Breakdown of systematic uncertainties in percent for the measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the Z/gamma* -> mu+mu- final state at 13TeV.

Measured fiducial cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+l- (l = e, mu) final state.

Measured total cross section times leptonic branching ratio for Z/gamma* production in the combined Z/gamma* -> l+ l- (l = e, mu) final state.

Measured total cross-section for ttbar events using e-mu events with b-tagged jets.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV.

Correlation coefficients amongst the combined (Z/gamma^* -> l+ l-) where (l = e, mu) fiducial cross section and ttbar total cross section at 13, 8, and 7TeV, omitting the common normalisation uncertainty due to the luminosity calibration and beam energy.

Z-boson and ttbar production cross-section single ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both numerator and denominator. In the second column, the total cross section is used for the numerator while the fiducial (FID) cross section is used for the denominator. In the third column, the fiducial cross sections are used for both numerator and denominator. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections. The luminosity uncertainty almost entirely cancels in some of the ratio measurements.

Z-boson and ttbar production cross-section double ratios at 13, 8, 7TeV. The beam-energy uncertainty, which largely cancels in the ratios, is included in the systematic uncertainty. In the first column, the total (TOT) cross sections are used for both ttbar and Z processes. In the second column, the total cross section is used for ttbar while the fiducial (FID) cross section is used for Z. In the third column, the fiducial cross sections are used for both ttbar and Z. Apart for the MZ requirement, the kinematic fiducial requirements listed below apply only to the fiducial cross sections.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

Measured cross-section as a function of angular separation between the muon and the closest jet for $500~\text{GeV} < p_T^{\text{leading jet}} < 600~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

Measured cross-section as a function of angular separation between the muon and the closest jet for $p_T^{\text{leading jet}} > 650~\text{GeV}$. Multiplicative correction factors for using prompt muons and prompt dressing photons in the particle-level selection, derived from ALPGEN 2.14 interfaced with PYTHIA 6.426, are also shown.

The total inelastic cross section.

The measured differential elastic cross section. In addition to the statistical and total systematic uncertainties, the following 22 systematic shifts are given, which are included in the profile fit with their signs: -- Constraints: Beam optics uncertainty obtained by varying the ALFA constraints in the optics fit -- QScan: Variation by +/- 0.1 % of the quadrupole strength -- Q2: Fit of the strength of Q2 using the best value for the strength of Q1 and Q3 -- Q5Q6: Variation of the strength of Q5 and Q6 by -0.2% as indicated by machine constraints -- MadX: Uncertainty related to the beam transport replacing matrix transport by MadX PTC tracking -- Qmisal: Uncertainty due to the mis-alignment of the quadrupoles in the beam line -- Q1Q3: Propagation of the optics fit uncertainty in the strenght of Q1 and Q3 on the differential elastic cross section -- Aopt: Alignment uncertainty from the optimization procedure -- Offv: Alignment uncertainty related to the vertical beam center offset -- Offh: Alignment uncertainty related to the horizontal beam center offset -- Ang: Alignment uncertainty related to the detector rotation in the x-y plane -- BGn: Uncertainty from the background normalization -- BGs: Uncertainty from the background shape -- MCres: Error from modelling of the detector response -- Slope: Residual dependence on the physics model estimated by varying the nuclear slope in the simulation by +/- 1 GeV^-2 -- Emit: Uncertainty from the emittance used to calculate beam divergence in the simulation -- Unf: Unfolding uncertainty from the data-driven closure test -- Trac: Uncertainty from the variation of the track reconstruction selection cuts -- Xing: Uncertainty from residual crossing angle in the horizontal plane -- Eff: Uncertainty from the reconstruction efficiency -- Lumi: Luminosity uncertainty (+/- 1.5%) -- Ebeam: Uncertainty from the nominal beam energy (+/- 0.65%) Small differences in the values given here compared to the published version are related to insignificant rounding issues.

The statistical covariance matrix for the differential elastic cross section.

Measured cross section in bins of $p_{\rm{T}}^{\rm{j}1}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{H}}$.

Measured fractions in bins of $|y^{\rm{H}}|$.

Measured fractions in bins of $N_{\rm{jets}}$.

Measured fractions in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential cross-section measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{H}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $|y^{\rm{H}}|$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $N_{\rm{jets}}$.

Correlation matrix for the total uncertainty of the differential shape measurement in bins of $p_{\rm{T}}^{\rm{j1}}$.

The total $pp\to H$ cross section in the $H\to\gamma\gamma$ and $H\to ZZ^*\to 4\ell$ channels and their combination.

The fiducial, inclusive (SPS+DPS) and DPS-subtracted differential cross-section ratio $\mathrm{d}R_{Z+J/\psi}/\mathrm{d}y$ as a function of $y_{J/\psi}$ for non-prompt $J/\psi$.

The inclusive (SPS+DPS) cross-section ratio $\mathrm{d}R_{Z+J/\psi}^\mathrm{incl}/\mathrm{d}p_\mathrm{T}$ for prompt and non-prompt $J/\psi$. Estimated DPS contributions for each bin, based on the assumptions made in this study, are presented.

The inclusive (SPS+DPS) cross-section ratio $\mathrm{d}R_{Z+J/\psi}^\mathrm{incl}/\mathrm{d}p_\mathrm{T}$ for prompt and non-prompt $J/\psi$. Estimated DPS contributions for each bin, based on the assumptions made in this study, are presented.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 6$. The total uncertainty is obtained by adding the three uncertainties linearly.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 7$. The total uncertainty is obtained by adding the three uncertainties linearly.

Number of data events (20.3 fb$^{-1}$), number of predicted events from the fit, statistical uncertainty on the fit, systematic uncertainty on the choice of control region, and on the choice of fit function versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ lower bin edge for inclusive jet multiplicity $N_{\textrm{Jet}} \geq 8$. The total uncertainty is obtained by adding the three uncertainties linearly.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 3$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 4$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 5$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 6$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 7$.

Upper limits on the visible cross section (cross section ($\sigma$) times acceptance ($A$) times efficiency ($\epsilon$)) at the 95% CL versus inclusive $H_{\textrm{T}}^{\textrm{min}}$ for $N_{\textrm{Jet}}\geq 8$.

Mean reconstruction efficiencies $(\epsilon)$ and RMS of the reconstruction efficiencies for various black hole and string ball models.

Ratio of the fiducial cross section for $t\bar{t}$ events with two leptons and at least four b-jets to the fiducial cross section for $t\bar{t}$ events with two leptons and at least four jets, at least two of which must be b-jets. The definition of the cross-sections includes $t\bar{t}+Z / H$ events that pass the fiducial requirements.

Measured fiducial cross section for $t\bar{t}$ events with exactly one lepton and at least five jets, of which at least three are b-jets. The definition of the cross-section excludes $t\bar{t}+Z / H$ events that pass the fiducial requirements.

Measured fiducial cross section for $t\bar{t}$ events with two leptons and at least three b-jets. The definition of the cross-section excludes $t\bar{t}+Z / H$ events that pass the fiducial requirements.

Measured fiducial cross section for $t\bar{t}$ events with two leptons and at least four b-jets. The definition of the cross-section excludes $t\bar{t}+Z / H$ events that pass the fiducial requirements.

Ratio of the fiducial cross section for $t\bar{t}$ events with two leptons and at least four b-jets to the fiducial cross section for $t\bar{t}$ events with two leptons and at least four jets, at least two of which must be b-jets. The definition of the cross-sections excludes $t\bar{t}+Z / H$ events that pass the fiducial requirements.

Measured integrated cross sections for the $Z\gamma\gamma$ process for neutrino final state at $\sqrt{s} = 8$ TeV in the extended fiducial regions defined in the paper, table 5. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $E_{\mathrm{T}}^{\gamma}$ for the $pp \rightarrow \nu\bar{\nu}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the inclusive $N_{\mathrm{jets}} \geq 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The differential cross sections as a function of $m_{\ell^{+}\ell^{-}\gamma}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the exclusive $N_{\mathrm{jets}} = 0$ extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.

The cross sections as a function of $N_{\mathrm{jets}}$ for the $pp \rightarrow \ell^{+}\ell^{-}\gamma$ process in the extended fiducial region. The parton-to-particle correction factors are also shown, which are defined as the ratio of the cross sections at parton-level to the cross sections at particle-level.