Upper limits on the production cross section times branching fraction of the b* RH hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the b* VL hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the B+b hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Upper limits on the production cross section times branching fraction of the B+t hypothesis at a 95% CL. Dashed colored lines show the expected limits from the l+jets and all-hadronic channels, where the latter start at resonance masses of 1.4 TeV. The observed and expected limits from the combination are shown as solid and dashed black lines, respectively. The green and yellow bands show the 68 and 95% confidence intervals on the combined expected limits.

Bayesian upper exclusion limits on the ratio $g_{W'}/g_{W}$ for an SSM-like W$\prime$ boson are shown. The unity coupling ratio (blue dotted curve) corresponds to the SSM common benchmark. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian lower exclusion limits on the NUGIM G(221) mixing angle $\cot(\theta_{E})$ are shown as a function of the W$\prime$ boson mass. The theoretically excluded region is shaded in grey. The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper exclusion limits at 95% CL on the product of the production cross section and branching fraction of a QBH in an associated $ au$ lepton and neutrino final state. Minimum threshold masses $m_{th}$ of up to 6.6 TeV are excluded at 95% CL. The observed limit (solid line) is obtained from the intersection with the LO QBH cross section (blue dotted curve). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Bayesian upper limits at 95% CL on the cross section of the process $pp\rightarrow\tau\nu$ mediated via LQ exchange in the t-channel. The inner (green) band and the outer (yellow) band indicate the regions containing 68 and 95%, respectively, of the distribution of limits expected under the background-only hypothesis. The predicted LQ cross section at LO in the three coupling benchmark scenarios is depicted in different colors for $g_{U}=1$. The uncertainty bandy correspond to the sum in quadrature of PDF and scale variations. The first benchmark scenario considers only couplings to left-handed SM fermions (i.e. $\beta_{\text{R}}^{ij}=0$) and is referred to as "best fit LH". The second benchmark, referred to as "best fit LH+RH", considers $|\beta_{\text{R}}^{\text{b}\tau}|=1$ and all other $\beta_{\text{R}}^{ij}=0$. In the third "democratic" benchmark, equal couplings only to LH fermions are assumed, i.e. $\beta_{\text{L}}^{ij}=1$ and $\beta_{\text{R}}^{ij}=0$ for all $i$ and $j$.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the LH+RH scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Expected and observed lower limits of the LQ mass as a function of the coupling $g_{U}$ in the democratic scenario. The blue band shows the 68% and 95% regions of $g_{U}$ preferred by the fit to the b anomalies data.

Bayesian upper exclusion limits at 95% CL on each of the Wilson coefficients described by the EFT model based on 2016-2018 data. The three different coupling types represent a left-handed vector coupling ($\epsilon^{cb}_{L}$), tensor-like coupling ($\epsilon^{cb}_{T}$), and scalar-tensor-like coupling ($\epsilon^{cb}_{S_{L}}$). The 68 and 95% quantiles of the limits are represented by the green and yellow bands, respectively.

Summary of exclusion limits (expected and observed) calculated at 95% CL for full Run-2 CMS data.

Background prediction and observed data yields in the signal region bins. The background yields are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning from Figure 4.

Matrix of covariance coefficients between signal region bins. The coefficients are obtained from the background-only fit and serve as input to the simplified likelihood reinterpretation scheme. The naming of the bins is "year_binnumber", following the binning used in Figure 4.

Predicted signal yields for the 2017 data-taking period, corresponding to 41.3 fb$^{-1}$, after the application of each search requirement (cumulative) for various signal hypothesis. The requirements listed are presented as total efficiencies w.r.t. the previous selection step.

Expected yields for different processes after several selection stages. The preselection requires two leptons and at least one photon with $\mathrm{p_\mathrm{T}}$ larger than 25, 20, and 25 GeV, respectively; in addition the dilepton $\mathrm{p_\mathrm{T}}$ must be larger than 60 GeV, and the $\mathrm{p_\mathrm{T}}^{\mathrm{miss}}$ larger than 70 GeV. The signal prediction corresponds to $0.1 \sigma_{\mathrm{\mathrm{ZH}}}$ at $m_{H}$ = 125 GeV.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

Expected and observed upper limits at 95\% confidence level on the product of $\sigma_{\mathrm{\mathrm{ZH}}}$ and $\mathcal{B}$($\mathrm{H}$ -> $\mathrm{invisible}+\gamma$) as a function of $m_{\mathrm{\mathrm{H}}}$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the $\mathrm{e}\mu$ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the WZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the ZZ control region.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|<1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

$\mathrm{M_{\mathrm{T}}}$ distribution for the signal region, events with $|\eta_{\gamma}|>1$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Muon reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Electron reconstruction, identification, and isolation efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Photon efficiency as a function of $|\eta|$ and $\mathrm{p_\mathrm{T}}$.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

Covariance matrix for all bins used in the analysis. There are 45 bins in total, 15 for every data-taking year. For every year, the first bin corresponds to events in the $\mathrm{e}\mu$ control region, the following five bins correspond to events with $|\eta^\gamma|< 1$ in the signal region, the next five bins correspond to events with $|\eta^\gamma|> 1$ in the signal region, the next two bins correspond to events in the WZ control region, and finally the last two bins correspond to events in the ZZ control region.

The $L_{T}$ distribution in the MisID-enriched region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L below-Z signal region. The last bin contains the overflow events.

The $M_{T}$ distribution in the 3L on-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L above-Z signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 3L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF0 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF1 signal region. The last bin contains the overflow events.

The $L_{T}+p^{miss}_{T}$ distribution in the 4L OSSF2 signal region. The last bin contains the overflow events.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 3L(ee) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{20}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dielectron $M_{OSSF}^{300}$ distribution in the 4L(ee) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {ee})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 0B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, 400<$S_{T}$<800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 3L($\mu\mu$) 1B, $S_{T}$>800 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$<400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 0B, $S_{T}$>400 GeV signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{20}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The dimuon $M_{OSSF}^{300}$ distribution in the 4L($\mu\mu$) 1B signal region. The last bin does not contain the overflow events. The signal is shown with $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$=0.05.

The 95% confidence level exclusion limits for the flavor-democratic scenario on the total production cross section of heavy fermion pairs.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {ee})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(S) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on the product of the total production cross section of tt$\phi$(PS) and $\mathcal{B}(\phi - {\mu\mu})$.

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {ee})$ for tt$\phi$(PS).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(S).

The 95% confidence level exclusion limits on $g_{t}^2\mathcal{B}(\phi - {\mu\mu})$ for tt$\phi$(PS).

Product of the fiducial acceptance and the event selection efficiency for the type-III Seesaw signal model at various signal mass hypotheses calculated after all analysis selection requirements.

Product of the fiducial acceptance and the event selection efficiency for the tt$\phi$ signal models at various signal mass hypotheses calculated after all analysis selection requirements.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The normalized particle-level $\mathrm{t}\overline{\mathrm{t}}$ differential cross section in the fiducial region as a function of the XCone-jet mass.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the experimental uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the model uncertainties of Figure 2a is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the statistical uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the experimental uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

The covariance matrix containing the model uncertainties of Figure 2b is shown.

Observed yields and pre-fit background predictions for Njets 8-9.

Observed yields and pre-fit background predictions for Njets >=10.

Observed yields and pre-fit background predictions for aggregated bins.

Pre-fit background covariance matrix $\sigma_{xy}$ for the 174 analysis bins.

Pre-fit background correlation matrix $\rho_{xy}$ for the 174 analysis bins.

Observed yields and post-fit background predictions for Njets 2-3.

Observed yields and post-fit background predictions for Njets 4-5.

Observed yields and post-fit background predictions for Njets 6-7.

Observed yields and post-fit background predictions for Njets 8-9.

Observed yields and post-fit background predictions for Njets >=10.

Simulated signal yields for representative gluino signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative gluino signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model light-LSP points in the aggregate search regions. The uncertainties shown are statistical.

Simulated signal yields for representative squark signal model compressed points in the aggregate search regions. The uncertainties shown are statistical.

The 95% CL observed and expected upper limits on the production cross sections of the T1tttt signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1bbbb signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T1qqqq signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T5qqqqVV signal model as a function of the gluino and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2tt signal model as a function of the top squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2bb signal model as a function of the bottom squark and LSP masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

Exclusion limits assuming the approximate-NNLO+NNLL cross sections

The 95% CL observed and expected upper limits on the production cross sections of the T2qq signal model as a function of the LSP and light squark masses.

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (u d s c)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

Exclusion limits assuming the approximate-NNLO+NNLL cross sections (single flavor)

The observed significance of the SMS models for T1tttt as function of the gluino and LSP masses.

The observed significance of the SMS models for T1bbbb as function of the gluino and LSP masses.

The observed significance of the SMS models for T1qqqq as function of the gluino and LSP masses.

The observed significance of the SMS models for T5qqqqVV as function of the gluino and LSP masses.

The observed significance of the SMS models for T2tt as function of the top squark and LSP masses.

The observed significance of the SMS models for T2bb as function of the bottom squark and LSP masses.

The observed significance of the SMS models for T2qq as function of the LSP and light squark masses.

The efficiency times acceptance of the SMS models for T1tttt as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1bbbb as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T1qqqq as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T5qqqqVV as function of the gluino and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2tt as function of the top squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2bb as function of the bottom squark and LSP masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

The efficiency times acceptance of the SMS models for T2qq as function of the LSP and light squark masses. The efficiency times acceptance is given for the total signal across the set of 174 search regions.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for four representative gluino pair production signal models with m(gluino) ~ m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) >> m(LSP). Only statistical uncertainties are shown.

Absolute cumulative efficiencies in percent for each step of the event selection process, listed for three representative squark pair production signal models with m(squark) ~ m(LSP). Only statistical uncertainties are shown.

The $m_{W}^{T}$ distribution from data (points) and simulation (shaded histograms) in the 2j1t (left) and 3j1t (right) categories for the muon (upper) and electron (lower) channels. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 2j1t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and b jet momenta system (right), shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distributionfrom the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j1t category: the $p_{T}^{miss}$ in the transverse plane (left) and the value of the MVA b tagger discriminator when applied to the extra jet (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points andthe hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distributions of the two most discriminating variables from data (points) and simulation (shaded histograms) in the 3j2t category: the $|\eta|$ of the non-b-tagged jet $|\eta_{j^{'}}|$ (left) and the invariant mass of lepton and non-b-tagged jet system (right) are shown for the muon (upper) and electron (lower) channels, respectively. The vertical lines on the points and the hatched bands show the experimental and MC statistical uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the MC prediction.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Distribution of the multivariate discriminators, comparing data to simulation normalised after the fit procedure, for the muon channel on the left and for the electron channel on the right, for 2j1t (upper), 3j1t (middle), and 3j2t (lower). The vertical lines on the points and the hatched bands show the experimental and fit uncertainties, respectively. The expected distribution from the STq,b+STb,q processes (multiplied by a factor of 1000) is shown by the solid blue line. The lower panels show the ratio of the data to the fit.

Values of the third-row elements of the CKM matrix inferred from low-energy measurements with the respective values of the top quark decay branching fractions. The q in bs{V_{tq}} and \mathcal{B}(t o Wq) in the first column refers to b, s, and d quarks, according to the quark label shown in the header row.

For each of the production and decay vertices, the cross section times branching fraction for the corresponding signal process from simulation. The uncertainties shown includethose from the factorisation and renormalisation scales, the PDFs, and any experimental uncer-tainties, where appropriate.

The sources and relative values in percent of the systematic uncertainty in the measurement of the STb,b cross section. The uncertainties are broken up into profiled and nonprofiled sources.

The signal strengths obtained under SM assumptions.

Results obtained under SM assumptions.

Results obtained under first BSM scenario.

Results obtained under second BSM scenario.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the absolute cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of Z pt on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of |y(Z)| on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dimuons.

The relative statistical and systematic uncertainties in % from various sources for the normalized cross section measurements in bins of $\phi^{\scriptscriptstyle *}_\eta$ on dielectrons.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

The relative statistical and systematic uncertainties in % from various sources for the absolute double-differential cross section measurements in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using dressed level leptons. The cross sections are normalized by the bin width.

The measured normalized cross sections in bins of Z pt, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of Z pt in |y(Z)| bins, using dressed level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dimuon final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dielectron final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dielectron final state.

The measured absolute cross sections in bins of |y(Z)|, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured absolute cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are normalized by the bin width.

The measured absolute cross sections in bins of Z pt different |y(Z)| bins, using born level leptons. The cross sections are normalized by the bin width. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level.

The measured normalized cross sections in bins of Z pt, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of $\phi^{\scriptscriptstyle *}_\eta$, using born level leptons. The cross sections are divided by the bin width and then the distributions are normalized to 1.

The measured normalized cross sections in bins of |y(Z)|, using born level leptons.

The measured normalized cross sections (left) in bins of Z pt in |y(Z)| bins, using born level leptons. The first bin (0-1 GeV) is not shown as large differences were observed in aMC@NLO and POWHEG predictions at Born level. The cross sections are divided by the bin width and then the distributions are normalized to 1.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using dressed level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of |y(Z)| in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of $\phi^{\scriptscriptstyle *}_\eta$ in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0 < |y(Z)| < 0.4 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.4 < |y(Z)| < 0.8 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 0.8 < |y(Z)| < 1.2 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.2 < |y(Z)| < 1.6 bin in the dilepton final state.

Covariance matrix for normalized cross sections using born level leptons for all bins used in bins of Z pt for the 1.6 < |y(Z)| < 2.4 bin in the dilepton final state.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $+1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the observed limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with $-1\sigma$ theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses obtained by comparing the excluded cross section with theoretical cross sections.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $+1\sigma$ variation of the experimental uncertainty.

Interpretation of results in the T1tttt model. The colored regions show the upper limits (95\% CL) on the production cross section for $pp\rightarrow \tilde{g}\tilde{g},\tilde{g}\rightarrow t\bar{t}\tilde{\chi}^0_1$ in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane. The curve shows the expected limit on the corresponding SUSY particle masses corresponding to a $-1\sigma$ variation of the experimental uncertainty.

Observed excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

Expected excluded region (95\% CL), shown in blue, in the $m_{\tilde{g}}$-$m_{\tilde{\chi}^0_1}$ plane for a model combining T5tttt, gluino pair production, followed by gluino decay to an on-shell top squark, together with a model for direct top squark pair production. The top squarks decay via the two-body process $\tilde{t}\rightarrow t\tilde{\chi}^0_1$. The neutralino and top squark masses are related by the constraint $m_{\tilde{t}} = m_{\tilde{\chi}^0_1} + 175$ GeV.

For the tu$\gamma$ signal channel, the total number of observed selected events in the data (N$_{obs}$), the SM expectations (N$_{SM}$), the efficiencies ($\epsilon$), and the upper limits on the cross sections $\sigma_{fid}$ at the 95% CL in the fiducial region, without and with a requirement on the presence of a single accompanying b jet.

For the tc$\gamma$ signal channel, the total number of observed selected events in the data (N$_{obs}$), the SM expectations (N$_{SM}$), the efficiencies ($\epsilon$), and the upper limits on the cross sections $\sigma_{fid}$ at the 95% CL in the fiducial region, without and with a requirement on the presence of a single accompanying b jet.