90% CL observed contour for U1B model

90% CL observed contour for up-philic model

90% CL observed contour for 2HDM model

90% CL observed contour for Dark Photon model

The relative systematic uncertainties of the fitted number of neutrino interactions.

The relative systematic uncertainties of the fitted number of anti-neutrino interactions.

The relative systematic uncertainties of the fitted number of neutrino and anti-neutrino interactions.

Number of observed CC $\nu_{\mu}$ neutrino candidate events in data and simulation.

Number of observed CC $\nu_{\mu}$ neutrino candidate events per inv. bin width.

Number of CC $\nu_{\mu$} neutrino interactions in the fiducial volume.

Number of CC $\nu_{\mu$} neutrino interactions in the fiducial volume per bin width.

Number of CC $\bar{nu}_{\mu$} neutrino interactions in the fiducial volume per bin width.

Number of CC $\nu_{\mu}$ and $\bar{nu}_{\mu$} neutrino interactions in the fiducial volume per bin width.

Neutrino cross section

Anti-neutrino cross section

Neutrino and anti-neutrino cross section

Neutrino cross section divided by energy.

Anti-neutrino cross section divided by energy.

Neutrino and anti-neutrino cross section divided by energy.

Neutrino flux divided by the cross sectional area of the fiducial volume.

Anti-Neutrino flux divided by the cross sectional area of the fiducial volume.

Neutrino and anti-Neutrino flux divided by the cross sectional area of the fiducial volume.

Neutrino flux per bin width divided by the cross sectional area of the fiducial volume.

Anti-neutrino flux per bin width divided by the cross sectional area of the fiducial volume.

Neutrino and anti-neutrino flux per bin width divided by the cross sectional area of the fiducial volume.

Number of neutrino interactions from pion and kaon decays.

Covariance matrix of the fitted number of neutrinos from pion and kaon decays.

Response matrix to unfold the reconstructed, calibrated muon momentum $q/p^{'}_{\mu}$ to the true neutrino energy $-L/E_{\nu}$.

Distribution of the number of clusters in the IFT for neutrino-like data, muon-like data, and simulation.

Distribution of the muon angle for neutrino-like data, muon-like data, and simulation.

Distribution of the muon charge over momentum for neutrino-like data, muon-like data, and simulation.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

The $m_{jj}$ distributions for the CRs and the BDT classifier response distribution for the SR after the fit in all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Observed and expected event yields for the signal and all of the background processes considered in this analysis after the fit to the data in all of the regions. The uncertainty on the expected yield is the combination of statistical and systematic uncertainties obtained in the fit. The individual uncertainties can be correlated and do not necessarily add in quadrature to equal the total background uncertainty.

Summary of the event yield for processes in all regions, after the fit over all regions. The dashed line shows the total background distribution before the fit. The vertical error bars on the data points correspond to the data's statistical uncertainty. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Impact of different components of systematic uncertainty on the measured cross section, without taking into account the correlations. The impact is calculated by fixing the value of the corresponding nuisance parameters to the values obtained in the fit used to measure the cross section, performing the fit, estimating the signal strength uncertainty and subtracting it from the nominal uncertainty in quadrature.

Fitted POI values for this analysis, the previous ATLAS analysis, and their combination. The first and second columns present the values obtained in the individual analyses. The third column presents the values obtained in the combination.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters. Limits are obtained by setting all aQGCs parameters except one to zero. Unitarity is not preserved.

Observed and expected one-dimensional limits on dimension 8 aQGC parameters in the region, where unitarity is preserved. Cutoff scales in MC, $E_{c}$, are given for each parameter. Limits are obtained by setting all aQGCs parameters except one to zero.

The $E_{T}^{\gamma}$ distribution in the SR after the fit in the control regions. The red (green) line shows the expected number of events in the case of non-zero EFT coefficient $f_{T0}/\Lambda^4$ ($f_{M0}/\Lambda^4$) with the value shown in the legend. The vertical error bars on the data points correspond to the data statistical uncertainty. Overflows are included in the last bin. The uncertainty band corresponds to the combination of the MC statistical uncertainty and systematic uncertainties obtained in the fit.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T5}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T8}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{T9}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 600$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M0}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M1}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Evolution of the expected (red line) and observed (blue line) limits versus $E_{c}$ values for $f_{M2}/\Lambda^4$. The unitarity bound is shown by the black line. The $E_{c}<4$ TeV regime was obtained with $E_{T}^{\gamma} > 400$ GeV. The $E_{c} \geq 4$ TeV regime was obtained with $E_{T}^{\gamma} > 900$ GeV.

Correlation matrix of the parameters for the fit in all regions. Only parameters with absolute value of the correlation coefficient larger than 10 are shown.

Measured differential cross section as a function of observable $ \Delta R (l,l)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ N_{jets}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{jj}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ m_{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ H_{T}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \Delta \phi (Jet,\gamma)$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \phi_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ \cos \theta_{CS}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma} / m_{ll\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll} - p_{T}^{\gamma}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Measured differential cross section as a function of observable $ p_{T}^{ll\gamma j}$. Error on the measured cross-section include all the systematic uncertainties. SM predictions are produced with the event generators at particle level: Sherpa 2.2.4, Sherpa 2.2.11, MadGraph5_aMC@NLO, and MiNNLO$_{PS}$. Fixed order calculations results use MATRIX NNLO. Error represent statistical uncertainty and theoretical uncertainty (PDF and Scale variations).

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{\gamma} / \sqrt{H_{T}}$ (Fig. 8 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ H_{T}$ (Fig. 8 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta \phi (Jet,\gamma)$ (Fig. 8 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \Delta R (l,l)$ (Fig. 5 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma}$ (Fig. 5 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} < 200 GeV$ (Fig. 11 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } 200 GeV < p_{T}^{ll} + p_{T}^{\gamma} < 300 GeV$ (Fig. 11 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} - p_{T}^{\gamma} \textrm{ in bin } p_{T}^{ll} + p_{T}^{\gamma} > 300 GeV$ (Fig. 11 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{jj}$ (Fig. 7 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ m_{ll\gamma j}$ (Fig. 7 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ N_{jets}$ (Fig. 6 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet1}$ (Fig. 6 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}$ (Fig. 6 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{Jet2}/p_{T}^{Jet1}$ (Fig. 6 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll}$ (Fig. 5 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j}$ (Fig. 8 (d))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} < 50 GeV$ (Fig. 12 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } 50 GeV < p_{T}^{ll\gamma} < 75 GeV$ (Fig. 12 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma j} \textrm{ in bin } p_{T}^{ll\gamma} > 75 GeV$ (Fig. 12 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 125 GeV < m_{ll\gamma} < 200 GeV$ (Fig. 10 (a))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } 200 GeV < m_{ll\gamma} < 300 GeV$ (Fig. 10 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll\gamma} / m_{ll\gamma} \textrm{ in bin } m_{ll\gamma} > 300 GeV$ (Fig. 10 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ p_{T}^{ll} + p_{T}^{\gamma}$ (Fig. 5 (c))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \cos \theta_{CS}$ (Fig. 9 (b))

Correlation matrix of the statistical uncertainties in the measured fiducial cross section for the observable $ \phi_{CS}$ (Fig. 9 (a))

The predicted and observed numbers of events in the control and signal regions. The predictions are shown after the fit to data. The indicated uncertainties consider statistical as well as all experimental and theoretical systematic uncertainties. Background categories with event yields with a value of 1.0e-6 have a negligible contribution to the region and are manually set to that value.

Fit results of the independent searches (1 POI) showing upper limits at 95% C.L. on the LFV branching ratios of the Higgs boson $H\to \mu\tau$. The results from standalone channel/categories fits are compared with the results of the combined fit.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{\ell'}$ channel for $e\tau_{\mu}$ final state in the non-VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{\ell'}$ channel for $\mu\tau_{e}$ final state in the non-VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{\ell'}$ channel for $e\tau_{\mu}$ final state in the VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{\ell'}$ channel for $\mu\tau_{e}$ final state in the VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{had}$ channel for $e\tau_{had}$ final state in the non-VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{had}$ channel for $\mu\tau_{had}$ final state in the non-VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{had}$ channel for $e\tau_{had}$ final state in the VBF category.

BDT score distribution, after the simultaneous fit of the $H\to e\tau$ and $H\to \mu\tau$ signals, obtained by fitting the data of the MC-template $\ell\tau_{had}$ channel for $\mu\tau_{had}$ final state in the VBF category.

NN score distribution, after an independent fit of the $H\to \mu\tau$ signal, obtained by fitting the data of the Symmetry $\ell\tau_{\ell'}$ channel, for the $\mu\tau_{e}$ final state in the non-VBF category.

NN score distribution, after an independent fit of the $H\to \mu\tau$ signal, obtained by fitting the data of the Symmetry $\ell\tau_{\ell'}$ channel, for the $\mu\tau_{e}$ final state in the VBF category.

Best-fit $\mathcal{B}(H\to \mu\tau)- \mathcal{B}(H\to e\tau)$ values, given in %, obtained from the standalone fits of the $\ell\tau_\ell'$ final state with either background estimation method. For the MC-template method, the correlated uncertainties are fixed to their best-fit values and the uncertainties are re-derived considering only the uncorrelated sources. For the Symmetry method, the full uncertainty is considered.

Best-fit value of the branching ratios $\mathcal{B}(H\to e\tau)$ and $\mathcal{B}(H\to \mu\tau)$, given in %, and likelihood contours at 68% and 95% C.L. Obtained from the simultaneous fit of $H\to e\tau$ and $H\to \mu\tau$ signals based on the MC-template method, compared to the SM expectation.

Distributions of $p_{T}^{Z_1}$. Small background contributions are denoted as "other backgrounds", including 4$\mu$ events containing non-prompt muons estimated from data and from $ttV$, $VVV$, and Higgs boson production processes.

Distributions of $p_{T}^{Z_2}$. Small background contributions are denoted as "other backgrounds", including 4$\mu$ events containing non-prompt muons estimated from data and from $ttV$, $VVV$, and Higgs boson production processes.

Distributions of the mass difference of the $Z_1$ and $Z_2$ candidates. Small background contributions are denoted as "other backgrounds", including 4$\mu$ events containing non-prompt muons estimated from data and from $ttV$, $VVV$, and Higgs boson production processes.

The pDNN output discriminant variable distributions for low mass with a signal sample at 35 GeV and 51 GeV, respectively.

The pDNN output discriminant variable distributions for high mass with a signal sample at 35 GeV and 51 GeV, respectively.

Mass spectra of $m_{Z2}$ for the pDNN-selected events with a signal sample at 15 GeV.

Mass spectra of $m_{Z1}$ for the pDNN-selected events with a signal sample at 51 GeV.

The $p_0$-value scan across the Z' mass signal regions.

95% CL upper limits (expected and observed) on the cross-sections times branching fraction. The discontinuity at 42 GeV represents the border of the low/high mass classifiers.

95% CL upper limits (expected and observed) on the coupling parameter. The discontinuity at 42 GeV represents the border of the low/high mass classifiers.

The parameterized mass resolution $\sigma_{m_{\mu\mu}}$ as a function of $m_{Z'}$ using fully simulated $Z' \rightarrow \mu^+\mu^-$ events.

The transverse momentum $p_{T}$ distributions for each muon (ordered with $p_{T}$ from (a) to (d)). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

The transverse momentum $p_{T}$ distributions for each muon (ordered with $p_{T}$ from (a) to (d)). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

The transverse momentum $p_{T}$ distributions for each muon (ordered with $p_{T}$ from (a) to (d)). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

The transverse momentum $p_{T}$ distributions for each muon (ordered with $p_{T}$ from (a) to (d)). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. The plots (a) to (d) are the $\eta$ distributions of the 4 muons ($p_{T}$ ordered). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. The plots (a) to (d) are the $\eta$ distributions of the 4 muons ($p_{T}$ ordered). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. The plots (a) to (d) are the $\eta$ distributions of the 4 muons ($p_{T}$ ordered). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. The plots (a) to (d) are the $\eta$ distributions of the 4 muons ($p_{T}$ ordered). In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. Plots (a) to (d) are the angular separations, $\Delta R$ of the two muons that formed $Z_1$ and $Z_2$, and the mass distributions of $Z_1$ and $Z_2$. In addition to the major backgrounds from the SM $Z(Z^*)\rightarrow 4\mu$ production, other background, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. Plots (a) to (d) are the angular separations, $\Delta R$ of the two muons that formed $Z_1$ and $Z_2$, and the mass distributions of $Z_1$ and $Z_2$. In addition to the major backgrounds from the SM $Z(Z^*)\rightarrow 4\mu$ production, other background, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. Plots (a) to (d) are the angular separations, $\Delta R$ of the two muons that formed $Z_1$ and $Z_2$, and the mass distributions of $Z_1$ and $Z_2$. In addition to the major backgrounds from the SM $Z(Z^*)\rightarrow 4\mu$ production, other background, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Kinematic distributions of the pre-selected $4\mu$ events. Plots (a) to (d) are the angular separations, $\Delta R$ of the two muons that formed $Z_1$ and $Z_2$, and the mass distributions of $Z_1$ and $Z_2$. In addition to the major backgrounds from the SM $Z(Z^*)\rightarrow 4\mu$ production, other background, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Data and MC comparison of the $Z \to 4\mu$ invariant mass using pre-selected 4$\mu$ events. Figure (b) shows the distribution between 80 GeV~and 110 GeV~in Figure (a). Figure (c) shows the distribution of transverse momentum of $4\mu$ system. In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Data and MC comparison of the $Z \to 4\mu$ invariant mass using pre-selected 4$\mu$ events. Figure (b) shows the distribution between 80 GeV~and 110 GeV~in Figure (a). Figure (c) shows the distribution of transverse momentum of $4\mu$ system. In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Data and MC comparison of the $Z \to 4\mu$ invariant mass using pre-selected 4$\mu$ events. Figure (b) shows the distribution between 80 GeV~and 110 GeV~in Figure (a). Figure (c) shows the distribution of transverse momentum of $4\mu$ system. In addition to the major background from the SM $Z(Z^*)\rightarrow 4\mu$ production, other backgrounds, including 4$\mu$ events containing non-prompt muons estimated from data, and from $ttV$, $VVV$, and Higgs boson production processes, are included in the plots. Examples of the Z' signal from $pp\rightarrow Z'\mu^+\mu^- \rightarrow 4\mu$ process with masses of 15 and 51 GeV are also shown in the plots.

Results of applying the BH algorithm to the mass spectra in the leading photon category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading electron category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading muon category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading small-R jet category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading bjet category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading large-R jet category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading photon category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading electron category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the leading muon category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the inclusive category, using the fitted background estimations from the initial step

Results of applying the BH algorithm to the mass spectra in the inclusive category, using the fitted background estimations from the initial step

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading small-R jet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading bjet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading large-R jet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading photon category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading electron category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading muon category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading small-R jet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading bjet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading large-R jet category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading photon category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading electron category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the leading muon category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the inclusive category

Upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signal with a relative width value of 3% as a function of mass in the inclusive category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading small-R jet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading bjet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading large-R jet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading photon category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading electron category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading muon category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading small-R jet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading bjet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading large-R jet category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading photon category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading electron category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the leading muon category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the inclusive category

Comparison of observed upper limits at 95% CL on the cross section times branching fraction times acceptance for a Gaussian-shaped signals with relative width values as a function of mass in the inclusive category

Acceptance times efficiency in an HVT model as a function of mass in the leading large-R jet category

Upper limits at 95% CL on the cross section times the branching fraction($W^{\prime} \to ZW$) for the HVT signal as functions of mass($m_{ZX}$) in the leading large-R jet category.The full(dashed) red curves correspond to the theoretical predictions of HVT model A(B)

Comparison of the identification efficiencies using standard and merged-ee reconstruction as a function of true PT(Z)

Background rejection factor as a function of signal efficiency. The red curve shows the BDT performance whereas the blue curve corresponds to that of a cut-based analysis relying only on the jet energyfraction deposited in the EM calorimeter

BH p-values of the 100 pseudo-experiments as a function of in the leading small-R jet category for an injected Gaussian-shaped signal with a relative width value of 3%. The fractions of the pseudo-experiments that have the correctly identified interval and BH p-values below the threshold of 0.01 are indicated. The background is derived by the background-only fit in the full fitting range.

BH p-values of the 100 pseudo-experiments as a function of in the leading small-R jet category for an injected Gaussian-shaped signal with a relative width value of 3%. The fractions of the pseudo-experiments that have the correctly identified interval and BH p-values below the threshold of 0.01 are indicated. The background is derived by the background-only fit in the range excluding the BH interval.

Fractions of pseudo-experiments in which the detected BH interval agrees with the injected mass point and the BH p-value is below 0.01 as a function of mass in the leading small-R jet category for Gaussian-shaped signal with a relative width of 3%.

Fractions of pseudo-experiments in which the detected BH interval agrees with the injected mass point and the BH p-value is below 0.01 as a function of mass in the leading small-R jet category for Gaussian-shaped signal with a relative width of 3%.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 3% at the low boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 3% at the high boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 5% at the low boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 5% at the high boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 10% at the low boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of exclusion upper limits on signal event yields at 95% CL from 1000 pseudo-experiments for Gaussian-shaped signals with relative width values of 10% at the high boundary of the limit-sensitive mass range for the ZX spectrum of the leading small-R jet category. The vertical line corresponds to the expected nominal exclusion limit at 95% CL.

Distribution of ${E}_{T}^{miss}$ after the fit of the multijet backgrounds, in the electron channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on ${E}_{T}^{miss}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the signal region, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $W$+jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 3-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Distribution of $m_{T}^{W}$ after the fit of the multijet backgrounds, in the muon channel, in the $t\bar{t}$ 4-jets VR, without applying the cut on $m_{T}^{W}$. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit. The last bin includes the overflow. The uncertainty band indicates the simulation's statistical uncertainty, the normalisation uncertainties for different processes ($40$ % for $W$+jets production, $30$ % for multijet background and $6$ % for top-quark processes) and the multijet background shape uncertainty in each bin, summed in quadrature. The lower panel of the figure shows the ratio of the data to the prediction.

Expected distributions of the MEM discriminant $P(S|X)$ in the SR, for the s-channel single-top signal, and for the $t\bar{t}$ and $W$+jets backgrounds, for MEM discriminant values larger than $2.0\times10^{-4}$. Each distribution is normalised to unity. The binning is the same as the optimised binning used in the signal extraction fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $W$+jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 3-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty band indicates the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the $t\bar{t}$ 4-jets VR. Simulated events are normalised to the expected number of events given the integrated luminosity, after applying the normalisation factors obtained in the multijet fit presented in Section 5 in the paper. The uncertainty bands indicate the simulation's statistical uncertainty and the normalisation uncertainties for the various processes in each bin, summed in quadrature. The ratio of the observed number to the predicted number of events in each bin is shown in the lower panel of the figure, with different vertical axis ranges. The binning is the same as the optimised binning used in the signal extraction fit described in Section 8 in the paper, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR before the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The uncertainties in the $t\bar{t}$ and $W$+jets normalisation factors, as well as in the s-channel signal cross-section, are not defined pre-fit and therefore not included. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$. The lower panel of the figure shows the ratio of the data to the prediction, with different vertical axis ranges. The uncertainty band indicates the total uncertainties and their correlations in each bin. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Distribution of the MEM discriminant $P(S|X)$ in the SR after the fit to data, for MEM discriminant values larger than $2.0\times10^{-4}$, after subtraction of all backgrounds. The fitted distribution for the simulation of the signal is shown together with the post-fit uncertainty in the backgrounds. The binning is the same as the optimised binning used in the fit, resulting in a non-linear horizontal scale.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the leading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the subleading-jet $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $p_{T}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the lepton $\eta$. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the ${E}_{T}^{miss}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Comparison between data and prediction after the fit to data in the signal region for the $m_{T}^{W}$. The last bin includes the overflow. The uncertainty band includes all uncertainties and their correlations. The lower panel of the figure shows the ratio of the data to the prediction.

Nuisance parameters ranked according to their post-fit impacts on the best-fit value of the ratio $\mu$ of the measured cross-section to the predicted cross-section. In the figure, only the 20 nuisance parameters with the largest post-fit impacts are shown. The empty (solid) blue rectangles illustrate the pre-fit (post-fit) impact on $\mu$, corresponding to the upper axis. The pre-fit (post-fit) impact of each nuisance parameter, $\Delta\mu$, is calculated as the difference in the fitted value of $\mu$ between the nominal fit and the fit when fixing the corresponding nuisance parameter to $\hat{\theta}\pm\Delta\theta$ ($\hat{\theta}\pm\Delta\hat{\theta}$), where $\hat{\theta}$ is the best-fit value of the nuisance parameter and $\Delta\theta$ ($\Delta\hat{\theta}$) is its pre-fit (post-fit) uncertainty. Several systematic uncertainties are split into different nuisance parameters, which are indicated by NP. JES (JER) indicates jet energy scale (resolution), and $\gamma$ indicates a nuisance parameter associated to the MC statistics in one of the 18 bins numbered from 0 to 17. The black points show the best-fit values of the nuisance parameters, with the error bars representing the post-fit uncertainties. Each nuisance parameter is shown wrt. its nominal value, $\theta_0$, and in units of its pre-fit uncertainty, except the free-floating normalisation factors of the $t\bar{t}$ and $W$+jets backgrounds, and the parameters associated to the MC statistics in each bin, for which the post-fit values and uncertainties are shown.

Correlation matrix of the nuisance parameters and of the ratio $\mu$ of the measured cross-section to the predicted cross-section. The correlations are given after the fit to data. In the figure, only the parameters which have a correlation of at least 0.2 with any other parameter are shown.

Event yields of the signal and SM background processes in the six analysis regions after the fit to the data under the $t \rightarrow cX$ hypothesis assuming $m_X = 30$ GeV. Total includes signal and background.The quoted uncertainties take into account correlations and constraints of the nuisance parameters and include both the statistical and systematic uncertainties. Negative correlations between the $t\bar{t} +$ light, $t\bar{t} + \geq1b$ and $t\bar{t} + \geq1c$ modelling uncertainties can make the uncertainty in the total yields smaller than in the individual components.

Event acceptance times efficiency in percent for every $t\rightarrow uX$ and $t\rightarrow cX$ mass signal sample.

Cut flow for the scalar signal in the $t\rightarrow uX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.

Cut flow for the scalar signal in the $t\rightarrow cX$ decay combining both quark and anti-quark samples. Shown for each signal are the corresponding mass, the number of generated events, the number of reconstructed ("Reco") events, the events that pass the lepton triggers, the events that have only one electron ("el") or only one muon ("mu") with p$_{\text{T}}$ larger than 27 GeV, the number of events with at least four jets with p$_{\text{T}}$ larger than 25 GeV, the number of events with at least three $b$-tagged jets at the 70% efficiency working point, and the number of events with at least two $b$-tagged jets at the 60% efficiency working point and at least another one at the 70%. The quoted yields do not include reweighting.