The minimum $\chi^2$ and the parameters $T_{fo}$ and $\beta^{max}_T$ for each of the five centrality selections. The best fit parameters are determined by averaging all parameter pairs within the 1$\sigma$ contour. The errors correspond to the standard deviation of the parameter pairs within the 1$\sigma$ $\chi^2$ contour.

Fit parameters for each particle species using Equations $\frac{dN}{dy}$ = $C \cdot$ ($N_{part}$)$^{\alpha_{part}}$ and $\frac{dN}{dy}$ = $C^{\prime} \cdot$ ($N_{coll}$)$^{\alpha_{coll}}$.

Values of the parameters $n_{pp}$ and $x$ from fitting Equation $R \equiv \frac{dN/dy}{N_{part}}$ = (1-$x$) $\cdot n_{pp} \frac{1}{2}$ + $x \cdot n_{pp} \frac{N_{coll}}{N_{part}}$ = $n_{pp}$ [$\frac{1}{2}$ + $x$($\frac{N_{coll}}{N_{part}}$ - $\frac{1}{2})$]to the observed $dN$/$dy$ per $N_{part}$.

Invariant yields for $\pi^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for $K^{\pm}$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Invariant yields for (anti)$p$ measured in minimum-bias events at midrapidity and normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Pion invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Kaon invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

(Anti)proton invariant yields in each event centrality and $p_T$ bin measured at midrapidity, normalized to one rapidity unit.

Minimum-bias invariant yields for $\pi^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for $K^{\pm}$ in equal $p_T$ bins.

Minimum-bias invariant yields for (anti)$p$ in equal $p_T$ bins.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Pion invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

Kaon invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

(Anti)proton invariant yields in each event centrality normalized to one rapidity unit at midrapidity.

The integrated mean $p_T$ for pions, kaons, and (anti)protons produced in the five different classes of event centrality.

The expansion parameters $T_{fo}$ and $\beta^{max}_T$ as a function of the number of participants.

Fit results based on $k(\delta_{\eta})$=$1/{{2\alpha\xi}/{\delta_{\eta}}}$ ($\xi << \delta_{\eta}$).

$F_{p_T}$ (in percent) of non-random fluctuations as a function of the $p_T$ range over which $M_{p_T}$ is calculated, 0.2 GeV/$c$ < $p_T$ < $p^{max}_T$, for the 20-25% centrality class ($N_{part}$ = 181.6).

$v(Q)$, for central events, as a function of the azimuthal coverage of the detector for data. (Angles in degrees.)

The effect on $v(Q)$ of varying the acceptance in $\varphi_r$. The solid curve shows the expectation from global charge conservation. The 10% most central events are used for data and RQMD. (Angles in degrees.)

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Invariant $\pi^0$ yields at midrapidity as a function of $p_T$ for minimum bias and nine centralities in $Au\ +\ Au$ at $\sqrt{s_{NN}} = 200\ GeV$ [0%–10% (80%–92%) is most central (peripheral)]. The labels "uncorr." and "corr." include systematic errors that are uncorrelated and correlated point-to-point, respectively.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

Nuclear modification factor $R_{AA}(p_T)$ for $\pi^0$ in Au+Au collisions at $\sqrt{s_{NN}} = 200$ GeV. The error bars include all point-to-point experimental ($p+p$, Au+Au) errors. The label "sys(uncorr)" refers to the uncorrelated point-to-point uncertainty (which includes statistical errors), while "sys(norm)" is the normalization uncertainty.

The $M_{e_T}$ distributions for four different centrality classes. The curves are the random baseline mixed event distributions. The source of differences in the data and mixed event distributions are addressed in the text.

The residual distribution between the data and mixed event $M_{e_T}$ spectra as a function of $M_{e_T}$ in units of standard deviation. The total ${\chi}^2$ and the number of degrees of freedom for the $0-5\%$, $0-10\%$, $10-20\%$, $20-30\%$ centrality classes are 310.0/32, 896.4/36, 678.7/47, and 553.9/53, respectively. A large fraction of the residual contributions are due to the effects of cluster merging.

Nucelar modification factor $R_{CP}$ for ($p+\bar{p}$)/2.

Nucelar modification factor $R_{CP}$ for $\pi^0$.

Charged hadron to $\pi^0$ ratio in central (0-10%) Au+Au collisions.

Charged hadron to $\pi^0$ ratio in peripheral (60-92%) Au+Au collisions. The peripheral data points are offset by +130 MeV/$c$ for clarity.

Systematic error on normalization a) common to both centralities b) that can move the $h$/$\pi^0$ ratios for each centrality independent of the other.

Ratio of the electron data to the calculated background as a function of $p_T$ in minimum bias collisions (upper panel) and relative contributions to the background from various sources (lower panel). The curves for $\omega$ and $\phi$ show the sum of the Dalitz and the di-electron decay modes.

The background-subtracted electron spectra for central (0-10%) collisions compared with the expected contributions from open charm decays. Also shown, for central collisions only, are the expected contribution from bottom decays (dashed) and the conversion electron spectrum from a direct phonon prediction (dotted).

The background-subtracted electron spectra for minimum bias (0-92%) collisions compared with the expected contributions from open charm decays. Also shown, for central collisions only, are the expected contribution from bottom decays (dashed) and the conversion electron spectrum from a direct phonon prediction (dotted).

Single electron cross sections $\frac{d\sigma_e}{dy}|_{y=0}$ of this measurement and ISR experiments [9,11,31] are displayed (bottom of figure, right-hand scale) with charm decay contributions calculated with PYTHIA. Open and filled symbols for 1.0 < $p_T$ < 1.4 GeV/$c$ and $p_T$ > 1.4 GeV/$c$, respectively. The derived charm cross section of this measurement is compared with charm cross sections from SPS/FNAL experiments (top of figure, left-hand scale). The thick curve and the shaded band represent the charm cross section in the PYTHIA model and in a NLO pQCD calculation [30], respectively.

Single electron cross sections $\frac{d\sigma_e}{dy}|_{y=0}$ of this measurement and ISR experiments [9,11,31] are displayed (bottom of figure, right-hand scale) with charm decay contributions calculated with PYTHIA. Open and filled symbols for 1.0 < $p_T$ < 1.4 GeV/$c$ and $p_T$ > 1.4 GeV/$c$, respectively. The derived charm cross section of this measurement is compared with charm cross sections from SPS/FNAL experiments (top of figure, left-hand scale). The thick curve and the shaded band represent the charm cross section in the PYTHIA model and in a NLO pQCD calculation [30], respectively.

$p_T$ spectra of charged hadrons for minimum bias collisions along with spectra for 9 centrality classes derived from the pseudo-rapidity region $|\eta|$ < 0.18. Stat. stands for statistical error, syst. stands for the systematic errors and occ. stands for occupancy error.

$p_T$ spectra of charged hadrons for minimum bias collisions along with spectra for 9 centrality classes derived from the pseudo-rapidity region $|\eta|$ < 0.18. Stat. stands for statistical error, syst. stands for the systematic errors and occ. stands for occupancy error.

Centrality dependence of $<p^{trunc}_T>$. Data points for truncated mean $p_T$ calculation for three $p_T$ ranges. The integral region is from 8 GeV/$c$ > $p_T$ > $p_{T_{min}}$ for the most peripheral bin. Since the data stop around 6.5 GeV/$c$, truncated mean $p_T$ is lower.

Ratio of charged hadron yields per nucleon-nucleon collision between central (0-10%) and peripheral (60-92%) Au + Au collisions. Stat. stands for statistical error, syst. stands for the systematic errors and occ. stands for occupancy error.

$R_{AA}$ for $(h^++h^-)/2$ and $\pi^0$ as function of $p_{T}$ for minimum bias and 9 centrality classes. Stat. stands for statistical error from Au+Au. The asymmetric uncertainty from the fit of the $\pi^0$ mass peak is denoted by fit. $\sigma_{ENBC}$ stands for error on number of binary collisions. Error from $pp$ parametrization that is not $p_T$ dependent. This error is not included in the calculation of the Upper bound of the systematic error and the Lower bound of the systematic error.

$R_{AA}$ for $(h^++h^-)/2$ and $\pi^0$ as function of $p_{T}$ for minimum bias and 9 centrality classes. Stat. stands for statistical error from Au+Au. The asymmetric uncertainty from the fit of the $\pi^0$ mass peak is denoted by fit. $\sigma_{ENBC}$ stands for error on number of binary collisions. Error from $pp$ parametrization that is not $p_T$ dependent. This error is not included in the calculation of the Upper bound of the systematic error and the Lower bound of the systematic error.

$R_{AA}$ for $(h^++h^-)/2$ and $\pi^0$ as function of $p_{T}$ for minimum bias and 9 centrality classes. Stat. stands for statistical error from Au+Au. The asymmetric uncertainty from the fit of the $\pi^0$ mass peak is denoted by fit. $\sigma_{ENBC}$ stands for error on number of binary collisions. Error from $pp$ parametrization that is not $p_T$ dependent. This error is not included in the calculation of the Upper bound of the systematic error and the Lower bound of the systematic error.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Charged hadron to $\pi^0$ ratios for minimum bias events and 9 centrality classes.

Au + Au yield integrated for $p_T$ > 4.5 (GeV/$c$) over the $N$ + $N$ yield, normalized using either $N_{coll}$ or $N_{part}$, plot as a function of $<N_{part}>$. Statistical and systematic error from Au+Au and $N$+$N$ reference includes: a) $NN$ reference error with 10.4% normalization error subtracted, this error is 11.2%, b) systematic error on Au+Au is 8.5% (correction), and c) 5% occupancy correction (it is centrality dependent). Error on $N_{coll}$+10.4% error on $N$+$N$ reference.

Au + Au yield integrated for $p_T$ > 4.5 (GeV/$c$) over the $N$ + $N$ yield, normalized using either $N_{coll}$ or $N_{part}$, plot as a function of $<N_{part}>$. Statistical and systematic error from Au+Au and $N$+$N$ reference includes: a) $NN$ reference error with 10.4% normalization error subtracted, this error is 11.2%, b) systematic error on Au+Au is 8.5% (correction), and c) 5% occupancy correction (it is centrality dependent). Error on $N_{coll}$+10.4% error on $N$+$N$ reference.

Invariant yields from the $p$+$p$ reference data. The normalization uncertainty is labeled norm, the uncertainty from the fit is labeled fit, and the uncertainty $\pi^0$ is from the $\pi^0$ ratio.