Measured and predicted cross sections (fb) in bins of photon transverse momentum $p_{T}^{\gamma}$. The fiducial phase space definition follows the analysis selection in the paper.

Expected and observed 95% CL intervals for anomalous coupling parameters. All other anomalous coupling parameters are fixed to zero when extracting each interval.

The distributions of the variables used in the simultaneous fit for the SR. The black points with error bars represent the data and their statistical uncertainties, whereas the shaded band represents the predicted uncertainties. The bottom panel in each figure shows the ratio of the number of events observed in data to that of the total SM prediction. The last bin of each plot has been extended to include the overflow contribution.

Expected and observed 95% upper limits on the product of the cross section and branching fraction$\sigma(\mathrm{pp} \ ightarrow W\mathrm{a})\mathcal{B}(W ightarrow \ell^{+} v_{\ell})\mathcal{B}(\mathrm{a} \rightarrow Z\gamma)\mathcal{B}(Z \rightarrow \ell^{+} \ell^{-})$ s a function of the ALP mass from 110 to 400 GeV

Expected and observed 95% upper limits on the photophobic ALP model parameter $1/f_{\mathrm{a}}$ as a function of ALP mass reinterpreted from $1/f_{\mathrm{a}}=2~\mathrm{TeV}^{-1}$

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|y_{e u}|$, versus $S_{e u}$ mass for scalar LQs coupled to electrons.

Observed and Expected UL exclusions on the $BR(H\to S)$ of generic signals with $m_{A'} = 1.0\;GeV$ and $BR(A' \rightarrow \pi\pi) = 1.0$.

The observed data in the dielectron channel and the fitted signal-plus-background templates, shown for the $S_{e d}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Observed and Expected UL exclusions on the number of 'signal' yields in sideband A from the model agnostic fit, assuming no 'SUEP-like' signal contamination in the CRs.

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|y_{e d}|$, versus $S_{e d}$ mass for scalar LQs coupled to electrons.

Postfit values for SR in the B-Only CR+SR and CR-Only fits with the prefit signal overlayed for reference

The observed data in the dimuon channel and the fitted signal-plus-background templates, shown for the $S_{\mu u}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Postfit values for PR in the B-Only CR+SR and CR-Only fits with the prefit signal overlayed for reference

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|y_{\mu u}|$, versus $S_{\mu u}$ mass for scalar LQs coupled to muons.

Postfit values for CRDY in the B-Only CR+SR and CR-Only fits with the prefit signal overlayed for reference

The observed data in the dimuon channel and the fitted signal-plus-background templates, shown for the $S_{\mu d}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Postfit values for CRTT in the B-Only CR+SR and CR-Only fits with the prefit signal overlayed for reference

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|y_{\mu d}|$, versus $S_{\mu d}$ mass for scalar LQs coupled to muons.

Per-selection efficiencies on Generic - $m_{A'} = 1.0\;GeV$ $BR(A' \rightarrow \pi\pi) = 1.0$ Hadronic - $m_{A'} = 0.7\;GeV$ and $BR(A' \rightarrow ee) = BR(A' \rightarrow \mu\mu) = 0.15$ $BR(A' \rightarrow \pi\pi) = 0.7$ Leptonic - $m_{A'} = 0.5\;GeV$ and $BR(A' \rightarrow ee) = BR(A' \rightarrow \mu\mu) = 0.2$ and $BR(A' \rightarrow \pi\pi) = 0.6$ samples. Selections: 2 OSSF leptons, one SUEP cluster, $60\leq Z_{m}\leq 120$ GeV, $p_{T}^Z\geq 25$ GeV, veto events with b-tagged jets, $p_{T}^{SUEP} > 60\;GeV$, and $dR^{Ak4}_{Ak15} < 1.5$. Efficiencies are the ratio of the histogram size at the selection step to the previous step (except twoLepton vs. initial). The final column is the total cumulative efficiency (dR vs. initial). Note that these selection numbers were all calculated using samples generated with 600,000 events for each signal point considered.

The observed data in the dielectron channel and the fitted signal-plus-background templates, shown for the $V_{e u}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Interpolated observed and expected UL exclusions on $BR(H\to S) = 1$ for generic signals with $m_{A'} = 1.0\;GeV$ and $BR(A' \rightarrow \pi\pi) = 1.0$. The discreate heatmap points can be found in the UL Generic (Observed & Expected) figure in this sandbox

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|g_{e u}|$, versus $V_{e u}$ mass for vector LQs coupled to electrons.

The observed data in the dielectron channel and the fitted signal-plus-background templates, shown for the $V_{e d}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|g_{e d}|$, versus $V_{e d}$ mass for vector LQs coupled to electrons.

The observed data in the dimuon channel and the fitted signal-plus-background templates, shown for the $V_{\mu u}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|g_{\mu u}|$, versus $V_{\mu u}$ mass for vector LQs coupled to muons.

The observed data in the dimuon channel and the fitted signal-plus-background templates, shown for the $V_{\mu d}$ scenario with a candidate LQ mass of 2.5 TeV. Distributions of events are binned in the reconstructed dilepton mass, rapidity, and cosine theta.

Upper limits at $95\%$ CL on the LQ-fermion couplings, $|g_{\mu d}|$, versus $V_{\mu d}$ mass for vector LQs coupled to muons.

Distributions of jet multiplicity in a Z-enriched selection of two-lepton OnZ events. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Distributions of jet multiplicity in a WZ-enriched selection of three-lepton OnZ events prior to corrections. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Distributions of jet multiplicity in a WZ-enriched selection of three-lepton OnZ events prior to corrections. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

Example diagram of a signal process, resulting from the EW production and decay of a chargino-neutralino pair and the subsequent hadronic RPV decay of the LSP. Leptonic decays of the W and Z bosons are targeted.

Example diagram of a signal process, resulting from the EW production and decay of a chargino-neutralino pair and the subsequent hadronic RPV decay of the LSP. Leptonic decays of the W and Z bosons are targeted.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Distribution of three- and four-lepton events across the control regions (CRs) and search regions (SR) used in the analysis. The first 13 bins correspond to ZZ (1-2), ttZ (3), ZG (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs.The "ZZ" and "ZG" background components are shown separately from the "Rare" background component for clarity.The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions.The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis.

Distribution of three- and four-lepton events across the control regions (CRs) and search regions (SR) used in the analysis. The first 13 bins correspond to ZZ (1-2), ttZ (3), ZG (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs.The "ZZ" and "ZG" background components are shown separately from the "Rare" background component for clarity.The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions.The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis.

Jet multiplicity distribution in a W-enriched selection of one-lepton events, where the expected W backround has been corrected using the two-lepton Z-enriched dataset. The same Z-enriched dataset is also used to correct the {\WZ} jet multiplicity distribution in the SRs. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainties in prediction.An example RPVq signal ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) is also overlaid.

Description of three- and four-lepton control regions (CRs) and search regions (SRs) used in the analysis. All three-lepton OnZ events are split either in $M_{\mathrm{T}}$ or $S_{\mathrm{T}}$ bins in units of GeV. The first 13 bins correspond to ZZ (1-2), t$\bar{{\rm t}}$Z (3), Z$\gamma$ (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs. A minimum lepton $p_{\mathrm{T}}$ cut of 20 GeV is applied to all three-lepton OnZ regions to suppress MisID background contributions, whereas it is kept at 10 GeV in all others. In the three-lepton BelowZ region (bin 4), an additional selection on the three lepton mass is applied to target Z$\gamma$ contributions, i.e. $76 < M(3\ell) < 106$ GeV.

The jet scaling patterns as measured in $t\overline{t}$-enriched one-lepton and Z-enriched two-lepton events in data. These are defined as the ratios of event counts in neighboring jet multiplicity $N_{j}$ bins, i.e. number of events with $(i+1)$ jets to the number with $i$ jets, and are used to correct the corresponding jet multiplicity distributions of WZ and ttZ events in three-lepton signal regions. In each measurement, the contributions of other processes are estimated and subtracted using simulated samples. The corresponding statistical uncertainties are negligible, whereas systematic uncertainties are not shown.

Jet multiplicity distribution in a W-enriched selection of one-lepton events, where the expected W backround has been corrected using the two-lepton Z-enriched dataset. The same Z-enriched dataset is also used to correct the {\WZ} jet multiplicity distribution in the SRs. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainties in prediction.An example RPVq signal ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) is also overlaid.

The jet scaling patterns as measured in $t\overline{t}$-enriched one-lepton and Z-enriched two-lepton events in data. These are defined as the ratios of event counts in neighboring jet multiplicity $N_{j}$ bins, i.e. number of events with $(i+1)$ jets to the number with $i$ jets, and are used to correct the corresponding jet multiplicity distributions of WZ and ttZ events in three-lepton signal regions. In each measurement, the contributions of other processes are estimated and subtracted using simulated samples. The corresponding statistical uncertainties are negligible, whereas systematic uncertainties are not shown.

Table contains number of signal events for selected masses with different cuts applied.

Differential cross sections for exclusive dielectron production, in the fiducial phase space of Table 1, as functions of the pair invariant mass. Data are compared with SUPERCHIC + FSR(PHOTOS++), STARLIGHT + FSR(PY8), and gamma-UPC + FSR(PY8) predictions.

Differential cross sections for exclusive dielectron production, in the fiducial phase space of Table 1, as functions of the pair |cos $\theta$*|. Data are compared with SUPERCHIC + FSR(PHOTOS++), STARLIGHT + FSR(PY8), and gamma-UPC + FSR(PY8) predictions.

Differential exclusive diphoton cross sections in the fiducial phase space of Table 1 as a function of the diphoton rapidity measured in data compared with SUPERCHIC and gamma-UPC@NLO predictions.

Differential exclusive diphoton cross sections in the fiducial phase space of Table 1 as a function of the diphoton invariant mass measured in data compared with SUPERCHIC and gamma-UPC@NLO predictions.

Observed and expected 95% CL limits on the production cross section $\sigma(\gamma\gamma \rightarrow a \rightarrow \gamma\gamma)$ as a function of the ALP mass $m_{a}$. The uncertainties indicate regions containing 68 and 95% of the distribution of limits expected under the background-only hypothesis. The additional datasets indicate the expected ALP cross sections as a function of $m_{a}$ for decreasing photon couplings ($g_{a\gamma} = 0.3, 0.1, 0.05 TeV^{-1}$).

Exclusion limits at 95% CL in the axion-photon coupling $g_{a\gamma}$ versus axion mass $m_a$ plane, for the operator $\frac{1}{4\Lambda}aF\widetilde{F}$ (assuming ALPs coupled only to photons) extracted in this analysis.

Cutflow for signal samples in the muon-tau channel for 2016 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the muon-tau channel for 2017 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the muon-tau channel for 2018 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2016 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2017 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2018 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Yields for the muon-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the muon-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the muon-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Covariance matrix for all bins and all channels used in the background-only fit of this analysis. There are the e-tau, the mu-tau, and the tau-tau analysis channels, each present for 2016, 2017, and 2018. Each has 6 bins in the reconstructed mass (mrec[GeV]) indicated with their borders in the bin naming. The bin labels have channel name, year name, then bin name.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to di-tau in the e-tau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to di-tau in the mu-tau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to ditau in the ditau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to ditau for the combination of all channels.

Invariant mass distribution of final state particles in SR1 HF category ($\text{H}\to\text{J}/\psi\gamma$ signal)

Invariant mass distribution of final state particles in SR1 Z-LP category ($\text{Z}\to\text{J}/\psi\gamma$ signal)

Invariant mass distribution of final state particles in SR1 Z-HP category ($\text{Z}\to\text{J}/\psi\gamma$ signal)

Invariant mass distribution of final state particles in SR2 category ($\text{H}\to\psi(\text{2S})\gamma$ signal)

Invariant mass distribution of final state particles in SR2 category ($\text{H}\to\psi(\text{2S})\gamma$ signal)

Invariant mass distribution of final state particles in control region category ($\text{H}\to\mu\mu\gamma$ background)

Observed and expected (with $\pm 1$, $\pm 2$ standard deviation bands) exclusion limits at 95% C.L. on the branching fraction $\mathcal{B}$ of the $(\text{H,Z}) \to \psi(\text{nS})\gamma$ decays

Observed (expected) upper limits at 95% C.L. on the normalized values with respect to the SM expectation, denoted as the signal strength parameter $\mu$, of the product of the cross section $\sigma$ and the branching fraction $\mathcal{B}$ of the $(\text{H,Z}) \to \psi(\text{nS})\gamma$ decays, and the branching fraction, assuming a SM Z and H boson cross section.

Distributions in $m_{Z'}^{rec}$ for data in the SRs, together with fits of the background functions under the background-only hypothesis for the muon channel. The number of observed events in each bin is divided by the bin width. The signal predictions are shown for different Z' boson masses, normalized to an arbitrary cross section of 1 fb. In the panels below the distributions, the ratios of data to the background function are displayed. The shaded green areas represent the statistical uncertainty from the fit. The $\chi^2$ values per number of degrees of freedom ($\chi^2$/n.d.f.) and the corresponding $p$-values are provided for each fit.

Distributions in $m_{Z'}^{T}$ for data in the SRs, together with fits of the background functions under the background-only hypothesis for the invisible channel. The number of observed events in each bin is divided by the bin width. The signal predictions are shown for different Z' boson masses, normalized to an arbitrary cross section of 1 fb. In the panels below the distributions, the ratios of data to the background function are displayed. The shaded green areas represent the statistical uncertainty from the fit. The $\chi^2$ values per number of degrees of freedom ($\chi^2$/n.d.f.) and the corresponding $p$-values are provided for each fit.

Distributions in $m_{Z'}^{T}$ for data in the SRs, together with fits of the background functions under the background-only hypothesis for the invisible channel. The number of observed events in each bin is divided by the bin width. The signal predictions are shown for different Z' boson masses, normalized to an arbitrary cross section of 1 fb. In the panels below the distributions, the ratios of data to the background function are displayed. The shaded green areas represent the statistical uncertainty from the fit. The $\chi^2$ values per number of degrees of freedom ($\chi^2$/n.d.f.) and the corresponding $p$-values are provided for each fit.

Distributions in $m_{Z'}^{rec}$ for data in the SRs, together with fits of the background functions under the background-only hypothesis for the electron channel. The number of observed events in each bin is divided by the bin width. The signal predictions are shown for different Z' boson masses, normalized to an arbitrary cross section of 1 fb. In the panels below the distributions, the ratios of data to the background function are displayed. The shaded green areas represent the statistical uncertainty from the fit. The $\chi^2$ values per number of degrees of freedom ($\chi^2$/n.d.f.) and the corresponding $p$-values are provided for each fit.

Distributions in $m_{Z'}^{rec}$ for data in the SRs, together with fits of the background functions under the background-only hypothesis for the electron channel. The number of observed events in each bin is divided by the bin width. The signal predictions are shown for different Z' boson masses, normalized to an arbitrary cross section of 1 fb. In the panels below the distributions, the ratios of data to the background function are displayed. The shaded green areas represent the statistical uncertainty from the fit. The $\chi^2$ values per number of degrees of freedom ($\chi^2$/n.d.f.) and the corresponding $p$-values are provided for each fit.

Expected upper limits at 95% CL on the product of the production cross section and the branching fraction as a function of the Z' boson mass.Each line corresponds to the three different final states and their combined result.

Expected upper limits at 95% CL on the product of the production cross section and the branching fraction as a function of the Z' boson mass.Each line corresponds to the three different final states and their combined result.

Expected and observed upper limits at 95% CL on the product of the production cross section and the branching fraction as functions of the Z' boson mass from the combination of all final states. The limits are compared with the predictions of the HVT model and the expected limits (shown by red curves) from a previous analysis.

Expected and observed upper limits at 95% CL on the product of the production cross section and the branching fraction as functions of the Z' boson mass from the combination of all final states. The limits are compared with the predictions of the HVT model and the expected limits (shown by red curves) from a previous analysis.

Prediction from the HVT model.

Prediction from the HVT model.

Observed upper limits at 95% CL on gF for different Z' boson masses as functions of the product of $g_{H}$ with the sign of $g_{F}$. The two benchmark scenarios of the HVT model are shown by the black markers.

Observed upper limits at 95% CL on gF for different Z' boson masses as functions of the product of $g_{H}$ with the sign of $g_{F}$. The two benchmark scenarios of the HVT model are shown by the black markers.

Differential cross section of tZq as a function of the transverse momentum of the lepton coming from the W boson decay. The overflow is included in the last bin.

Differential cross section of ttZ+tWZ as a function of the azimuthal angle between the two leptons coming from the Z boson. The overflow is included in the last bin.

Differential cross section of tZq as a function of the azimuthal angle between the two leptons coming from the Z boson. The overflow is included in the last bin.

Differential cross section of ttZ+tWZ as a function of the $\Delta$R between the Z boson and the lepton coming from the W boson. The overflow is included in the last bin.

Differential cross section of tZq as a function of the $\Delta$R between the Z boson and the lepton coming from the W boson. The overflow is included in the last bin.

Differential cross section of ttZ+tWZ as a function of the cosine of the polar angle between the Z boson and the negatively charged lepton coming from its decay, boosted into the Z boson restframe.

Differential cross section of tZq as a function of the cosine of the polar angle between the Z boson and the negatively charged lepton coming from its decay, boosted into the Z boson restframe.

Normalized differential cross section of ttZ+tWZ as a function of the transverse momentum of the Z boson. The overflow is included in the last bin.

Normalized differential cross section of tZq as a function of the transverse momentum of the Z boson. The overflow is included in the last bin.

Normalized differential cross section of ttZ+tWZ as a function of the transverse momentum of the lepton coming from the W boson decay. The overflow is included in the last bin.

Normalized differential cross section of tZq as a function of the transverse momentum of the lepton coming from the W boson decay. The overflow is included in the last bin.

Normalized differential cross section of ttZ+tWZ as a function of the azimuthal angle between the two leptons coming from the Z boson. The overflow is included in the last bin.

Normalized differential cross section of tZq as a function of the azimuthal angle between the two leptons coming from the Z boson. The overflow is included in the last bin.

Normalized differential cross section of ttZ+tWZ as a function of the $\Delta$R between the Z boson and the lepton coming from the W boson. The overflow is included in the last bin.

Normalized differential cross section of tZq as a function of the $\Delta$R between the Z boson and the lepton coming from the W boson. The overflow is included in the last bin.

Normalized differential cross section of ttZ+tWZ as a function of the cosine of the polar angle between the Z boson and the negatively charged lepton coming from its decay, boosted into the Z boson restframe.

Normalized differential cross section of tZq as a function of the cosine of the polar angle between the Z boson and the negatively charged lepton coming from its decay, boosted into the Z boson restframe.

Covariance matrix for the differential cross sections as a function of the transverse momentum of the Z boson.

Covariance matrix for the differential cross sections as a function of the transverse momentum of the lepton coming from the W boson decay.

Covariance matrix for the differential cross sections as a function of the $\Delta$R between the Z boson and the lepton coming from the W boson.

Covariance matrix for the differential cross sections as a function of the azimuthal angle between the two leptons coming from the Z boson.

Covariance matrix for the differential cross sections as a function of the cosine of the polar angle between the Z boson and the negatively charged lepton coming from its decay, boosted into the Z boson restframe.

Distributions for data and expected signal and background contributions of the MVA score for the µ + jets channel in the 3j1b category, before the maximum likelihood fit. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty in the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-prediction ratio. The first and last bins in each distribution include underflow and overflow events, respectively.

Observed and predicted number of events in each of the eight categories of the signal region, before the maximum likelihood fit. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty in the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-prediction ratio.

Distributions for the e + jets final state before the maximum likelihood fit, MVA score bins for the 3j1b category and ∆R med ( j, j 0 ) bins for the other categories. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty of the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-simulation ratio, where the simulations are adjusted according to their normalization before the fit. The first and last bins in each distribution include underflow and overflow events, respectively.

Distributions for the e + jets final state after the maximum likelihood fit, MVA score bins for the 3j1b category and ∆R med ( j, j 0 ) bins for the other categories. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty of the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-simulation ratio, where the simulations are adjusted according to their normalization after the fit. The first and last bins in each distribution include underflow and overflow events, respectively.

Distributions for the µ + jets final state before the maximum likelihood fit, MVA score bins for the 3j1b category and ∆R med ( j, j 0 ) bins for the other categories. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty of the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-simulation ratio, where the simulations are adjusted according to their normalization before the fit. The first and last bins in each distribution include underflow and overflow events, respectively.

Distributions for the µ + jets final state after the maximum likelihood fit, MVA score bins for the 3j1b category and ∆R med ( j, j 0 ) bins for the other categories. The vertical error bars represent the statistical uncertainty in the data, and the shaded band the uncertainty of the prediction. All uncertainties considered in the analysis are included in the uncertainty band. The lower panels show the data-to-simulation ratio, where the simulations are adjusted according to their normalization after the fit. The first and last bins in each distribution include underflow and overflow events, respectively.

Covariance matrix for the lepton+jets ML fit.

Covariance matrix for the combination ML fit.