Observed 95% CL limits on the production cross-section for scalar up-type LQs decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for scalar up-type LQs decaying into a top quark and a neutrino or a bottom quark and an electron.

Observed 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and a muon.

Expected 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and a muon.

Observed 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and an electron.

Expected 95% CL limits on the production cross-section for scalar down-type LQs decaying into a bottom quark and a neutrino or a top quark and an electron.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the Yang-Mills coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and a muon.

Observed 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Expected 95% CL limits on the production cross-section for vector up-type LQs in the minimal coupling scenario decaying into a top quark and a neutrino or a bottom quark and an electron.

Product of signal acceptance and efficiency in the training region for scalar up-type LQs decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^u\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for scalar up-type LQs decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^u\rightarrow be)$.

Product of signal acceptance and efficiency in the training region for scalar down-type LQs decaying into top quarks and muons or bottom quarks and neutrinos depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^d\rightarrow t\mu)$.

Product of signal acceptance and efficiency in the training region for scalar down-type LQs decaying into top quarks and electrons or bottom quarks and neutrinos depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(LQ_{mix}^d\rightarrow te)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the Yang-Mills coupling scenario decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{YM}\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the Yang-Mills coupling scenario decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{YM}\rightarrow be)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the minimal coupling scenario decaying into top quarks and neutrinos or bottom quarks and muons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{min}\rightarrow b\mu)$.

Product of signal acceptance and efficiency in the training region for vector LQs in the minimal coupling scenario decaying into top quarks and neutrinos or bottom quarks and electrons depending on the signal mass, $m_{LQ}$, and $\mathcal{B}(vLQ_{mix}^{min}\rightarrow be)$.

Cut-flow for the four models containing scalar LQs at a mass of $m_{LQ}=1300$ GeV and $\mathcal{B}(LQ_{mix}\rightarrow q_3\ell)=0.5$.

Cut-flow for the four models containing vector LQs at a mass of $m_{LQ}=1300$ GeV and $\mathcal{B}(LQ_{mix}\rightarrow q_3\ell)=0.5$.

Bayesian upper exclusion limits on the ratio $g_{W'}/g_{W}$ for an SSM-like W$\prime$ boson are shown. The unity coupling ratio (blue dotted curve) corresponds to the SSM common benchmark. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian lower exclusion limits on the NUGIM G(221) mixing angle $\cot(\theta_{E})$ are shown as a function of the W$\prime$ boson mass. The theoretically excluded region is shaded in grey. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper exclusion limits at 95% CL on the product of the production cross section and branching fraction of a QBH in an associated $ au$ lepton and neutrino final state. Minimum threshold masses $m_{th}$ of up to 6.6 TeV are excluded at 95% CL. The observed limit (solid line) is obtained from the intersection with the LO QBH cross section (blue dotted curve). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper limits at 95% CL on the cross section of the process $pp\rightarrow\tau\nu$ mediated via LQ exchange in the t-channel. The inner (green) band and the outer (yellow) band indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The predicted LQ cross section at LO in the three coupling benchmark scenarios is depicted in different colors for $g_{U}=1$. The uncertainty bandy correspond to the sum in quadrature of PDF and scale variations. The first benchmark scenario considers only couplings to left-handed SM fermions (i.e. $\beta_{\text{R}}^{ij}=0$) and is referred to as "best fit LH". The second benchmark, referred to as "best fit LH+RH", considers $|\beta_{\text{R}}^{\text{b}\tau}|=1$ and all other $\beta_{\text{R}}^{ij}=0$. In the third "democratic" benchmark, equal couplings only to LH fermions are assumed, i.e. $\beta_{\text{L}}^{ij}=1$ and $\beta_{\text{R}}^{ij}=0$ for all $i$ and $j$.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH+RH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the democratic scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Bayesian upper exclusion limits at 95% CL on each of the Wilson coefficients described by the EFT model based on 2016-2018 data. The three different coupling types represent a left-handed vector coupling ($\epsilon^{cb}_{L}$), tensor-like coupling ($\epsilon^{cb}_{T}$), and scalar-tensor-like coupling ($\epsilon^{cb}_{S_{L}}$). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Summary of exclusion limits (expected and observed) calculated at 95% CL for full Run-2 CMS data.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning from Figure 4.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning used in Figure 4.

Predicted signal yields for the 2017 data-taking period, corresponding to 41.3 fb$^{-1}$, after the application of each search requirement (cumulative) for various signal hypothesis. The requirements listed are presented as total efficiencies w.r.t. the previous selection step.

Signal selection efficiency ($\epsilon$) times acceptance ($A$) as a function of $H^{\pm}$. The estimated $\epsilon\times A$ arises from the lepton selection and triggering (∼30%) as well as jet selection and flavour tagging (∼10% or lower). The decrease of $\epsilon\times A$ for $m_{H^{\pm}}$ = 120 GeV and higher is expected from the kinematic constraint on the $H^{\pm}$ decay products due to the top-quark mass.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Observed and expected event yields for the signal and all of the background processes considered in this analysis after the fit to the data in all of the regions. The uncertainty on the expected yield is the combination of statistical and systematic uncertainties obtained in the fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the event yield for processes in all regions, after the fit over all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Impact of different components of systematic uncertainty on the measured cross section, without taking into account the correlations. The impact is calculated by fixing the value of the corresponding nuisance parameters to the values obtained in the fit used to measure the cross section, performing the fit, estimating the signal strength uncertainty and subtracting it from the nominal uncertainty in quadrature.

Fitted POI values for this analysis, the previous ATLAS analysis, and their combination. The first and second columns present the values obtained in the individual analyses. The third column presents the values obtained in the combination.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters. Limits are obtained by setting all aQGCs parameters except one to zero. Unitarity is not preserved.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters in the region, where unitarity is preserved. Cutoff scales in MC, $E_{c}$, are given for each parameter. Limits are obtained by setting all aQGCs parameters except one to zero.

The $E_{T}^{\gamma}$ distribution in the SR after the fit in the control regions. The red (green) line shows the expected number of events in the case of non-zero EFT coefficient $f_{T0}/\Lambda^4$ ($f_{M0}/\Lambda^4$) with the value shown in the legend. The vertical error bars on the data points correspond to the data statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T5}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T8}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T9}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M1}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M2}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Correlation matrix of the parameters for the fit in all regions. Only parameters with absolute value of the correlation coefficient larger than 10 are shown.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the hadhad category. The efficiencies are calculated with respect to HH to bbtautau decays in which both tau-leptons decay hadronically. The ‘Pre-selection’ consists of basic requirements, including that at least two tau-had-vis pass loose kinematic requirements, at least one of the tau-had-vis candidate passes identification requirement, and that events do not contain an electron or muon. The ‘Object selections’ require exactly two tau-had-vis candidates, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Loose tau ID’ requires that both tau-had-vis candidates pass identification requirements. The ‘DTT offline jet cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the lephad SLT category. The efficiencies are calculated with respect to HH to bbtautau decays in which one tau-lepton decays hadronically and one decays leptonically. The ‘Pre-selection’ consists of basic requirements, including that at least one tau-had-vis candidate and one lepton pass loose kinematic requirements. The ‘Object selections’ require exactly one tau-had-vis candidate, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Trigger specific offline pT cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Cumulative efficiency for simulated signal events to pass each stage of the event selection in the lephad LTT category. The efficiencies are calculated with respect to HH to bbtautau decays in which one tau-lepton decays hadronically and one decays leptonically. The ‘Pre-selection’ consists of basic requirements, including that at least one tau-had-vis candidate and one lepton pass loose kinematic requirements. The ‘Object selections’ require exactly one tau-had-vis candidate, and at least two jets with pT > 25 GeV and abs(eta) < 2.5. The ‘Trigger specific offline pT cuts’ are cuts placed on the pT of the reconstructed jet or tau-had-vis that are geometrically matched to the HLT objects, to ensure the efficiencies of the HLT objects reach the plateau region.

Post-fit expected number of signal and background events and observed number of data events after applying the selection criteria and requiring exactly 2 b-tagged jets and assuming a background-only hypothesis.

Observed and expected limits at 95% CL on the cross-section of HH production, for the non-resonant ggF+VBF HH search, and the resonant HH search for four values of the resonance mass mX.

Acceptance times efficiency for the full analysis selections as a function of the resonance mass mX in the hadhad, lephad SLT and lephad LTT trigger categories, and the combined lephad. The acceptance times efficiency is evaluated for HH to bbtautau decays, with respect to the targeted tau-lepton decay modes (lephad or hadhad).

Post-fit distribution of mHH in the hadhad channel.

Post-fit distribution of mHH in the lephad SLT channel.

Post-fit distribution of mHH in the lephad LTT channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of mtautau MMC in the hadhad channel.

Post-fit distribution of of di-b-jet mass in the hadhad channel.

Post-fit distribution of di-b-jet mass in the LTT lephad channel.

Post-fit distribution of di-b-jet mass in the LTT lephad channel.

BDT for SM HH in the hadhad channel

NN for SM HH in the lephad SLT channel

NN for SM HH in the lephad LTT channel

PNN for mX = 500 GeV resonant HH in the hadhad channel

PNN for mX = 500 GeV resonant HH in the lephad SLT channel

PNN for mX = 500 GeV resonant HH in the lephad LTT channel

PNN for mX = 1000 GeV resonant HH in the hadhad channel

PNN for mX = 1000 GeV resonant HH in the lephad SLT channel

PNN for mX = 1000 GeV resonant HH in the lephad LTT channel

Event yields as a function of log10(S/B) for data, background and non-resonant HH signal. Final discriminant bins from the hadhad, lephad SLT and lephad LTT categories are combined into bins of log10(S/B). The B is the fitted background yield assuming background-only hypothesis, and the signal S is scaled to the SM expected cross-section.

Observed and expected limits at 95% CL on the cross-section of the resonant HH production as a function of the scalar resonance mass mX.

Post-fit distribution of delta-R between the taus in the hadhad channel.

Post-fit distribution of delta-R between the b-tagged jets in the hadhad channel.

Post-fit distribution of delta-R between the taus in the lephad SLT channel.

Post-fit distribution of delta-R between the b-tagged jets in the lephad SLT channel.

Post-fit distribution of delta-pT between the tau and lepton in the lephad SLT channel.

Post-fit distribution of pT of the subleading b-tagged jet in the lephad SLT channel.

Post-fit distribution of MTW in the lephad SLT channel.

Post-fit distribution of missing transverse momentum in the lephad SLT channel.

Post-fit distribution of missing transverse momentum centrality in the lephad SLT channel.

Post-fit distribution of delta-phi between the Higgs boson candidates in the lephad SLT channel.

Post-fit distribution of delta-pT between the tau and lepton in the lephad LTT channel.

Post-fit distribution of delta-R between the taus in the lephad LTT channel.

Post-fit distribution of delta-phi between the lepton and the missing transverse momentum in the lephad LTT channel.

Post-fit distribution of delta-phi between the Higgs boson candidates in the lephad LTT channel.

Post-fit distribution of the total transverse momentum s in the lephad LTT channel.

PNN for mX = 300 GeV resonant HH in the hadhad channel

PNN for mX = 300 GeV resonant HH in the lephad SLT channel

PNN for mX = 300 GeV resonant HH in the lephad LTT channel

PNN for mX = 1600 GeV resonant HH in the hadhad channel

PNN for mX = 1600 GeV resonant HH in the lephad SLT channel

PNN for mX = 1600 GeV resonant HH in the lephad LTT channel

Local p-value of the background-only hypothesis as a function of the resonance mass.

Acceptance * reconstruction efficiency for the P P --> Zprime --> Zh --> llbb/cc signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> vvbb signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> vvbb signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> llbb signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> llbb signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 1-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 1-lepton channel.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1+2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1+2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved top control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved top control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Upper limits on Zprime to Z h production cross section times branching fraction in pb.

Upper limits on Zprime to Z h production cross section times branching fraction in pb.

Upper limits on Wprime to W h production cross section times branching fraction in pb.

Upper limits on Wprime to W h production cross section times branching fraction in pb.

Upper limits on ggA to Z h production cross section times branching fraction in pb.

Upper limits on ggA to Z h production cross section times branching fraction in pb.

Upper limits on bbA to Z h production cross section times branching fraction in pb.

Upper limits on bbA to Z h production cross section times branching fraction in pb.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 220 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 220 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 260 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 260 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 300 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 300 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 340 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 340 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 380 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 380 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 420 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 420 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 440 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 440 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 460 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 460 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 500 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 500 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 700 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 700 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 800 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 800 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 900 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 900 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1200 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1200 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 2000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 2000 GeV.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> vvbb signal in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> vvbb signal in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> llbb signal in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> llbb signal in the 2-lepton channel.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Distributions of expected upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of expected upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of observed upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of observed upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Dijet signal efficiencies as a function of the signal mass and lifetime for events satisfying all event and vertex requirements, with corrections based on systematic differences in the vertex reconstruction efficiency between data and simulation.

The distribution of $d_{\mathrm{BV}}$ for $\geq$5-track one-vertex events in data and three simulated multijet signal samples each with a mass of 1600 GeV. The production cross section for each signal model is assumed to be the lower limit excluded by CMS-EXO-17-018, corresponding to values of 0.8, 0.25, and 0.15 fb for the samples with $c\tau =$ 0.3, 1.0, and 10 mm, respectively. The last bin includes the overflow events. This bin includes one event in data with a vertex with large $d_{\mathrm{BV}}$ that appears to arise from tracks originating from separate pp interaction vertices, consistent with background.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data with two 3-track vertices. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data which have exactly one 4-track vertex and one 3-track vertex. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized to the number of two-vertex events in data with two 4-track vertices. The two vertical red dashed lines separate the regions used in the fit.

Distribution of the $x$-$y$ distances between vertices, $d_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution $d_{\mathrm{VV}}^{\kern 0.15em\mathrm{C}}$ (blue continuous line) is constructed from one-vertex events in data, and is normalized using $\geq$5-track one-vertex event information. The two vertical red dashed lines separate the regions used in the fit.

Predicted yields for the background-only normalized template, predicted yields for three simulated multijet signals each with a mass of 1600 GeV, and the observed yield in each $d_{\mathrm{VV}}$ bin. The production cross section for each signal model is assumed to be the lower limit excluded by CMS-EXO-17-018, corresponding to values of 0.8, 0.25, and 0.15 fb for samples with $c\tau =$ 0.3, 1.0, and 10 mm, respectively. The uncertainties in the signal yields and the systematic uncertainties in the background prediction reflect the systematic uncertainties given in the text.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the multijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the neutralino (red) and gluino (purple) with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the dijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the top squark with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed 95% CL upper limits on the product of cross section and branching fraction squared for the dijet signals, as a function of mass and $c\tau$. The overlaid mass-lifetime exclusion curves assume pair-production cross sections for the top squark with 100% branching fraction to each model's respective decay mode specified. The solid black (dashed colored) lines represent the observed (median expected) limits at 95% CL. The thin black lines represent the variation of the observed limit within theoretical uncertainties of the signal cross section. The thin dashed colored lines represent the region containing 68% of the expected limit distribution under the background-only hypothesis. The observed limits from the CMS displaced jets search (CMS-EXO-19-021) are also shown in teal for comparison.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 300um in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 300um in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 1 mm in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 1 mm in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for multijet signals, for a fixed $c\tau$ of 10 mm in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of mass for dijet signals, for a fixed $c\tau$ of 10 mm in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 800 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 800 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 1600 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 1600 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for multijet signals, for a fixed mass of 2400 GeV in the full Run-2 data set. The neutralino and gluino pair production cross sections are shown for the multijet signals. For $m$ = 2400 GeV, the expected neutralino cross section is $\approx 8\times 10^{-5}$ fb and is not shown.

Observed and expected 95% CL upper limits on the product of cross section and branching fraction squared, as a function of $c\tau$ for dijet signals, for a fixed mass of 2400 GeV in the full Run-2 data set. The top squark pair-production cross section is shown for the dijet signals.

Data-to-simulation efficiency correction factors, shown for multijet and dijet signal topologies in several ranges of $c\tau$. Note that these correction factors account for the two long-lived particles in the simulated events, and are therefore the total correction factors used to scale event yields rather than the correction factors one would apply to individual vertices.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 3-track one-vertex events in data, and is normalized to the number of 3-track two-vertex events in data.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 4-track and 3-track one-vertex events in data, and is normalized to the number of two-vertex events in data which have exactly one 4-track vertex and one 3-track vertex.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from 4-track one-vertex events in data, and is normalized to the number of 4-track two-vertex events in data.

Distribution of the azimuthal angle between vertices, $\Delta\phi_{\mathrm{VV}}$, for 2017 and 2018 data. The background distribution (blue continuous line) is constructed from $\geq$5-track one-vertex events in data, and is normalized using one-vertex event information. No $\geq$5-track two-vertex data events pass the selection.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Pre-fit and post-fit event yields in the SR, for MEM discriminant values larger than $2.0\times10^{-4}$. The central value of the event yield for each process is calculated by summing the values of the discriminant bin contents, using the nominal expected yield for the pre-fit value, and the best-fit estimate for the post-fit value. The error includes statistical and systematic uncertainties summed in quadrature. All sources of systematic uncertainties are included, taking into account correlations and anti-correlations in the post-fit case. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore only included in the post-fit uncertainties.

Observed impact of the different sources of uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. The 'Systematic uncertainties' category combines all sources of systematic uncertainties. The statistical uncertainty is obtained by repeating the fit after having fixed all nuisance parameters, including the $t\bar{t}$ and $W$+jets normalisation factors. 'Total' gives the total uncertainty on the measurement.

Observed impact of the different sources of $t\bar{t}$ modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and 'ME/PS matching' to the matching of the ME to the parton shower.

Observed impact of the different sources of s-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of t-channel modelling uncertainty on the measured s-channel signal cross-section. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, as described in Section 7 in the paper.

Observed impact of the different sources of $tW$ modelling uncertainty on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root. 'PS & had.' refers to the parton shower and hadronisation model, and '$t\bar{t}$ overlap' to the algorithm removing the overlap between $tW$ and $t\bar{t}$ production at NLO, as described in Section 7 in the paper.

Observed impact of the different sources of PDF uncertainties on the measured s-channel signal cross-section, grouped by categories. The impact of each category is obtained by repeating the fit after having fixed the set of nuisance parameters corresponding to that category, subtracting the square of the resulting uncertainty from the square of the uncertainty found in the full fit, and calculating the square root.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Distribution of the MEM discriminant $P(S|X)$ in the SR for MEM discriminant values larger than $2.0\times10^{-4}$, for the collision data used for the measurement, and for 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured values of the signal cross-section and of the $t\bar{t}$ and $W$+jets normalisation factors, obtained by statistical-only fits to the collision data used for the measurement, and to 1000 pseudo-data replicas, generated using a bootstrapping technique, in order to assess the statistical correlations between this measurement and others, for the purpose of combinations. The central values and their statistical uncertainties are obtained by repeating the fit after having fixed all nuisance parameters, except the $t\bar{t}$ and $W$+jets normalisation factors, which are let free-floating (unlike for the statistical uncertainty on the cross-section quoted in the paper). The replicas are obtained by reweighting each observed data event by a random integer generated according to Poisson statistics, using the <a href="https://zenodo.org/record/5361038">BootstrapGenerator</a> software package , which implements a technique described in <a href="https://cds.cern.ch/record/2759945/">ATL-PHYS-PUB-2021-011</a>. The ATLAS event number and run number of each event are used as seed to uniquely but reproducibly initialise the random number generator for each event. Each pseudo-data replica is assigned an index, ranging from 0 to 999, corresponding to the random number index used consistently for each observed data event.

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} + p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))