields are normalized to data using the yields in the $M_{T2}(ll)$ < 100 GeV region.

Figure 4 (upper). Expected and observed yields in the five $t\bar{t}Z$ control regions, which are defined by different requirements on the number of reconstructed jets and b jets, before the fit.

Figure 4 (lower). Expected and observed yields in the five $t\bar{t}Z$ control regions, which are defined by different requirements on the number of reconstructed jets and b jets, after the fit.

Figure 5 (left). Distribution of $M_{T2}(ll)$ of SF events falling within in the Z boson mass window with at least two jets and no b jet, $p_{T}^{miss} > 80$ GeV and $M_{T2}(ll) > 100$ GeV.

Figure 5 (center). Distribution of $M_{T2}(blbl)$ of SF events falling within in the Z boson mass window with at least two jets and no b jet, $p_{T}^{miss} > 80$ GeV and $M_{T2}(ll) > 100$ GeV.

Figure 5 (right). Distribution of $p_{T}^{miss}$ of SF events falling within in the Z boson mass window with at least two jets and no b jet, $p_{T}^{miss} > 80$ GeV and $M_{T2}(ll) > 100$ GeV.

Figure 6. Event yields in the 13 Drell-Yan and multiboson control regions for events with SF leptons falling within the Z boson mass window and no b jets, after renormalizing with the scale factors obtained from the fit procedure described in the text.

Figure 7 (left). Distributions of $M_{T2}(ll)$ for observed events in the dimuon channel compared to the predicted SM background.

Figure 7 (center). Distributions of $M_{T2}(ll)$ for observed events in the dielectron channel compared to the predicted SM background.

Figure 7 (right). Distributions of $M_{T2}(ll)$ for observed events in the electron-muon channel compared to the predicted SM background.

Figure 8 (left). Distributions of $M_{T2}(ll)$ for all lepton flavors for the defined selection.

Figure 8 (center). Distributions of $M_{T2}(blbl)$ for all lepton flavors for the defined selection, after requiring $M_{T2}(ll) > 100$ GeV.

Figure 8 (right). Distributions of $p_{T}^{miss}$ for all lepton flavors for the defined selection, after requiring $M_{T2}(ll) > 100$ GeV.

Figure 9 (upper). Predicted backgrounds and observed yields in the dielectron and dimuon search regions. The yields are post fit and correspond to the numbers quoted in Tab. 4 of the publication.

Figure 9 (lower). Predicted backgrounds and observed yields in the electron-muon search regions. The yields are post fit and correspond to the numbers quoted in Tab. 4 of the publication.

Figure 10. Predicted backgrounds and observed yields in all search regions combined. The yields are post fit and correspond to the numbers quoted in Tab. 4 of the publication.

Figure 11 (upper). Observed limits for the T2tt model in the top squark - LSP mass plane. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane.

Figure 11 (upper). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 11 (upper). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 11 (lower). Observed limits for the T2bW model in the top squark - LSP mass plane. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane.

Figure 11 (lower). Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 11 (lower). Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 12 (upper left). Observed limits for the T8bbllnunu model in the top squark - LSP mass plane. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.05 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (upper left). Observed exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.05 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (upper left). Expected exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.05 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (upper left). Observed limits for the T8bbllnunu model in the top squark - LSP mass plane. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.5 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (upper left). Observed exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.5 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (upper left). Expected exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.5 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (lower). Observed limits for the T8bbllnunu model in the top squark - LSP mass plane. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.95 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (lower). Observed exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.95 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 12 (lower). Expected exclusion region at 95% CL assuming 100% branching fraction. $m_{\tilde{\chi}^{\pm}_{1}} = 0.5 (m_{\tilde{t}_{1}} + m_{\tilde{\chi}^{0}_{1}})$, $m_{\tilde{l}} = 0.95 (m_{\tilde{\chi}^{\pm}_{1}} - m_{\tilde{\chi}^{0}_{1}}) + m_{\tilde{\chi}^{0}_{1}}$

Figure 13. Observed limits for the T2tt model in the top squark - LSP mass plane combining the dilepton final state with single-lepton and the all-hadronic final states. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane.

Figure 13. Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 13. Expected exclusion region at 95% CL assuming 100% branching fraction.

Figure 14. Observed limits for the T2bW model in the top squark - LSP mass plane combining the dilepton final state with single-lepton and the all-hadronic final states. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane.

Figure 14. Observed exclusion region at 95% CL assuming 100% branching fraction.

Figure 14. Expected exclusion region at 95% CL assuming 100% branching fraction.

Additional Figure 3. Observed limits for the T2tt model in the top squark - LSP mass plane using aggregate signal regions. The numbers indicate the 95% CL upper limit on the cross section times the square of the branching fraction at each point of the plane.

Additional Figure 3. Observed exclusion region at 95% CL assuming 100% branching fraction.

Additional Figure 3. Expected exclusion region at 95% CL assuming 100% branching fraction.

Table 5. Ratios of $\mu=\frac{\sigma$}{\sigma_{theory}}$ of the 95% CL expected and observed limits to simplified model expectations for different DM particle masses and mediator masses.

Table 6. Expected and observed event yields, summed over all lepton flavors, in aggregate signal regions.

Table 7 (upper). Covariance matrix for the background prediction in aggregate signal regions.

Table 7 (lower). Correlation matrix for the background prediction in aggregate signal regions.

Additional Figure 1. Correlation matrix of the 13 signal regions, split into same-flavor (SF) and different-flavor (DF) regions.

Additional Figure 2. Covariance matrix of the 13 signal regions, split into same-flavor (SF) and different-flavor (DF) regions.