Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Distribution of $m_{\mathrm{jjj}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of $m_{\mathrm{j}}$ for preselected events with $\mathrm{N}_{j}$ = 3

Distribution of the deep-WH value of the highest-mass jet with 60 < $m_{\mathrm{j}}$ < 100 GeV for preselected events with $\mathrm{N}_{j}$ = 3

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (LL) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for W, $t^{2}$, and q/g matched jets in the low-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (LH) bin, as functions of the deep-W discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and low-$p_{\mathrm{T}}$ (HL) bin, as functions of the deep-WH discriminant value.

scale factors (SFs) for $t^{2}$, $t^{3,4}$, and q/g matched jets in the high-$m_{\mathrm{j}}$ and high-$p_{\mathrm{T}}$ (HH) bin, as functions of the deep-WH discriminant value.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LL samples.

The deep-W discriminant of the jet with highest mass in the single-lepton sideband for LH samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HL samples.

The deep-WH discriminant of the jet with highest mass in the single-lepton sideband for HH samples.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR1, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR2, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-WH discriminant value for the highest-mass jet in CR3, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR45, after the scale factors have been applied.

Comparison of the distribution of data and simulated backgrounds, as a function of the deep-W discriminant value for the highest-mass jet in CR6, after the scale factors have been applied.

The $m_{\mathrm{j}^{\mathrm{max}}}$ distributions for different jet types for SR1–3 events of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV$ without deep-W (WH) constraints.

The deep-W distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The deep-WH distribution normalized to unity for the shown components of of the signal with $m_{\mathrm{W}_{\mathrm{KK}}}$ = 2.5 TeV, $m_{\mathrm{R}}$ = 0.2 TeV. The $t^{3,4}$ jets from the preselected sample, normalized to unity, are superimposed to compare shapes with the $R^{3q}$ and $R^{4q}$ distributions.

The $m_{\mathrm{jj}}$ distribution for CR1 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR2 for data and simulation.

The $m_{\mathrm{jj}}$ distribution for CR3 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR45 for data and simulation.

The $m_{\mathrm{jjj}}$ distribution for CR6 for data and simulation.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jj}}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR4.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed triboson system ($m_{\mathrm{jjj}}$) in data and simulation for SR6.

Observed upper limits at $95\%$ CL on the signal cross section $\times$ branching fraction as functions of the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ resonance masses.

Expected median lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane.

The signal cross-sections values of the signal QBH RS1 with n=1 extra dimensions, as a function of threshold mass

The product of acceptance and selection efficiency for QBH ADD model, as a function of threshold mass of the signal.

The product of acceptance and selection efficiency for QBH RS1 models, as a function of threshold mass of the signal.

The product of acceptance and selection efficiency for q* signal, as a function of resonance mass

The product of acceptance and selection efficiency for b* signal, as a function of resonance mass of the signal.

Distributions of the γ+jet invariant mass generated from various signal samples for reconstructed mass 4 TeV

Fitting distribution of data with expected q*, and QBH signal events, and fit parameters p0= 3.05674e+00, p1 = 10.5343, p3 = 4.15163 and p4 = 0.107405

Fitting distribution of data with expected b* events, and fit parameters p0= 1.45055e+03, p1 = 2.04830e+01, p3 = -4.16760e-01 and p4 = -5.07768e-01

Fitting distribution of data with expected b* events for 0btag category, and fit parameters p0= 2.44120e+00, p1 = 1.08886e+01, p3 = 4.23198e+00 and p4 = 1.16300e-01

Exclusion limits on the product of cross section and branching fraction for q* signal coupling f = 1.0, as a function of the resonance mass hypothesis.

Theoretical cross-section of q* signal for coupling multiplier f =1.0

Exclusion limits on the product of cross section and branching fraction for the q* signal coupling f = 0.5, as a function of the resonance mass hypothesis.

Theoretical cross-section of q* signal for coupling multiplier f =0.5

Exclusion limits on the product of cross section and branching fraction for q* coupling f = 0.1, as a function of the resonance mass hypothesis.

Theoretical cross-section of q* signal for coupling multiplier f =0.1

Exclusion limits on the product of cross section and branching fraction for b* signal coupling f = 1.0, as a function of the resonance mass hypothesis.

Theoretical cross-section of b* signal for coupling multiplier f =1.0

Exclusion limits on the product of cross section and branching fraction for b* signal coupling f = 0.5, as a function of the resonance mass hypothesis.

Theoretical cross-section of b* signal for coupling multiplier f =0.5

Exclusion limits on the product of cross section and branching fraction for b* signal coupling f = 0.1, as a function of the resonance mass hypothesis.

Theoretical cross-section of b* signal for coupling multiplier f =0.1

Exclusion limits on the product of cross section and branching fraction for QBH ADD signal, as a function of the mass hypothesis.

Theoretical cross-section of ADD signal

Exclusion limits on the product of cross section and branching fraction for QBH RS1 signal, as a function of the mass hypothesis.

Theoretical cross-section of RS1 signal

The expected and observed exclusion mass limits for q* and b* signals, as a function coupling multiplier

The observed exclusion mass limits for b* signal, as a function of threshold mass of the signal.

Comparisons of the data and the expected background distributions of the WZ invariant mass in the ANN-based VBF signal region. The background predictions are obtained through a background-only simultaneous fit to the VBF signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width

Comparisons of the observed data and the expected background distributions of the WZ invariant mass using the cut-based VBF selection. The background predictions are obtained through a background-only simultaneous fit to the VBF cut-based signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width.

Comparisons of the observed data and the expected background distributions of the WZ invariant mass using the cut-based VBF selection. The background predictions are obtained through a background-only simultaneous fit to the VBF cut-based signal region and the WZ-QCD and ZZ VBF control regions. The yields are normalized to the bin width.

Drell-Yan signal region selection cutflow for a simulated W' in the HVT model A with m_W' = 1 TeV. The unweighted number of events is shown.

Drell-Yan signal region selection cutflow for a simulated W' in the HVT model A with m_W' = 1 TeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated W' in the HVT model C with m_W' = 500 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated W' in the HVT model C with m_W' = 500 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated H5+ in the GM model with m_H5+ = 450 GeV. The unweighted number of events is shown.

VBF signal region selection cutflow for a simulated H5+ in the GM model with m_H5+ = 450 GeV. The unweighted number of events is shown.

The acceptancetimes efficiencyof the HVT W' in the Drell-Yan signal region for different mass points and for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof the HVT W' in the Drell-Yan signal region for different mass points and for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the ANN-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF H5+ selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

The acceptancetimes efficiencyof VBF HVT W' selection after the cut-based VBF selection at different mass points for the individual channels and the sum of all channels. The uncertainty includes both statistical and experimental systematic components.

Observed and expected 95% CL exclusion upper limits on sigma * B(W' -> WZ) for the Drell-Yan production of a W' boson in the HVT model as a function of its mass. The LO theory predictions for HVT Model A with g_V=1 and Model B with g_V=$ are also shown.

Observed and expected 95% CL exclusion upper limits on sigma * B(W' -> WZ) for the Drell-Yan production of a W' boson in the HVT model as a function of its mass. The LO theory predictions for HVT Model A with g_V=1 and Model B with g_V=3 are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the ANN VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) for the VBF production of a W' boson in the HVT with parameter c_F=0, as a function of its mass. The LO theory predictions for HVT VBF model with different values of the coupling parameters g_V and c_H are also shown.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sigma * B(W' -> WZ) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Using the cut-based VBF selection, observed and expected 95% CL upper limits on sin(thetaH) of the GM model as a function of m_H_5.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the hadhad category. The efficiencies are calculated with respect to HH to bbtautau decays in which both tau-leptons decay hadronically. The ‘Pre-selection’ consists of basic requirements, including that at least two tau-had-vis pass loose kinematic requirements, at least one of the tau-had-vis candidate passes identification requirement, and that events do not contain an electron or muon. The ‘Object selections’ require exactly two tau-had-vis candidates, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Loose tau ID’ requires that both tau-had-vis candidates pass identification requirements. The ‘DTT offline jet cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the lephad SLT category. The efficiencies are calculated with respect to HH to bbtautau decays in which one tau-lepton decays hadronically and one decays leptonically. The ‘Pre-selection’ consists of basic requirements, including that at least one tau-had-vis candidate and one lepton pass loose kinematic requirements. The ‘Object selections’ require exactly one tau-had-vis candidate, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Trigger specific offline pT cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the lephad LTT category. The efficiencies are calculated with respect to HH to bbtautau decays in which one tau-lepton decays hadronically and one decays leptonically. The ‘Pre-selection’ consists of basic requirements, including that at least one tau-had-vis candidate and one lepton pass loose kinematic requirements. The ‘Object selections’ require exactly one tau-had-vis candidate, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Trigger specific offline pT cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Post-fit expected number of signal and background events and observed number of data events after applying the selection criteria and requiring exactly 2 b-tagged jets and assuming a background-only hypothesis.

Observed and expected limits at 95% CL on the cross-section of HH production, for the non-resonant ggF+VBF HH search, and the resonant HH search for four values of the resonance mass mX.

Acceptance times efficiency for the full analysis selections as a function of the resonance mass mX in the hadhad, lephad SLT and lephad LTT trigger categories, and the combined lephad. The acceptance times efficiency is evaluated for HH to bbtautau decays, with respect to the targeted tau-lepton decay modes (lephad or hadhad).

Post-fit distribution of mHH in the hadhad channel.

Post-fit distribution of mHH in the lephad SLT channel.

Post-fit distribution of mHH in the lephad LTT channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of of di-b-jet mass in the hadhad channel.

Post-fit distribution of di-b-jet mass in the LTT lephad channel.

Post-fit distribution of di-b-jet mass in the LTT lephad channel.

BDT for SM HH in the hadhad channel

NN for SM HH in the lephad SLT channel

NN for SM HH in the lephad LTT channel

PNN for mX = 500 GeV resonant HH in the hadhad channel

PNN for mX = 500 GeV resonant HH in the lephad SLT channel

PNN for mX = 500 GeV resonant HH in the lephad LTT channel

PNN for mX = 1000 GeV resonant HH in the hadhad channel

PNN for mX = 1000 GeV resonant HH in the lephad SLT channel

PNN for mX = 1000 GeV resonant HH in the lephad LTT channel

Event yields as a function of log10(S/B) for data, background and non-resonant HH signal. Final discriminant bins from the hadhad, lephad SLT and lephad LTT categories are combined into bins of log10(S/B). The B is the fitted background yield assuming background-only hypothesis, and the signal S is scaled to the SM expected cross-section.

Observed and expected limits at 95% CL on the cross-section of the resonant HH production as a function of the scalar resonance mass mX.

Post-fit distribution of delta-R between the taus in the hadhad channel.

Post-fit distribution of delta-R between the b-tagged jets in the hadhad channel.

Post-fit distribution of delta-R between the taus in the lephad SLT channel.

Post-fit distribution of delta-R between the b-tagged jets in the lephad SLT channel.

Post-fit distribution of delta-pT between the tau and lepton in the lephad SLT channel.

Post-fit distribution of pT of the subleading b-tagged jet in the lephad SLT channel.

Post-fit distribution of MTW in the lephad SLT channel.

Post-fit distribution of missing transverse momentum in the lephad SLT channel.

Post-fit distribution of missing transverse momentum centrality in the lephad SLT channel.

Post-fit distribution of delta-phi between the Higgs boson candidates in the lephad SLT channel.

Post-fit distribution of delta-pT between the tau and lepton in the lephad LTT channel.

Post-fit distribution of delta-R between the taus in the lephad LTT channel.

Post-fit distribution of delta-phi between the lepton and the missing transverse momentum in the lephad LTT channel.

Post-fit distribution of delta-phi between the Higgs boson candidates in the lephad LTT channel.

Post-fit distribution of the total transverse momentum s in the lephad LTT channel.

PNN for mX = 300 GeV resonant HH in the hadhad channel

PNN for mX = 300 GeV resonant HH in the lephad SLT channel

PNN for mX = 300 GeV resonant HH in the lephad LTT channel

PNN for mX = 1600 GeV resonant HH in the hadhad channel

PNN for mX = 1600 GeV resonant HH in the lephad SLT channel

PNN for mX = 1600 GeV resonant HH in the lephad LTT channel

Local p-value of the background-only hypothesis as a function of the resonance mass.

Product of acceptance and efficiency for dimuon pairs as a function of generated mass in simulated events. The DY samples are used to represent spin-1 particles, and RS graviton samples are used for spin-2 particles.

The invariant mass spectra of dielectron events. The points with error bars represent the observed yield. The histogram represents the expectations from the SM processes. The bins have equal width in logarithmic scale so that the width in GeV becomes larger with increasing mass.

The invariant mass spectra of dielectron events. The points with error bars represent the observed yield. The histogram represents the expectations from the SM processes. The bins have equal width in logarithmic scale so that the width in GeV becomes larger with increasing mass.

The invariant mass spectra of dimuon events. The points with error bars represent the observed yield. The histogram represents the expectations from the SM processes. The bins have equal width in logarithmic scale so that the width in GeV becomes larger with increasing mass.

The invariant mass spectra of dimuon events. The points with error bars represent the observed yield. The histogram represents the expectations from the SM processes. The bins have equal width in logarithmic scale so that the width in GeV becomes larger with increasing mass.

The invariant mass distribution of pairs of electrons observed in data and expected from simulated SM processes for $\cos\theta^* < 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of electrons observed in data and expected from simulated SM processes for $\cos\theta^* < 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of electrons observed in data and expected from simulated SM processes for $\cos\theta^* /geq 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of electrons observed in data and expected from simulated SM processes for $\cos\theta^* /geq 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of muons observed in data and expected from simulated SM processes for $\cos\theta^* < 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of muons observed in data and expected from simulated SM processes for $\cos\theta^* < 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of muons observed in data and expected from simulated SM processes for $\cos\theta^* /geq 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

The invariant mass distribution of pairs of muons observed in data and expected from simulated SM processes for $\cos\theta^* /geq 0$. The bin width gradually increases with mass. The quoted uncertainty represents the combined statistical and systematic uncertainties on the background. The signal contribution expected from the constructive LL CI model with $\Lambda = 16$ TeV is shown as a dashed green line.

Observed and expected background yields for different mass ranges in the dielectron channel. The sum of all background contributions is shown as well as a breakdown into the three main categories. The quoted uncertainty includes both the statistical and the systematic components.

Observed and expected background yields for different mass ranges in the dielectron channel. The sum of all background contributions is shown as well as a breakdown into the three main categories. The quoted uncertainty includes both the statistical and the systematic components.

Observed and expected background yields for different mass ranges in the dimuon channel. The sum of all background contributions is shown as well as a breakdown into the three main categories. The quoted uncertainty includes both the statistical and the systematic components.

Observed and expected background yields for different mass ranges in the dimuon channel. The sum of all background contributions is shown as well as a breakdown into the three main categories. The quoted uncertainty includes both the statistical and the systematic components.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits together with the 68 and 95% quantiles at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits together with the 68 and 95% quantiles at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance, for widths equal to 0.6, 3, 5, and 10% of the resonance mass, relative to the product of production cross section and branching fraction for a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance, for widths equal to 0.6, 3, 5, and 10% of the resonance mass, relative to the product of production cross section and branching fraction for a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance, for widths equal to 0.6, 3, 5, and 10% of the resonance mass, relative to the product of production cross section and branching fraction for a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits at 95% CL on the product of production cross section and branching fraction for a spin-1 resonance, for widths equal to 0.6, 3, 5, and 10% of the resonance mass, relative to the product of production cross section and branching fraction for a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the GSM model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the GSM model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the LR model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the LR model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the E6 model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

Limits in the ( $c_{d}$ , $c_{u}$ ) plane obtained by recasting the combined limit at 95% CL on the $Z'$ boson cross section from dielectron and dimuon channels. The closed contour representing the E6 model class is composed of thick line segments. Each point on a segment corresponds to a particular model, and the location of the point gives the mass limit on the relevant $Z'$ boson. As indicated in the bottom left legend, the segment line styles correspond to ranges of the particular mixing angle for each considered model. The bottom right legend indicates the constituents of each model class.

The observed local p-value for the dielectron channel as a function of the dilepton invariant mass.

The observed local p-value for the dielectron channel as a function of the dilepton invariant mass.

The observed local p-value for the dimuon channel as a function of the dilepton invariant mass.

The observed local p-value for the dimuon channel as a function of the dilepton invariant mass.

The observed local p-value for the combined channel as a function of the dilepton invariant mass.

The observed local p-value for the combined channel as a function of the dilepton invariant mass.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-2 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The observed upper limits at 95% CL on the product of production cross section and branching fraction for a spin-2 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits together with the 68 and 95% quantiles at 95% CL on the product of production cross section and branching fraction for a spin-2 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

The expected upper limits together with the 68 and 95% quantiles at 95% CL on the product of production cross section and branching fraction for a spin-2 resonance with a width equal to 0.6% of the resonance mass, relative to the product of production cross section and branching fraction of a Z boson, multiplied by the theoretical value of the cross section for $\sigma(pp \to \mathrm{Z}+X \to\ell\ell+X)$ of 1928 pb.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a vector mediator. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a vector mediator. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a vector mediator. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a vector mediator. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a axial vector. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a axial vector. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a axial vector. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Limits at 95% confidence level for the masses of the DM particle, which is assumed to be Dirac fermion, and its associated mediator, in a simplified model of DM production via a axial vector. The parameter exclusion is obtained by comparing the limits on product of the production cross section and the branching fraction for decay to a Z boson, with the values obtained from calculations in the simplified model. For each combination of the DM particle and mediator mass values, the width of the mediator is taken into account in the limit calculation. The lines with the hatching represents the excluded regions. The solid grey lines, marked as “Ωh 2 ≥ 0.12”, correspond to parameter regions that reproduce the observed DM relic density in the universe, with the hatched area indicating the region where the DM relic abundance exceeds the observed value.

Exclusion limits at 95% CL on the ultraviolet cutoff for the dielectron channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the ultraviolet cutoff for the dielectron channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the ultraviolet cutoff for the dimuon channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the ultraviolet cutoff for the dimuon channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the ultraviolet cutoff for the combination of the dielectron and dimuon channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Exclusion limits at 95% CL on the ultraviolet cutoff for the combination of the dielectron and dimuon channel, with $m_{\ell\ell}>1.8$ TeV ($m_{\ell\ell}>1.9$ TeV for 2016) in the GRW, Hewett, and HLZ conventions for the ADD model. Signal model cross sections are calculated up to LO, and an NNLO correction factor of 1.3 is applied.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the dielectron channel. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the dielectron channel. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the dimuon channel. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the dimuon channel. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the combination of the dielectron and dimuon channels. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Dilepton lower exclusion limits at 95% CL on the CI scale ($\Lambda$) for the eight CI models considered, for the combination of the dielectron and dimuon channels. The limits are obtained for $m_{\ell\ell}>400$ GeV.

Ratio of the differential dilepton production cross section in the dimuon and dielectron channels $R_{\mu^{+}\mu^{-}/e^{+}e^{-}}$, as a function of $m_{\ell\ell}$ for events with central leptons. The ratio is obtained after correcting the reconstructed mass spectra to particle level.

Ratio of the differential dilepton production cross section in the dimuon and dielectron channels $R_{\mu^{+}\mu^{-}/e^{+}e^{-}}$, as a function of $m_{\ell\ell}$ for events with central leptons. The ratio is obtained after correcting the reconstructed mass spectra to particle level.

Ratio of the differential dilepton production cross section in the dimuon and dielectron channels $R_{\mu^{+}\mu^{-}/e^{+}e^{-}}$, as a function of $m_{\ell\ell}$ for events with forward leptons. The ratio is obtained after correcting the reconstructed mass spectra to particle level.

Ratio of the differential dilepton production cross section in the dimuon and dielectron channels $R_{\mu^{+}\mu^{-}/e^{+}e^{-}}$, as a function of $m_{\ell\ell}$ for events with forward leptons. The ratio is obtained after correcting the reconstructed mass spectra to particle level.

Invariant mass resolution for dielectron pairs as obtained from simulated DY samples as a function of generated mass.

Invariant mass resolution for dielectron pairs as obtained from simulated DY samples as a function of generated mass.

Invariant mass resolution for dimuon pairs as obtained from simulated DY samples as a function of generated mass.

Invariant mass resolution for dimuon pairs as obtained from simulated DY samples as a function of generated mass.

Observed data and total background estimate in all bins used in the limit calculation for the CI limits. The total event sample is split into the three years of data taking, the two lepton flavors, two categories in $\cos\theta^*$, and two categories in lepton pseudorapidity. Furthermore, each of these categories is split into 6 bins in dilepton invariant mass: [400,500,700,1100,1900,3500,10000] in GeV. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Observed data and total background estimate in all bins used in the limit calculation for the CI limits. The total event sample is split into the three years of data taking, the two lepton flavors, two categories in $\cos\theta^*$, and two categories in lepton pseudorapidity. Furthermore, each of these categories is split into 6 bins in dilepton invariant mass: [400,500,700,1100,1900,3500,10000] in GeV. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Observed data and total background estimate in all bins used in the limit calculation for the ADD limits. The total event sample is split into the three years of data taking, the two lepton flavors, two categories in $\cos\theta^*$, and two categories in lepton pseudorapidity. Furthermore, each of these categories is split into 5 bins in dilepton invariant mass: [1800,2200,2600,3000,3400,10000] ([1900,2200,2600,3000,3400,10000] for 2016) in GeV. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Observed data and total background estimate in all bins used in the limit calculation for the ADD limits. The total event sample is split into the three years of data taking, the two lepton flavors, two categories in $\cos\theta^*$, and two categories in lepton pseudorapidity. Furthermore, each of these categories is split into 5 bins in dilepton invariant mass: [1800,2200,2600,3000,3400,10000] ([1900,2200,2600,3000,3400,10000] for 2016) in GeV. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Bin-by-bin correlation for the limit calculation for the CI limits. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Bin-by-bin correlation for the limit calculation for the CI limits. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Bin-by-bin correlation for the limit calculation for the ADD limits. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

Bin-by-bin correlation for the limit calculation for the ADD limits. The bin names indicate the $\cos\theta^*$ bin (cspos for positive values and csneg for negative values), the lepton flavor (dielectron or dimuon), the year of data taking (2016, 2017, 2018) with associated integrated luminosities of 35.9, 41.5, and 59.4 $\mathrm{fb}^{-1}$ (36.3, 42.1, 61.3 $\mathrm{fb}^{-1}$ in the dimuon channel), respectively. The lepton $|\eta|$ categories are labelled as BB (both leptons with $|\eta| < 1.442$ for electrons and $|\eta| < 1.2$ for muons) and BE (One electron with $|\eta| < 1.442$ and one with $|\eta| > 1.562$ or for muons at least one with $|\eta| > 1.2$). The mass bins are numbered in ascending order.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.17$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.19$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.21$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.23$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.25$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.27$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.29$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.31$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.33$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for resonant production of paired dijet resonances decaying to a quark-gluon pair, with $M(X)/M(Y) = 0.42$. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to predictions for a scalar diquark with couplings to pairs of up quarks, $y_{uu}$ = 0.4, and to pairs of vector-like quarks, $y_{χ}$ = 0.6.

The observed 95% CL upper limits on the product of the cross section, branching fraction, and acceptance for the non-resonant production of top squark pairs in the RPV SUSY decay scenario. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to the top squark model cross section.

Observed differential four-jet mass spectrum for 0.22 < $\\a$ < 0.24. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for 0.24 < $\\a$ < 0.26. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for 0.26 < $\\a$ < 0.28. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential four-jet mass spectrum for all $\\a$ bins together. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Observed differential average dijet mass spectrum within three $\\a$ bins of the non-resonant search. The cross-section is calculated by dividing the event yield by the bin width and luminosity.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-0 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Corrected $m(HH)$ distribution in the resolved $4b$ signal region (dots), after the fit under the background-only hypothesis. The error bars on the $4b$ points represent the Poisson uncertainties corresponding to their event yields. The background model (teal histogram) is shown with its total post-fit uncertainty (gray band). The final bin includes overflow. Representative spin-2 signal hypotheses (dashed, dotted, and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. The bottom panel shows the difference between the $4b$ distribution and the background model, relative to the background model. No significant excess of data relative to the SM background is observed.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-0.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The steps up to the $b$-tag categorization are shown for the spin-2.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-0 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Cumulative signal acceptance times efficiency as a function of the resonance mass for various selection steps in the boosted channel. The efficiencies of the three b-tag categories are shown for the spin-2 scenario; this efficiency is obtained after the other selection steps including the SR definition. The signal efficiency in the 4b region has a maximum around 1.5 TeV. Above that value the track-jets start to merge together, and for the highest resonance masses the 2b category becomes the most efficient.

Comparison of the background model (stacked histograms) with data (dots) in the $2b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $3b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

Comparison of the background model (stacked histograms) with data (dots) in the $4b$ validation region. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background uncertainty (gray band) is computed by adding all individual components in quadrature and is not allowed to extend below zero.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $2b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $3b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-0 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

The $m(HH)$ distributions in the boosted $4b$ signal regions (dots), after the fit under the background-only hypothesis. The error bars on the data points represent the Poisson uncertainties corresponding to their event yields. The background model (stacked histogram) is shown with its total post-fit uncertainty (gray band). The uncertainty bands are defined using an ensemble of curves constructed by sampling a multivariate Gaussian probability density function built from the covariance matrix of the fit. Representative spin-2 signal hypotheses (dashed and dashed-dotted lines) are overlaid, normalized to the overall expected limits on their cross-sections. No significant excess of data relative to the SM background is observed.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-0 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

Expected (dashed black lines) and observed (solid black lines) 95% CL upper limits on the cross-section of resonant $HH$ production in the spin-2 signal models. The $\pm 1 \sigma$ and $\pm 2 \sigma$ uncertainty ranges for the expected limits (colored bands) are shown. Expected limits using each of the resolved and boosted channels individually (dashed colored lines) are shown. The theoretical prediction for the bulk RS model with $k/\bar{M}_{\text{Pl}} = 1$ (solid red line) is shown; the decrease below 350 GeV is due to a sharp reduction in the $G^{*}_{\text{KK}} \rightarrow HH$ branching ratio. The nominal $H\rightarrow b\bar{b}$ branching ratio is taken as 0.582.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the characteristic variable $\Delta\phi_{\text{min}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $m_{\text{SD}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $D_{p_{\text{T}}}$ for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The normalized BDT discriminator distribution for the two highest $p_{\text{T}}$ jets from the simulated SM backgrounds and several signal models.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The BDT ROC curves for the two highest $p_{\text{T}}$ jets, comparing the simulated SM backgrounds with one signal model with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{3}(x) = \exp(p_{1}x)x^{p_{2}(1+p_{3}\ln(x))}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-$R_{\text{T}}$ signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the high-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The $m_{\text{T}}$ distribution for the low-SVJ2 signal region, comparing the observed data to the background prediction from the analytic fit ($g_{2}(x) = \exp(p_{1}x)x^{p_{2}}$, $x = m_{\text{T}}/\sqrt{s}$). The distributions from several example signal models, with cross sections corresponding to the observed limits, are superimposed.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL observed upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The observed exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 68% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The lower 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The upper 95% expected exclusion for the nominal $\text{Z}^{\prime}$ cross section.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the inclusive search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The 95% CL upper limits on the product of the cross section and branching fraction from the BDT-based search for the $\alpha_{\text{dark}}$ variations.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

The three two-dimensional signal model parameter scans.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

Metrics representing the performance of the BDT for the benchmark signal model ($m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$), compared to each of the major SM background processes.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The range of effects on the signal yield for each systematic uncertainty and the total. Values less than 0.01% are rounded to 0.0%.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $m_{\text{T}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $\Delta\eta(\text{J}_{1},\text{J}_{2})$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $p_{\text{T}}^{\text{miss}}$ for the simulated SM backgrounds and several signal models. The $R_{\text{T}}$ requirement is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\text{e}}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of the variable $N_{\mu}$ for the simulated SM backgrounds and several signal models. The requirement on this variable is omitted, but all other preselection requirements are applied. The last bin of each histogram includes the overflow events.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $\Delta\eta(\text{J}_{1},\text{J}_{2})$ vs. $R_{\text{T}}$ for the simulated QCD background. The preselection requirements on both variables are omitted, but all other preselection requirements are applied.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $p_{\text{T}}^{\text{miss}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distribution of $R_{\text{T}}$ vs. $m_{\text{T}}$ for the simulated QCD background. All selection requirements are omitted, except for the requirement of two high-$p_{\text{T}}$ wide jets.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{21}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\tau_{32}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{2}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $N_{3}^{(1)}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{dark}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $g_{\text{jet}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{major}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\sigma_{\text{minor}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $\Delta\phi(\vec{J},\vec{p}_{\text{T}}^{\text{miss}})$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $r_{\text{inv}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{\pm}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{e}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\mu}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\text{h}^{0}}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The normalized distributions of the BDT input variable $f_{\gamma}$ for the two highest $p_{\text{T}}$ wide jets from the simulated SM backgrounds and several signal models with varying $m_{\text{Z}^{\prime}}$ values. Each sample's jet $p_{\text{T}}$ distribution is weighted to match a reference distribution (see text). The last bin of each histogram includes the overflow events.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-$R_{\text{T}}$ signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the high-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark hadron mass.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the invisible fraction.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

The product of signal acceptance and efficiency in the low-SVJ2 signal region, for variations of the mediator mass and the dark coupling strength.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

Comparison of different the dijet mass $m_{\text{J}\text{J}}$, the transverse mass $m_{\text{T}}$, and the Monte Carlo (MC) mass $m_{\text{MC}}$ for a signal model with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. No selection is applied, except that there must be at least two jets. $m_{\text{MC}}$ is computed by adding the generator-level four-vectors for invisible particles to the dijet system, to represent the achievable resolution if the invisible component were fully measured. The last bin of each histogram includes the overflow events.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $m_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $r_{\text{inv}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the high-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

$m_{\text{T}}$ distributions for signal models with different $\alpha_{\text{dark}}$ values for the low-$R_{\text{T}}$ inclusive signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the low-$R_{\text{T}}$ signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the high-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The proportions of each SM background process in the low-SVJ2 signal region.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the inclusive search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the dark hadron mass.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

The 95% CL expected upper limits on the product of the cross section and branching fraction from the BDT-based search for variations of the mediator mass and the invisible fraction.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for the major background processes. Statistical uncertainties, at most 1.8%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.5%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, varying $m_{\text{dark}}$ values, $r_{\text{inv}} = 0.3$, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 2.6%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 1.2%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, varying $r_{\text{inv}}$ values, and $\alpha_{\text{dark}} = \alpha_{\text{dark}}^{\text{peak}}$. Statistical uncertainties, at most 0.9%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 2.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 3.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.

Relative efficiencies in % for each step of the event selection process for signals with $m_{\text{Z}^{\prime}} = 4.1\,\text{TeV}$, $m_{\text{dark}} = 20\,\text{GeV}$, $r_{\text{inv}} = 0.3$, and varying $\alpha_{\text{dark}}$ values. Statistical uncertainties, at most 0.4%, are omitted. The line "Efficiency [%]" is the absolute efficiency after the final selection. The subsequent lines show the efficiency for each signal region, relative to the final selection.