Bayesian upper exclusion limits on the ratio $g_{W'}/g_{W}$ for an SSM-like W$\prime$ boson are shown. The unity coupling ratio (blue dotted curve) corresponds to the SSM common benchmark. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian lower exclusion limits on the NUGIM G(221) mixing angle $\cot(\theta_{E})$ are shown as a function of the W$\prime$ boson mass. The theoretically excluded region is shaded in grey. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper exclusion limits at 95% CL on the product of the production cross section and branching fraction of a QBH in an associated $ au$ lepton and neutrino final state. Minimum threshold masses $m_{th}$ of up to 6.6 TeV are excluded at 95% CL. The observed limit (solid line) is obtained from the intersection with the LO QBH cross section (blue dotted curve). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper limits at 95% CL on the cross section of the process $pp\rightarrow\tau\nu$ mediated via LQ exchange in the t-channel. The inner (green) band and the outer (yellow) band indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The predicted LQ cross section at LO in the three coupling benchmark scenarios is depicted in different colors for $g_{U}=1$. The uncertainty bandy correspond to the sum in quadrature of PDF and scale variations. The first benchmark scenario considers only couplings to left-handed SM fermions (i.e. $\beta_{\text{R}}^{ij}=0$) and is referred to as "best fit LH". The second benchmark, referred to as "best fit LH+RH", considers $|\beta_{\text{R}}^{\text{b}\tau}|=1$ and all other $\beta_{\text{R}}^{ij}=0$. In the third "democratic" benchmark, equal couplings only to LH fermions are assumed, i.e. $\beta_{\text{L}}^{ij}=1$ and $\beta_{\text{R}}^{ij}=0$ for all $i$ and $j$.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH+RH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the democratic scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Bayesian upper exclusion limits at 95% CL on each of the Wilson coefficients described by the EFT model based on 2016-2018 data. The three different coupling types represent a left-handed vector coupling ($\epsilon^{cb}_{L}$), tensor-like coupling ($\epsilon^{cb}_{T}$), and scalar-tensor-like coupling ($\epsilon^{cb}_{S_{L}}$). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Summary of exclusion limits (expected and observed) calculated at 95% CL for full Run-2 CMS data.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning from Figure 4.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning used in Figure 4.

Predicted signal yields for the 2017 data-taking period, corresponding to 41.3 fb$^{-1}$, after the application of each search requirement (cumulative) for various signal hypothesis. The requirements listed are presented as total efficiencies w.r.t. the previous selection step.

Final state radiation correction used in the $\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-p_{T}^{Z}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Final state radiation correction used in the $y^{Z}-\phi_{\eta}^{*}$ cross-section measurement. The first uncertainty is statistical and the second is systematic.

Correlation matrix of statistical uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of statistical uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $y^Z$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for one-dimensional $\phi_{\eta}^{*}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-p_{T}^{Z}$ measurement.

Correlation matrix of efficiency uncertainty for two-dimensional $y^Z-\phi_{\eta}^{*}$ measurement.

Measured total $Z$-boson cross-section for different datasets. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $y^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured single differential cross-sections in interval regions of $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Measured double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$. The first uncertainty is statistical, the second systematic, and the third is due to the luminosity.

Systematic uncertainties in the single differential cross-sections in interval regions of $y^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the single differential cross-sections in interval regions of $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $p_{T}^{Z}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Systematic uncertainties in the double differential cross-sections in interval regions of $y^{Z}$ and $\phi_{\eta}^{*}$, presented in percentage. The contributions from efficiency (Eff), background (BKG), final state radiation (FSR), closure test (Closure), and alignment and calibration (Alignment) are shown.

Upper limits on the production cross section times branching fraction of the b* RH hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the b* VL hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the B+b hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the B+t hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

The measured differential cross sections $\rm{d}\sigma/\rm{d}|\eta|$ of $D^{*\pm}$ and $D^\pm$ production with $20<p_T<100\,$GeV. The first and second errors are the statistical and systematic uncertainties, respectively. The systematic uncertainty fractions corresponding to the tracking ($\delta_2$) uncertainties (Table 2 of the paper) are strongly correlated. The fully correlated uncertainties linked with the luminosity measurement ($3.5\%$) and branching fractions ($1.5\%$ and $2.1\%$ for $D^{*\pm}$ and $D^\pm$, respectively) are not shown.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $46\textrm{ GeV} \leq m_{\ell\ell} < 66\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $66\textrm{ GeV} \leq m_{\ell\ell} < 116\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,\mathrm{d}\sigma/\mathrm{d}\phi^*_{\eta}$ in each bin of $\phi^*_{\eta}$ for the electron and muon channels separately (for various particle-level definitions) and for the Born-level combination in the kinematic region $116\textrm{ GeV} \leq m_{\ell\ell} < 150\textrm{ GeV},\ |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins of $\phi^*_{\eta}$) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $(1/\sigma)\,d\sigma/dp_T^{\ell\ell}$ in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 0.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.4 \leq |y_{\ell\ell}| < 0.8$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.8 \leq |y_{\ell\ell}| < 1.2$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.2 \leq |y_{\ell\ell}| < 1.6$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 1.6 \leq |y_{\ell\ell}| < 2.0$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 2.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 12 \textrm{ GeV} \leq m_{\ell\ell} < 20 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 20 \textrm{ GeV} \leq m_{\ell\ell} < 30 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 30 \textrm{ GeV} \leq m_{\ell\ell} < 46 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 46 \textrm{ GeV} \leq m_{\ell\ell} < 66 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 66 \textrm{ GeV} \leq m_{\ell\ell} < 116 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

The values of $d\sigma/dp_T^{\ell\ell}$ in pb in each bin of $p_T^{\ell\ell}$ for the electron and muon channels separately (for various generator-level definitions) and for the Born-level combination in the kinematic region $ 116 \textrm{ GeV} \leq m_{\ell\ell} < 150 \textrm{ GeV},\ 0.0 \leq |y_{\ell\ell}| < 2.4$. The associated statistical and systematic (both uncorrelated and correlated between bins) are provided in percentage form. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $p_T^{\ell\ell}$ bins, pertains to these measurements.

Fiducial cross sections at dressed level in the electron- and muon-pair channels. The statistical and systematic uncertainties are given as a percentage of the cross section. Leptons are required to have $p_T>20$ GeV and $|\eta|<2.4$. An additional uncertainty of 2.8% on the integrated luminosity, which is fully correlated between channels and among all $m_{\ell\ell}$ bins, pertains to these measurements.

The total uncertainty covariance matrix for measured differential cross sections in $m_{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The total uncertainty covariance matrix for measured differential cross sections in $p_\mathrm{T}^{4\ell}$ bins in fiducial volume. The matrix elements are in unit of $[$fb/TeV$]^2$.

The stransverse mass mT2 in the W+jets validation region VR2 for the two-tau MVA analysis.

The BDT response prior to applying the SR BDT requirement for the two-tau MVA analysis.

The missing transverse energy ETmiss in the two-tau MVA signal region.

The effective mass meff in the two-tau MVA signal region.

The stransverse mass mT2 in the two-tau MVA signal region.

The ratio R2 in the signal region SR2l-1a SF from the two-lepton, opposite-sign analysis, prior to the requirement on this variable.

The ratio R2 in the signal region SR2l-1a DF from the two-lepton, opposite-sign analysis, prior to the requirement on this variable.

The super razor quantity MdR in the signal region SR2l-1b SF from the two-lepton, opposite-sign analysis, prior to the requirement on this variable.

The super razor quantity MdR in the signal region SR2l-1b DF from the two-lepton, opposite-sign analysis, prior to the requirement on this variable.

The separation in phi between the leading jet and the missing transverse momentum dPhi(jet 1,ETmiss) in the ISR validation region of the two-lepton, same-sign MVA analysis.

The transverse mass using the leading lepton mTlep1 in the ISR validation region of the two-lepton, same-sign MVA analysis.

The transverse mass using the second leading lepton mTlep2 in the no-ISR validation region of the two-lepton, same-sign MVA analysis.

The scalar sum of the pT of the leptons and jets, HT in the no-ISR validation region of the two-lepton, same-sign MVA analysis.

The three-lepton invariant mass mlll in the validation region VR3l-0a from the three-lepton analysis.

The missing transverse energy ETmiss in the validation region VR3l-0b from the three-lepton analysis.

The transverse momentum of the leading jet pTjet1 in the validation region VR3l-1a from the three-lepton analysis.

The missing transverse energy ETmiss in the validation region VR3l-1b from the three-lepton analysis.

The missing transverse energy ETmiss in the signal region SR3l-0a from the three-lepton analysis.

The three-lepton invariant mass mlll in the signal region SR3l-0b from the three-lepton analysis.

The separation in phi between the leading jet and the missing transverse momentum dPhi(jet 1,ETmiss) in the signal region SR3l-1a from the three-lepton analysis.

The transverse momentum of the leading jet pTjet1 in the signal region SR3l-1b from the three-lepton analysis.

The transverse momentum of the second leading jet pTjet2 in the VV validation region from the same-sign two-lepton VBF analysis.

The invariant mass of the two leading jets mjj in the VV validation region from the same-sign two-lepton VBF analysis.

The transverse momentum of the second leading lepton pTlep2 in the Fakes validation region from the same-sign two-lepton VBF analysis.

The missing transverse momentum ETmiss in the Fakes validation region from the same-sign two-lepton VBF analysis.

The invariant mass of the two leading jets mjj in the same-sign, two lepton VBF signal region.

The separation in eta between the two leading jets dEtajj in the same-sign, two lepton VBF signal region.

The missing transverse energy ETmiss in the same-sign, two lepton VBF signal region.

The transverse momentum of the second leading lepton pTlep2 in the same-sign, two lepton VBF signal region.

The 95% CL exclusion limits (expected and observed) on the cross-section for production of left- and right-handed stau pairs for various LSP masses.

The 95% CL exclusion limits (expected and observed) on the cross-section for CHARGINO1+ CHARGINO1- production with SLEPTONL-mediated decays, where the LSP is massless and the intermediate slepton mass is set to 5%, 25%, 50%, 75%, and 95% of the CHARGINO1+- mass (x).

The expected 95% CL exclusion limits for CHARGINO1+ CHARGINO1- production with SLEPTONL-mediated decays as a function of the CHARGINO1+- and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+ CHARGINO1- production with SLEPTONL-mediated decays as a function of the CHARGINO1+- and NEUTRALINO1 masses.

The expected and observed 95% CL exclusion limits on the cross-section for VBF CHARGINO1+-CHARGINO1+- production, as a function of the CHARGINO1-NEUTRALINO1 mass difference, for a CHARGINO1+- of 110 GeV.

The 95% CL exclusion limits (expected and observed) on the cross-section for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays, where the LSP is massless and the intermediate slepton mass is set to 5%, 25%, 50%, 75%, and 95% of the NEUTRALINO2 mass (x).

The expected 95% CL exclusion limits for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for NEUTRALINO2 NEUTRALINO3 production with SLEPTONR-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The 95% CL exclusion limits (expected and observed) on the cross-section for CHARGINO1+- NEUTRALINO2 production with SLEPTONL-mediated decays, where the LSP is massless and the intermediate slepton mass is set to 5%, 25%, 50%, 75%, and 95% of the CHARGINO1+- mass (x).

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.50) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.50) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.95) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with SLEPTONL-mediated decays (x=0.95) as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The expected 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with STAU-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The observed 95% CL exclusion limits for CHARGINO1+-NEUTRALINO2 production with STAU-mediated decays as a function of the NEUTRALINO2 and NEUTRALINO1 masses.

The expected 95% CL exclusion limits in the pMSSM scenario.

The observed 95% CL exclusion limits in the pMSSM scenario.

The expected 95% CL exclusion limits in the NUHM2 scenario.

The observed 95% CL exclusion limits in the NUHM2 scenario.

The expected 95% CL exclusion limits in the GMSB scenario.

The observed 95% CL exclusion limits in the GMSB scenario.

The best expected signal region in the direct STAUL STAUL SUSY model, where "1" indicates the two-tau MVA signal region is used, and "2" indicates the previously published signal regions are used.

The number of generated events in the direct STAUL STAUL SUSY model.

The cross-section in the direct STAUL STAUL SUSY model.

The experimental uncertainty in the two-tau MVA signal region in the direct STAUL STAUL SUSY model.

The expected CLs in the two-tau MVA signal region in the direct STAUL STAUL SUSY model.

The observed CLs in the two-tau MVA signal region in the direct STAUL STAUL SUSY model.

The 95% CL upper limit on the SUSY cross-section in the CHARGINO1+CHARGINO1- SUSY model using the opposite-sign, two-lepton analysis.

The best expected signal region in the CHARGINO1+CHARGINO1- SUSY model using the opposite-sign, two-lepton analysis, where "1" denotes SR2l-1a and "2" denotes SR2l-1b.

The number of generated events in the CHARGINO1+CHARGINO1- SUSY model.

The total cross-section in the CHARGINO1+CHARGINO1- SUSY model.

The acceptance for the opposite-sign, two-lepton signal region SR2l-1b in the CHARGINO1+CHARGINO1- SUSY model.

The efficiency for the opposite-sign, two-lepton signal region SR2l-1b in the CHARGINO1+CHARGINO1- SUSY model.

The experimental uncertainty for the opposite-sign, two-lepton signal region SR2l-1b in the CHARGINO1+CHARGINO1- SUSY model.

The expected CLs for the opposite-sign, two-lepton signal region SR2l-1b in the CHARGINO1+CHARGINO1- SUSY model.

The observed CLs for the opposite-sign, two-lepton signal region SR2l-1b in the CHARGINO1+CHARGINO1- SUSY model.

The number of generated events in the VBF CHARGINO1+- CHARGINO1+- VBF SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The total cross-section in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The acceptance for the same-sign, two-lepton VBF signal region in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The efficiency for the same-sign, two-lepton VBF signal region in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The experimental uncertainty for the same-sign, two-lepton VBF signal region in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The expected CLs for the same-sign, two-lepton VBF signal region in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The observed CLs for the same-sign, two-lepton VBF signal region in the VBF CHARGINO1+- CHARGINO1+- SUSY model, where m(CHARGINO1+-)=m(NEUTRALINO2) and x=0.5.

The best expected signal region in the same-sign, two-lepton MVA analysis for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5), where "1" indicates SR dM20, "2" indicates SR dM35, "3" indicates SR dM65, and "4" indicates SR dM100.

The number of generated events in the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The total cross-section in the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The experimental uncertainty in the same-sign, two-lepton MVA signal region SR dM20 for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The expected CLs in the same-sign, two-lepton MVA signal region SR dM20 for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The observed CLs in the same-sign, two-lepton MVA signal region SR dM20 for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The acceptance in the three-lepton signal region SR3l-1b for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The efficiency in the three-lepton signal region SR3l-1b for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The experimental uncertainty in the three-lepton signal region SR3l-1b for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The expected CLs in the three-lepton signal region SR3l-1b for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The observed CLs in the three-lepton signal region SR3l-1b for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.5).

The best expected signal region in the same-sign, two-lepton MVA analysis for the CHARGINO1+-NEUTRALINO2 SUSY model (x=0.95), where "1" indicates SR dM20, "2" indicates SR dM35, "3" indicates SR dM65, and "4" indicates SR dM100.

The 95% CL upper limit on the SUSY cross-section in the CHARGINO1+-NEUTRALINO2 SUSY model with STAU-mediated decays.

The 95% CL upper limit on the SUSY cross-section in the NEUTRALINO2 NEUTRALINO3 SUSY model.

Distribution of $m_{{\rm T}2}(\ell, \tau_{\mathrm{had}})$ for events passing all the lepton-hadron HM signal region requirements, except that on the variable itself. The SM background process have been normalised using a fit to the data observed in CRs.

Expected exclusion contour at 95% CL in the (scalar top, scalar tau) mass plane from the combination of all selections.

Observed exclusion contour at 95% CL in the (scalar top, scalar tau) mass plane from the combination of all selections.

The region / analysis with the best expected upper limit on the signal cross-section (95% CL) as a function of the stop and stau masses. 1: SRLM, 2: SRHH, 3: two-lepton channel analysis, 5: SRHM.

The 95% CL excluded cross section times branching ratio, using the best expected SR / analysis for each mass point.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (337,148) GeV for the hadron-hadron SR. The production cross section for this signal point is $1.00 \pm 0.14$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have $E_T^{miss}>60$ GeV or one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.883) there are 100000 events remaining.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (195,87) GeV for the lepton-hadron LM SR. The production cross section for this signal point is $21 \pm 3$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have $E_T^{miss}<60$ GeV and one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.117) there are 50000 events remaining before applying the event weights.

The cut flow on the raw generated events for the signal point (scalar top mass, scalar tau mass) = (391,337) GeV for the lepton-hadron HM SR. The production cross section for this signal point is $0.41 \pm 0.06$ pb. Quality Cuts indicate a set of cuts applied to ensure good quality events in data. A full description of the cuts used is given in the text. The original input file has a filter applied to it that ensures that all the events have either $E_T^{miss}>150$ GeV or at least one electron or muon with $p_\mathrm{T} > 20$ GeV at truth level. After the filter is applied (efficiency = 0.925) there are 50000 events remaining before applying the event weights.