Reconstruction level differential cross section spectla, obtained for the central acceptance, $|\eta| < 3$, for events with Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology compared to the to the EPOS-LHC predictions, broken down into the non-diffractive (ND), central diffractive (CD), single diffractive (SD) and double diffractive (DD) components. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV

The number of high purity tracksin the first $\eta$ bin after a gap of $4.5 \leq \Delta\eta^F < 5.0$ for events with the Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV

The transeverse momentum of high purity tracksin the first $\eta$ bin after a gap of $4.5 \leq \Delta\eta^F < 5.0$ for events with the Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV

The total energy of all Particle Flow candidatesin the first $\eta$ bin after a gap of $4.5 \leq \Delta\eta^F < 5.0$ for events with the Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV

Unfolded diffraction enhanced differential cross section for events with Pomeron-Lead ($\mathrm{I\!P}\mathrm{Pb}$) topology, defined on the region $|\eta| < 5.2$, compared to hadron level predictions of the MC generators. The data are corrected for the contribution from events with undetectable energy in the HF calorimeter adjacent to the rapidity gap. The corrections are obtained using the EPOS-LHC MC sample. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Unfolded diffraction enhanced differential cross section for events with Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology, defined on the region $|\eta| < 5.2$, compared to hadron level predictions of the MC generators. The data are corrected for the contribution from events with undetectable energy in the HF calorimeter adjacent to the rapidity gap. The corrections are obtained using the EPOS-LHC MC sample. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Unfolded diffractive enhanced differential cross section spectla for events with Pomeron-Lead ($\mathrm{I\!P}\mathrm{Pb}$) topology, compared to the to the hadron-level EPOS-LHC predictions, broken down into the non-diffractive (ND), central diffractive (CD), single diffractive (SD) and double diffractive (DD) components. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Unfolded diffractive enhanced differential cross section spectla for events with Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology, compared to the to the hadron-level EPOS-LHC predictions, broken down into the non-diffractive (ND), central diffractive (CD), single diffractive (SD) and double diffractive (DD) components. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Unfolded diffractive enhanced differential cross section spectla for events with Pomeron-Lead ($\mathrm{I\!P}\mathrm{Pb}$) topology, compared to the to the hadron-level QGSJET II predictions, broken down into the non-diffractive (ND), central diffractive (CD), single diffractive (SD) and double diffractive (DD) components. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Unfolded diffractive enhanced differential cross section spectla for events with Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology, compared to the to the hadron-level QGSJET II predictions, broken down into the non-diffractive (ND), central diffractive (CD), single diffractive (SD) and double diffractive (DD) components. Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Reconstruction level diffraction enhanced differential cross section spectrum for Pomeron-Proton ($\mathrm{I\!P}\mathrm{p} + \gamma \mathrm{p}$) topology corrected for the contribution from events with undetectable energy in the HF calorimeter adjacent to the rapidity gap, compared with the spectrum obtained with events satisfying the ZDC veto requirement $E_{ZDC−} < 1 \mathrm{~TeV}$ which selects only the events without lead nuclear break up (without correction for HF undetectable energy). Forward Rapidity Gap definition: $|\eta| < 2.5$: $p_{T}^{track} < 200$ MeV and $\sum \limits_{bin} E^{PF} < 6$ GeV $|\eta| \in [2.5,3.0]$: $\sum \limits_{bin} E_{neutral}^{PF} < 13.4$ GeV $|\eta| > 3.0$: No particles

Electron $p_{T}$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_{T}^{miss}$ distribution in the electron channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Muon $p_T$ distribution using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$p_T^{miss}$ distribution in the muon channel using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the E+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

$M_T$ distribution for the MU+INVISIBLE system using 2016-2018 data sets. The complete set of selection criteria were applied. Two examples of SSM WPRIME boson signal samples with masses of 3.8 and 5.6 TeV are shown. The lower panel shows the ratio of data to SM prediction, and the shaded band represents the systematic uncertainties.

Theoretical prediction for the production and decay cross-section of SSM WPRIME bosons (W --> LEPTON + NU) as a function of the WPRIME mass, for the range 200-6400 GeV and inclusive in phase-space (no cuts). The uncertainty shown covers PDF and ALPHAS uncertainties. These theoretical predictions are obtained with PYTHIA (LO) and corrected to NNLO in QCD using FEWZ program.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the product of WPRIME cross-section production and BF(WPRIME --> LEPTON + NU) for an SSM WPRIME boson, as a function of the boson mass, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits. The theoretical predictions for the SSM at NNLO precision in QCD are shown with narrow gray bands corresponding to the PDF and ALPHAS uncertainties.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the electron decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the muon decay channel. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

The 95% CL observed (solid line) and expected (dashed line) model independent cross section upper limits as function of the $MT_{min}$ threshold, for the combined electron and muon decay channels. The shaded bands represent the one (green) and two (yellow) standard deviation uncertainty bands for the expected limits.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW as a function of the mass of the WPRIME boson, for the electron channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime, being equal to gW, the SM coupling.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the coupling strength ratio, gWprime/gW, as a function of the mass of the WPRIME boson, for the muon channel. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. The dotted line represents the case of SSM coupling, gWprime , being equal to gW, the SM coupling.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the electron channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the muon channel for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Exclusion limits in the 2D plane (1/R, $\mu$) for the split-UED interpretation for the n = 2 case, for the combined electron and muon channels for the 2016-2018 data sets. R is the radius of the additional spatial dimension and $\mu$ the bulk mass for the fermion field in five dimensions. The expected limit is depicted as a black dashed line. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The experimentally excluded region is the entire area to the left of the solid black line.

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{231}$ coupling in the RPV SUSY model with a STAU mediator, as a function of the mass of STAU, for the electron channel and for the production coupling, ${\lambda}^{'}_{3ij}$=0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying the ones shown by the ratio ${\lambda}^{'}_{3ij}$/0.5

Observed (solid line) and expected (dashed line) upper limits at 95% CL on the ${\lambda}_{132}$ coupling in the RPV SUSY model with a stau mediator, as a function of the mass of the stau, for the muon channel and for the production coupling, ${\lambda}^{'}_{3ij}$ = 0.5 . The couplings ${\lambda}^{'}_{3ij}$, ${\lambda}_{231}$, and ${\lambda}_{132}$ are defined in Fig. 1. The one (green) and two (yellow) standard deviation uncertainty bands for the expected limits are shown. The area above the limit curve is excluded. Limits for other values of ${\lambda}^{'}_{3ij}$ are obtained multiplying these ones by the ratio ${\lambda}^{'}_{3ij}$/0.5

Region in the oblique (W,Y) parameter phase space allowed by the current analysis at 95% CL. The combination of the electron and muon channel distributions from the 2017 and 2018 data sets at sqrt(s) = 13 TeV is used, having 101 fb-1 of luminosity.

Negative Log-Likelihood for the determination of the oblique W parameter, for the combination of the electron and muon channel and for 2017 and 2018 data sets (L=101 fb-1) at sqrt(s) = 13 TeV.

Total background estimate and observed data in all bins used in the limit calculation for the SSM WPRIME limits. The total event sample is split into the three years of data taking and the two lepton flavors.The distributions being shown are $M_T$ ones. The associated integrated luminosities for each year are of 35.9, 41.5, and 59.4 fb$̣^{-1}. The mass bins are numbered in ascending order.

The measured cross section as a function of exclusive jet multiplicity, $N_{\text{jets}}$, when $50<p_T<100$ GeV

The measured cross section as a function of exclusive jet multiplicity, $N_{\text{jets}}$, when $p_T>100$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $p_T<10$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $10<p_T<30$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $30<p_T<50$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $50<p_T<100$ GeV

The measured cross section as a function of $\Delta\phi_{Z,jet1}$, when $p_T>100$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $p_T<10$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $10<p_T<30$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $30<p_T<50$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $50<p_T<100$ GeV

The measured cross section as a function of $\Delta\phi_{jet1,jet2}$, when $p_T>100$ GeV

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with 400 < $p_{T1}$ < 800 GeV and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $0 < \Delta\Phi_{1,2} < 150^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $150 < \Delta\Phi_{1,2} < 170^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity measured for a leading-pT jet ($p_{T1}$) with $p_{T1}$ > 800 and for an azimuthal separation between the two leading jets of $170 < \Delta\Phi_{1,2} < 180^{\circ}$. The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the leading $p_{T}$ jet ($p_{T1}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the subleading $p_{T}$ jet ($p_{T2}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the third leading $p_{T}$ jet ($p_{T3}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Measured transverse momentum of the fourth leading $p_{T}$ jet ($p_{T4}$). The full breakdown of the uncertainties is displayed, with PU corresponding to Pileup, PREF to Trigger Prefering, PTHAT to the hard-scale (renormalization and factorization scales), MISS and FAKE to the inefficienties and background, LUMI to integrated luminosity. With JES, JER and stat. unc. following the notation in the paper.

Jet multiplicity distribution in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet multiplicity in TUnfold binning ($N_{jets},\Delta\phi_{1,2},p_{T1}$) as indicated in the XML file provided as additional resource.

Jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource. The uncertainties follow the notation of Table 1.

Correlation matrix at particle level for the measured jet $p_{T}$ distributions in TUnfold binning ($p_{T1},p_{T2},p_{T3},p_{T4}$) as indicated in the XML file provided as additional resource.

SM background observation/prediction in the WH signal region

SM background prediction vs. observation in the W signal region

SM background observation/prediction in the W signal region

SM background prediction vs. observation in the H signal region

SM background observation/prediction in the H signal region

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a Z boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$ assuming that each $\widetilde{\chi}^\pm_1$ decays to a W boson and $\widetilde{\chi}^0_1$ and the $\widetilde{\chi}^0_2$ decays to a H boson and $\widetilde{\chi}^0_1$

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

Observed exclusion limits assuming the approximate-NLO+NLL cross sections

Expected exclusion limits assuming the approximate-NLO+NLL cross sections

The 95% CL observed upper limits on the production cross sections for mass-degenerate higgsino-like$\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^\mp_1$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_2$, $\widetilde{\chi}^\pm_1$ $\widetilde{\chi}^0_3$ and $\widetilde{\chi}^0_2$ $\widetilde{\chi}^0_3$ as functions of the NLSP and LSP masses.

Efficiency of bb-tagger for H(bb), Z(bb) and Z(cc) decays.

Efficiency of W- and V-tagger for W(qq) and Z(qq) decays.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the b-Veto region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWW in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWZ in the HSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WHSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiWH in the HSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WHSR region.

Acceptance times efficiency values with uncertainties for TChiHZ in the WSR region.

Acceptance times efficiency values with statistical uncertainties for TChiHZ in the HSR region.

Covariance matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

Correlation matrix for the signal regions, derived from a fit to the control regions only under the background-only hypothesis.

The observed and expected (in parentheses) 95% CL lower mass limits on RPV SUSY, Z′ ($\mathcal{B}=0.1$) , and QBH signals for the e$\mu$, e$\tau$, and $\mu\tau$ channels.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected and observed 95% CL upper limits on the product of cross section times branching fraction as a function of the $ au$ sneutrino mass in an RPV SUSY model for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red and blue solid lines show the product of cross section times branching fraction as a function of the tau sneutrino mass for two different values of couplings.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\mu$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the e$\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for a Z′ ($\mathcal{B}=0.1$) boson with LFV decays, in the $\mu\tau$ channel.The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the Z′ mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Expected (black dashed line) and observed (black solid line) 95% CL upper limits on the product of cross section and branching fraction for quantum black hole production in an ADD model with $n=4$ extra dimensions, in the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits. The red solid lines show the product of cross section times branching fraction as a function of the QBH threshold mass.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the e$\mu$ channel. The regions to the left of and above the curves are excluded.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the e$\tau$ channel. The regions to the left of and above the curves are excluded.

Upper limits at 95% CL on the RPV SUSY model in the plane of $\tau$ sneutrino mass and $\lambda'$ coupling, for four values of $\lambda$ couplings for the $\mu\tau$ channel. The regions to the left of and above the curves are excluded.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\mu$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the e$\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Model-independent upper limits at 95% CL on the product of cross section, branching fraction, and acceptance are shown. Observed (expected) limits are shown in black solid (dashed) lines for the $\mu\tau$ channel. The shaded bands represent the one and two standard deviation (s.d.) uncertainties in the expected limits.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning from Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "channel_year_binnumber", following the binning used in Figure 2.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum. At least one jet is required. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable. The values are normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the dilepton transverse momentum, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $50 \le M_{ll} < 76$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $106 \le M_{ll} < 170$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $170 \le M_{ll} < 350$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width.

The measured differential cross section in the $350 \le M_{ll} < 1000$ GeV mass window, in bins of the $\varphi^*$ variable, divided by the measured differential cross section in the $76 \le M_{ll} < 106$ GeV mass window. At least one jet is required. The values are not normalized by the bin width. This entry contains the covariance matrix of the results.

Response matrix for pT ll mass 50-76 (electron channel)

Response matrix for pT ll mass 50-76 (muon channel)

Response matrix for pT ll mass 76-106 (electron channel)

Response matrix for pT ll mass 76-106 (muon channel)

Response matrix for pT ll mass 106-170 (electron channel)

Response matrix for pT ll mass 106-170 (muon channel)

Response matrix for pT ll mass 170-350 (electron channel)

Response matrix for pT ll mass 170-350 (muon channel)

Response matrix for pT ll mass 350-1000 (electron channel)

Response matrix for pT ll mass 50-76 jet (electron channel)

Response matrix for pT ll mass 50-76 jet (muon channel)

Response matrix for pT ll mass 76-106 jet (electron channel)

Response matrix for pT ll mass 76-106 jet (muon channel)

Response matrix for pT ll mass 106-170 jet (electron channel)

Response matrix for pT ll mass 106-170 jet (muon channel)

Response matrix for pT ll mass 170-350 jet (electron channel)

Response matrix for pT ll mass 170-350 jet (muon channel)

Response matrix for phistar mass 50-76 (electron channel)

Response matrix for phistar mass 50-76 (muon channel)

Response matrix for phistar mass 76-106 (electron channel)

Response matrix for phistar mass 76-106 (muon channel)

Response matrix for phistar mass 106-170 (electron channel)

Response matrix for phistar mass 106-170 (muon channel)

Response matrix for phistar mass 170-350 (electron channel)

Response matrix for phistar mass 170-350 (muon channel)

Response matrix for phistar mass 350-1000 (electron channel)

Response matrix for phistar mass 350-1000 (muon channel)

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the first jet, $|y(\text{j}_1)|$.

Measured cross section as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the first jet, $p_{\text{T}}(\text{j}_1)$.

Measured cross section as a function of the rapidity absolute value of the second jet, $|y(\text{j}_2)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the second jet, $|y(\text{j}_2)|$.

Measured cross section as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the second jet, $p_{\text{T}}(\text{j}_2)$.

Measured cross section as a function of the rapidity absolute value of the third jet, $|y(\text{j}_3)|$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the rapidity absolute value of the third jet, $|y(\text{j}_3)|$.

Measured cross section as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$, and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momenum of the third jet, $p_{\text{T}}(\text{j}_3)$.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least one jet.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least two jets.

Measured cross section as a function of the $H_{\text{T}}$ observable for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the $H_{\text{T}}$ observable for events with at least three jets.

Measured differential cross section as a function of dijet mass, $M_{\text{j}_1\text{j}_2}$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of dijet mass, $M_{\text{j}_1\text{j}_2}$, for events with at least two jets.

Measured differential cross section as a function of Z boson rapidity absolute value, $|y(\text{Z})|$ for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of Z boson rapidity absolute value, $|y(\text{Z})|$ for events with at least one jet.

Measured differential cross section as a function of the leading and subleading jet rapidity difference, $y_{\text{diff}}(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet rapidity difference, $y_{\text{diff}}(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the leading and subleading jet rapidity sum, $y_{\text{sum}}(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet rapidity sum, $y_{\text{sum}}(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet rapidity difference, $y_{\text{diff}}(\text{Z},\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet rapidity sum, $y_{\text{sum}}(\text{Z},\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and dijet rapidity difference, $y_{\text{diff}}(\text{Z},\text{dijet})$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and dijet rapidity difference, $y_{\text{diff}}(\text{Z},\text{dijet})$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and dijet rapidity sum, $y_{\text{sum}}(\text{Z},\text{dijet})$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and dijet rapidity sum, $y_{\text{sum}}(\text{Z},\text{dijet})$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least one jet.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_1)$, for events with at least two jets.

Measured differential cross section as a function of the Z boson and leading jet azimuthal difference for events, $\Delta\phi(\text{Z},\text{j}_1)$, with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and leading jet azimuthal difference for events, $\Delta\phi(\text{Z},\text{j}_1)$, with at least three jets.

Measured differential cross section as a function of the Z boson and subleading jet azimuthal difference for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet azimuthal difference for events with at least two jets.

Measured differential cross section as a function of the Z boson and subleading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_2)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and subleading jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_2)$, for events with at least three jets.

Measured differential cross section as a function of the Z boson and third jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the Z boson and third jet azimuthal difference, $\Delta\phi(\text{Z},\text{j}_3)$, for events with at least three jets.

Measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least two jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least two jets.

Measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and subleading jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_2)$, for events with at least three jets.

Measured differential cross section as a function of the leading and third jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the leading and third jet azimuthal difference, $\Delta\phi(\text{j}_1,\text{j}_3)$, for events with at least three jets.

Measured differential cross section as a function of the subleading and third jet azimuthal difference, $\Delta\phi(\text{j}_2,\text{j}_3)$, for events with at least three jets and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured differential cross section as a function of the subleading and third jet azimuthal difference, $\Delta\phi(\text{j}_2,\text{j}_3)$, for events with at least three jets.

Measured cross section as a function of the leading jet transverse momentum, $p_{\text{T}}(\text{j}_1)$, and rapidity absolute value, $|y(\text{j}_1)|$ for events with at least one jet and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the leading jet transverse momentum, $p_{\text{T}}(\text{j}_1)$, and rapidity absolute value, $|y(\text{j}_1)|$ for events with at least one jet.

Measured cross section as a function of the leading jet and Z boson rapidity abosolute values, $|y(\text{j}_1|$ and $|y(\text(Z))|$, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the leading jet and Z boson rapidity abosolute values, $|y(\text{j}_1|$ and $|y(\text(Z))|$, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$.

Measured cross section as a function of the transverse momementum, $p_{\text{T}}(\text{Z})$, and rapidity, $y(\text{Z})$, of the Z boson, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$ and breakdown of the relative uncertainty.

Bin-to-bin correlation in the measured cross section as a function of the transverse momementum, $p_{\text{T}}(\text{Z})$, and rapidity, $y(\text{Z})$, of the Z boson, for events with at least one jet with $p_\text{T}>20\,\text{Gev}$.

Results for the covariance matrix where the parameters a, b, c, and d are taken from a linear fit to the different CP-violating samples.

The elliptic flow $v_2\{SP\}$ for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{6\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{8\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{SP\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{6\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{8\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{SP\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{6\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{8\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{p-SP\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{Pb-SP\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{6\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{p-SP\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{Pb-SP\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{6\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{p-SP\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{Pb-SP\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4,veto\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{6,veto\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The ratio $v_2\{4,veto\}/v_2\{4\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The ratio $v_2\{6,veto\}/v_2\{6\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4,Sub\}$ for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4,Sub\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4,Sub\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The elliptic flow $v_2\{4,Sub\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4,Sub\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The elliptic flow $v_2\{4,Sub\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The ratio $v_2\{4,Sub\}/v_2\{4\}$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The flow fluctuation $\sigma/\langle v_{2} \rangle$ for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ for $K_S^0$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ for $\Lambda$ as a function of $p_T$ in pPb collision at 8.16 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ using $v_2\{4\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ using $v_2\{6\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The flow fluctuation $\sigma/\langle v_2 \rangle$ using $v_2\{4,veto\}$ for charged hadron as a function of $p_T$ in pPb collision at 8.16 TeV.

The $v_2\{6\}/v_2\{4\}$ ratio for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The $v_2\{6\}/v_2\{4\}$ ratio for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The $v_2\{6\}/v_2\{4\}$ ratio for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The $v_2\{8\}/v_2\{4\}$ ratio for charged hadron as a function of $p_T$ in PbPb collision at 5.02 TeV.

The $v_2\{8\}/v_2\{4\}$ ratio for $K_S^0$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

The $v_2\{8\}/v_2\{4\}$ ratio for $\Lambda$ as a function of $p_T$ in PbPb collision at 5.02 TeV.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=1600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2000\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2200\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2400\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2600\;\mathrm{GeV}$.

Upper limits at 95% CL on $\sigma\times\mathcal{B}^2(\mathrm{H}_1\rightarrow b\bar{b})$ as a function of $m_{\mathrm{H_1}}$ for $m_{\mathrm{SUSY}}=2800\;\mathrm{GeV}$.

$V_{n\Delta}$ coefficients for minimum bias events as a function of N$_{\text{trk}}$ for $ 1.0 < p_\mathrm{T} < 3.0 GeV$ in pPb collisions at 8.16 TeV.

Single-particle azimuthal anisotropy $v_2$ for $\gamma$p events as a function of N$_{\text{trk}}$ for $0.3 < p_\mathrm{T} < 3.0 GeV$ in pPb collisions at 8.16 TeV.

Single-particle azimuthal anisotropy $v_2$ for minimum bias events as a function of N$_{\text{trk}}$ for $0.3 < p_\mathrm{T} < 3.0 GeV$ in pPb collisions at 8.16 TeV.

Single-particle azimuthal anisotropy $v_2$ for $\gamma$p events as a function of N$_{\text{trk}}$ for $1.0 < p_\mathrm{T} < 3.0 GeV$ in pPb collisions at 8.16 TeV.

Single-particle azimuthal anisotropy $v_2$ for minimum bias events as a function of N$_{\text{trk}}$ for $1.0 < p_\mathrm{T} < 3.0 GeV$ in pPb collisions at 8.16 TeV.

Measurements of the signal strengths $\mu_{\text{s}}$ in the STXS stage-1.2 bins for the ggH, qqH, and VH processes, for the combination of the CB- and VH-analyses. Central values and a split of uncertainties are also provided with each result.

Correlation matrix of the POIs of the measured STXS stage-1.2 signal strengths for the combination of the NN- an VH-analyses.

Correlation matrix of the POIs of the measured STXS stage-1.2 signal strengths for the combination of the CB- an VH-analyses.

Cross section measurements in the STXS stage-0 bins for the combination of the NN- and VH-analyses. Central values and combined statistical and systematic uncertainties are given for each measurement.

Cross section measurements in the STXS stage-1.2 bins for the combination of the NN- and VH-analyses. Central values and combined statistical and systematic uncertainties are given for each measurement.

Cross section measurements in the STXS stage-0 bins for the combination of the CB- and VH-analyses. Central values and combined statistical and systematic uncertainties are given for each measurement.

Cross section measurements in the STXS stage-1.2 bins for the combination of the CB- and VH-analyses. Central values and combined statistical and systematic uncertainties are given for each measurement.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-1 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-2 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the dijet-3 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 1 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 2 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 3 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Fits to the $m_{\ell^+\ell^-\gamma}$ data distribution in the untagged 4 categories. In the upper panel, the red solid line shows the result of a signal-plus-background fit to the given category. The red dashed line shows the background component of the fit. The green and yellow bands represent the 68 and 95% CL uncertainties in the fit. Also plotted is the expected SM signal, scaled by a factor of 10. In the lower panel, the data minus the background component of the fit is shown.

Observed signal strength ($\mu$) for a SM Higgs boson at 125.38 GeV. The labels untagged combined,dijet combined and combined represent the results obtained from simultaneous fits of the untagged categories, dijet categories, and full set of categories, respectively. The black solid line shows $\mu=1$, and the red dashed line shows the best fit value $\hat{\mu}=2.4$ of all categories combined.

Upper limit (95% CL) on the signal strength ($\mu$) relative to the SM prediction, as a function of the assumed value of the Higgs boson mass used in the fit.

The $M_{JJ}$ distribution for the number of observed events (black markers) compared with the estimated backgrounds (filled histograms) and their uncertainties (hatched areas) in the SR1. The distributions expected from the signal under three $M_X$ and $M_Y$ hypotheses and assuming a cross section of 1 fb are also shown. The lower panels show the ''Pulls'' defined as (observed events - expected events)/$\sqrt{\smash[b]{\sigma_{obs}^{2} - \sigma_{exp}^{2}}}$, where $\sigma_{obs}$ and $\sigma_{exp}$ are the statistical and total uncertainties in the observation and the background estimation, respectively. The minus sign accounts for the correlation between data and the data-driven estimation.

The 95% confidence level expected and observed upper limits on $\sigma$(pp->X->YH->4b) for different values of $M_X$ and $M_Y$. The areas within the red and black contours represent the regions where the cross sections predicted by NMSSM and TRSM, respectively, are larger than the experimental limits. The areas within the dashed and dotted contours show the excluded masses at -1 standard deviation from the expected limits.

The soft-drop mass distribution of the top quark candidate jets in the 2018 jets+lepton category, in the tight ParticleNet region, after the joint fit in all-jets and jets+lepton categories. Observed data (black markers) and the postfit estimate (filled histograms) are shown for the three jet categories. The lower panel shows the ''Pulls'' defined as (observed events - expected events)/$\sqrt{\smash[b]{\sigma_{obs}^{2} + \sigma_{exp}^{2}}}$, where $\sigma_{obs}$ and $\sigma_{exp}$ are the statistical and total uncertainties in the observation and the background estimation, respectively.

The 95% confidence level expected and observed upper limits on $\sigma$(pp->X->YH->4b) for different values of $M_X$ and $M_Y$. The areas within the red and black contours represent the regions where the cross sections predicted by NMSSM and TRSM, respectively, are larger than the experimental limits. The areas within the dashed and dotted contours on the left show the excluded masses at -1 standard deviation from the expected limits.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 40 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 45 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 50 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 55 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 60 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 65 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 70 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 75 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 80 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 85 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 90 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 95 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

The observed 95% CL upper limits on the product of the cross section, and branching fraction for the production of X$\to\phi\phi\to$4b, with $m_\phi$ = 100 GeV. The corresponding expected limits and their variations at the 1 and 2 standard deviation levels are also shown. Limits are compared to various extended higgs sector model cross sections as a function of the parameter $m_XN/f$.

Data event yields and predicted signal and background yields (including subdominant $t\bar{t}$) in bins of dijet and average jet mass.

The W' boson 95% CL limits on the product of cross section and branching fraction. The expected and observed limits are shown for the high VLQ mass range.

The W' boson 95% CL limits on the product of cross section and branching fraction. The expected and observed limits are shown for the low VLQ mass range.

Expected 95% CL limits for generalized hypotheses varying the fraction of tB (F(VLQ=B)) and bT (F(VLQ=T)) from the W′ decay

Expected 95% CL limits for generalized hypotheses varying the VLQ branching fraction to qH and qZ

Observed 95% CL limits for generalized hypotheses varying the fraction of tB (F(VLQ=B)) and bT (F(VLQ=T)) from the W′ decay

Observed 95% CL limits for generalized hypotheses varying the VLQ branching fraction to qH and qZ

The fraction of photon-induced background as compared with the total amount of DY signal plus photon-induced events ($N_{\gamma\gamma}/(N_{\gamma\gamma} + N_\mathrm{DY})$) in different dilepton mass bins. These numbers are averaged across the different years and channels.

Exclusion limits at 95% CL on the coupling K_L for a Z' in the sequential standard model as a function of the Z' mass.

Differential cross section times dimuon branching fraction of Y(1S) as a function of $y^{Y}_{CM}$ in pPb collisions. The global uncertainty arises from the integrated luminosity uncertainty in pPb collisions.

Differential cross section times dimuon branching fraction of Y(2S) as a function of $y^{Y}_{CM}$ in pPb collisions. The global uncertainty arises from the integrated luminosity uncertainty in pPb collisions.

Differential cross section times dimuon branching fraction of Y(3S) as a function of $y^{Y}_{CM}$ in pPb collisions. The global uncertainty arises from the integrated luminosity uncertainty in pPb collisions.

Differential cross section times dimuon branching fraction of Y(1S) as a function of pT in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Differential cross section times dimuon branching fraction of Y(2S) as a function of pT in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Differential cross section times dimuon branching fraction of Y(3S) as a function of pT in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Differential cross section times dimuon branching fraction of Y(1S) as a function of $|y^{Y}_{CM}|$ in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Differential cross section times dimuon branching fraction of Y(2S) as a function of $|y^{Y}_{CM}|$ in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Differential cross section times dimuon branching fraction of Y(3S) as a function of $|y^{Y}_{CM}|$ in pp collisions. The global uncertainty arises from the integrated luminosity uncertainty in pp collisions.

Nuclear modification factor of Y(1S) as a function of pT. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(2S) as a function of pT. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(3S) as a function of pT. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(1S) as a function of $y^{Y}_{CM}$. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(2S) as a function of $y^{Y}_{CM}$. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(3S) as a function of $y^{Y}_{CM}$. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(1S) at forward and backward $y^{Y}_{CM}$ for pT < 6 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(2S) at forward and backward $y^{Y}_{CM}$ for pT < 6 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(3S) at forward and backward $y^{Y}_{CM}$ for pT < 6 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(1S) at forward and backward $y^{Y}_{CM}$ for 6 < pT < 30 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(2S) at forward and backward $y^{Y}_{CM}$ for 6 < pT < 30 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

Nuclear modification factor of Y(3S) at forward and backward $y^{Y}_{CM}$ for 6 < pT < 30 GeV/c. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

RFB of Y(1S) versus $N^{|\eta_{lab}|<2.4}_{tracks}$.

RFB of Y(2S) versus $N^{|\eta_{lab}|<2.4}_{tracks}$.

RFB of Y(3S) versus $N^{|\eta_{lab}|<2.4}_{tracks}$.

RFB of Y(1S) versus $E^{|\eta_{lab}|>4}_{T}$.

RFB of Y(2S) versus $E^{|\eta_{lab}|>4}_{T}$.

RFB of Y(3S) versus $E^{|\eta_{lab}|>4}_{T}$.

Nuclear modification factor of Y(1S), Y(2S), and Y(3S) integrated over pT and $y^{Y}_{CM}$. The global uncertainty arises from the integrated luminosity uncertainties in pPb and pp collisions.

The distribution of $\mathrm{p_{T}^{miss}}$ (GeV) in 2L1T MisID CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{M_{T}}$ (GeV) in 3L OnZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{H_{T}}$ (GeV) in 3L ttZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

Distribution of BDT score from the SS-M ($\mathrm{B_{e}=B_{\mu}=B_{\tau}}$) BDT for the 3L+2L1T CR events for the combined 2016-2018 data set. The 3L+2L1T CR consists of the 3L OnZ, 3L Z$\mathrm{\gamma}$, and 2L1T MisID CRs. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of visible diboson $\mathrm{p_{T}}$ (GeV) in 4L ZZ CR events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

Distribution of BDT score from the SS-M ($\mathrm{B_{e}=B_{\mu}=B_{\tau}}$) BDT for the 4L ZZ CR events for the combined 2016-2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The distribution of $\mathrm{L_{T}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton of $\mathrm{m_{\tau'}}$ = 1 TeV in the doublet scenario, before the fit, is also overlaid.

The distribution of $\mathrm{p_{T}^{miss}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermion of $\mathrm{m_{\Sigma}}$ = 1 TeV in the flavor-democratic scenario, before the fit, is also overlaid.

The distribution of $\mathrm{H_{T}}$ in all seven multilepton channels for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the scalar leptoquark of $mathrm{m_{S}}$ = 1 TeV coupled to a top quark and a $\tau$ lepton, before the fit, is also overlaid.

The distribution of $\mathrm{M_{OSSF}}$ in channels with at least one light lepton pair (4L, 3L1T, 3L, 2L2T, and 2L1T) for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermion of $\mathrm{m_{\Sigma}}$ = 1 TeV in the flavor-democratic scenario, before the fit, is also overlaid.

The $\mathrm{N_{b}}$ distribution in 4L, 3L1T, 3L, 2L2T, 2L1T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The invariant mass distribution of the opposite-sign same-flavor ($\mathrm{M_{OSSF}}$) tau lepton pair distribution in 2L2T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The $\mathrm{M_{T}^{12}}$ distribution in 4L, 3L1T, 3L, 2L2T, 2L1T, 1L3T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction.

The $\mathrm{N_{b}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{L_{T}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{p_{T}^{miss}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{H_{T}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{OSSF}}$ distribution in 3L, and 2L1T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign different-flavor ($\mathrm{M_{OSDF}}$) light lepton pair distribution in 3L, and 2L1T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign same-flavor ($\mathrm{M_{OSSF}}$) tau lepton pair distribution in 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The invariant mass distribution of the opposite-sign different-flavor ($\mathrm{M_{OSDF}}$) light lepton and tau lepton pair distribution in 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{T}^{1}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{M_{T}^{12}}$ distribution in 3L, 2L1T, and 1L2T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The model independent fundamental table categories for the combined 2016-2018 data set, as defined in Table 1. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The $\mathrm{N_{b}}$ distribution in 4L, 3L1T, 2L2T, and 1L3T events for the combined 2016-2018 data set. The rightmost bin contains the overflow events. The gray band represents the sum of statistical and systematic uncertainties on the SM background predictions.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 3L channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 2L1T and 1L2T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the fundamental $\mathrm{S_{T}}$ table in 4L, 3L1T, 2L2T, and 1L3T channels for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 1L2T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. An example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid. For this category, the signal yield is negligible and is not visible in the figure.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 1B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 2L1T 2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 1L2T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. An example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid. For this category, the signal yield is negligible and is not visible in the figure.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 1B/2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L1T, 2L2T, and 1L3T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 0B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 4L 1B/2B channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The SR distributions of the advanced $\mathrm{S_{T}}$ table in 3L1T, 2L2T, and 1L3T channel for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-L BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 200 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-M BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 400 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The VLL-H BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 900 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 100 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 300 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 550 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The SS-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the scenario with mixing exclusively to $\tau$ lepton for $\mathrm{m_{\Sigma}}$ = 850 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 3-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{e}+B_{\mu}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and an electron for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-VL $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 200 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-L $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 400 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-M $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 700 GeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2016 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2017 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

The LQ-H $\mathrm{B_{\tau}=1}$ BDT regions for the 4-lepton channels for the 2018 data set. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background prediction. The expected SM background distributions and the uncertainties are shown after fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a $\tau lepton$ for $\mathrm{m_{S}}$ = 1.2 TeV, before the fit, is also overlaid.

Observed and expected upper limits at 95%% CL on the production cross section for the type-III seesaw fermions in the flavor-democratic scenario using the table schemes and the BDT regions of the SS-M and the SS-H $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ BDTs. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95%% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: doublet model. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\tau}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{e}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks: $\mathrm{B_{\mu}=1}$ and $\mathrm{\beta=1}$. To the left of the vertical dashed gray line, the limits are shown from the advanced $\mathrm{S_{T}}$ table, and to the right the limits are shown from the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\mathrm{\tau}$ leptons: singlet model. The limit is shown from the advanced $\mathrm{S_{T}}$ table for all masses.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=B_{\mu}=B_{\tau}}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the BDT regions.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the doublet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Fundamental $\mathrm{S_{T}}$ table.

Observed and expected upper limits at 95% CL on the production cross section for the vector-like $\tau$ leptons in the singlet scenario using the Advanced $\mathrm{S_{T}}$ table.

Observed lower limits at 95% CL on the mass of the type-III seesaw fermions in the plane defined by $\mathrm{B_{e}}$ and $\mathrm{B_{\tau}}$, with the constraint that $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$. These limits arise from the SS-H $\mathrm{B_{\tau}=1}$ BDT when $\mathrm{B_{\tau}\geq0.9}$, and by the SS-H $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$ BDT for the other decay branching fraction combinations.

Median Expected lower limits at 95% CL on the mass of the type-III seesaw fermions in the plane defined by $\mathrm{B_{e}}$ and $\mathrm{B_{\tau}}$, with the constraint that $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$. These limits arise from the SS-H $\mathrm{B_{\tau}=1}$ BDT when $\mathrm{B_{\tau}\geq0.9}$, and by the SS-H $\mathrm{B_{e}+B_{\mu}+B_{\tau}=1}$ BDT for the other decay branching fraction combinations.

Acceptance times efficiency values for the major SM backgrounds WZ, ZZ, and ttZ in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample. The statistical uncertainty on the acceptance times efficiency values is insignificant with respect to the quoted precision.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the doublet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the vector-like $\mathrm{\tau}$ lepton model in the singlet scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=B_{\mu}=B_{\tau})}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{e}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{(B_{\mu}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the type-III seesaw fermions in the $\mathrm{B_{\tau}=1)}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\tau}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{e}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Acceptance times efficiency values with statistical uncertainty for the scalar leptoquarks with $\mathrm{\beta=1}$ in the $\mathrm{B_{\mu}=1}$ scenario in the signal regions of all seven multilepton channels. The product is defined as the ratio of the total reconstructed yield in a given channel (after all the corrections and scale factor implementation) to the product of luminosity and the production cross section of the given simulation sample.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for electrons in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|<1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for 0.2<dRmin<0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for dRmin>0.4. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for muons in the $\mathrm{|\eta|>1.2}$ region, arising from the decay of $\tau$ leptons for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 1-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|<1.1}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{|\eta|>1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for dRmin>0.2. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}<2}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

Reconstruction efficiency and associated uncertainty maps for 3-prong $\tau_{h}$ in the $\mathrm{1.1<|\eta|<1.6}$ region, arising from the decay of SM gauge bosons (W/Z/h) for $\mathrm{N_{j}>1}$. The lepton efficiency is estimated in a simulated event sample for the ZZ process. For a given input generator-level $\mathrm{p_{T}}$, the efficiency map provides the probability distribution of the reconstructed $\mathrm{p_{T}}$, accounting for reconstruction and identification efficiency, and the $\mathrm{p_{T}}$ resolution. The x-axis and the y-axis represent bins in the reconstructed and generated lepton $\mathrm{p_{T}}$, respectively.

The SR distributions of the Fundamental $\mathrm{L_{T}+p_{T}^{miss}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the type-III seesaw heavy fermions in the flavor-democratic scenario for $\mathrm{m_{\Sigma}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the Fundamental $\mathrm{S_{T}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the vector-like $\tau$ lepton in the doublet scenario for $\mathrm{m_{\tau'}}$ = 1 TeV, before the fit, is also overlaid.

The SR distributions of the Advanced $\mathrm{S_{T}}$ table for the combined 2016-2018 data set. The detailed description of the bin numbers can be found in Tables 3-6 in the paper. The lower panel shows the ratio of observed events to the total expected background prediction. The gray band on the ratio represents the sum of statistical and systematic uncertainties in the SM background predictions. The expected SM background distributions and the uncertainties are shown before fitting the data under the background-only hypothesis. For illustration, an example signal hypothesis for the production of the scalar leptoquark coupled to a top quark and a muon for $\mathrm{m_{S}}$ = 1.4 TeV, before the fit, is also overlaid.

GGsm vs -2dNLL (f_{#Lambda1} (u) observed)

GGsm vs -2dNLL (SM-like (f_{ai}=0) expected)

GGsm vs -2dNLL (f_{a2} (u) expected)

GGsm vs -2dNLL (f_{a3} (u) expected)

GGsm vs -2dNLL (f_{#Lambda1} (u) expected)

GGsm vs -2dNLL (2l2#nu off-shell + 4l on-shell observed)

GGsm vs -2dNLL (4l off-shell + 4l on-shell observed)

GGsm vs -2dNLL (2l2#nu off-shell + 4l on-shell expected)

GGsm vs -2dNLL (4l off-shell + 4l on-shell expected)

r_offshell vs -2dNLL (R_{V,F}^{off-shell}=1 observed)

r_offshell vs -2dNLL (R_{V,F}^{off-shell} (u) observed)

r_offshell vs -2dNLL (R_{V,F}^{off-shell}=1 (2l2#nu) observed)

r_offshell vs -2dNLL (R_{V,F}^{off-shell} (u, 2l2#nu) observed)

r_offshell vs -2dNLL (R_{V,F}^{off-shell}=1 expected)

r_offshell vs -2dNLL (R_{V,F}^{off-shell} (u) expected)

r_offshell vs -2dNLL (R_{V,F}^{off-shell}=1 (2l2#nu) expected)

r_offshell vs -2dNLL (R_{V,F}^{off-shell} (u, 2l2#nu) expected)

rf_offshell vs -2dNLL (2l2#nu+4l observed)

rf_offshell vs -2dNLL (Only 2l2#nu observed)

rf_offshell vs -2dNLL (2l2#nu+4l expected)

rf_offshell vs -2dNLL (Only 2l2#nu expected)

rv_offshell vs -2dNLL (2l2#nu+4l observed)

rv_offshell vs -2dNLL (Only 2l2#nu observed)

rv_offshell vs -2dNLL (2l2#nu+4l expected)

rv_offshell vs -2dNLL (Only 2l2#nu expected)

rf_offshell vs rv_offshell observed

fa2 vs -2dNLL (#Gamma_{H}=4.1 MeV observed)

fa2 vs -2dNLL (#Gamma_{H} (u) observed)

fa2 vs -2dNLL (On-shell 4l observed)

fa2 vs -2dNLL (#Gamma_{H}=4.1 MeV expected)

fa2 vs -2dNLL (#Gamma_{H} (u) expected)

fa2 vs -2dNLL (On-shell 4l expected)

fa3 vs -2dNLL (#Gamma_{H}=4.1 MeV observed)

fa3 vs -2dNLL (#Gamma_{H} (u) observed)

fa3 vs -2dNLL (On-shell 4l observed)

fa3 vs -2dNLL (#Gamma_{H}=4.1 MeV expected)

fa3 vs -2dNLL (#Gamma_{H} (u) expected)

fa3 vs -2dNLL (On-shell 4l expected)

fL1 vs -2dNLL (#Gamma_{H}=4.1 MeV observed)

fL1 vs -2dNLL (#Gamma_{H} (u) observed)

fL1 vs -2dNLL (On-shell 4l observed)

fL1 vs -2dNLL (#Gamma_{H}=4.1 MeV expected)

fL1 vs -2dNLL (#Gamma_{H} (u) expected)

fL1 vs -2dNLL (On-shell 4l expected)

Expected event yields in each $m_{jj}$ bin for the different background processes in the SR of the VTR category, in the 2017 and 2018 samples. The background yields and the corresponding uncertainties are obtained after performing a combined fit across all of the CRs and SR. The expected signal contributions for a Higgs boson, produced in the non-VBF and VBF modes, decaying to invisible particles with a branching fraction of $\mathcal{B}(\text{H} \to \text{inv}) = 1$, and the observed event yields are also reported.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, signal region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, dimuon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, photon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for MTR, 2018, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single electron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2017, dielectron region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Event yields for the postfit background model from the background-only and signal-plus-background fits, as well as the observed event yields for VTR, 2018, single muon region. All signal and control regions from the 2017 and 2018 data sets are included in the fit.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>80~\text{GeV}$ ($>40~\text{GeV}$). The two jets are required to form a system with $m_{jj}>200~\text{GeV}$ and $\Delta\Phi_{jj}<1.5$.

Trigger efficiency measured as a function of $p_{T}^{miss}$ in data for the 2017 and 2018 samples for the MTR category. The efficiency is measured in a phase space with at least two jets in which the leading (trailing) jet has $p_{T}>140~\text{GeV}$ ($>70~\text{GeV}$). The two jets are required to form a system with $m_{jj}>900~\text{GeV}$ and $\Delta\Phi_{jj}<1.8$.

The measured branching fraction ratios

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

Transverse momentum distribution for B-candidate

The measured branching fractions

The measured branching fractions

Expected $+ 1$ s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Expected - 1 s.d. lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Observed lower limit contour on the $m_{\mathrm{W}_{\mathrm{KK}}}$ and $m_{\mathrm{R}}$ plane after combinign with an analysis of the all-hadronic final state.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR1.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR2.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR3.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR5.

Post-fit distributions of the reconstructed $\ell\nu$+jets system ($m_{\mathrm{j}\ell\nu}$, $m_{\mathrm{jj}\ell\nu}$) in data and simulation for SR6.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiency for quark and gluon jets to pass different tau identification discriminators versus the efficiency for genuine tau_h. The upper two plots are obtained with jets from the W+jets simulated sample and the lower two plots with jets from the tt sample. The left two plots include jets and genuine tau_h with pt < 100 GeV, whereas the right two plots include those with pt > 100 GeV. The working points are indicated as full circles. The efficiency for jets from the W+jets event sample, enriched in quark jets, to pass the discriminators is higher compared to jets from the tt event sample, which has a larger fraction of gluon and b-quark jets. The jet efficiency for a given tau_h efficiency is larger for jets and tau_h with pt < 100 GeV than for those with pt > 100 GeV. Compared with the previously used MVA discriminator, the DEEPTAU discriminator reduces the jet efficiency for a given tau_h efficiency by consistently more than a factor of 1.8, and by more at high tau_h efficiency. The additional gain at high pt comes from the inclusion of updated decay modes in the tau_h reconstruction, as illustrated by the curves for the previously used MVA discriminator but including reconstructed tau_h candidates with additional decay modes.

Efficiencies for simulated tau_h decays with |eta| < 2.3 to pass the following reconstruction and identification requirements: to be reconstructed in any decay mode with pt > 20 GeV and |eta| < 2.3 (black dashed line), to be reconstructed in a decay mode except for those with missing charged hadrons (labelled ''2-prong'' and shown as full black line), and to be reconstructed in a decay mode except the 2-prong ones and to pass the Loose, Medium, or Tight working point of the Djet discriminator (blue lines), obtained with a Z to tau tau event sample. The efficiencies are shown as a function of the visible genuine tau_h pt obtained from simulated decay products.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for electrons against efficiency for genuine tau_h to pass the MVA and De discriminators, separately for electrons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). Vertical bars correspond to the statistical uncertainties. The tau_h candidates are reconstructed in one of the tau_h decay modes without missing charged hadrons. Compared with the MVA discriminator, the De discriminator reduces the electron efficiency by more than a factor of two for a tau_h efficiency of 70% and by more than a factor of 10 for τh efficiencies larger than 88%. Furthermore, working points (indicated as full circles) are now provided for previously inaccessible tau_h efficiencies larger than 90%, for a misidentification efficiency between 0.3 and 8%.

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Efficiency for muons against efficiency for simulated τh to pass the cutoff-based and Dμ discriminators, separately for muons and tau_h with 20 < pt < 100 GeV (left) and pt > 100 GeV (right). The four working points are indicated as full circles. Vertical bars cor- respond to the statistical uncertainties. In both pt regimes, the D_m discriminator rejects up to a factor of 10 more muons at tau_h efficiencies around 99%, and it leads to an increase of the τh efficiency for a similar background rejection by about 0.5%

Correlation matrix between the four W boson decay branching fraction components.

Values of the QCD coupling constant at the W mass, the charm-strange CKM mixing element, and the squared sum of the first two rows of the CKM matrix.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.