The unfolded differential charge asymmetry as a function of the transverse momentum of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded differential charge asymmetry as a function of the longitudinal boost of the top pair system. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NNLO in QCD and NLO in EW theory are listed. The scale uncertainty is obtained by varying renormalisation and factorisation scales independently by a factor of 2 or 0.5 around $\mu_0$ to calculate the maximum and minimum value of the asymmetry, respectively. The nominal value $\mu_0$ is chosen as $H_T/4$. The variations in which one scale is multiplied by 2 while the other scale is divided by 2 are excluded. Finally, the scale and MC integration uncertainties are added in quadrature.

The unfolded inclusive leptonic asymmetry. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the invariant mass of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the transverse momentum of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

The unfolded differential leptonic asymmetry as a function of the longitudinal boost of the di-lepton pair. The unfolded $A_C^{\ell\bar{\ell}}$ is obtained in the reduced phase-space defined by the requirement $|\Delta |\eta_{\ell\bar{\ell}}||<2.5$. The measured values are given with statistical and systematic uncertainties. The SM theory predictions calculated at NLO in QCD and NLO in EW theory are listed. The theory uncertainty is obtained by varying both scales by a factor of 0.5 or 2.0 to calculate the minimum and maximum value of the asymmetry, respectively.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ inclusive measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Individual 68% and 95% CL bounds on the relevant Wilson coefficients of the SM Effective Field Theory in units of $\text{TeV}^{-2}$. The bounds are derived from the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. The experimental uncertainties are accounted for, in the form of the complete covariance matrix that keeps track of correlations between bins for the differential measurement. The theory uncertainty from the NNLO QCD + NLO EW calculation is included by explicitly varying the renormalization and factorization scales, or the parton density functions, in the calculation and registering the variations in the intervals.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement for $\beta_{z,t\bar{t}}$ $\in$ [0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ < 500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [500,750] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [750,1000] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ $\in$ [1000,1500] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement for $m_{t\bar{t}}$ > 1500 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ < 30 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ $\in$ [30,120] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement for $p_{T,t\bar{t}}$ > 120 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ inclusive measurement. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0,0.3]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.3,0.6]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.6,0.8]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement for $\beta_{z,\ell\bar{\ell}}$ $\in$[0.8,1]. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ < 200 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [200,300] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ $\in$ [300,400] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement for $m_{\ell\bar{\ell}}$ > 400 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ < 20 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ $\in$ [20, 70] GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Ranking of the systematic uncertainties with marginalisation for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement for $p_{T,\ell\bar{\ell}}$ > 70 GeV. The effect on unfolded $A_C$ for down and up variation of the systematic uncertainty is shown, respectively. The pulls and constraints of the ranked NPs are obtained from data.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ inclusive measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Post-marginalisation correlation coefficients $\rho_{ij}$ of nuisance parameters for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement. Only $|\rho_{ij}| > 0.05$ values are included.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $m_{t\bar{t}}$ measurement.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $p_{T,t\bar{t}}$ measurement.

Covariance matrix for the $A_C^{t\bar{t}}$ vs $\beta_{z,t\bar{t}}$ measurement.

Covariance matrix for the $A_C^{\ell\ell}$ vs $m_{\ell\bar{\ell}}$ measurement.

Covariance matrix for the $A_C^{\ell\ell}$ vs $p_{T,\ell\bar{\ell}}$ measurement.

Covariance matrix for the $A_C^{\ell\ell}$ vs $\beta_{z,\ell\bar{\ell}}$ measurement.

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Leading tau Pt distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$ region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-1j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-2j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{lep}\tau_{had}$-3j region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{\ell}\tau_{had}\tau_{had}$SS region. Other MC includes single top, V+jets, and other small backgrounds. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-2j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3j region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

Di-tau mass distributions obtained before the fit to data (Pre-Fit) showing the expected background and tuH signals after applying fake factors in the $t_{h}\tau_{had}\tau_{had}$-3jSS region. Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. The tuH signals with nominal branching ratio of 0.1% are scaled using normalization factors of 2 to 50. Statistical and systematic uncertainties are included in the "Total background".

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tuH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(uH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$ region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-1j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-2j region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{lep}\tau_{had}$-3j region,Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{\ell}\tau_{had}\tau_{had}$SS region, Other MC includes single top, V+jets, and other small backgrounds. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-2j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3j region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

BDT output distributions obtained from a signal+background fit to the data for the tcH search in the $t_{h}\tau_{had}\tau_{had}$-3jSS region, Rare includes single top, V+jets, and other small backgrounds. $\tau_{sub}$ real includes the contribution of fakes for which the sub-leading tau is real. Statistical and systematic uncertainties are included in the "Total background". The signal shapes of tt(cH), tH, and their sum are also shown using a normalisation of 2 x $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ of 0.1%.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{uH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ for the individual searches as well as their combination, assuming $\mathcal{B}(\mathrm{t}\to\mathrm{cH}) = 0$. The observed limits are compared with the expected (median) limits under the background-only hypothesis. The surrounding shaded bands correspond to the 68% and 95% CL intervals around the expected limits, denoted by $\pm 1\sigma$ and $\pm 2\sigma$, respectively.

Observed upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $+1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-1\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Expected $-2\sigma$ upper limits at 95% CL on the branching fractions in the plane of $\mathcal{B}(\mathrm{t}\to\mathrm{uH})$ and $\mathcal{B}(\mathrm{t}\to\mathrm{cH})$.

Observed upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $+1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-1\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Expected $-2\sigma$ upper limits at 95% CL on the anomalous couplings in the plane of $C_{\mathrm{c\phi}}$ and $C_{\mathrm{u\phi}}$.

Predicted and observed yields in each of the analysis regions considered in leptonic channel.

Predicted and observed yields in each of the analysis regions considered in hadronic channel.

Absolute uncertainties on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$ obtained from the combined fit to the data.

Summary of 95% CL upper limits on $\mathcal{B}(\mathrm{t}\to\mathrm{qH})$, significance and best-fit branching ratio in the signal regions. The values in the tables are in the form of observed(expected).

Correlation matrix for the measurement of STXS parameters in each of the 28 regions considered.

Fitted values for kappa_g and kappa_y.

Correlation matrix for the measurement of kappa_g and kappa_y.

Summary of the 68% CL confidence intervals for individual measurements of SMEFT parameters observed in data. In each case, SMEFT parameters other than the one measured are fixed to 0.

Results of the EV parameter measurement in data, in the linear and linear+quadratic parameterizations of the SMEFT. All the EVs parameters are free to vary in the fits. The ranges correspond to 68% CL confidence intervals.

Observed linear correlation coefficients of the EVs parameters in the linear parameterization.

Observed linear correlation coefficients of the EVs parameters in the linear+quadratic parameterization.

Cross-sections times H->yy branching ratio for ggF +bbH, VBF, VH, ttH, and tH production. The values are obtained from a simultaneous fit to all categories. The theory uncertainties in the predictions include uncertainties due to missing higher-order terms in the perturbative QCD calculations and choices of parton distribution functions and value of alpha_s, as well as the H->yy branching ratio uncertainty.

Best-fit values and uncertainties for STXS parameters in each of the 28 regions considered. The values for the gg->H process also include the contributions from bbH production.

Correlation matrix for the measurement of STXS parameters in each of the 33 regions considered.

Acceptance * reconstruction efficiency for the P P --> Zprime --> Zh --> llbb/cc signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> vvbb signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> vvbb signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> llbb signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> bbA --> Zh --> llbb signals in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 1-lepton channel.

Acceptance * reconstruction efficiency for the P P --> Wprime --> Zh --> lvbb/cc signals in the 1-lepton channel.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved 3+ b-tag signal region. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1+2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the merged 1+2 b-tag signal region with additional b-tagged track jets not associated with the large-R jet. The background prediction is shown after a background-only maximum-likelihood bbA fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 1-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved top control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{Vh}$ for the 2-lepton channel in the resolved top control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag sideband control region. The background prediction is shown after a background-only maximum-likelihood Z' fit to the data. In the plot, the last bin contains the overflow.

Upper limits on Zprime to Z h production cross section times branching fraction in pb.

Upper limits on Zprime to Z h production cross section times branching fraction in pb.

Upper limits on Wprime to W h production cross section times branching fraction in pb.

Upper limits on Wprime to W h production cross section times branching fraction in pb.

Upper limits on ggA to Z h production cross section times branching fraction in pb.

Upper limits on ggA to Z h production cross section times branching fraction in pb.

Upper limits on bbA to Z h production cross section times branching fraction in pb.

Upper limits on bbA to Z h production cross section times branching fraction in pb.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 220 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 220 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 260 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 260 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 300 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 300 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 340 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 340 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 380 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 380 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 420 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 420 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 440 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 440 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 460 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 460 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 500 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 500 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 700 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 700 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 800 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 800 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 900 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 900 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1200 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1200 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1400 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 1600 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 2000 GeV.

Expected and observed two-dimensional likelihood scans of the b-associated production cross section times branching fraction vs the gluon-fusion production cross section times branching fraction at $m_{A}$ = 2000 GeV.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> vvbb signal in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> vvbb signal in the 0-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> llbb signal in the 2-lepton channel.

Acceptance * reconstruction efficiency for the P P --> A --> Zh --> llbb signal in the 2-lepton channel.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the resolved 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 1 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Event distributions of $m_{T,Vh}$ for the 0-lepton channel in the merged 2 b-tag signal region. The background prediction is shown after a background-only maximum-likelihood W' fit to the data. In the plot, the last bin contains the overflow.

Distributions of expected upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of expected upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of observed upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

Distributions of observed upper limits at 95% confidence level on the cross section of P P --> A --> Zh as a function of bbA fraction an signal mass.

The reconstruction efficiency for caloDPJs produced by the decay of &gamma;_d into e⁺e^- or qq&#772;. The reconstruction efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as a function of their transverse momentum in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d+X and WH selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^WH, assuming an FRVZ signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d+X is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_c+&mu;^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

Observed 95% CL upper limits on the branching ratio (B) for the decay H&rarr;&nbsp;2&gamma;_d and ggF selection, for different &gamma;_d masses and a 125&nbsp;GeV Higgs boson. The limits are shown for the SR_2c^ggF, assuming a HAHM signal model. The hatched band denotes the region in which the branching ratio of H&rarr;&nbsp;2&gamma;_d is larger than unity.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2015--2016 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The CalRatio 2017--2018 trigger efficiency for the decay of &gamma;_d in e⁺e^- or qq&#772;. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is between 2&nbsp;m and 4&nbsp;m.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2015--2016 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse decay length L_xy.

The narrow-scan 2017--2018 trigger efficiency for the decay of &gamma;_d in &mu;⁺&mu;^-. The trigger efficiency is shown for &gamma;_d with 0&lt;|&eta;|&lt;1.1 as function of the transverse momentum, in events where the &gamma;_d L_xy is below 6&nbsp;m.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the cosmic-ray tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the &mu;DPJs for which the cosmic-ray tagger score is &gt; 0.2 for each associated MS-only track.

Efficiency of the QCD tagger as function of the &gamma;_d transverse decay length. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

Efficiency of the QCD tagger as function of the &gamma;_d transverse momentum. The efficiency is calculated accepting the caloDPJs for which the QCD tagger score is &gt; 0.5.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^ggF.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_2c^WH.

The extrapolated acceptance times efficiencies as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the SR_c+&mu;^WH.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;2&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the HAHM H&rarr;&nbsp;2&gamma;_d+X process and a SM Higgs boson for the ggF channel.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a Higgs-like scalar with a mass of 800&nbsp;GeV. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_c+&mu;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

The extrapolated acceptance times efficiencies for SR_2c;^ggF, as a function of the &gamma;_d mean proper lifetime c&tau; for the FRVZ pp &rarr; H&rarr;&nbsp;4&gamma;_d+X process and a SM Higgs boson. The coloured bands represent the MC statistical uncertainties.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the branching ratio (B), obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X, for different &gamma;_d masses and a 125 GeV Higgs boson. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_c+&mu;^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section, obtained from the SR_2c^ggF, for the process pp &rarr; H&rarr;&nbsp;2&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the c+&mu; search channel, assuming an FRVZ signal model.

Observed limits at the 95% CL on the cross section for the process pp &rarr; H&rarr;&nbsp;4&gamma;_d+X and ggF selection, for different &gamma;_d masses and a Higgs-like scalar with a mass of 800&nbsp;GeV. The limits are shown for the 2c search channel, assuming an FRVZ signal model.

Observed (points with error bars) and expected background (solid histograms) distributions for $E_{T}^{miss}$ in the signal region (a) SRL, (b) SRM and (c) SRH after the background-only fit applied to the CRs. The predicted signal distributions for the two models with a gluino mass of 2000 GeV and neutralino mass of 250 GeV (SRL), 1050 GeV (SRM) or 1950 GeV (SRH) are also shown for comparison. The uncertainties in the SM background are only statistical.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Observed and expected exclusion limit in the gluino-neutralino mass plane at 95% CL combined using the signal region with the best expected sensitivity at each point, for the full Run-2 dataset corresponding to an integrated luminosity of $139~\mathrm{fb}^{-1}$, for $\gamma/Z$ (a) and $\gamma/h$ (b) signal models. The black solid line corresponds to the expected limits at 95% CL, with the light (yellow) bands indicating the 1$\sigma$ exclusions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves, the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties. For each point in the higgsino-bino parameter space, the labels indicate the best-expected signal region, where L, M and H mean SRL, SRM and SRH, respectively.

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/Z$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Acceptance (left) and efficiency (right) for the $\gamma/h$ model signal grid for SRL (top), SRM (middle) and SRH (bottom).

Cutflow for the SRL selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 250 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRM selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1050 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Cutflow for the SRH selection, for two relevant signal points for both $\gamma/Z$ and $\gamma/h$ models, where the gluinos have mass of 2000 GeV and the neutralinos have a mass of 1950 GeV (10000 generated events). The numbers are normalized to a luminosity of 139 $fb^{-1}$.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

Observed and expected exclusion limits in the gluino–neutralino mass plane at 95% CL for the full Run-2 dataset corresponding to an integrated luminosity of 139 fb−1 , for the (a) $\gamma/Z$ and (b) $\gamma/h$ signal models. They are obtained by combining limits from the signal region with the best expected sensitivity at each point. The dashed (black) line corresponds to the expected limits at 95% CL, with the light (yellow) band indicating the $\pm 1\sigma$ excursions due to experimental and background-theory uncertainties. The observed limits are indicated by medium (red) curves: the solid contour represents the nominal limit, and the dotted lines are obtained by varying the signal cross section by the theoretical scale and PDF uncertainties.

The observed mass distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the short lifetime regime.

List of expected and observed events, $p_{0}$-value and the corresponding $Z$ local significance, as well as the 95% CLs upper limit of the expected and observed signal events ($S^{95}_ ext{exp} and $S^{95}_ ext{obs}$ ) in each mass window for SR-Inclusive bins of the long lifetime regime.

The observed $p_{\rm T$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $|\eta|$ distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Inclusive_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed mass distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

Lower limits on the gluino mass, from gluino $R$-hadron pair production, as a function of gluino lifetime for two neutralino mass assumptions of (a) $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$ and (b) $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$. The upper $1 \sigma_\text{exp}$ expected bound is very close to the expected limit for some lifetime values due to the expected background getting very close to 0 events.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

(a) Lower limits on the chargino mass as a function of lifetime, and (b) the contours around the excluded mass-lifetime region for stau pair production.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-LowPt-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_Low. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL0_High. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Trk-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

Comparison of the observed and expected VAR distributionsin VR-HiEta-Mu-IBL1. The band on the expected background estimation indicates the total uncertainty of the estimation. Downward triangle markers at the bottom of the panels indicate there is no events observed in the corresponding bin, while upward triangle markers at the bottom panel indicate the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed $p_{\rm T$ distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_Low signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL0_High signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Trk-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

The observed dE/dx distribution in the SR-Mu-IBL1 signal-region bin. The band on the expected background indicates the total uncertainty of the estimation. Several representative signal models are overlaid. Events outside the shown range are accumulated in the rightmost bin indicated as 'Overflow'. Downward triangle markers at the bottom of the panels indicate that no events are observed in the corresponding mass bin, while upward triangle markers in the lower panels indicate that the observed data is beyond the range.

Expected and observed distributions in SR-Inclusive_Low of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of missing transverse momentum. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of relative phi-angle between pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track, and the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the relative phi-angle between pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the transverse mass of pTmiss and the leading jet pT, required to be separated by at least deltaR > 0.4 with respect to the signal candidate track. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_Low of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

Expected and observed distributions in SR-Inclusive_High of the effective mass, defined as the scalar sum pT of the signal candidate track, jets satisfying pT > 30 GeV, excluding ones within deltaR < 0.4 with respect to the signal candidate track, and pTmiss. The expected background distribution is calculated for each |eta| slice using CR-kin control region as the template and applying the scale factor using the dE/dx distribution in CR-dEdx of the corresponding |eta| slice. The last bins of the plots include overflow events above the range.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $m(\tilde{\chi}_{1}^{0}) = 100 \text{GeV}$, with lifetime with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for gluinos with $\Delta m(\tilde{g}, \tilde{\chi}_{1}^{0}) = 30 \text{GeV}$, with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, and (d) 30 ns.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for charginos with lifetime (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

The expected upper limits on cross-section for sleptons with lifetime (a) 1 ns, (b) 3 ns, (c) 10 ns, (d) 30 ns, and (e) stable.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Muon reconstruction efficiency as a function of β and |η| for (a) stable charginos and (b) stable charged R-hadrons. For weakly interacting LLPs with calorimeter materials the efficiency for the chargino is recommended to refer to. The muon reconstruction efficiency for R-hadrons is significantly lower due to having QCD interactions with materials.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Trigger and event selection efficiencies. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal track selection efficiency as a function of CLLP $\beta\gamma$ for SR-Inclusive_Low and SR-Inclusive_High bins. The band on the marker indicates a typical size of fluctuation by the LLP mass and lifetime observed by the samples used in efficiency derivation, but it does not indicate the full envelope of model dependence.

Signal selection efficiency by the mass window for SR-Inclusive_Low and SR-Inclusive_High bins.

Acceptance for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |eta| < 1.8 and r_decay > 500 mm.

Acceptance for the chargino pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Acceptance for the stau pair-production model for various masses and lifetimes. The acceptance is defined as the fraction of events having at least one charged LLP satisfying pT > 120 GeV, |\eta| < 1.8 and r_decay > 500 mm.

Event-level efficiency for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Event-level efficiency for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the fraction of events satisfying the selection of trigger, event and jet cleaning, ETmiss and primary vertex requirements per events satisfying the acceptance criteria.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Highfor the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the chargino pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Efficiency of SR-Inclusive_Low for the stau pair-production model for various masses and lifetimes. The efficiency is defined as the ratio of events satisfying the signal region selection to those satisfying the acceptance criteria. The mass window is not applied for the presented numbers.

Passing events in event selection steps for the R-hadron pair-production model with m(N1) = 100 GeV for various masses and lifetimes.

Passing events in event selection steps for the R-hadron pair-production model with DeltaM(gluino, N1) = 30 GeV for various masses and lifetimes.

Passing events in event selection steps for the chargino pair-production model for various masses and lifetimes.

Passing events in event selection steps for the stau pair-production model for various masses and lifetimes.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with leptons at the Born-level to the cross section calculated with dressed leptons as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Correction scale factor from the cross section calculated with an overlap removal with jets of pT greater than 100 GeV to the cross section calculated with an overlap removal with jets of pT greater than 30 GeV as a function of the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, averaging the electron and muon channels, derived with Sherpa2.2.11. The systematic uncertainty is obtained with an enveloppe around scale factors computed from Sherpa2.2.1 and MG5_aMC+Py8 CKKWL.

Measured fiducial differential cross sections for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Measured fiducial differential cross sections for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The statistical, systematic, and luminosity uncertainties are given.

Systematic uncertainties for the Z boson p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the leading jet p$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the high-p$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $r_{Z,j}$ in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the collinear region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the back-to-back region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the H$_{\mathrm{T}}$ in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the $\Delta R_{Z,j}^{min}$ in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.

Systematic uncertainties for the jet multiplicity in the high-S$_{\mathrm{T}}$ region in Z($\to \ell^{+} \ell^{-}$) + high p$_{\mathrm{T}}$ jets events, where the EW Zjj contribution is treated as signal and not subtracted as background. The uncertainties are presented as a percentage of the measured cross-section for the upward variation of each source of uncertainty in each bin.