Mcculloch, J.w.
CLEO
Muon production
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Bounds on the CP asymmetry in like sign dileptons from B0 anti-B0 meson decays

The CLEO collaboration Jaffe, D.E. ; Mahapatra, R. ; Masek, G. ; et al.
Phys.Rev.Lett. 86 (2001) 5000-5003, 2001.
Inspire Record 551926 DOI 10.17182/hepdata.47284

We have measured the charge asymmetry in like-sign dilepton yields from B^0 B^0-bar meson decays using the CLEO detector at the Cornell Electron Storage Ring. We find a_ll = [N(l+l+) - N(l-l-)]/[N(l+l+) + N[l-l-)] = +0.013 +/- 0.050 +/- 0.005 . We combine this result with a previous, independent measurement and obtain Re(epsilon_B)/(1+|epsilon_B|^2) = +0.0035 +/- 0.0103 +/- 0.0015 (uncertainties are statistical and systematic, respectively) for the CP impurity parameter, epsilon_B.

1 data table
Table 1

CONST(NAME=EPSILON) is CP impurity parameter.


Measurement of B --> rho l nu decay and |V(ub)|.

The CLEO collaboration Behrens, B.H. ; Ford, William T. ; Gritsan, A. ; et al.
Phys.Rev.D 61 (2000) 052001, 2000.
Inspire Record 500781 DOI 10.17182/hepdata.52337

Using a sample of 3.3 million Upsilon(4S) -> BBbar events collected with the CLEO II detector at the Cornell Electron Storage Ring (CESR), we measure the branching fraction for B -> rho l nu, |V_ub|, and the partial rate (Delta Gamma) in three bins of q^2 = (p_B-p_rho)^2. We find B(B^0 -> rho^- l^+ nu)=(2.69 +- 0.41^+0.35_-0.40 +- 0.50) 10^-4, |V_ub|=(3.23 +- 0.24^+0.23_-0.26 +- 0.58) 10^-3, Delta Gamma (0 < q^2 < 7 GeV^2/c^4) =(7.6 +- 3.0 ^+0.9_-1.2 +- 3.0) 10^-2 ns^-1, Delta Gamma (7 < q^2 < 14 GeV^2/c^4) =(4.8 +- 2.9 ^+0.7_-0.8 +- 0.7) 10^-2 ns^-1, and Delta Gamma (14 < q^2 < 21 GeV^2/c^4) = (7.1 +- 2.1^+0.9_-1.1 +- 0.6)10^-2 ns^-1. The quoted errors are statistical, systematic, and theoretical. The method is sensitive primarily to B -> rho l nu decays with leptons in the energy range above 2.3 GeV. Averaging with the previously published CLEO results, we obtain B(B^0 -> rho^- l^+ nu) = (2.57 +- 0.29^+0.33_-0.46 +- 0.41) 10^-4 and |V_{ub}| = (3.25 +- 0.14 ^+0.21_-0.29 +- 0.55) 10^-3.

1 data table
Table 1

VCB is the V-CKM (Cabibbo-Kobayashi-Maskawa) mixing matrix element. LEPTON+- stands for E+- or MU+-.


Measurements of B ---> D(s)+ X decays

The CLEO collaboration Gibaut, D. ; Kinoshita, K. ; Pomianowski, P. ; et al.
Phys.Rev.D 53 (1996) 4734-4746, 1996.
Inspire Record 401599 DOI 10.17182/hepdata.47241

This paper describes new measurements from CLEO of the inclusive B→Ds+X branching fraction as well as the B+→Ds(*)+D¯(*)0 and B0→Ds(*)+D(*)− branching fractions. The inclusive branching fraction is B(B→Ds+X)=(12.11±0.39±0.88±1.38)% where the first error is statistical, the second is the systematic error, and the third is the error due to the uncertainty in the Ds+→φπ+ branching fraction. The branching fractions for the B→Ds(*)+D¯(*) modes are found to be between 0.9% and 2.4% and are significantly more precise than previous measurements. The sum of the B→Ds(*)+D¯(*) branching fractions is consistent with the results of fits to the inclusive Ds+ momentum spectrum. Factorization is used to arrive at a value for fDs, the Ds+ decay constant. © 1996 The American Physical Society.

1 data table
Table 1

FORMFACTOR(NAME=FP,C=DECAY CONSTANT) is pseudoscalar meson decay constant. Three different methods are used: 1) C=MUNU: D/S+ --> MU+ NUMU, 2) C = ENU: B --> D/S+ D*BAR / B --> D*BAR E+ NU, and 3) C = PI : B --> D/S+ D*BAR / B0 - -> PI+(RHO+) D*BAR-. The F(D/S) is evaluated from B decay assuming the factorization.


Limit on the B ---> u Coupling from Semileptonic B Decay

The CLEO collaboration Chen, A. ; Goldberg, M. ; Horwitz, N. ; et al.
Phys.Rev.Lett. 52 (1984) 1084, 1984.
Inspire Record 199380 DOI 10.17182/hepdata.20474

We have used the momentum spectrum of leptons produced in semileptonic B-meson decays to set a 90%-confidence-level upper limit on Γ(b→ulν)Γ(b→clν) of 4%. We also measure the semileptonic branching fractions of the B meson to be (12.0±0.7±0.5)% for electrons and (10.8±0.6±1.0)% for muons.

2 data tables
Table 1

No description provided.

Table 2

No description provided.