Distributions in SR-low of the data and post-fit background prediction for p_T^soft/(p_T^soft + m_eff^3ℓ). The SR-low event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for m_T. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for R(E_T^miss,jets). The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^soft. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Distributions in SR-ISR of the data and post-fit background prediction for p_T^jets. The SR-ISR event selections are applied for each distribution except for the variable shown, where the selection is indicated by a red arrow. The normalization factor for the WZ background is derived from the background-only estimation described in Section 7. The expected distribution for a benchmark signal model is included for comparison. The first (last) bin includes underflow (overflow). The "Top-quark like" category contains the tt̄, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. The bottom panel shows the ratio of the data to the post-fit background prediction. The hatched bands indicate the combined theoretical, experimental, and MC statistical uncertainties.

Observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, varying the signal cross section within its uncertainty, on the observed exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Plus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Minus 1$\sigma$ uncertainty, due to uncertainties in the background prediction and experimental uncertainties affecting the signal, on the expected exclusion contour on C1N2 production assuming on-shell $W/Z$ decays as a function of the C1/N2 and N1 masses, and derived from the combined fit of low-mass and ISR regions.

Upper limits on observed wino-bino simplified model signal cross section $\sigma_\text{obs}^\text{95}$.

Upper limits on expected wino-bino simplified model signal cross section $\sigma_\text{exp}^\text{95}$.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} \geq 100$ GeV.

Signal acceptance in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-low, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal acceptance in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

Signal efficiency in SR-ISR, for signals with $m(\widetilde{\chi}^{\pm}_{1}/\widetilde{\chi}^{0}_{2}) - m\widetilde{\chi}^{0}_{1} < 100$ GeV.

The observed and expected yields after the background-only fit in the SRs. The normalization factors of the $WZ$ sample for the low-mass and ISR regions are different and are treated separately in the combined fit. \The "Top-quark like" category contains the tt&#772;, Wt, and WW processes while the "Others" category contains backgrounds from triboson production and processes that include a Higgs boson, 3 or more tops, and tops produced in association with W or Z bosons. Combined statistical and systematic uncertainties are presented. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the expected background and data yields in $\text{SR-low}$ and $\text{SR-ISR}$. The second and third columns show the data and total expected background with systematic uncertainties. The fourth column gives the model-independent upper limits at 95\% CL on the visible cross section ($\sigma_\text{vis}$). The fifth and sixth columns give the visible number of observed ($S^{95}_\text{obs}$) and expected ($S^{95}_\text{exp}$) events of a generic beyond-the-SM process, where uncertainties on $S^{95}_\text{exp}$ reflect the $\pm 1 \sigma$ uncertainties on the background estimation. The last column shows the discovery $p$-value and Gaussian significance $Z$ assuming no signal.

Upper limits on observed (expected) wino-bino simplified model signal cross section $\sigma_\text{obs(exp)}^\text{95}$.

Full list of event selections and MC generator-weighted yields and in $\text{SR-ISR}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Full list of event selections and MC generator-weighted yields and in $\text{SR-low}$ for the main $WZ$ background and a representative $\tilde{\chi}^{\pm}_{1}\tilde{\chi}^{0}_{2}$ signal point of mass 200 GeV and mass splitting $\Delta m = 100$ GeV normalized to 139 fb$^{-1}$. 40000 events were generated.

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 8-12 GeV

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 12-18 GeV

Yield ratios of chi_c2 over chi_c1 mesons as a function of costh (HX) in the J/psi pT range 18-30 GeV

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle level.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid}\times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on born level for the $Z\rightarrow ee$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) and Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. for the electron momentum scale and resolution uncertainties; Elec. (Reco), Elec. (ID), Isolation, Trigger and Charge-ID denote the correlated uncertainties of the data/MC scale-factors for the electron reconstruction, identification, isolation, trigger and charge-identification efficiencies; The uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}p_{T}^{ll}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Results of the normalized differential cross-section $1/\sigma_\mathrm{fid} \times \mathrm{d}\sigma_\mathrm{fid}/\mathrm{d}\phi_{\eta}^{*}$ measured on bare level for the $Z\rightarrow\mu\mu$ decay channel. The following naming convention is used: Stat.(Data), Stat.(MC) an Eff.(Uncor.), denote the statistical uncertainties due limited data and MC as well as the uncorrelated lepton efficiency uncertainties; Scale and Res. denote the muon momentum scale and resolution uncertainties; Muon Sag. denotes the uncertainty due to the muon sagitta bias; Eff. (Cor.), Isolation, Trigger and TTVA denote the uncertainties of the data/MC scale-factors for the correlated muon reconstruction, isolation, trigger and track-to-vertex matching efficiencies; the uncertainties due to the primary vertex z-distribution and pile-up reweighting are denoted as Z-Pos and Pile-Up, while the model and background uncertainties are summarized under Model and Bkg.. The sign-information is kept to track bin-to-bin changes.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

Measured combined normalized differential cross-section in the fiducial volume at Born level as well as a factor $k_{dressed}$ to translate from the Born particle level to the dressed particle.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton invariant mass $m_{ll}$ , the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton invariant mass $m_{ll}$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of lepton pseudorapidity $\eta$, the latter with one entry for each lepton per event. The MC signal sample is simulated using Powheg+Pythia8. The predictions of the MC signal sample together with the MC background samples are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of dilepton transverse momentum. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the electron channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The distribution of events passing the selection requirements in the muon channel as a function of $\phi_{\eta}^{*}$. The MC signal sample is simulated using Powheg+Pythia8. The predictions are normalized to the integral of the data and the total experimental uncertainty of the predicted values is shown as a grey band in the ratio of the prediction to data.

The measured normalized cross section as a function of $p_{ll}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown. The $p_{ll}$ distribution is split into linear and logarithmic scales at 30 GeV.

The measured normalized cross section as a function of $\phi_{\eta}^{*}$ for the electron and muon channels and the combined result as well as their ratio together with the total uncertainties, shown as a blue band. The pull distribution between the electron and muon channels, defined as the difference between the two channels divided by the combined uncorrelated uncertainty, is also shown.

Comparison of the normalized $p_{ll}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $\phi_{\eta}^{*}$ distributions predicted by different computations: Pythia8 with the AZ tune, Powheg+Pythia8 with the AZNLO tune, Sherpa v2.2.1 and RadISH with the Born level combined measurement. The uncertainties of the measurement are shown as vertical bars and uncertainties of the Sherpa and RadISH predictions are indicated by the coloured bands.

Comparison of the normalized $p_{ll}$ distribution in the range $p_{ll}$ > 10 GeV. The Born level combined measurement is compared with predictions by Sherpa v2.2.1, fixed-order NNLOjet and NNLOjet supplied with NLO electroweak corrections. The uncertainties in the measurement are shown as vertical bars and the uncertainties in the predictions are indicated by the coloured bands.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

The measured combined normalized differential cross-sections, divided by the bin-width, in the fiducial volume at dressed level.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 200-400$ GeV.

Observed $CL_S$ limits on $\sigma \times BR$ for $m_{\Phi} = 600-1000$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

Combined limits from this analysis (ID) and the CR and MS analyses for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for all ID vertices in the signal MC sample.

Comparison of the IDVx reconstruction and selection efficiency for a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV, using only standard tracking versus using standard and large radius tracking for ID vertices passing the full IDVx selection criteria.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with a 125 GeV Higgs boson decaying to LLPs with masses of 8, 25, and 55 GeV. The efficiency for the 55 GeV LLP sample is shown both with and without the material veto applied.

The IDVx selection efficiency as a function of long-lived particle decay $z$ position for MC signal samples with mediators of masses 200, 400, and 600 GeV decaying to LLPs with a mass of 50 GeV. The efficiency for the 200 GeV mediator sample is shown both with and without the material veto applied.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a Higgs with a mass of 125 GeV decaying to an LLP with a mass of 8 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 400 GeV decaying to an LLP with a mass of 50 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

The impact of the IDVx selections on the selection efficiency for the MC signal sample with a $\Phi$ with a mass of 1000 GeV decaying to an LLP with a mass of 150 GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 15$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 40$ GeV.

$CL_S$ limits on $B_{H\rightarrow ss}$ for $m_{H} = 125$ GeV, $m_s = 55$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 8$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 25$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 200$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 400$ GeV, $m_s = 100$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 600$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 50$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 150$ GeV.

$CL_S$ limits on $\sigma \times B_{\Phi\rightarrow ss}$ for $m_{\Phi} = 1000$ GeV, $m_s = 400$ GeV.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Expected 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Expected 95% CL exclusion sensitivity for simplified models of VBF wino-bino production.

Observed 95% CL exclusion sensitivity for simplified models of direct wino-bino production.

Expected 95% CL exclusion sensitivity for simplified models of direct slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH slepton production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH smuon production.

Expected 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct LH selectron production.

Expected 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Observed 95% CL exclusion sensitivity for simplified models of direct RH selectron production.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the C1C1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2N1 higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1p higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-high region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-low region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-med region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Efficiency for the N2C1m higgsino process in the SR-E-1l1T region. Truth dilepton invariant mass is constrained to be within the range [0.5,60] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-high region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-3}$) for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Efficiency for the slepton process in the SR-S-low region. Truth stransverse mass is constrained to be within the range [100,140] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the C1C1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2N1 VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1p VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-high region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF-low region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Acceptance (note the $z$-axis is in units of $10^{-4}$) for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Efficiency for the N2C1m VBF higgsino process in the SR-VBF region. Truth dilepton invariant mass is constrained to be within the range [1,40] GeV.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})>0$.

Observed and Expected upper cross-section limits for wino-bino scenarios, assuming $m(\tilde{\chi}_{2}^{0}) \times m(\tilde{\chi}_{1}^{0})<0$.

Observed and Expected upper cross-section limits for higgsino scenarios.

Observed and Expected upper cross-section limits for higgsino scenarios, assuming VBF production..

Observed and Expected upper cross-section limits for direct slepton scenarios.

Observed and Expected upper cross-section limits for direct LH slepton scenarios.

Observed and Expected upper cross-section limits for direct RH slepton scenarios.

Observed and Expected upper cross-section limits for direct smuon scenarios.

Observed and Expected upper cross-section limits for direct LH smuon scenarios.

Observed and Expected upper cross-section limits for direct RH smuon scenarios.

Observed and Expected upper cross-section limits for direct selectron scenarios.

Observed and Expected upper cross-section limits for direct LH selectron scenarios.

Observed and Expected upper cross-section limits for direct RH selectron scenarios.

Number of signal events in SR-E-1L1T for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-high for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-low for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-E-med for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (155 GeV, 150 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-high for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-S-low for the (m($\tilde{\ell}$),m($\tilde{\chi}_{1}^{0}$)) = (150 GeV, 140 GeV) Slepton signal model at different stages of selection before and after weighting events to correspond to 140/fb.

Number of signal events in SR-VBF for the (m($\tilde{\chi}_{2}^{0}$),m($\tilde{\chi}_{1}^{0}$)) = (100 GeV, 95 GeV) Higgsino signal model at different stages of selection before and after weighting events to correspond to 140/fb.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with combined ${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production.

The observed 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

The expected 95% CL exclusion contours for the combined fit of SR-lowMass and SR-highMass for simplified models with ${\tilde{\tau}}_L {\tilde{\tau}}_L$ only production.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-lowMass.

Observed 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Expected 95% CL exclusion limits for simplified models with direct stau pair production in SR-highMass.

Signal acceptance in SR highMass for combined stau final states

Signal acceptance in SR lowMass for combined stau final states

Signal efficiency in SR highMass for combined stau final states

Signal efficiency in SR lowMass for combined stau final states

Signal acceptance*efficiency in SR highMass for combined stau final states

Signal acceptance*efficiency in SR lowMass for combined stau final states

Cutflow for two reference points (${\tilde{\tau}}^{+}_{R,L} {\tilde{\tau}}^{-}_{R,L}$ production) in SR. The column labelled $N_{weighted}$ shows the results including all correction factors applied to simulation, and is normalised to 139 fb$^{-1}$, while $N_{raw}$ in brackets shows the results for the generated number of events. The quoted uncertainties are statistical only. The "Generator filter" includes the requirements that two $\tau$ in the event have ${p}_{T} > 15$ GeV and $|\eta| <$ 2.6. The "Baseline Cut" includes the requirement of two baseline $\tau$ with a minimum value at 0.01 of the boosted decision tree discriminant (JetBDTSigTransMin $>$ 0.01) and ${p}_{T, \tau_{1}} > 50$ GeV and ${p}_{T, \tau_{2}} > 40$ GeV. At the step "Trigger & offline cuts", the following requirements are applied: the event is recorded using the asymmetric di-$\tau$ trigger (di-$\tau$ $E_{T}^{miss}$ trigger) in SR-lowMass (SR-highMass), and the lepton $p_{T}$ and $E_{T}^{miss}$ are required at plateau.

Observed and expected numbers of events in the control and signal regions where all control and signal region bins are included as constraints in the likelihood. The expected event yields of SM processes are given after the background-only fit. The entries marked as "--" are negligible. The uncertainties correspond to the sum in quadrature of statistical and systematic uncertainties. The correlation of systematic uncertainties among control regions and among background processes is fully taken into account.

The post-fit $m_{T2}$ distribution for SR-lowMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The post-fit $m_{T2}$ distribution for SR-highMass. The stacked histograms show the expected SM backgrounds. The multi-jet contribution is estimated from data using the ABCD method. The contributions of multi-jet and $W$+jets events are scaled with the corresponding normalization factors derived from the background-only fit. The hatched bands represent the sum in quadrature of systematic and statistical uncertainties of the total SM background. For illustration, the distributions from the SUSY reference points are also shown as dashed lines. The last bin includes the overflow events.

The $m_{T2}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $m_{T2}$ post-fit distributions in the multi-jet background validation VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (lowMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The $E_{T}^{miss}$ post-fit distributions in the multi-jet background validation region VR-F (highMass). The stacked histograms show the contribution of each relevant SM process. The multi-jet shape is taken from VR-E in the ABCD method and the normalization is determined by the transfer factor $T$ and rescaled by a correction factor determined by the fit. The hatched bands represent the combined statistical and systematic uncertainties in the sum of the SM backgrounds shown. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The pre-fit $m_{T2}$ distribution in the $WCR$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is estimated from data using the OS--SS method. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines.

The post-fit yields in the $WVR$, $TVRs$, $ZVRs$ and $VVVRs$. The SM backgrounds other than multi-jet production are estimated from MC simulation. The multi-jet contribution is negligible and is estimated from data using the ABCD method, using CRs obtained with the same technique used for the SRs. The hatched bands represent the combined statistical and systematic uncertainties of the total SM background. For illustration, the distributions of the SUSY reference points are also shown as dashed lines. The lower panels show the ratio of data to the SM background estimate.

The measured fiducial cross section vs $m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $\Delta\phi(ll,\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.

The measured fiducial cross section vs $p_{\mathrm{T}}^{\ell\ell\gamma}/m(\ell\ell\gamma)$. The central values are provided along with the statistical and systematic uncertainties together with the sign information. The statistical and "Uncor" uncertainty should be treated as uncorrelated bin-to-bin, while the rest are correlated between bins, and they are written as signed NP variations. The parton-to-particle correction factor $C_{theory}$ is the ratio of the cross-section predicted by Sherpa LO samples at particle level within the fiducial phase-space region defined in Table 4 to the predicted cross-section at parton level within the same fiducial region but with the smooth-cone isolation prescription defined above replacing the particle-level photon isolation criterion, and with Born-level leptons in place of dressed leptons. This correction should be applied on fixed order parton-level calculations. The systematic uncertainty is evaluated from a comparison with the correction factor obtained using events generated with Sherpa 2.2.2 at NLO. The uncertainty is defined as Max(stat error, systematic difference between Sherpa LO and Sherpa 2.2.2 NLO), and cannot be considered correlated bin-to-bin. In the case that the calculations are valid for dressed leptons, a modified correction factor excluding the Born-to-dressed lepton correction should be applied instead. This correction only takes into account the particle-level isolation criteria, and is provided separately here. The Sherpa 2.2.8 NLO cross-sections given below include a small contribution from EW $Z\gamma jj$ production.