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Final state radiation correction used in the $\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-p_{T}^{Z}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Correlation matrix of statistical uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Measured total $Z$-boson cross-section for different datasets. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $y^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Systematic uncertainties in the single differential cross-sections in interval regions of $y^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for prompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Single-differential production cross-sections for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainties are statistical, the second are correlated systematic uncertainties shared between intervals, and the last are uncorrelated systematic uncertainties.

Fraction of nonprompt $J/\psi$ mesons (in \%) in ($p_\text{T},y$) intervals. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Nuclear modification factor $R_{p\text{Pb}}$ for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for prompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 8 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $p_\text{T}$. The first uncertainty is statistical and the second is systematic.

Cross-section ratios between 13 TeV and 5 TeV measurements for nonprompt $J/\psi$ mesons as a function of $y$. The first uncertainty is statistical and the second is systematic.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-0.2$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=-1$ rather than zero, in ($p_\text{T},y$) intervals.

Relative changes of cross-sections (in \%), for a polarisation of $\lambda_{\theta}=+1$ rather than zero, in ($p_\text{T},y$) intervals.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Correlation matrix for the measurement of STXS parameters in each of the 28 regions considered.

Fitted values for kappa_g and kappa_y.

Correlation matrix for the measurement of kappa_g and kappa_y.

Summary of the 68% CL confidence intervals for individual measurements of SMEFT parameters observed in data. In each case, SMEFT parameters other than the one measured are fixed to 0.

Results of the EV parameter measurement in data, in the linear and linear+quadratic parameterizations of the SMEFT. All the EVs parameters are free to vary in the fits. The ranges correspond to 68% CL confidence intervals.

Observed linear correlation coefficients of the EVs parameters in the linear parameterization.

Observed linear correlation coefficients of the EVs parameters in the linear+quadratic parameterization.

Cross-sections times H->yy branching ratio for ggF +bbH, VBF, VH, ttH, and tH production. The values are obtained from a simultaneous fit to all categories. The theory uncertainties in the predictions include uncertainties due to missing higher-order terms in the perturbative QCD calculations and choices of parton distribution functions and value of alpha_s, as well as the H->yy branching ratio uncertainty.

Best-fit values and uncertainties for STXS parameters in each of the 28 regions considered. The values for the gg->H process also include the contributions from bbH production.

Correlation matrix for the measurement of STXS parameters in each of the 33 regions considered.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.4$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and photon isolation cone radius $R=0.2$.

Measured cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and photon isolation cone radius $R=0.2$.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.4$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ and isolation cone radius $0.2$ at NNLO QCD.

Predicted cross sections for inclusive isolated-photon production as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ and isolation cone radius $0.2$ at NNLO QCD.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted ratio of the differential cross sections for inclusive isolated-photon production for $R=0.2$ and $R=0.4$ as a function of $E_{\rm T}^{\gamma}$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$.

Measured fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $|\eta^{\gamma}|<0.6$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.6<|\eta^{\gamma}|<0.8$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $0.8<|\eta^{\gamma}|<1.37$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.56<|\eta^{\gamma}|<1.81$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $1.81<|\eta^{\gamma}|<2.01$ at NNLO QCD.

Predicted fiducial integrated cross section for inclusive isolated-photon production as a function of $R$ for $2.01<|\eta^{\gamma}|<2.37$ at NNLO QCD.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of measured PSI(2S) over J/PSI(1S) cross section in charged-particle multiplicity intervals and integrated in multiplicity.

Ratio of $p_{\mathrm{T,ch\ jet}}$-differential cross section of charm jets tagged with $\mathrm{D^{0}}$ mesons for different $R$: $\sigma(R=0.2)/\sigma(R=0.4)$ and $\sigma(R=0.2)/\sigma(R=0.6)$ in pp collisions at $\sqrt{s}=13$ TeV.

Ratio of $p_{\mathrm{T,ch\ jet}}$-differential cross section of charm jets tagged with $\mathrm{D^{0}}$ mesons for different $R$: $\sigma(R=0.2)/\sigma(R=0.4)$ and $\sigma(R=0.2)/\sigma(R=0.6)$ in pp collisions at $\sqrt{s}=5.02$ TeV.

The fraction of $\mathrm{D^{0}}$ jets over inclusive charged-particle jets in pp collisions at $\sqrt{s}=5.02$ TeV for $R=0.2$, $0.4$, and $0.6$.

Distributions of $z^{\mathrm{ch}}_{||}$-differential yield of charm jets tagged with $\mathrm{D^{0}}$ mesons normalised by the number of $\mathrm{D^{0}}$ jets within each distribution in pp collisions at $\sqrt{s}=13$ TeV in four jet-$p_{\mathrm{T}}$ intervals $5<p_{\mathrm{T,ch\ jet}}<7$ GeV/$c$, $7<p_{\mathrm{T,ch\ jet}}<10$ GeV/$c$, $10<p_{\mathrm{T,ch\ jet}}<15$ GeV/$c$, and $15<p_{\mathrm{T,ch\ jet}}<50$ GeV/$c$ for jet radii $R=0.2$, $0.4$, and $0.6$.

Distributions of $z^{\mathrm{ch}}_{||}$-differential yield of charm jets tagged with $\mathrm{D^{0}}$ mesons normalised by the number of $\mathrm{D^{0}}$ jets within each distribution in pp collisions at $\sqrt{s}=5.02$ TeV in four jet-$p_{\mathrm{T}}$ intervals $5<p_{\mathrm{T,ch\ jet}}<7$ GeV/$c$, $7<p_{\mathrm{T,ch\ jet}}<10$ GeV/$c$, $10<p_{\mathrm{T,ch\ jet}}<15$ GeV/$c$, and $15<p_{\mathrm{T,ch\ jet}}<50$ GeV/$c$ for jet radii $R=0.2$, $0.4$, and $0.6$.

$p_{\mathrm{T,ch\ jet}}$-differential cross section of charm jets tagged with $\mathrm{D^{0}}$ mesons for $R=0.3$ in pp collisions at $\sqrt{s}=5.02$ TeV.

The fraction of $\mathrm{D^{0}}$ jets over inclusive charged-particle jets in pp collisions at $\sqrt{s}=5.02$ TeV for $R=0.3$.

Distributions of $z^{\mathrm{ch}}_{||}$-differential yield of charm jets tagged with $\mathrm{D^{0}}$ mesons normalised by the number of $\mathrm{D^{0}}$ jets within each distribution in pp collisions at $\sqrt{s}=5.02$ TeV in four jet-$p_{\mathrm{T}}$ intervals $5<p_{\mathrm{T,ch\ jet}}<7$ GeV/$c$, $7<p_{\mathrm{T,ch\ jet}}<10$ GeV/$c$, $10<p_{\mathrm{T,ch\ jet}}<15$ GeV/$c$, and $15<p_{\mathrm{T,ch\ jet}}<50$ GeV/$c$ for jet radius $R=0.3$.

The Bose-Einstein correlation (BEC) parameter R as a function of n_ch for HMT events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter R as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameter &lambda; as a function of k_T for MB events using different MC generators in the calculation of R₂(Q). The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 71 &le; n_ch &lt; 80 for the minimum-bias (MB) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The two-particle double-ratio correlation function, R₂(Q), for pp collisions for track p_T &gt;100&nbsp;MeV at &radic;s=13&nbsp;TeV in the multiplicity interval 231 &le; n_ch &lt; 300 for the high-multiplicity track (HMT) events. The blue dashed and red solid lines show the results of the exponential and Gaussian fits, respectively. The region excluded from the fits is shown. The statistical uncertainty and the systematic uncertainty for imperfections in the data reconstruction procedure are added in quadrature.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the correlation strength, &lambda;(m_ch), on rescaled multiplicity, m_ch, obtained from the exponential fit of the R₂(Q) correlation functions for tracks with p_T &gt; 100 &nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13 &nbsp;TeV for the minimum-bias (MB) and high multiplicity track (HMT) data. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the exponential fit of &lambda;(m_ch) for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the source radius, R(m_ch), on m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively.

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

The dependence of the R(m_ch) on &#8731;m_ch. The uncertainties represent the sum in quadrature of the statistical and asymmetric systematic contributions. The black and blue solid curves represent the fit of R(m_ch) for &#8731;m_ch &lt; 1.2 for p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV, respectively. The black and blue dotted curves are extensions of the black and blue solid curves beyond &#8731;m_ch &gt; 1.2, respectively. The black and brown dashed curves represent the saturation value of R(m_ch) for &#8731;m_ch &gt; 1.45 with p_T &gt;100&nbsp;MeV and for &#8731;m_ch &gt; 1.6 with p_T &gt;500&nbsp;MeV, respectively

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13&nbsp;TeV (black circles) and 7&nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative multiplicity region 3.09 &lt; m_ch &le; 3.86. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

Comparison of single-ratio two-particle correlation functions, using the unlike-charge particle (UCP) pair reference sample, for minimum-bias (MB) events, showing C₂^data(Q) (top panel) at 13 &nbsp;TeV (black circles) and 7 &nbsp;TeV (open blue circles), and the ratio of C₂^7&nbsp;TeV (Q) to C₂^13&nbsp;TeV (Q) (bottom panel). Comparison of C₂^data (Q) for representative k_T region 400 &lt; k_T &le;500 &nbsp;MeV. The statistical and systematic uncertainties, combined in quadrature, are presented. The systematic uncertainties include track efficiency, Coulomb correction, non-closure and multiplicity-unfolding uncertainties.

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the correlation strength, &lambda;(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to &lambda;(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The k_T dependence of the source radius, R(k_T), obtained from the exponential fit to the R₂(Q) correlation functions for events with multiplicity n_ch &ge; 2 and transfer momentum of tracks with p_T &gt;100&nbsp;MeV and p_T &gt;500&nbsp;MeV at &radic;s=13&nbsp;TeV for the minimum-bias (MB) and high-multiplicity track (HMT) events. The uncertainties represent the sum in quadrature of the statistical and systematic contributions. The curves represent the exponential fits to R(k_T).

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 100&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.1 and 0.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 100&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &mu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &mu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The fit parameter &nu; describing the dependence of the correlation strength, &lambda;, on charged-particle scaled multiplicity, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid (blue dashed) curve represents the exponential fit of the dependence of parameter &nu; on m_ch for tracks with p_T &gt;100&nbsp;MeV (p_T &gt;500&nbsp;MeV).

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &xi; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the saturated value of the parameter &xi; for m_ch &gt; 3.0 for tracks with p_T &gt;100&nbsp;MeV and for m_ch &gt; 2.8 for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The parameter &kappa; describing the dependence of the source radius, R, on charged-particle scaled multiplicity, m_ch, for track p_T&gt;100&nbsp;MeV and track p_T&gt;500&nbsp;MeV in the minimum-bias (MB) and high-multiplicity track (HMT) samples at &radic;s = 13&nbsp;TeV. The error bars and boxes represent the statistical and systematic contributions, respectively. The black solid and blue dashed curves represent the exponential fit to the parameter &kappa; for tracks with p_T &gt;100&nbsp;MeV and for tracks with p_T &gt;500&nbsp;MeV, respectively.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the correlation strength, &lambda;, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The two-dimensional dependence on m_ch and k_T for p_T &gt; 500&nbsp;MeV for the source radius, R, obtained from the exponential fit to the R₂(Q) correlation functions using the MB sample for m_ch &le; 3.08 and the HMT sample for m_ch &gt; 3.08.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter &lambda; for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected low m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of k_T in selected high m_ch intervals. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

The parameter R for p_T &gt; 500&nbsp;MeV as a function of m_ch in k_T intervals between 0.5 and 1.5&nbsp;GeV. The error bars and boxes represent the statistical and systematic contributions, respectively.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

ATLAS and CMS results for the source radius R as a function of &#8731;n_ch in pp interactions at 13&nbsp;TeV. The CMS results (open circles) have been adjusted (by the CMS collaboration) to the ATLAS kinematic region&#8758; p_T &gt; 100&nbsp;MeV and |&eta;|&lt;2.5. The ATLAS uncertainties are the sum in quadrature of the statistical and asymmetric systematic uncertainties. For CMS, only the systematic uncertainties are shown since the statistical uncertainties are smaller than the marker size. The dashed blue (ATLAS) and black (CMS) lines represent the fit to &#8731;n_ch at low multiplicity, continued as dotted lines beyond the fit range. The solid green (ATLAS) and broken black (CMS) lines indicate the plateau level at high multiplicity.

Systematic uncertainties (in percent) in the correlation strength, &lambda;, and source radius, R, for the exponential fit of the two-particle double-ratio correlation functions, R₂(Q), for p_T &gt; 100&nbsp;MeV at &radic;s= 13&nbsp;TeV for the MB and HMT events. The choice of MC generator gives rise to asymmetric uncertainties, denoted by uparrow and downarrow. This asymmetry propagates through to the cumulative uncertainty. The columns under ‘Uncertainty range’ show the range of systematic uncertainty from the fits in the various n_ch intervals.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the average rescaled charged-particle multiplicity, m_ch, for |&eta;| &lt; 2.5 and both p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV for the minimum-bias (MB) and the high-multiplicity track (HMT) events. The parameters &gamma; and &delta; resulting from a joint fit to the MB and HMT data are presented. The total uncertainties are shown.

The results of the fits to the dependencies of the correlation strength, &lambda;, and source radius, R, on the pair average transverse momentum, k_T, for various functional forms and for minimum-bias (MB) and high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV and p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. The total uncertainties are shown.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The Bose-Einstein correlation (BEC) parameters &lambda; and R as a function of n_ch and k_T using different MC generators in the calculation of R₂(Q). (a) &lambda; versus n_ch for MB events, (b) &lambda; versus n_ch for HMT events, (c) &lambda; versus k_T and (d) R versus k_T for MB events. The uncertainties shown are statistical. The lower panel of each plot shows the ratio of the BEC parameters obtained using EPOS LHC (red circles), Pythia 8 Monash (blue squares) and Herwig++ UE-EE-5 (green triangles) compared with the parameters obtained using Pythia 8 A2. The gray band in the lower panels is the MC systematic uncertainty, obtained as explained in the text.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 10, (b) 11 &lt; n_ch &le; 20, (c) 21 &lt; n_ch &le; 30, (d) 31 &lt; n_ch &le; 40, (e) 41 &lt; n_ch &le; 50, (f) 51 &lt; n_ch &le; 60, (g) 61 &lt; n_ch &le; 70, (h) 71 &lt; n_ch &le; 80 and (i) 81 &lt; n_ch &le; 90. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 91 &lt; n_ch &le; 100, (b) 101 &lt; n_ch &le; 125, (c) 126 &lt; n_ch &le; 150, (d) 151 &lt; n_ch &le; 200, (e) 201 &lt; n_ch &le; 250. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 101 &lt; n_ch &le; 110, (b) 111 &lt; n_ch &le; 120, (c) 121 &lt; n_ch &le; 130, (d) 131 &lt; n_ch &le; 140, (e) 141 &lt; n_ch &le; 155, (f) 156 &lt; n_ch &le; 175, (g) 176 &lt; n_ch &le; 200, (h) 201 &lt; n_ch &le; 230 and (i) 231 &lt; n_ch &le; 300. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), for the high-multiplicity track (HMT) events using the unlike-charge particle (UCP) pairs reference sample for k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample for n_ch - intervals&#8758; (a) 2 &lt; n_ch &le; 9, (b) 10 &lt; n_ch &le; 18, (c) 19 &lt; n_ch &le; 27, (d) 28 &lt; n_ch &le; 36, (e) 37 &lt; n_ch &le; 45, (f) 46 &lt; n_ch &le; 54, (g) 55 &lt; n_ch &le; 63, (h) 64 &lt; n_ch &le; 72, (i) 73 &lt; n_ch &le; 81, (j) 82 &lt; n_ch &le; 90, (k) 91 &lt; n_ch &le; 113, and (l) 114 &lt; n_ch &le; 136. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The single-ratio two-particle correlation functions, C₂^data(Q), at 7 TeV for the minimum-bias (MB) events using the unlike-charge particle (UCP) pairs reference sample k_T - intervals&#8758; (a) 100 &lt; k_T &le; 200&nbsp;MeV, (b) 200 &lt; k_T &le; 300&nbsp;MeV, (c) 300 &lt; k_T &le; 400&nbsp;MeV, (d) 400 &lt; k_T &le; 500&nbsp;MeV, (e) 500 &lt; k_T &le; 600&nbsp;MeV, (f) 600 &lt; k_T &le; 700&nbsp;MeV, (g) 700 &lt; k_T &le; 1000&nbsp;MeV, and (h) 1000 &lt; k_T &le; 1500&nbsp;MeV. The error bars represent the statistical uncertainties. The boxes represent the systematic uncertainties, which are the sum in quadrature of a variation of the Coulomb correction, the track reconstruction efficiency and the unfolding matrix.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the multiplicity, m_ch, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 100&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.

The correlation strength, &lambda;, and source radius, R, of the exponential fits to the two-particle double-ratio correlation functions, R₂(Q), in dependence on the pair transverse momentum, k_T, intervals for the minimum-bias (MB) and the high-multiplicity track (HMT) events for p_T &gt; 500&nbsp;MeV at &radic;s = 13&nbsp;TeV. Statistical uncertainties for &radic;&chi;²/ndf&gt;1 are corrected by the &radic;&chi;²/ndf. The total uncertainties are shown.