Measured and predicted cross sections (fb) in bins of photon transverse momentum $p_{T}^{\gamma}$. The fiducial phase space definition follows the analysis selection in the paper.

Expected and observed 95% CL intervals for anomalous coupling parameters. All other anomalous coupling parameters are fixed to zero when extracting each interval.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new spin-2 particle $\mathrm{X}^{(2)}$ which decays to Higgs boson pairs, $\sigma(\mathrm{pp} \to \mathrm{X}^{(2)} \to \mathrm{HH})$, given for different values of $m_\mathrm{X}$ in the range 260-1000 GeV. Theoretical predictions for this cross section assuming that $\mathrm{X}^{(2)}$ is a graviton particle with $\kappa / \overline{M_{pl}} = 1$ are also provided [arXiv:1404.0102].

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$ which subsequently decay to a pair of photons and a pair of tau leptons, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH} \to \gamma\gamma\tau\tau)$. The limits are shown for different values of $m_\mathrm{Y}$ in the range 50-800 GeV and at particular values of $m_\mathrm{X}$ in the range 300-1000 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$ which subsequently decay to a pair of photons and a pair of tau leptons, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH} \to \gamma\gamma\tau\tau)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-1000 GeV and at particular values of $m_\mathrm{Y}$ in the range 50-800 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$ which subsequently decay to a pair of photons and a pair of tau leptons, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH} \to \gamma\gamma\tau\tau)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-1000 GeV and $m_\mathrm{Y}$ in the range 50-800 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{Y}$ in the range 70-125 GeV and at particular values of $m_\mathrm{X}$ in the range 300-1000 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-800 GeV and at particular values of $m_\mathrm{Y}$ in the range 70-125 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-1000 GeV and $m_\mathrm{Y}$ in the range 70-125 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{Y}$ in the range 125-800 GeV and at particular values of $m_\mathrm{X}$ in the range 300-1000 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-800 GeV and at particular values of $m_\mathrm{Y}$ in the range 125-800 GeV.

Observed and expected 95% CL upper limits on the cross section for the resonant production of a new scalar particle $\mathrm{X}$ which decays to a SM Higgs boson and a new scalar particle $\mathrm{Y}$, multiplied by the $\mathrm{Y} \to \gamma\gamma$ branching fraction, $\sigma(\mathrm{pp} \to \mathrm{X} \to \mathrm{YH})B(\mathrm{Y} \to \gamma\gamma)$. The limits are shown for different values of $m_\mathrm{X}$ in the range 300-1000 GeV and $m_\mathrm{Y}$ in the range 125-800 GeV.

Distributions of jet multiplicity in a Z-enriched selection of two-lepton OnZ events. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Distributions of jet multiplicity in a WZ-enriched selection of three-lepton OnZ events prior to corrections. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Distributions of jet multiplicity in a WZ-enriched selection of three-lepton OnZ events prior to corrections. The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainty (Unc.) in the predictions. SM background predictions fall short of the observations in all cases for higher jet multiplicities. Expected RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

Example search region distributions of jet multiplicity with $N_{b}=0$ (left) as well as $S_{T}$ in four-jet bins with $N_{b}=0$ (center) and $N_{b}\geq1$ (right). The lower panels show the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical (left), or statistical and systematic (center and right) uncertainties (Unc.) in the predictions.The expected background jet multiplicity distribution is obtained after applying the data driven corrections, whereas the $S_{T}$ distributions and the uncertainties are obtained after also performing the binned maximum likelihood fit to the data under the background-only hypothesis.Expected RPVq and RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}=350~$GeV with $m_{{\widetilde{\chi^{0}}_{1}}}=150$ and 50 GeV, respectively) signal distributions are overlaid for comparison.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

The 95% confidence level upper limits on the RPVq (left) and RPVb (right) signal production cross sections as a function of $m_{{\widetilde{\chi^{\pm}}_{1}}}=m_{{\widetilde{\chi^{0}}_{2}}}$ and $m_{{\widetilde{\chi^{0}}_{1}}}$. Contour lines indicate the observed (bold solid) and median expected (bold dashed) boundaries with 1 standard deviation (s.d.) as well as the 68% expected bands (thin dashed), where the latter on the observed contour line is due to the theoretical uncertainty on the signal production cross section.

Example diagram of a signal process, resulting from the EW production and decay of a chargino-neutralino pair and the subsequent hadronic RPV decay of the LSP. Leptonic decays of the W and Z bosons are targeted.

Example diagram of a signal process, resulting from the EW production and decay of a chargino-neutralino pair and the subsequent hadronic RPV decay of the LSP. Leptonic decays of the W and Z bosons are targeted.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets and zero b-tagged jets. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVq ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with two jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with three jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Search region distribution of $S_{T}$ in OnZ three-lepton events with five jets at least one of which is b-tagged. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions. The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis. For illustration, the expected pre-fit distribution of an example RPVb ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=50~$GeV) signal hypothesis is also overlaid.

Distribution of three- and four-lepton events across the control regions (CRs) and search regions (SR) used in the analysis. The first 13 bins correspond to ZZ (1-2), ttZ (3), ZG (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs.The "ZZ" and "ZG" background components are shown separately from the "Rare" background component for clarity.The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions.The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis.

Distribution of three- and four-lepton events across the control regions (CRs) and search regions (SR) used in the analysis. The first 13 bins correspond to ZZ (1-2), ttZ (3), ZG (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs.The "ZZ" and "ZG" background components are shown separately from the "Rare" background component for clarity.The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the sum of statistical and systematic uncertainties in the predictions.The expected SM background distributions and the uncertainties are obtained after performing the binned maximum likelihood fit to the data under the background-only hypothesis.

Jet multiplicity distribution in a W-enriched selection of one-lepton events, where the expected W backround has been corrected using the two-lepton Z-enriched dataset. The same Z-enriched dataset is also used to correct the {\WZ} jet multiplicity distribution in the SRs. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainties in prediction.An example RPVq signal ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) is also overlaid.

Description of three- and four-lepton control regions (CRs) and search regions (SRs) used in the analysis. All three-lepton OnZ events are split either in $M_{\mathrm{T}}$ or $S_{\mathrm{T}}$ bins in units of GeV. The first 13 bins correspond to ZZ (1-2), t$\bar{{\rm t}}$Z (3), Z$\gamma$ (4), MisID (5-7) and WZ (8-13) CRs, respectively, whereas the latter bins correspond to the SRs. A minimum lepton $p_{\mathrm{T}}$ cut of 20 GeV is applied to all three-lepton OnZ regions to suppress MisID background contributions, whereas it is kept at 10 GeV in all others. In the three-lepton BelowZ region (bin 4), an additional selection on the three lepton mass is applied to target Z$\gamma$ contributions, i.e. $76 < M(3\ell) < 106$ GeV.

The jet scaling patterns as measured in $t\overline{t}$-enriched one-lepton and Z-enriched two-lepton events in data. These are defined as the ratios of event counts in neighboring jet multiplicity $N_{j}$ bins, i.e. number of events with $(i+1)$ jets to the number with $i$ jets, and are used to correct the corresponding jet multiplicity distributions of WZ and ttZ events in three-lepton signal regions. In each measurement, the contributions of other processes are estimated and subtracted using simulated samples. The corresponding statistical uncertainties are negligible, whereas systematic uncertainties are not shown.

Jet multiplicity distribution in a W-enriched selection of one-lepton events, where the expected W backround has been corrected using the two-lepton Z-enriched dataset. The same Z-enriched dataset is also used to correct the {\WZ} jet multiplicity distribution in the SRs. The lower panel shows the ratio of observed events (Data) to the total background prediction (Bkg.), with the gray bands representing the statistical uncertainties in prediction.An example RPVq signal ($m_{{\widetilde{\chi^{\pm}}_{1}}}=350~$GeV, $m_{{\widetilde{\chi^{0}}_{1}}}=150~$GeV) is also overlaid.

The jet scaling patterns as measured in $t\overline{t}$-enriched one-lepton and Z-enriched two-lepton events in data. These are defined as the ratios of event counts in neighboring jet multiplicity $N_{j}$ bins, i.e. number of events with $(i+1)$ jets to the number with $i$ jets, and are used to correct the corresponding jet multiplicity distributions of WZ and ttZ events in three-lepton signal regions. In each measurement, the contributions of other processes are estimated and subtracted using simulated samples. The corresponding statistical uncertainties are negligible, whereas systematic uncertainties are not shown.

Table contains number of signal events for selected masses with different cuts applied.

The elliptic anisotropy $v_2\{4\}$ as a function of $\langle N_{trk}^{offline} \rangle$ with 4-subevent method compared between pPb collisions at 8.16 TeV and PbPb collisions at 5.02 TeV with $p_{T}^{POI}>6$ GeV.

The elliptic anisotropy $v_2\{4\}$ as a function of $\langle N_{trk}^{corrected} \rangle$ with 4-subevent method compared between pPb collisions at 8.16 TeV and PbPb collisions at 5.02 TeV with $p_{T}^{POI}>6$ GeV.

The differential cumulant $d_2\{4\}$ as a function of $p_T$ in generator level HIJING for $60 \le N_{trk}^{gen} <120$ are compared to the experimental pPb results with $60 \le N_{trk}^{offline} <120$ and $185 \le N_{trk}^{offline} <250$.

The second-order Fourier sine coefficients of $\Lambda$ polarization along the beam direction as functions of $N_\mathrm{trk}^\mathrm{offline}$ in pPb collisions at 8.16 TeV extracted with HF based event planes. The HF-based event plane is reconstructed only with the HF detectors toward the Pb going direction.

The second-order Fourier sine coefficients of $\bar{\Lambda}$ polarization along the beam direction as functions of $N_\mathrm{trk}^\mathrm{offline}$ in pPb collisions at 8.16 TeV extracted with HF based event planes. The HF-based event plane is reconstructed only with the HF detectors toward the Pb going direction.

The second-order Fourier sine coefficients of $\Lambda+\bar{\Lambda}$ polarization along the beam direction as functions of $N_\mathrm{trk}^\mathrm{offline}$ in pPb collisions at 8.16 TeV extracted with HF based event planes. The HF-based event plane is reconstructed only with the HF detectors toward the Pb going direction.

Matrix of the correlations of the systematic uncertainties between pairs of physics parameters, as obtained from the analysis to data at 13 TeV.

Matrix of the correlations between the physics parameters as obtained from the combination between the CMS 8 TeV and 13 TeV results. Correlations include both statistical and systematic uncertainties.

Cutflow for VBF Z' to WW in ditau 2016 channel for different signal scenarios

Cutflow for VBF Z' to WW in ditau 2017 channel for different signal scenarios

Cutflow for VBF Z' to WW in ditau 2018 channel for different signal scenarios

Cutflow for VBF Z' to tautau in mutau 2016 channel for different signal scenarios

Cutflow for VBF Z' to tautau in mutau 2017 channel for different signal scenarios

Cutflow for VBF Z' to tautau in mutau 2018 channel for different signal scenarios

Cutflow for VBF Z' to WW in mutau 2016 channel for different signal scenarios

Cutflow for VBF Z' to WW in mutau 2017 channel for different signal scenarios

Cutflow for VBF Z' to WW in mutau 2018 channel for different signal scenarios

Cutflow for VBF Z' to tautau in etau 2016 channel for different signal scenarios

Cutflow for VBF Z' to tautau in etau 2017 channel for different signal scenarios

Cutflow for VBF Z' to tautau in etau 2018 channel for different signal scenarios

Cutflow for VBF Z' to WW in etau 2016 channel for different signal scenarios

Cutflow for VBF Z' to WW in etau 2017 channel for different signal scenarios

Cutflow for VBF Z' to WW in etau 2018 channel for different signal scenarios

Cutflow for VBF Z' to tautau in emu 2016 channel for different signal scenarios

Cutflow for VBF Z' to tautau in emu 2017 channel for different signal scenarios

Cutflow for VBF Z' to tautau in emu 2018 channel for different signal scenarios

Cutflow for VBF Z' to WW in emu 2016 channel for different signal scenarios

Cutflow for VBF Z' to WW in emu 2017 channel for different signal scenarios

Cutflow for VBF Z' to WW in emu 2018 channel for different signal scenarios

Observed and expected background yields for different mass ranges in the mutau channel. The quoted uncertainty includes both the statistical and the systematic components. The last bin contains the overflow bin.

Observed and expected background yields for different mass ranges in the ditau channel. The quoted uncertainty includes both the statistical and the systematic components. The last bin contains the overflow bin.

Observed and expected background yields for different mass ranges in the etau channel. The quoted uncertainty includes both the statistical and the systematic components. The last bin contains the overflow bin.

Observed and expected background yields for different mass ranges in the emu channel. The quoted uncertainty includes both the statistical and the systematic components. The last bin contains the overflow bin.

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.1.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.25.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.50.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.75.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 1.0.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.1.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.25.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.50.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.75.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to tautau, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 1.0.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.1.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.25.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.50.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 0.75.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 0 and $k_V = 1.0.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.1.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.25.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.50.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 0.75.$

Combined $95\%$ confidence level expected and observed upper limits on the product of the $\mathrm{Z'}$ cross section and the branching fraction for a $\mathrm{Z'}$ boson decaying to WW, as a function of $\mathrm{Z'}$ mass and assuming g_(1,2) = 1 and $k_V = 1.0.$

Cross sections for different signal models for VBF Z'. To calculate cross section for branching fraction (br) 0.20 and kV = 0.1, subsitute the values in (br {x} $\kappa_{V}^{2}$ {x} xsec)

Combined 95% CL lower limits on m(Z') as a function of the Z' branching fraction to tautau for g_(1,2)=0 scenario. The observed limits corresponding to $\kappa_V$ equal to 0.1, 0.5, and 1.0 are shown here.

Combined 95% CL lower limits on m(Z') as a function of the Z' branching fraction to tautau for g_(1,2)=1 scenario. The observed limits corresponding to $\kappa_V$ equal to 0.1, 0.5, and 1.0 are shown here.

Combined 95% CL lower limits on m(Z') as a function of the Z' branching fraction to WW for g_(1,2)=0 scenario. The observed limits corresponding to $\kappa_V$ equal to 0.1, 0.5, and 1.0 are shown here.

Combined 95% CL lower limits on m(Z') as a function of the Z' branching fraction to WW for g_(1,2)=1 scenario. The observed limits corresponding to $\kappa_V$ equal to 0.1, 0.5, and 1.0 are shown here.

Differential cross sections for exclusive dielectron production, in the fiducial phase space of Table 1, as functions of the pair invariant mass. Data are compared with SUPERCHIC + FSR(PHOTOS++), STARLIGHT + FSR(PY8), and gamma-UPC + FSR(PY8) predictions.

Differential cross sections for exclusive dielectron production, in the fiducial phase space of Table 1, as functions of the pair |cos $\theta$*|. Data are compared with SUPERCHIC + FSR(PHOTOS++), STARLIGHT + FSR(PY8), and gamma-UPC + FSR(PY8) predictions.

Differential exclusive diphoton cross sections in the fiducial phase space of Table 1 as a function of the diphoton rapidity measured in data compared with SUPERCHIC and gamma-UPC@NLO predictions.

Differential exclusive diphoton cross sections in the fiducial phase space of Table 1 as a function of the diphoton invariant mass measured in data compared with SUPERCHIC and gamma-UPC@NLO predictions.

Observed and expected 95% CL limits on the production cross section $\sigma(\gamma\gamma \rightarrow a \rightarrow \gamma\gamma)$ as a function of the ALP mass $m_{a}$. The uncertainties indicate regions containing 68 and 95% of the distribution of limits expected under the background-only hypothesis. The additional datasets indicate the expected ALP cross sections as a function of $m_{a}$ for decreasing photon couplings ($g_{a\gamma} = 0.3, 0.1, 0.05 TeV^{-1}$).

Exclusion limits at 95% CL in the axion-photon coupling $g_{a\gamma}$ versus axion mass $m_a$ plane, for the operator $\frac{1}{4\Lambda}aF\widetilde{F}$ (assuming ALPs coupled only to photons) extracted in this analysis.

Cutflow for signal samples in the muon-tau channel for 2016 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the muon-tau channel for 2017 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the muon-tau channel for 2018 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2016 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2017 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Cutflow for signal samples in the electron-tau channel for 2018 signal samples. Each entry other than the total is the relative efficiency with respect to the previous selection.

Yields for the muon-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the muon-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the muon-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the electron-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2016 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2017 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Yields for the di-tau channel in 2018 as a function of reconstructed mass. Data and each background are listed with their respective uncertainties. The last bin contains the overflow bin.

Covariance matrix for all bins and all channels used in the background-only fit of this analysis. There are the e-tau, the mu-tau, and the tau-tau analysis channels, each present for 2016, 2017, and 2018. Each has 6 bins in the reconstructed mass (mrec[GeV]) indicated with their borders in the bin naming. The bin labels have channel name, year name, then bin name.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to di-tau in the e-tau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to di-tau in the mu-tau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to ditau in the ditau channel.

95% confidence level expected limit with 1 and 2 sigma uncertainties, as well as observed limits on Z' model cross section times branching ratio to ditau for the combination of all channels.