Data (bold boxes) and background estimates (colour fill) for m_beta vs. m_betagamma for the gluino R-hadron search (1000 GeV). The blue thin-line boxes illustrate the expected signal (on top of background) for the given R-hadron mass hypothesis. The black dashed vertical/horizontal lines at 500 GeV show the mass selection (signal region in the top-right). Two events pass this selection.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of bottom-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Expected (dashed black line) and observed (solid red line) 95% CL upper limits on the cross section as a function of mass for the production of top-squark R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. The observed 8 TeV Run-1 limit and theory prediction [arXiv:1411.6795] are shown in dash-dotted and dotted lines, respectively.

Distribution of the truth-level beta for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Distribution of the truth-level betagamma for gluino R-hadrons in exemplary signal MC samples and muons in a Zmumu MC sample. All distributions have been normalised to one. The last bin contains the overflow of the histograms. The distributions illustrate the good discriminating power of the variables.

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 50 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 30 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Expected (dashed black line) and observed (solid red line) 95% confidence level upper limits on the cross section as a function of mass for the production of long-lived gluino R-hadrons. The theory prediction along with its +-1sigma uncertainty is show as a black line and a blue band, respectively. For meta-stable gluinos with a lifetime of 10 ns. (mass exclusion: about 1660 GeV expected, 1520 GeV observed).

Missing transverse momentum distribution after SR3b selection, beside the $E_\mathrm{T}^\mathrm{miss}$ requirement. The results in the signal region correspond to the last inclusive bin. The systematic uncertainties include theory uncertainties for the backgrounds with prompt SS/3L and the full systematic uncertainties for data-driven backgrounds. For illustration the distribution for a benchmark SUSY scenario ($pp\to \tilde g\tilde g$, $\tilde g\to t\bar t\tilde\chi_1^0$, $m_{\tilde g}=1.2$ TeV, $m_{\tilde\chi_1^0}=0.7$ TeV) is also shown.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qq(\tilde\ell\ell/\tilde\nu\nu)$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to qqWZ\tilde\chi_1^0$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde b_1$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde b_1\tilde b_1^*$ pair production with exclusive $\tilde b_1\to t\tilde\chi_1^-$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

Observed exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Expected exclusion limits on the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays. All limits are computed at 95% CL.

Upper limits on signal cross-sections as function of the $\tilde g$ and $\tilde\chi_1^0$ masses in the context of SUSY scenarios with simplified mass spectra featuring $\tilde g\tilde g$ pair production with exclusive $\tilde g\to t\bar t\tilde\chi_1^0$ decays, obtained using the signal efficiency and acceptance specific to each model. All limits are computed at 95% CL.

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar q(\tilde\ell\ell/\tilde\nu\nu)$ decay: signal acceptance (in %) in the signal region SR0b3j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar q(\tilde\ell\ell/\tilde\nu\nu)$ decay: reconstruction efficiency (in %) in the signal region SR0b3j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar qWZ\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR0b5j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to q\bar qWZ\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR0b5j. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde b_1\tilde b_1^*$ production and $\tilde b_1\to tW\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR1b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde b_1\tilde b_1^*$ production and $\tilde b_1\to tW\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR1b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to t\bar t\tilde\chi_1^0$ decay: signal acceptance (in %) in the signal region SR3b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

SUSY scenario with $\tilde g\tilde g$ production and $\tilde g\to t\bar t\tilde\chi_1^0$ decay: reconstruction efficiency (in %) in the signal region SR3b. The benchmark scenarios used to set exclusion limits are materialized by black dot markers. Acceptance and efficiency are defined as in appendix A of [JHEP 06 (2014) 124, arXiv: 1403.4853v1 [hep-ex]].

Numbers of observed and background events for SR3L low for each bin of the distribution in Meff. The table corresponds to Fig. 4(d). The statistical and systematic uncertainties are combined for the predicted numbers.

Numbers of observed and background events for SR3L high for each bin of the distribution in Meff. The table corresponds to Fig. 4(e). The statistical and systematic uncertainties are combined for the predicted numbers.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The efficiencies are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The efficiencies are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The efficiencies are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into b s and gluinos decay into t stop (see Fig. 5d in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The efficiencies are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The efficiencies are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The acceptances (in percent, %) are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The acceptances (in percent, %) are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The acceptances (in percent, %) are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The acceptances (in percent, %) are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The acceptances (in percent, %) are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The limits on observed cross section are calculated for all simplified models. The simplified models are for direct pair production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair-production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The limits on observed cross sections are calculated for all simplified models. The simplified models are for direct pair production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop)-20 GeV.

The signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

Experimental uncertainties on the signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

Experimental uncertainties on the signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

Experimental uncertainties on the signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

Experimental uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the values are given for the five signal regions and their combination.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

Statistical uncertainties on the signal event yields are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, and mu>0.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

Statistical uncertainties on the signal event yields are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

Statistical uncertainties on the signal event yields are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the values are given for the five signal regions and their combination. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

Statistical uncertainties on the signal event yields are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W ^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluino), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The confidence levels are calculated for all simplified models. For each model, the observed and expected values are given. The simplified model is for direct production of gluinos that decay into t tbar t tbar chi1^0 chi1^0 (see Fig. 5a in the paper). This particular model assumes that top quark is much heavier than gluino.

The confidence levels are calculated for all simplified models. For each model, the observed and expected values are given. The simplified model is for direct production of squarks that decay into two steps into q q W Z W Z chi1^0 chi1^0 (see Fig. 6c in the paper).

The confidence levels are calculated for all simplified models. For each model, the values are given for the five signal regions and their combination. The simplified model is for direct pair-production of gluinos that decay via a two-step process into q q q q W Z W Z chi1^0 chi1^0 (see Fig. 6b in the paper).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos that decay via sleptons into q q q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6d in the paper).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct pair-production of gluinos. A gluino decays into t stop. Consequently, a top squark squark decays into b chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 5b in the paper). This particular model assumes that m(stop) < m(gluion), m(chi1^0)=6 GeV, and m(chi1^(+-))=118 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos. A gluino decays into t c chi1^0 (see Fig. 5c in the paper). This particular model assumes that m(chi1^0) = m(stop) - 20 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7b in the paper). This particular model assumes that m(chi1^0)=2(chi1^0).

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of bottom squarks. A bottom squark decays into t chi1^(+-) and chi1^(+-) --> W^(+-) chi1^0 (see Fig. 7a in the paper). This particular model assumes that m(chi1^0)=60 GeV.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of squarks. Squarks decay into q q l l (l l) chi1^0 chi1^0 + neutrinos (see Fig. 6e in the paper).

The confidence levels are calculated for all GMSB models (see Fig. 8c in the paper). For each model, the expected and observed values are given. The model assumes mmess=250 TeV, m5=3, mu>0, and Cgrav=1.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos and top squarks. Top squarks undergo R-parity violating decays into bs and gluinos decay into t stop (see Fig. 5d in the paper).

The confidence levels are calculated for all mSUGRA/CMSSM models with bRPV (see Fig. 8b in the paper). For each model, the expected and observed values are given. The model assumes tan(beta)=30, A0=2m0, mu>0, and bRPV.

The confidence levels are calculated for all simplified extra dimension model (see Fig. 8d in the paper). For each model, the expected and observed values are given.

The confidence levels are calculated for all simplified models. For each model, the expected and observed values are given. The simplified model is for direct production of gluinos that decay into q q q q W W chi1^0 chi1^0 (see Fig. 6a in the paper).

The confidence levels are calculated for all mSUGRA models (see Fig. 8a in the paper). For each model, the expected and observed values are given. The model assumes tan(beta)=30, A0=2m0, and mu>0.

Absolute differential cross sections as a function of the transverse momentum of the Z boson candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the Z boson candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the Z boson candidate at particle level.

Absolute differential cross sections as a function of the transverse momentum of the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the recoiling jet at particle level.

Absolute differential cross sections as a function of the absolute pseudorapidity of the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the absolute pseudorapidity of the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the absolute pseudorapidity of the recoiling jet at particle level.

Absolute differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at parton level.

Absolute differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at particle level.

Absolute differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at parton level.

Absolute differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at particle level.

Absolute differential cross sections as a function of the invariant mass of the three-lepton system at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the three-lepton system at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the three-lepton system at parton level.

Absolute differential cross sections as a function of the invariant mass of the three-lepton system at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the three-lepton system at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the three-lepton system at particle level.

Absolute differential cross sections as a function of the transverse momentum of the top candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the top candidate at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the top candidate at parton level.

Absolute differential cross sections as a function of the transverse momentum of the top candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the top candidate at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the transverse momentum of the top candidate at particle level.

Absolute differential cross sections as a function of the invariant mass of the top-Z system at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the top-Z system at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the top-Z system at parton level.

Absolute differential cross sections as a function of the invariant mass of the top-Z system at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the top-Z system at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the invariant mass of the top-Z system at particle level.

Absolute differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the spectator quark at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the spectator quark at parton level.

Covariance matrix for the measurement of the differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the spectator quark at parton level.

Absolute differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the recoiling jet at particle level.

Covariance matrix for the measurement of the differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the recoiling jet at particle level.

Normalized differential cross sections as a function of the transverse momentum of the Z boson candidate at parton level.

Normalized differential cross sections as a function of the transverse momentum of the Z boson candidate at particle level.

Normalized differential cross sections as a function of the transverse momentum of the recoiling jet at parton level.

Normalized differential cross sections as a function of the absolute pseudorapidity of the recoiling jet at particle level.

Normalized differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at parton level.

Normalized differential cross sections as a function of the difference in azimuthal angle of the leptons, associated to the Z boson candidate at particle level.

Normalized differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at parton level.

Normalized differential cross sections as a function of the transverse momentum of the leptons, associated to the top candidate at particle level.

Normalized differential cross sections as a function of the invariant mass of the three-lepton system at parton level.

Normalized differential cross sections as a function of the invariant mass of the three-lepton system at particle level.

Normalized differential cross sections as a function of the transverse momentum of the top candidate at parton level.

Normalized differential cross sections as a function of the transverse momentum of the top candidate at particle level.

Normalized differential cross sections as a function of the invariant mass of the top-Z system at parton level.

Normalized differential cross sections as a function of the invariant mass of the top-Z system at particle level.

Normalized differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the spectator quark at parton level.

Normalized differential cross sections as a function of the cosine of the top polarization angle, measured in respect to the recoiling jet at particle level.

Likelihood scan of the top quark spin asymmetry.

Distribution of $m_{T}(W)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $M_{3}$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $m(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(l,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Distribution of $\Delta R(j,\gamma)$ in the $N_{jet}\geq 3$ signal region.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for electrons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Fit result of the multijet template obtained with loosely isolated leptons and the electroweak background to the measured $m_{T}(W)$ distribution with isolated leptons in the $N_{jet}=2$, $N_{b jet}=0$ selection for muons.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the e channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Distribution of the invariant mass of the lepton and the photon ($m(l,\gamma)$) in the $N_{jet}\geq 3$, $N_{b jet}=0$ selection for the $\mu$ channel.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the control regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

Predicted and observed yields in the signal regions in the $N_{jet}= 3$ and $\geq 4$ seletions using the post-fit values of the nuisance parameters.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

The measured inclusive ttgamma cross section in the fiducial phase space compared to the prediction from simulation using Madgraph_aMC@NLO at a center-of-mass energy of 13 TeV.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

Summary of the measured cross section ratios with respect to the NLO cross section prediction for signal regions binned in the electron channel, muon channel and the combined single lepton measurement.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $p_{T}(\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $|\eta(\gamma)|$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

The unfolded differential cross sections for $\Delta R(l,\gamma)$ and the comparison to simulations.

Summary of the one-dimensional intervals at 68 and 95% CL.

Summary of the one-dimensional intervals at 68 and 95% CL.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR3 signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the electron channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

The observed and predicted post-fit yields for the combined Run 2 data set in the SR4p signal region for the muon channel.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional profiled scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the one-dimensional scan for the Wilson coefficient $c_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Negative log-likelihood ratio values with respect to the best fit value of the two-dimensional scan for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $ee$ channel, after the fit to the data.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $ee$ channel, after the fit to the data.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $ee$ channel, after the fit to the data.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $\mu\mu$ channel, after the fit to the data.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $\mu\mu$ channel, after the fit to the data.

Observed and predicted event yields as a function of $p_{T}(\gamma)$ in the $\mu\mu$ channel, after the fit to the data.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Measured inclusive fiducial $tt\gamma$ production cross section in the dilepton final state for the different dilepton-flavour channels and combined.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ .

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$. The values provided in the table are not divided by the bin width.

Absolute differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\gamma)$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\eta |(\gamma)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, \ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta R(\gamma, \ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\gamma, b)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $|\Delta\eta(\ell\ell)|$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $\Delta \phi(\ell\ell)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell\ell) $. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ . The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of min $\Delta R(\ell, j)$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ .

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$. The values provided in the table are not divided by the bin width.

Normalized differential $tt\gamma$ production cross section as a function of $p_{T}(j_{1})$ . The values provided in the table are not divided by the bin width.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\gamma)$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\eta |(\gamma)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, \ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{1})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta R(\gamma, \ell_{2})$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\gamma, b)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $|\Delta\eta(\ell\ell)|$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $\Delta \phi(\ell\ell)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell\ell) $.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(\ell_{1})+p_{T}(\ell_{2})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of min $\Delta R(\ell, j)$.

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the systematic uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Correlation matrix of the statistical uncertainty in the absolute differential cross section as a function of $p_{T}(j_{1})$ .

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is fixed to zero in the fit.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c^{I}_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the photon pT distribution from the dilepton analysis. The value of $c_{tZ}$ is profiled in the fit.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

Negative log-likelihood difference from the best-fit value for the one-dimensional scans of the Wilson coefficient $c^{I}_{tZ}$, using the combination of photon pT distributions from the dilepton and lepton+jets analyses. The value of $c_{tZ}$ is profiled in the fit.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton measurement.

Negative log-likelihood difference from the best-fit value as a function of Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$ from the interpretation of the dilepton and lepton+jets measurements combined.

One-dimensional 68 and 95% CL intervals obtained for the Wilson coefficients $c_{tZ}$ and $c^{I}_{tZ}$, using the photon $p_{T}$ distribution from the dilepton analysis, or the combination of photon pT distributions from the dilepton and lepton+jets analyses.

The measured fiducial cross sections are corrected to the dressed level. The ratio of $C_{WZ}^{\textrm{dressed}}/C_{WZ}^{\textrm{Born}}$ factors presented in this table can be used to correct fiducial integrated cross sections from dressed to Born level.

Cross section extrapolated to total phase space and all W and Z boson decays. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the theory uncertainty and the third is the luminosity uncertainty.

The total cross section is measured at dressed level and can also be corrected to Born level use this acceptance correction factor.

Ratio of fiducial cross sections measured for $W^{+} Z$ and $W^{-} Z$ production. The first systematic uncertainty is the combined systematic uncertainty excluding the luminosity uncertainty, the second is the luminosity uncertainty.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the VBS fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Observed and expected upper limits at $95\%$ CL in fb on the fiducial cross section $\sigma^{\mathrm{fid.}}_{W^{\pm} Zjj \textrm{-EW} \rightarrow \ell^{'} \nu \ell \ell}$, multiplied by the $W$ and $Z$ branching ratios in a single leptonic channel with muons or electrons in the aQGC fiducial phase space. Values obtained with or without subtraction of the $tZj$ contribution are presented. The $1$ $\sigma$ and $2$ $\sigma$ uncertainty intervals around the expected limits are also indicated.

Expected and observed one-dimensional 95% Confidence Level intervals on the anomalous couplings parameters. Anomalous couplings are introduced as form factors using a cut-off scale $\Lambda_{\mathrm{co}}$.

Expected and observed one-dimensional intervals at 95% Confidence Level on the Effective Field Theory (EFT) parameters.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Measured normalised fiducial cross section in all $\ell'^\pm \nu \ell^+ \ell^-$ channels combined, where $\ell, \ell' = e, \mu$. The first systematic uncertainty is the combined systematic uncertainty excluding theory and luminosity uncertainties, the second is the luminosity uncertainty. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$. The last bin is a cross section for all events above the lower end of the bin.

Ratio of $W^{+}Z$ over $W^{-}Z$ differential fiducial cross sections measured in all $\ell'^\pm \nu \ell^+ \ell'^-$ channels combined, where $\ell, \ell' = e, \mu$.

Measured fiducial cross section in fb as a function of Yll.

Measured fiducial cross section in fb/GeV as a function of the leading jet pT, PT(JET1).

Measured normalised fiducial cross section as a function of Njet. Jet PT>25 GeV for |eta|<2.4 and PT>30 GeV for 2.4<|eta|<4.5.

Measured normalised fiducial cross section in 1/GeV as a function of pTH.

Measured normalised fiducial cross section as a function of Yll.

Measured normalised fiducial cross section in 1/GeV as a function of the leading jet pT, PT(JET1).

Jet veto efficiency as a function of PT(JET1) pT threshold.

Full correlation matrix for the measured differential cross section as a function of Njet, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of pTH, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of Yll, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured differential cross section as a function of the leading jet pT, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of Njet, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of pTH, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of Yll, taking into account statistical and systematic uncertainties.

Full correlation matrix for the measured normalised differential cross section as a function of the leading jet pT, taking into account statistical and systematic uncertainties.

Fiducial cross section of H+0-jet events in femtobarn for different values of PT(JET1) pT threshold with the uncertainties for each bin given in absolute values and in percent. The asterisk for the 25 GeV column header indicates that the results are for a mixed jet pT threshold, which is raised from 25 GeV to 30 GeV for jets with 2.5 < |eta| < 4.5.

Correction factors from inclusive parton level to fiducial particle level for bins of Njet derived with POWHEG NNLOPS+Pythia8. Uncertainties due to the non-perturbative correction are dominant for the correction factors.

Correction factors from inclusive parton level to fiducial particle level for bins of the leading jet pT derived with POWHEG NNLOPS+Pythia8. Uncertainties due to the non-perturbative correction are dominant for the correction factors.

Correction factors from inclusive parton level to fiducial particle level for the jet-veto efficiency with different jet pT thresholds derived with POWHEG NNLOPS+Pythia8. The asterisk on the 25 GeV bin label indicates that the results are for a mixed pT threshold, which is raised from 25 GeV to 30 GeV for jets with 2.5 < |eta| < 4.5, corresponding to the selection used to define the signal regions for the analysis.

The cross-section in bins of the di-$J/\psi$ transverse momentum in the forward rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The cross-section in bins of the di-$J/\psi$ invariant mass in the central rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The cross-section in bins of the di-$J/\psi$ invariant mass in the forward rapidity region, assuming unpolarised $J/\psi$ mesons and excluding the $J/\psi$ spin-alignment systematic uncertainty. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $\Delta y$ distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $\Delta \phi$ distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $m$($J/\psi$ $J/\psi$) distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The total cross-section, DPS cross-section, $f_{\mathrm{DPS}}$, and average acceptance correction in the muon fiducial volume for the $p_{\mathrm{T}}$($J/\psi$ $J/\psi$) distribution. The branching fraction and luminosity uncertainties are not included in the systematic uncertainty as they are constant at 1.1$\%$ and 1.9$\%$ respectively.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the sub-leading $J/\psi$ transverse momentum in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the sub-leading $J/\psi$ transverse momentum in the forward rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ transverse momentum in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ transverse momentum in the forward rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ invariant in the central rapidity region.

The average acceptance weight for each spin-alignment scenario relative to the unpolarised case in bins of the di-$J/\psi$ invariant in the forward rapidity region.