Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}<$ 35 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 80 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 35 $<N_{offline}^{trk}<$ 90 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 80 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and 90 $<N_{offline}^{trk}<$ 105 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 0.1 $<p_{T}<$ 1.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 1.0 $<p_{T}<$ 2.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 2.0 $<p_{T}<$ 3.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 105 bins for pp data at $\sqrt =$ 13 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Correlated yield obtained with the ZYAM procedure as a function of $|\Delta\Phi|$, averaged over 2 $<|\Delta\eta|<$ 4 in for 3.0 $<p_{T}<$ 4.0 $GeV/c$ and $N_{offline}^{trk}>$ 110 bins for pp data at $\sqrt =$ 7 $TeV$. The $p_{T}$ selection applies to both particles in the pair. Only statistical uncertainties are given. The subtracted ZYAM constant is given ($C_{ZYAM}$).

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 105. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $p_{T}$ for events with $N^{offline}_{trk} \geq$ 110. The $p_{T}$ value for each $p_{T}$ bin is the average $p_{T}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 and integrated over the region $|\Delta\Phi| < \Delta\Phi_{ZYAM}$ for pp data at $\sqrt{s} =$ 13 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 for pp data at $\sqrt{s} =$ 7 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 pPb data at $\sqrt{s} =$ 5.02 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Associated yield for the near side of the correlation function averaged over 2 $<|\Delta\eta|<$ 4 PbPb data at $\sqrt{s} =$ 2.76 $TeV$. The associated yield as a function of $N_{trk}^{offline}$ for events with 1.0 $< p_{T} <$ 2.0 GeV/c. The $N_{trk}^{offline}$ value for each $N_{trk}^{offline}$ bin is the average $N_{trk}^{offline}$ value.

Inclusive cross-section for $W^+$ and $W^-$ boson production in bins of muon pseudorapidity. The uncertainties are statistical, systematic, beam and luminosity.

Ratio of $W^+$ to $W^-$ cross-section in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Lepton charge asymmetry in bins of muon pseudorapidity. The uncertainties are statistical, systematic and beam.

Correlation coefficients of differential cross-section measurements as a function of $y_{Z}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of transverse momentum. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of $\phi^{*}$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients of differential cross-section measurements as a function of lepton $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Correlation coefficients between differential cross-section measurements as a function $y_{Z}$ and $W^{\pm}$ boson muon $\eta$. The beam energy and luminosity uncertainties, which are fully correlated between cross-section measurements, are excluded.

Upper limits at 95% CL on the gluon-gluon fusion cross section for a heavy Higgs boson as a function of its mass and its width relative to a SM-like Higgs boson.

Upper limits at 95% CL on the VBF cross section for a heavy Higgs boson as a function of its mass and its width relative to a SM-like Higgs boson.

Measured differential cross section dsigma/dET in pb/GeV given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dET in pb/GeV given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T < 10 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

Measured differential cross section dsigma/dDR in pb/radians given q_T > 50 GeV. For the data values, the first uncertainty is statistical and the second is systematic. For the theory values, the uncertainty combines statistical, PDF, and renormalization/factorization scale components.

CORRECTED NORMALIZED DISTRIBUTION OF FOUR-JET MASS IN THE INCLUSIVE FOUR-JET SAMPLE. THE PROVIDED UNCERTAINTY CORRESPONDS TO SYSTEMATIC UNCERTAINTY.

CORRECTED NORMALIZED DISTRIBUTION OF FOUR-JET MASS IN THE INCLUSIVE FOUR-JET SAMPLE. THE PROVIDED UNCERTAINTY CORRESPONDS TO SYSTEMATIC UNCERTAINTY.

CORRECTED NORMALIZED DISTRIBUTION OF THE BENGTSSON-ZERWAS ANGLE IN THE INCLUSIVE FOUR-JET SAMPLE. THE PROVIDED UNCERTAINTY CORRESPONDS TO SYSTEMATIC UNCERTAINTY.

CORRECTED NORMALIZED DISTRIBUTION OF THE COSINE OF THE NACHTMANN-REITER ANGLE IN THE INCLUSIVE FOUR-JET SAMPLE. THE PROVIDED UNCERTAINTY CORRESPONDS TO SYSTEMATIC UNCERTAINTY.

CORRECTED NORMALIZED DISTRIBUTION OF SCALED ENERGY OF THE LEADING-JET IN THE INCLUSIVE THREE-JET SAMPLE.

CORRECTED NORMALIZED DISTRIBUTION OF SCALED ENERGY OF THE SECOND-LEADING-JET IN THE INCLUSIVE THREE-JET SAMPLE.

CORRECTED NORMALIZED DISTRIBUTION OF FOUR-JET MASS IN THE INCLUSIVE FOUR-JET SAMPLE.

CORRECTED NORMALIZED DISTRIBUTION OF THE BENGTSSON-ZERWAS ANGLE IN THE INCLUSIVE FOUR-JET SAMPLE.

CORRECTED NORMALIZED DISTRIBUTION OF THE COSINE OF THE NACHTMANN-REITER ANGLE IN THE INCLUSIVE FOUR-JET SAMPLE.

psi(2S) double-differential cross section times branching fraction and the corresponding scaling factors to obtain the cross sections for different polarization scenarios (azimuthal polarization parameter in the center of mass helicity frame lambda_theta^HX = +1, -1, +0.03) as a function of pT for |y| < 1.2.

Ratio of psi(2S) to J/psi differential cross section times branching fractions assuming unpolarized productions as a function of pT for |y| < 1.2.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 0.6$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $0.6 < |y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The $p_{\rm T}$ bin width and corrected yield ratios R21 and R31 for $|y| < 1.2$. The statistical and systematic uncertainties in the corrected yield ratios are given as the percentage of the ratio.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon$(1S) state and $|y| <0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(1S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(2S) state and $|y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 0.6$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $0.6 < |y| < 1.2$.

The dimuon acceptance $\mathcal{A}$ calculated using the CMS measured polarization and its positive and negative uncertainties $\mathcal{A}(\sigma^{\pm})$, and the values of the acceptance assuming no polarization $\mathcal{A}$(unpol), transverse polarization $\mathcal{A}(T)$, and longitudinal polarization $\mathcal{A}(L)$ for the $\Upsilon $(3S) state and $|y| < 1.2$.